CT PSM Meeting 2017 - ZEISS Metrology/de/PDF/Events/ct... · CT User Meeting 2017 Visualisierung und Analyse von Volumendaten 2017-11-15 Dr. Marco Zeschky. Product Management

CT User Meeting 2017Visualisierung und Analyse von Volumendaten

2017-11-15

Dr. Marco ZeschkyProduct Management

22017-10-11Carl Zeiss Industrielle Messtechnik GmbH, Dr. Marco Zeschky, X-Ray

Agenda

123

Functionality

Outlook & Further Information

Introduction


ZEISS NEO insights

The easiest software for visualization and analysis of CT volume data


When to use NEO insights

Simple and easy defect inspection of multi materialInspection

Simple and easy measurement of single materialMeasure-ment

Simple and easy comparison of nominal-actual and actual-actual partsComparison

Simple and quick communication of measurement results to anyone

Communi-cation

Simple and convenient visualization of volume dataVisualization


Agenda

123

Functionality


Introduction


Taking a look at the NEO insights UI

Tab BarEditorExplorer

Menu Bar Tool BarMain Area

Navigation Bar

Action Bar


Navigating through NEO insights

Blue thread

The blue thread guides you from left to right and from top to down through the measurement


Core benefits

Important functionality (1/6) porosity check

Porosity visualization Highlights

Manual inspection of defects Sliding through different 2D

slices of the CT volume data for different views Clipping of the CT volume data

to analyze porosity in 3D

Quick, easy and destruction-free inspection of material defects Tracing back and early correction

of manufacturing process errors Prevention of early part wear down

due to improved quality system


Core benefits

Material detection Highlights

Automated detection and visualization of different materials Manual inspection of different

materials

Improved visualization by automatic detection and coloring of different materials

Important functionality (2/6) material detection and inspection


Core benefits

Feature recognition Highlights

Automated recognition of elements by activating “automated feature recognition”

Time savings as manual touching of measurement points is obsolete Easy creation of measurement

plan by “click and pick” of recognized features

Important functionality (3/6) automated feature recognition


Core benefits

Feature selection Highlights

Clicking on desired feature and choosing of desired feature for inclusion in measurement plan

Automated proposal of often required and linked features and characteristics Quick and easy inspection plan

creation by clicking and picking the relevant features and characteristics*

Important functionality (4/6) inspection plan creation

* Patent pending


Core benefits

Deviation visualization Highlights

Viewing of overall 3D deviations Viewing of 2D deviations in slices Previews of mini tables Comparison of actual-actual parts

during production

Quick comparison of good and bad parts by simple visualization Quick and easy in-line production

inspection of good or bad parts

Important functionality (5/6) nominal-actual comparison

* Patent pending


Core benefits


Taking of SnapViews during measurement plan creation Integration of SnapViews in PiWeb

Easy way to visualize results for anyone Automated updating of

SnapViews during CNC run and integration in protocol

Important functionality (6/6)snap views

* Patent pending


Core benefits


Creation of standard protocols or own protocol formats Integration of SnapViews in

protocol

Easy and integrated reporting of measurement results Automated updating of SnapViews

during CNC run and integration in protocol

Integrated ZEISS PiWeb reporting

* Patent pending


Central data & results management in PiWebsbs and PiWeb enterprise

CT volume data Measurementresults


Linking the entire work process chain with NEO insights STL format

ZEISS METROTOM

ZEISS NEO insights

ZEISS Reverse Engineering


Core benefits


Loading a project created with NEO insights including all necessary results (CAD and CT volume data) Creation of additional or new mini

tables for the nominal-actual comparison

Serving as interactive report including SnapViews Free of charge

Using the NEO viewer free of charge


Agenda

123

Functionality


Introduction


System requirements for NEO insights

Software

Operating system:− Microsoft Windows 7 (64 Bit)

Professional, Enterprise or Ultimate Edition

− Microsoft Windows 10 (64 Bit) Professional or Enterprise

Other:− Windows Internet Explorer

(version 7 or higher)

Hardware

Processor:− Intel Core i7, 64 Bit, ≥ 3,2 GHz RAM:− ≥ 16 gigabyte Graphics card− Support of Open GL 4.3,

Graphics memory ≥4 GB, Recommendation: NVIDIA

Monitor:− 19’’ monitor Full HD Hard drive− (depends on the project size)

Installation: 1.5 GB SSD hard drive

Pointing device:− Three-button mouse Drive:− Recommendation: DVD writer (+/-

RW) for data backup Interfaces:− The interfaces required for

communication with your measuring machine depend on the measuring machine used.

− Free USB connection for the installation via the USB stick.

Processor:− Intel Core i7, 64 Bit, ≥ 3,2 GHz RAM:− ≥ 64 gigabyte Graphics card− Support of Open GL 4.3,

Graphics memory ≥8 GB, Recommendation: NVIDIA

Monitor:− Dual monitor ≥ 22’’ Full HD Hard drive− (depends on the project size)

Installation: 1.5 GB SSD hard drive

Pointing device:− Three-button mouse Drive:− Recommendation: DVD writer (+/-

RW) for data backup Interfaces:− The interfaces required for

communication with your measuring machine depend on the measuring machine used.

− Free USB connection for the installation via the USB stick.

Recommended requirementsMinimum requirements


Further information on ZEISS NEO insights

YouTube / Software Portal Go to…

See the YouTube tutorial on ZEISS NEO insights for a first glimpse at:

https://www.youtube.com/watch?v=5GeUzRdiFi8

Don’t have own CT volume data?

Download test data or a measurement planfrom the ZEISS IMT software download portal at:

https://sdp.metrology.zeiss.com/Home/LoginLandingPage

https://www.youtube.com/watch?v=5GeUzRdiFi8

https://sdp.metrology.zeiss.com/Home/LoginLandingPage


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CT PSM Meeting 2017 - ZEISS Metrology/de/PDF/Events/ct... · CT User Meeting 2017 Visualisierung und Analyse von Volumendaten 2017-11-15 Dr. Marco Zeschky. Product Management