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CEN 281 CEN 281 Electronic Circuits and Devices 201 201 1 1 -201 -201 2 2 Spring Term Spring Term INTERNATIONAL BURCH UNIVERSITY DEPARTMENT of ELECTRICAL & ELECTRONICS ENGINEERING Gunter Senyurt Gunter Senyurt gsenyurt@ gsenyurt@ ibu.edu.ba ibu.edu.ba

CEN 281 Electronic Circuits and Devices 2011-2012 Spring Term CEN 281 Electronic Circuits and Devices 2011-2012 Spring Term INTERNATIONAL BURCH UNIVERSITY

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Page 1: CEN 281 Electronic Circuits and Devices 2011-2012 Spring Term CEN 281 Electronic Circuits and Devices 2011-2012 Spring Term INTERNATIONAL BURCH UNIVERSITY

CEN 281CEN 281Electronic Circuits and

Devices20120111-201-20122 Spring Term Spring Term

CEN 281CEN 281Electronic Circuits and

Devices20120111-201-20122 Spring Term Spring Term

INTERNATIONAL BURCH

UNIVERSITY

DEPARTMENT ofELECTRICAL & ELECTRONICS ENGINEERING

Gunter SenyurtGunter Senyurtgsenyurt@[email protected]

Page 2: CEN 281 Electronic Circuits and Devices 2011-2012 Spring Term CEN 281 Electronic Circuits and Devices 2011-2012 Spring Term INTERNATIONAL BURCH UNIVERSITY

Timetable and office hours

Class Schedule: Class Schedule: Tuesday Tuesday 1177:00-1:00-199::4545 Office Hour: Office Hour: Open Open DDoor Policyoor Policy

Page 3: CEN 281 Electronic Circuits and Devices 2011-2012 Spring Term CEN 281 Electronic Circuits and Devices 2011-2012 Spring Term INTERNATIONAL BURCH UNIVERSITY

Course Objectives

The student will become proficient in the use of The student will become proficient in the use of algebra, calculus, and linear algebra to describe algebra, calculus, and linear algebra to describe and analyze DC and AC electric circuit problems.and analyze DC and AC electric circuit problems.

The student will become proficient in the use of The student will become proficient in the use of Kirchhoff’s laws of Voltage and Current to Kirchhoff’s laws of Voltage and Current to analyze electrical circuits, utilizing the techniques analyze electrical circuits, utilizing the techniques of mesh and nodal analysis.of mesh and nodal analysis.

Review of solid-state device characteristics and Review of solid-state device characteristics and circuit analysiscircuit analysis..

Page 4: CEN 281 Electronic Circuits and Devices 2011-2012 Spring Term CEN 281 Electronic Circuits and Devices 2011-2012 Spring Term INTERNATIONAL BURCH UNIVERSITY

Textbooks

*James W. Nilsson, Susan A. Riedel. Electric Circuits, 7th Edition, Pearson

*Robert L.Boylestad, Louis Nashelsky, Electronic Devices and Circuit Theory, 10th Edition, Pearson

Page 5: CEN 281 Electronic Circuits and Devices 2011-2012 Spring Term CEN 281 Electronic Circuits and Devices 2011-2012 Spring Term INTERNATIONAL BURCH UNIVERSITY

Brief ContentsBrief Contents

Ch. 1: Circuit Variables. Ch. 2: Circuit Elements.Ch. 1: Circuit Variables. Ch. 2: Circuit Elements. Ch. 3: Simple Resistive Circuits.Ch. 3: Simple Resistive Circuits. Ch. 4: Techniques of Circuit Analysis.Ch. 4: Techniques of Circuit Analysis. Ch. 4: Techniques of Circuit Analysis.Ch. 4: Techniques of Circuit Analysis. Ch. 5: The Operational Amplifier.Ch. 5: The Operational Amplifier. Ch. 5: The Operational Amplifier.Ch. 5: The Operational Amplifier. Ch.1 : Semiconductor Diodes Ch.1 : Semiconductor Diodes Ch. 2 : Diode ApplicationsCh. 2 : Diode Applications Ch. 3 : Bipolar Junction TransistorsCh. 3 : Bipolar Junction Transistors Ch. 3 : Bipolar Junction TransistorsCh. 3 : Bipolar Junction Transistors Ch. 4 : DC Biasing-BJTsCh. 4 : DC Biasing-BJTs Ch. 4 : DC Biasing-BJTsCh. 4 : DC Biasing-BJTs JFET, MOSFET, FET amplifiersJFET, MOSFET, FET amplifiers Overviews Overviews

Page 6: CEN 281 Electronic Circuits and Devices 2011-2012 Spring Term CEN 281 Electronic Circuits and Devices 2011-2012 Spring Term INTERNATIONAL BURCH UNIVERSITY

Grading

Lab. Sessions 25%Quiz 10%Midterm Exam 25%Final Examination 40%