CIC3D + QIF Symposium – Oct. 3-5, 2017 - Action Engineering · –Manual gage device CIC3D + QIF Symposium – Oct. 3-5, 2017 Upper ... • Sine Bar • Microscope ... data as they

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Capturing Measurement Resources in the QIF Format

Edward Morse, Prashanth JaganmohanCenter for Precision Metrology

Department of Mechanical Engineering

UNC Charlotte, USA

CIC3D + QIF Symposium – Oct. 3-5, 2017

Topical outline

• The "Quality Process"

• The Quality Information Framework (QIF)

• QIF Resources Development

• Populating a QIF document with resources

• Conclusions & Looking Forward

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The Quality Process

• Geometry Assurance ↔ Data Assurance

• Completeness

• Correctness

• Trust & Traceability

• Interoperability


Quality workflow

Product Definition

Measurement Planning

Measurement Execution

Results, Analysis,& Reports

MBD

PLANS

RESULTS

RESOURCES

RULES

STATISTICS

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How do we model these data?

• What is QIF?

• Feature‐Based Ontology of Manufacturing Quality Metadata

• XML Technology: Simple Implementation and Built‐In Code Validation

• Data semantically linked to Model for pure MBE implementation


QIF Application Areas

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2

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QIF Statistics

QIF Resources

QIF Rules

DMIS

QIF Results

CAD and PMI data

QIF MBD

Bill of Characteristics (“what”) and Measurement Plan (“how”) data

Measurement Resource information

Measurement templates, macros, and best practices

ISO/DMIS 5.3 is fully linked to QIF

Measurement result data

Statistical process control using QIF

QIF Plans

QIF Library

ISO 22093Industrial automation systems and integration ̶ Physical device control ̶ Dimensional Measuring Interface Standard (DMIS)

ISO 22093Industrial automation systems and integration ̶ Physical device control ̶ Dimensional Measuring Interface Standard (DMIS)

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1

2

34

5

6

7

QIF Statistics

QIF Resources

QIF Rules

DMIS

QIF Results

CAD and PMI data

QIF MBD

Bill of Characteristics (“what”) and Measurement Plan (“how”) data

Measurement Resource information

Measurement templates, macros, and best practices

ISO/DMIS 5.3 is fully linked to QIF

Measurement result data

Statistical process control using QIF

QIF Plans

QIF Library

QIF Application Areas


QIF Resources

• The role of the QIF Resources schema is to provide a model that supports all of the information about measuring equipment that would be needed by a measurement planner.

• Examples related to a CMM include: measuring volume, accuracy statement (possible including details of the testing method), probing access directions (where appropriate), and calibration status.

• This information is necessary both for measuring equipment selection, and in detailed measurement planning once the equipment has been identified.

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Evolution of QIF Resources

Version 2.0

• Cartesian CMM

• Caliper

• Gage (comparator type)

Version 2.1

• Hierarchy of instruments

• CMMs (many types)– Also, explicit CMM component

descriptions

• Sensors– CMM sensors & others

• Hand Gages– Manual gage device


Upper hierarchy

Measurement Device Type

Universal Device Type

CMM Type

Cartesian CMM Type

Light Pen CMM Type

Parallel Link CMM

Type

Articulated Arm CMM

Type

Theodolite Type

Universal Length Measuring

Machine Type

Computed Tomography

Type

… additional Types

Universal Device Type hierarchy in

QIF Measurement Resources

Hierarchy

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Overview of Inheritancefor Measurement Resources


• Light-Pen CMM

• Multiple Carriage CMM

• Parallel Link CMM

• Comparator

• Equator

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• Micrometer

• Sine Bar

• Microscope

• Profile Projector

• Theodolite

• Universal Length Measuring

Machine


• Tool with Capacitive Sensor

• Tool with Confocal Chromatic Sensor

• Tool with DVRT Sensor

• Tool with Draw Wire Sensor

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• Tool with Magneto Inductive Sensor

• Tool with Structured Light Sensor

• Tool with Tactile Probe Sensor

• Tool with Ultrasonic Sensor


Current state

• We have an extensive structure that supports recording and organizing metrology resources.

• Question: How do we populate this structure?

• Proposed solutions:1. provide assistance to someone who will enter the

data as they move through the metrology lab (or shop floor)

2. automate the extraction of resource data from an existing database

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Objectives for the first solution

• Develop an app that enables cataloging of the measurement resources of an enterprise in the QIF format

• Use the results from this process to update the QIF standards: specifically, filling in gaps and reducing ambiguity for the measurement resources schema definition.


Proposed features of the app

• Catalog

– Ability to add, edit, and update information on any available device within the defined hierarchy

– Ability to add multiple similar devices at once, when they share similar attributes with the exception of unique identifiers (such as serial number)

– Provide database query capabilities, including simple search functions, report generation, etc.

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Proposed features of the app

• Version

– Ability to log in with employee credentials to authenticate changes

– Display of most recent version along with log of changes made throughout the resources section

– Cloud storage and syncing to ensure that the most recent version is available to all devices that use the app within the enterprise.


Additional possible features

• MBD support:

– Ability to open model files and visualize the product definition along with Product Manufacturing Information (PMI) within the app environment

– Ability to generate Model Based Data in QIF format for export or use in other sections of the app.

• e.g. enter permanent fixture data that accompanies another measurement resource.

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The application in use …


Output in an xml file

(QIF Document)

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Conclusions / Future Directions• Systematic modeling of quality data allows greater

automation, optimization, and traceability throughout the quality enterprise.

• There are remaining opportunities for better understanding of how metrology resources can be characterized and what rules are needed for both the selection and application of metrology equipment.

• I encourage the use of these data models by my colleagues to share our models, resources, rules, and results with industry and with each other.


Thank you

• Acknowledgements

– UNC Charlotte's Center for Precision Metrology

– NIST (Agreement #70NANB14H254)

– CIC3D's organizers, sponsors, and attendees

Documents

CIC3D + QIF Symposium – Oct. 3-5, 2017 - Action Engineering · –Manual gage device CIC3D + QIF Symposium – Oct. 3-5, 2017 Upper ... • Sine Bar • Microscope ... data as they