Coherent VUV generation :Coherent VUV generation :High order Harmonics in gases (High order Harmonics in gases (160 - 10nm)160 - 10nm)

Characterization

Application

Spectral selection /focussingLaser 5-50fs, 1-30mJ, 10Hz-1kHzIL ~1014 -1015 Wcm-2

Linear pol.

Rare gas (jet, cell, capillary)

Forward Phase-matching

ELaser

1- Tunnel ionization

Above-threshold Ionization(ATI)

Re-collisionMulti-ionization

IL = 1013 -1017 W/cm2 field-electron momentum transfer

ELaser

2- Acceleration

3- Recombination

Ultra-short (as) XUV burstUVX = Ec + Ip

Interaction of atoms with high laser fieldInteraction of atoms with high laser field

ti

xelec

te

time

Emission time te

30 25 20 15105

106

107

108

Nb

ph

oto

ns

~ |A

mp

litu

de

|2

Cutoff

Plateau

65

25

(nm)

Single harmonic(Salières et al. Science 2001)

Broadband emission (Paul et al. Science 2001, Mairesse Science 2003)

Characterization of attosecond pulse train

0

20

40

60

80

100

120

Ph

ase

(rad

)

Discrete / broadband XUV emissionDiscrete / broadband XUV emission

Coherence properties

Phase of XUV emission dXUV = dIL + te dXUV

Ne

Harmonic phase q ≈ qLaser + IL

0 500 1 000 1 500 2 000 2 5000

5

10

15

20

25

30

35

40

45

Inte

nsity

(ar

bitr

ary

units

)

Time (as)

25-33, te

35-43, te

H25-63=150 as

H35-43

H45-53

H55-63

H25-33 (N = 5)

Dinu et al., PRL 2003Mairesse et al, PRL 2004

EX(t) = Aq eiq(t teq)

N

EnergyUVX Electronic trajectory in the laser field

Proof of semi-classical three-step model

Attosecond time structure and dynamicsAttosecond time structure and dynamics

Energy / Peak powerEnergy / Peak power

160 120 80 70 60 50 40 30 20 10nJ

10nJ

100nJ

µJ

10µJ

100kW

MW

10MW

100MW

1GWRiken 16mJ

Xe

Saclay : EL= 20-25mJ

Hannover: KrF 14mJ 500fsE

nerg

y / p

ulse

(nm)

Pe

ak P

ow

er (2

0fs X

UV

pu

lse)

Ne

Ar

Riken 130mJ

Riken 16mJ

Scaling laser energy and medium at constant IL (Laserlab I3 ) 10µJ

7 9 11 13 15 17 19 21 23 250

10

20

30

40

50

60

70

80

90

100

Ref

lect

ivity

of

two

SiO

2 P

late

s at

10°

Harmonic order

7 9 11 13 15 17 19 21 23 25 27 29

0

20

40

60

80

100

Measured T thickness : 100nm 160nm

Filt

er

Tra

nsm

issi

on

(%

)

Harm order

CXRO data 100nm 160nm

Spectral selection

• Silica plates + metallic filters

• Grating time stretch

• Multilayer mirrors (< 40 nm)

RIR ~ 10-4

Al

10 15 20 25 30

0,00

0,05

0,10

0,15

0,20

0,25

0,30

0,35

0,40

0,45

0,507 9 11 13 15 17 19

Tra

nsm

issi

on

Photon energy (eV)

In 162nm (CXRO) Sn 162nmIn, Sn

= 0.5 :

Coherent flux ~ 75% Total flux

d=1mm

d=2mm

d=3mm

H13 (15)61nm

Fresnel bi-mirror Interferometer

Le Déroff et al. PRA 61 (2000) 043802

0,2 0,4 0,6 0,8 1,00,0

0,5

1,0

= 61.5 nm (H13)

Cohere

nt F

lux / T

ota

l F

lux

Coherence degree

Spatial Coherence of High HarmonicsCollab. Lab. Charles Fabry Orsay

Focussing

0

5

10

15

200 400 600 800 10000

2

4

6

M2

Backing Pressure (torr)

H15 (52 nm)

w0 (

µm

)

f=200 mm

• Multilayer spherical M

• Bragg Fresnel lens (Mo/Si)

1µJ at 20eV : IUVX ~ 1014 W.cm-

2

2.5 µm

• Parabola f=70mm

Zeitoun et al. LOA-LIXAM-20 -10 0 10 20

2

4

6

8 H37 (21.6 nm)

Spo

t dia

met

er (

µm

)

Distance to focus (µm)

f=50mm

Spatial interferometry

Spectral interferometry

Mutually coherent harmonic sources

80µm 180µm 380µm 600µmx=

H17

-5 -3 -1 1 3 50,0

0,2

0,4

0,6

0,8

1,0

H11

(Å)

t=150fs

Inte

nsity

-3 -1 1 3 5 (Å)

t=450fs

x

t

Separated spatially

Separated temporally

Frequency modulation :

Temporal properties

50 45 40 35 30 25

0,00

0,05

0,10

0,15

0,20

0,25

Ar25

XU

V I

nte

nsi

ty (

arb

. u

nits

)

(nm)

~10-3 -10-2

Coherence time < pulse duration

t

Iq

tL

Lq

Reconstruction of E() and from the

spectral interference pattern

2 Replicas

•Temporal delay

•Spectral shift

²)(²)()( EES

))()(cos()()(2 EE

Grating

Spectral interference

C. Iaconis & I.A. Walmsley, Optics Letters 23 (1998)

Complete characterization of an XUV pulsePrinciple of SPIDER in the visible

F. Verluise et al., Optics Letters 25 (2000)

DAZZLERLaserOscillator

Acousto-optic filter Tailoring of the IR pulse

GasJet

Lens

HH Generato

r

Creation of two delayed replicas is programmable and accurately set by the Dazzler

Spectral shift of one of them set by cutting the wings of the laser spectrum

q

q

HHG Transfer as =q.on harmonic q is measured on the harmonic spectra

Transposition in XUV : “Dazzling SPIDER”

Amplifier

Mairesse et al. PRL 2005

Quadratic spectral phase

Quadratic XUV temporal phase (IL-dependent)

Negative linear chirp : q = qL + bq t

SPIDER XUV SPECTRUM In

tens

ity (

a.u.

)

25,6 25,7 25,8 25,9 26,0 26,1 26,28

9

10

11

Inte

nsity

.10-15 rad/s

Phase (rad)

SPIDERALGORITHM

Phase-locked XUV pulses

Chirp Rate b11= 1.2 10 28 s-2

Complete characterization of harmonic pulse

-100 -50 0 50 100228

229

230

231

232

233

234

235

236

IR XUV (H11)

Inte

nsity

Time (fs)

XUV Phase (rad)

Temporal profile of harmonic emission

FWHM=50fsFWHM=22fs Consistent

Varju et al., JMO 52, 379 (2005)

13 15 17 19 21 23-3

-2

-1

0

1x1028

Chi

rp ra

te b

q (s

-2)

Order

Exp. bfund

=0 Th.

Exp. bfund

=0.8 1027 s-2

Th.

HHG cellToroidal Mirror

Delay line

1 J, 30 fs10Hz

Kr plasma

Al Filter

20 mJ, 30 fs

/4

towards diagnostics

Ph. Zeitoun et al., Nature 431, 426 (2004)

Amplification of harmonics in a laser medium

3d94d J=0

Ni-like Kr 8+ : (Ne)3s23p63d10

Collisions

e - ions3d94p J=1

32,6nm

0

2000

4000

6000

8000

10000

12000

0 100 200 300 400 500 600 700 800

XRL line

0

2000

4000

6000

8000

10000

12000

0 100 200 300 400 500 600 700 800

HHG +XRLnon synchronized

0

2000

4000

6000

8000

10000

12000

0 100 200 300 400 500 600 700 800

Amplified harmonic

Amplification in Krypton IX plasma at 32.8 nm

Harmonic 25 alone Amplified Harmonic

Amplification Factor : 15 à 200 (depending on seed level) Divergence : < 2 mrad

Prints of Laser at 32.8 nm

Amplification of harmonics in X-Ray laser : TUIXS (NEST)

L’amplification dépend du niveau d’injection

Gss = 80 cm-1

Iseed ~ Isat/100 : strong amplification (x 200)

Iseed ~ 4Isat : moderate amplification ( x 20)

Broad band Amplification > ASE regime

Attophysics group 2005Attophysics group 2005P. Breger H. Wabnitz PDocB. Carré W. Boutu PhDM.-E. Couprie M. de Grazia PhDH. MerdjiM. Labat PhDP. Monchicourt G. Lambert PhDP. Salière s Y. Mairesse PhD

ContractsContracts

I3 Laserlab : access (SLIC) / Development of Coherent ultra-short XUV source Applications of Coherent ultra-short XUV : Marie Curie RTN “XTRA” Amplification of harmonics in X-Ray laser : TUIXS (NEST) Seeding of FEL with laser harmonics generated in gas : EUROFEL-DS4

CollaborationsCollaborationsLab. Francis Perrin, CEA-SaclayLab. Francis Perrin, CEA-Saclay

Lab. Optique Appliquée, ENSTA-Ecole Polytechnique, PalaiseauLab. Optique Appliquée, ENSTA-Ecole Polytechnique, Palaiseau

Centre d’Etudes des Lasers Intenses et Applications, Bordeaux Centre d’Etudes des Lasers Intenses et Applications, Bordeaux

Lab. Interaction du rayonnement X Avec la Matière, OrsayLab. Interaction du rayonnement X Avec la Matière, Orsay

Lab. Charles Fabry , Institut d’Optique, OrsayLab. Charles Fabry , Institut d’Optique, Orsay

Service de Chimie Moléculaire, CEA-SaclayService de Chimie Moléculaire, CEA-Saclay

Lund Laser Center, LundLund Laser Center, Lund

CUSBO, Politecnico MilanoCUSBO, Politecnico Milano

FOM Institute for Atomic and Molecular Physics, AmsterdamFOM Institute for Atomic and Molecular Physics, Amsterdam

IESL- FORTH, Heraklion, CreeteIESL- FORTH, Heraklion, Creete

INOA-LENS, FirenzeINOA-LENS, Firenze

Brookhaven Nat LabBrookhaven Nat Lab

J. J. Thomson Lab., Univ. ReadingJ. J. Thomson Lab., Univ. Reading

Kurchatov Institute, MoscowKurchatov Institute, Moscow

Researchers - Collaborations - ContractsResearchers - Collaborations - Contracts

Power: 0.4TW

Duration: 30 fs

Reprate: 1 kHz

+ 2 NOPAs (~5GW)

Tunability: 520-750 nm

PLFA

Power: 10TW

Duration: 65 fs

reprate: 10 Hz

Intensity: >3.1018W/cm2

Plasma physics

Particles acceleration

UHI10

Power: <1TW

Duration: 45 fs

Reprate: 20 Hz

+1 line 560-650 nm (GW)

5 experimental stations

LUCA

Saclay Laser-matter Interaction Center

B4.2 Time-resolved diagnostics of dense plasmasTime-resolved diagnostics of dense plasmas

Resolution (object): 4 µmField diam ~ 0.8 mm.

Collab. Lab. Ch. Fabry OrsayCollab. Lab. Ch. Fabry OrsayXUV interferometer using HH mutual coherence

Imaging elliptical mirrorB4C/Si multilayer

(32nm)

plasmaObject

Magnif. ~10Pump

Salières et al. PRL (1999)Descamps et al. Optics Lett. (2000)

Interferogram in virtual Object plane

IR beam splitter

In 2001-2005 Multi-photon/multi-color photoionization of atoms (AMOLF 2003)

Photoionization of water in the liquid phase (Univ. Stockholm 2004) Surface ablation by XUV pulses (Univ. Warsaw, PALS 2005) Photoionization of clusters by XUV pulses (Technische Univ. Berlin 2005)

High intensity in the XUV (~ 1012W/cm2) : Non Linear processes Short duration (10fs100as) /synchronization with laser : time-resolved studies Intrinsic or mutual coherence : interferometry techniquesAtomic physics (photoionization): Toma et al. Phys. Rev. A (2000).

Solid state physics : Quéré et al., Phys. Rev. B (2000), Gaudin et al., Appl. Phys. B (2004)

Plasma physics : Salières et al., Phys. Rev. Lett. (1999), Descamps et al., Opt. Lett. (2000).

Applications of Coherent XUV pulses

7 9 11 13 15 17 19 21 23 25

0

10

20

30

40

50

60

70

80

90

100

Ref

lect

ivity

of

two

SiO

2 P

late

s at

10°

Harmonic order

7 9 11 13 15 17 19 21 23 25 27 29

0

20

40

60

80

100

Measured T thickness : 100nm 160nm

Filt

er

Tra

nsm

issi

on

(%

)

Harm order

CXRO data 100nm 160nm

Spectral selection

10 15 20 25 30

0,00

0,05

0,10

0,15

0,20

0,25

0,30

0,35

0,40

0,45

0,507 9 11 13 15 17 19

Tra

nsm

issi

on

Photon energy (eV)

In 162nm (CXRO) Sn 162nm

5 10 15 20 250

10

20

30

40

50

60

70

80

90

100

Polarization S

Tr

/ Re

(%)

Incidence (°)

Transmission Reflectivity

• Silica plates + metallic filters

• Grating time stretch

25 30 35 40

0,00

0,05

0,10

0,15

0,20

0,25

0,30

0,35

B4C/Si

Ref

lect

ivity

Wavelength (nm)

Simul (inc=4°) Exp:

, incidence 4°, 5°

Spectral selection and focussing

0

5

10

15

200 400 600 800 10000

2

4

6

M2

Backing Pressure (torr)

H15 (52 nm)

w0 (

µm

)

Spherical Mirrorf=200 mm

• Multilayer mirror (< 40 nm)

• Bragg Fresnel lens (Mo/Si)

1µJ at 20eV : IUVX ~ 1014 W.cm-

2

2.5 µm

Parabola f=70mm

Zeitoun et al. LOA-LIXAM

Reconstruction of from the

spectral interference pattern

2 Replicas

•Temporal delay

•Spectral shift

²)()( ES

²)( E

))()(cos()()(2 EE

Grating

Spectral interference

C. Iaconis & I.A. Walmsley, Optics Letters 23 (1998)

Complete characterization of XUV pulse : SPIDER

Principle of IR SPIDER