CE Marking EMI/EMC Test Report For the - EverPro Tech · 2018-01-04 · Certificates and reports shall not be reproduced except in full. CE Marking EMI/EMC Test Report For the EverPro

Certificates and reports shall not be reproduced except in full.

CE Marking EMI/EMC Test Report

For the EverPro Technologies Company Ltd.

USB3.0 AOC Cable Model: EPU3C-NNMMXYYYM

WLL Report#14WB0528020E Rev. 0

June.17, 2014

Prepared for:

EverPro Technologies Company Ltd. 4# Guanshan Er Road, Wuhan 430073 P, R, China

Prepared by: WASHINGTON TECHNOLOGY INTERNATIONAL LIMITED

This report applies only to the sample evaluated prior to the preparation date stated above.

This report must be copied in its entirety, including all technical documents

EverPro Technologies Company Ltd. USB3.0 AOC Cable

EMI/EMC Test Report

June.17, 2014

WLL Report #14WB0528020E Rev. 0 - ii - © 2014 Washington Laboratories, Ltd.

CE Marking EMI/EMC Test Report

For the


Model: EPU3C-NNMMXYYYM

WLL Report#14WB0528020E Rev. 0

June.17, 2014

Prepared by:

________________________

Henry guo

Reviewed by:

_______________________

Steven yang


EMI/EMC Test Report

June.17, 2014

WLL Report #14WB0528020E Rev. 0 - iii - © 2014 Washington Laboratories, Ltd.

Abstract This report has been prepared on behalf of EverPro Technologies Company Ltd. to document the findings of the emissions and immunity testing performed on the EverPro Technologies Company Ltd. USB3.0 AOC Cable. The purpose of this testing is to determine compliance with emissions and immunity requirements set forth by the European Community under the requirements of the EMC Directive (2004/108/EC).

This test report supports the EverPro Technologies Company Ltd. Declaration of Conformity for compliance with applicable specifications under the EMC Directive. The requirements of the EMC Directive specify compliance with emissions and immunity standards.

This report is based on testing methods and levels called out in:

• EN 55022:2010+AC:2011: Limits and methods of measurement of radio Emission characteristics of information technology equipment

• EN 550024:2010: Information technology equipment-Immunity characteristics limits and methods of measurement

• EN 61000-3-2:2006+A1:2009+A2:2009: Electromagnetic compatibility(EMC)-Part 3 :

Limits- Section 2 : Limits for harmonic current emissions • EN 61000-3-3:2013: Electromagnetic compatibility(EMC)-Part 3 :Limits Section 3 : Limits of

voltage fluctuations and flicker in low-voltage supply systems for equipment with rated

• IEC 61000-4-2:2008, Electromagnetic compatibility (EMC) – Part 4-2: Testing and measurement techniques – Electrostatic discharge immunity test

• IEC 61000-4-3:2010, Electromagnetic compatibility (EMC) – Part 4-3: Testing and measurement techniques – Radiated, radio-frequency, electromagnetic field immunity test

• IEC 61000-4-4:2012, Electromagnetic compatibility (EMC) – Part 4-4: Testing and measurement

• IEC 61000-4-5:2005, Electromagnetic compatibility (EMC) – Part 4-5: Testing and measurement techniques – Surge immunity test

• IEC 61000-4-6:2013, Electromagnetic compatibility (EMC) – Part 4-6: Testing and measurement techniques – Immunity to conducted disturbances, induced by radio-frequency fields

• IEC 61000-4-8:2009, Electromagnetic compatibility (EMC) – Part 4-8: Testing and measurement techniques –Power frequency magnetic field

• IEC 61000-4-11:2004, Electromagnetic compatibility (EMC) – Part 4-11: Testing and measurement techniques – Voltage dips, short interruptions and voltage variations immunity tests

The affixation of the "CE" marking is contingent on the product's compliance with all applicable "New Approach Directives”. The conduct of this test supports the emissions and immunity requirements specified under the EMC Directive. Other directives or standards may apply (Low Voltage Directive, for example) for which a separate certification effort may be required. Other national standards may apply on a country-by-country basis for which a separate approval may be required.

Testing was performed at METROLOGY AND TEST CENTER OF RADIO AND TV, ACADEMY OF BROADCASTING PLANNING. The CNAS Registration No.: L2111.

The EverPro Technologies Company Ltd. USB3.0 AOC Cable complied with the EMC requirements of and EN 55022, EN 55024.


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WLL Report #14WB0528020E Rev. 0 - iv - © 2014 Washington Laboratories, Ltd.

Table of Contents Abstract .................................................................................................................................................................. ii 1 Introduction ............................................................................................................................................... 1

1.1 Compliance Statement ............................................................................................................................. 1 1.2 Test Scope Summary ............................................................................................................................... 2 1.3 Contract Information ............................................................................................................................... 2 1.4 Test and Support Personnel ..................................................................................................................... 2

2 Equipment Under Test .............................................................................................................................. 3 2.1 EUT Identification................................................................................................................................... 3 2.2 Test Configuration................................................................................................................................... 3 2.3 EUT Description ..................................................................................................................................... 3 2.4 Equipment Configuration ........................................................................................................................ 6 2.5 Interface Cables ....................................................................................................................................... 6 2.6 Support Equipment ................................................................................................................................. 6 2.7 EUT Modifications ................................................................................................................................. 6 2.8 Testing Algorithm ................................................................................................................................... 6 2.9 Test Location ........................................................................................................................................... 7

3 Test Deviations and Sequence .................................................................................................................. 9 3.1 Deviations to the Standard ....................................................................................................................... 9

4 Performance Criteria .............................................................................................................................. 10 5 Test Result ................................................................................................................................................ 11

5.1 Conducted Emissions ............................................................................................................................ 11 5.2 Radiated Emissions ............................................................................................................................... 16 5.3 HARMONIC CURRENT TEST ........................................................................................................... 23 5.4 VOLTAGE FLUCTUATIONS & FLICKER ........................................................................................ 23 5.5 Electrostatic Discharge .......................................................................................................................... 26 5.6 Radiated RF Susceptibility .................................................................................................................... 29 5.7 Electrical Fast Transient/Burst ............................................................................................................... 32 5.8 Voltage Surge ........................................................................................................................................ 34 5.9 Conducted RF Susceptibility ................................................................................................................. 36 5.10 Magnetic field immunity test ................................................................................................................. 38 5.11 VOLTAGE DIPS AND INTERRUPTIONS TEST ............................................................................... 40

6 Attachment (EUT Photograph) .............................................................................................................. 42 7 Appendix .................................................................................................................................................. 44


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WLL Report #14WB0528020E Rev. 0 - v - © 2014 Washington Laboratories, Ltd.

List of Tables Table 1: Overview of USB3.0 AOC Cable, Equipment Under Test ......................................................................... 3 Table 2: Equipment Configuration ........................................................................................................................... 6 Table 3: Interface Cables .......................................................................................................................................... 6 Table 4: Conducted Emission Test Data ............................................................................................................ 13 Table 5: Radiated Emission Test Data ............................................................................................................... 19 Table 6: Flicker Test Data ................................................................................................................................... 24 Table 7: ESD Test Results ................................................................................................................................... 28 Table 8: Radiated RF Susceptibility Test Results ................................................................................................... 30 Table 9: Electrical Fast Transient/Burst Test Results .............................................................................................. 33 Table 10: Voltage Surge Test Results ..................................................................................................................... 35 Table 11: Conducted RF Susceptibility Test Results .............................................................................................. 37 Table 12: Magnetic field immunity Test Results .................................................................................................... 39 Table 13: Voltage Dips/Interrupts Test Results ...................................................................................................... 41 Table 14: Expanded Uncertainty List ..................................................................................................................... 50

List of Figures Figure 1: Test Configuration ..................................................................................................................................... 3

List of Photographs Photograph 1: Conducted Emission Test Configuration, Front ...................................................................... 14 Photograph 2: Conducted Emission Test Configuration ......................................................................................... 15 Photograph 3: Radiated Emission Test Configuration, Front below 1G ................................................................. 21 Photograph 4: Radiated Emission Test Configuration, Back below 1G .................................................................. 21 Photograph 5: Radiated Emission Test Configuration, Front above 1G ................................................................. 22 Photograph 6: Radiated Emission Test Configuration, Back above 1G .................................................................. 22 Photograph 7: Voltage Fluctuation and Flick Test Configuration .................................................................. 25 Photograph 8: ESD Test Configuration, V Plate .................................................................................................... 28 Photograph 9: Radiated RF Susceptibility Test Configuration, Front ..................................................................... 31 Photograph 10: Radiated RF Susceptibility Test Configuration, Back ................................................................... 31 Photograph 11: Electrical Fast Transient/Burst Test Configuration Mains ............................................................. 33 Photograph 12: Voltage Surge Immunity Test Configuration Mains ...................................................................... 35 Photograph 13: Conducted RF Susceptibility Test Configuration Mains / Port ...................................................... 37 Photograph 14: Magnetic field immunity Test Configuration Mains /Port ............................................................. 39 Photograph 15: Voltage Dips/Interrupts Test Configuration ........................................................................... 41


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Report #14WB0528020E Rev. 0 - Page 1 of 50 © 2014 Washington Laboratories, Ltd.

1 Introduction Washington Technology International Limited was contracted by EverPro Technologies Company Ltd. to perform testing on the USB3.0 AOC Cable.

This document describes the test setups, test methods, required test equipment, and the test limit

criteria used to perform compliance testing of the EverPro Technologies Company Ltd.

1.1 Compliance Statement

After the modification listed in Section 2.7 were installed:

The EverPro Technologies Company Ltd. USB3.0 AOC Cable complied with the EMC emission requirements of EN 55022, EN 55024 Tests for radiated and conducted emissions were performed. Tests were performed according to: • EN 55022:2010+AC:2011, Information technology equipment - Radio disturbance

characteristics - Limits and methods of measurement • EN 550024:2010: Information technology equipment-Immunity characteristics limits and

methods of measurement • EN 61000-3-2:2006+A1:2009+A2:2009, Electromagnetic compatibility (EMC) – Part 5-3:

Testing and measurement techniques – Harmonic immunity test • EN 61000-3-3:2013, Electromagnetic compatibility (EMC) – Part 5-4: Testing and measurement

techniques – Flicker immunity test • IEC 61000-4-2:2008, Electromagnetic compatibility (EMC) – Part 5-5: Testing and

measurement techniques – Electrostatic discharge immunity test • IEC 61000-4-3:2010, Electromagnetic compatibility (EMC) – Part 5-6: Testing and

measurement techniques – Radiated, radio-frequency, electromagnetic field immunity test • IEC 61000-4-4:2012, Electromagnetic compatibility (EMC) – Part 5-7: Testing and

measurement • IEC 61000-4-5:2005, Electromagnetic compatibility (EMC) – Part 5-8: Testing and

measurement techniques – Surge immunity test • IEC 61000-4-6:2013, Electromagnetic compatibility (EMC) – Part 5-9: Testing and

measurement techniques – Immunity to conducted disturbances, induced by radio-frequency fields

• IEC 61000-4-8:2009, Electromagnetic compatibility (EMC) – Part 5-10: Testing and measurement techniques –Power frequency magnetic field

• IEC 61000-4-11:2004, Electromagnetic compatibility (EMC) – Part 5-11: Testing and measurement techniques – Voltage dips, short interruptions and voltage variations immunity tests

The affixation of the "CE" marking is contingent on the product's compliance with all applicable "New Approach Directives”. The conduct of this test supports the emissions and immunity requirements specified under the EMC Directive. Other directives or standards may apply (Low Voltage Directive, for example) for which a separate certification effort may be required. Other national standards may apply on a country-by-country basis for which a separate approval may be required.


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1.2 Test Scope Summary

Test Specific Description Date Completed Result Modifications

Installed (Y/N)

EN 55022:2010+ AC:2011

CISPR 22:2008

Conducted Emissions at the

Mains Port June.04, 2014 Complied N

EN 55022:2010+ AC:2011

CISPR 22:2008

Conducted Emission at

telecommunication port

N/A N/A N

EN 55022:2010+ AC:2011

CISPR 22:2008 Radiated Emissions June.04-10, 2014 Complied N

EN 61000-3-2:2006+A1:2009+A2:

2009 Harmonic Current

Emissions N/A N/A N

EN 61000-3-3:2013 Voltage Fluctuation & Flicker June.10, 2014 Complied N

EN 55024 IEC 61000-4-2

Electrostatic Discharge June.10, 2014 Complied

N

EN 55024 IEC 61000-4-3

Radiated RF Susceptibility June.10, 2014 Complied

N EN 55024

IEC 61000-4-4 Electrical Fast Transient/Burst June.11, 2014 Complied

N EN 55024

IEC 61000-4-5 Voltage Surge June.11, 2014 Complied N

EN 55024 IEC 61000-4-6

Radio-frequency, Continuous conducted Emission

June.12, 2014 Complied N

EN 55024 IEC 61000-4-8

Power frequency magnetic field June.16, 2014 Complied

N

EN 55024 IEC 61000-4-11

Voltage Dips, Interruptions and

Variations June.12, 2014 Complied

N

1.3 Contract Information

Customer: EverPro Technologies Company Ltd. 4# Guanshan Er Road, Wuhan 430073 P, R, China

1.4 Test and Support Personnel

David Wang Metrology and Test Center of Radio and TV, Academy of Broadcasting Planning

Test Engineer


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2 Equipment Under Test

2.1 EUT Identification

The results obtained relate only to the item(s) tested.

Table 1: Overview of USB3.0 AOC Cable, Equipment Under Test

Model(s) EPU3C-A0A0B100M

EUT Specifications: DC 5V From USB port

Equipment Emissions Class: B

Test Date(s): June.09~June, 2014

2.2 Test Configuration

The EverPro Technologies Company Ltd. USB3.0 AOC Cable, Equipment Under Test (EUT), was operated from USB port.

The USB3.0 AOC Cable was configured as below:

5V DC input from USB port 5V DC input from

230V AC adaptor

Figure 1: Test Configuration

2.3 EUT Description

Product Name: USB3.0 AOC Cable

Model No. : EPU3C-A0A0B100M

EUT Rated Voltage: DC 5V From USB port

Super TT Dongle Adaptor Info:

Input 100-240V AC, 50/60Hz, 0.6A

Output 5V, 2A

Notebook USB3.0 AOC Cable SuperTT Dongle USB Flash Drive


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2.4 Equipment Configuration

The EUT were set up as outlined in Figure 1. The EUT was comprised of the following equipment. (All Modules, PCBs, etc. listed were considered as part of the EUT, as tested.)

Table 2: Equipment Configuration

Slot # Name / Description Model Number Part Number Serial Number Revision

1 USB3.0 AOC Cable EPU3C-

A0A0B100M / / /

2.5 Interface Cables

Table 3: Interface Cables

Slot # Port Identification

Connector Type

Cable Length

Shielded (Y/N) Termination Point

1. Fiber Cable Unshielded; Undetachable 100m N EUT

2.6 Support Equipment

Description Manufacturer Model Serial Number Approved type

1 Notebook Lenovo B490 WB13103812 DOC

2 SuperTT Dongle EverPro EPU3D02ARSM / NBO

3 Power Adapter Shenzhen Nalin Elec.

Tech. CO., LTD. NLD200050T1A / DOC

4 USB disk Kingston DataTraveler 100 G3 / DOC

2.7 EUT Modifications

N/A

2.8 Testing Algorithm

The USB3.0 AOC Cable was continuously transmission data between notebook and SuperTT Dongle with USB disk bidirectional by software control.

Immunity judgment: during immunity testing, the software will record the data transferred between notebook and SuperTT Dongle with USB disk. If software log no error recorded, then it judged as A. If software log has error recorded but recovered without operator involved, then it


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judged as B. If software log has error recorded but recovered requires operator involved, then it judged as C.

2.9 Test Location NAME: Metrology and Test Center of Radio and TV, Academy of Broadcasting Planning is accredited by CNAS. The CNAS Registration No.: L2111.

Address: WEST 3rd. ring, CHINA Center Tower.


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3 Test Deviations and Sequence

3.1 Deviations to the Standard

There were no deviations to the requirements established in the specification.


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4 Performance Criteria Performance

Criterion Description

A

The unit shall continue to operate as intended. No degradation of performance or loss of function is allowed below the performance level specified by the manufacturer. The performance level may be replaced by a permissible loss of performance. If the minimum performance level or the permissible performance loss is not specified by the manufacturer then either of these may be derived from the product description and documentation and what the user may reasonably expect from the equipment if used as intended.

B

After the test, the equipment shall continue to operate as intended without user intervention. No degradation of performance or loss of function is allowed, after the application of the phenomena below the performance level specified by the manufacturer. The performance level may be replaced by a permissible loss of performance. During the test, degradation of performance is allowed. However, no change of operating state or stored data is allowed to persist after the test. If the minimum performance level or the permissible performance loss is not specified by the manufacturer then either of these may be derived from the product description and documentation and what the user may reasonably expect from the apparatus if used as intended.

C

Loss of function is allowed, provided the function is self-recoverable or can be restored by the operation of the controls by the user in accordance with the manufacturer’s instructions. Functions, and/or information stored in non-volatile memory, or protected by a battery backup, shall not be lost.


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5 Test Result

5.1 Conducted Emissions

5.1.1 Requirements

Test Arrangement: Table Top

Compliance Standard: EN 55022:2010+AC:2011 Clause 5

Reference Standard: CISPR 22 Clause 5

Compliance Requirement: Class B

Frequency Range Tested: 150 kHz to 30MHz

Class B Compliance Limits

Frequency Quasi-Peak Level dB(µV)

Average Level dB(µV)

150kHz~500kHz 500kHz~5MHz 5MHz ~30MHz

66 ~ 56* 56 60

56 ~ 46* 46 60

*Decreases with the logarithm of the frequency.

5.1.2 Test Equipment

Test Name: Conducted Emissions

Asset # Manufacturer/Model Description Cal Due Date

AMN R&S/ENV 216 100032 09.12.2014

EMI Receiver R&S/ ESCI 200224 09.12.2014

10dB Pulse Limiter R&S/ESH3-Z2 100608 09.12.2014

5.1.3 Test Setup

5.1.4 Test Procedure Summary

The EUT was placed on a non-metallic table, 80cm above the ground plane. The EUT Power connected to the power mains through a line impedance stabilization network (L.I.S.N. 1#). This provided a 50-ohm coupling impedance for the EUT (Please refer to the block diagram of the test setup and photographs). Both sides of power line were checked for maximum conducted interference. In order to find the maximum emission, the relative positions of equipments and all

EUT Peripheral

LISN LISN

PC System

80cm

80cm

Receiver

:50Ω Terminator


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of the interface cables were changed according to CISPR 22 on conducted Emission test. The bandwidth of test receiver (R & S ESHS10) is set at 9kHz. The frequency range from 150kHz to 30MHz is checked.

5.1.5 Conducted Data Reduction and Reporting

To convert the EMI Receiver radiated data into a form that can be compared with the limits, it is necessary to account for various calibration factors that are supplied with the antennas and other measurement accessories. These factors are included the antenna factor (AF) and the cable factor (CF). The AF (in dB/m) and the CF (in dB) is algebraically added to the EMI Receiver Voltage in dBµV to obtain the Radiated Electric Field in dBµV/m.

The following data lists the significant emission frequencies, measured levels, correction factors (including cable and antenna correction factors), and the corrected readings against the limits. Explanation of the data is given as follows: Example: EMI Receiver Voltage: VdBµV

Antenna Correction Factor: AFdB/m Cable Correction Factor: CFdB Amplifier Gain: AGdB Standard Limits: LdBµV/m Electric Field: EdBµV/m = V dBµV + AFdB/m + CFdB- AGdB Margin: dB = LdBµV/m - EdBµV/m

5.1.6 Results Summary

The EUT complied with the emission requirements throughout the test.

5.1.7 Areas of Concern

None.

5.1.8 Test Data

Table 4 provides the test results for Conducted emissions.

Photograph 1 and 2 show the Conducted emission test configuration.


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Table 4: Conducted Emission Test Data

Frequency

(MHz) QuasiPeak (dBμV/m)

Meas. Time (ms)

Bandwidth (kHz)

PE Line Corr. (dB)

Margin (dB)

Limit (dBμV/m)

Comment

0.150000 37.4 1000.000

9.000 GND

L1 9.9 28.6 66.0

0.329215 33.7 1000.000

9.000 GND

L1 10.0 25.8 59.5

0.335832 33.7 1000.000

9.000 GND

L1 10.0 25.6 59.3

0.430682 33.6 1000.000

9.000 GND

N 10.0 23.6 57.2

0.457178 36.1 1000.000

9.000 GND

L1 10.0 20.6 56.7

0.569056 30.4 1000.000

9.000 GND

N 10.0 25.6 56.0

Frequency

(MHz) CAverage (dBμV/m)

Meas. Time (ms)

Bandwidth (kHz)

PE Line Corr. (dB)

Margin (dB)

Limit (dBμV/m)

Comment

0.430682 27.8 1000.000

9.000 GND

N 10.0 19.4 47.2

0.452651 29.9 1000.000

9.000 GND

L1 10.0 16.9 46.8

0.495058 23.4 1000.000

9.000 GND

N 10.0 22.7 46.1

0.520311 26.2 1000.000

9.000 GND

N 10.0 19.8 46.0

0.641227 25.8 1000.000

9.000 GND

L1 10.0 20.2 46.0

4.000779 24.2 1000.000

9.000 GND

L1 10.1 21.8 46.0


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Photograph 1: Conducted Emission Test Configuration, Front


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Photograph 2: Conducted Emission Test Configuration


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5.2 Radiated Emissions

5.2.1 Requirements


Compliance Standard: EN 55022:2010+AC:2011 Clause 5

Reference Standard: CISPR 22 Clause 6

Compliance Requirement: Class B

Frequency Range Tested: 30MHz to 1000MHz And 1G-6GHz

All emanations from a Class B computing devices or system, including any network of conductors and apparatus connected thereto, shall not exceed the level of field strengths specified below:

Class B Compliance Limits (3m)

Frequency Quasi-peak Limits

30-230MHz 230-1000MHz

40dBµV/m 47dBµV/m

Class B Compliance Limits (3m)

Frequency Average Limits Peak Limits

1-3GHz 3-6GHz

50dBµV/m 54dBµV/m

70dBµV/m 74dBµV/m

Note: (1) Emission level = Antenna Factor + Cable Loss + Reading

Emission level = Antenna Factor -Amp Factor +Cable Loss + Reading (above 1000MHz)

(2) The lower limit shall apply at the transition frequencies. (3) Distance refers to the distance in meters between the test instrument antenna and the closed point of any part of the E.U.T.


For frequency range 30MHz~6000MHz (At Anechoic Chamber)

No. Name Manufactor Type Serial Num Next

Calibration Date

1 EMI receiver R&S ESU8 100250 09.12.2014

2 Antenna R&S HF906 100380 09.12.2014

3 Antenna R&S HL562 100294 09.12.2014


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5.2.3 Test Setup

Setup below 1GHz

Setup above 1GHz


The system was configured at the 3 meter semi-chamber on an 80 cm high 1 X 1.5 m non-conductive table above a ground plane a turntable. During test the system under test was rotated 360° while the antenna was varied in height from 1 to 4 meters. The system under test was examined for emissions with both horizontal and vertical antenna polarizations.

5.2.5 Measurement Method

All emission measurements herein were performed according to CISPR 22. Calibration checks are made periodically to verify proper performance of the measuring instrumentation.

5.2.6 Radiated Data Reduction and Reporting

To convert the EMI Receiver radiated data into a form that can be compared with the limits, it is necessary to account for various calibration factors that are supplied with the antennas and other measurement accessories. These factors are included the antenna factor (AF) and the cable factor (CF). The AF (in dB/m) and the CF (in dB) is algebraically added to the EMI Receiver Voltage in dBµV to obtain the Radiated Electric Field in dBµV/m.

The following data lists the significant emission frequencies, measured levels, correction factors


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(including cable and antenna correction factors), and the corrected readings against the limits. Explanation of the data is given as follows: Example: EMI Receiver Voltage: VdBµV

Antenna Correction Factor: AFdB/m Cable Correction Factor: CFdB Amplifier Gain: AGdB Standard Limits: LdBµV/m Electric Field: EdBµV/m = V dBµV + AFdB/m + CFdB- AGdB Margin: dB = LdBµV/m - EdBµV/m


The EUT complied with the emission requirements throughout the test.


None.

5.2.9 Test Data

Table 5 provides the test results for radiated emissions. Photograph 3,4,5,6 shows the radiated emission test configuration.


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Table 5: Radiated Emission Test Data

30M - 1GHz

10

15

20

25

30

35

40

45

50

30M 50 60 80 100M 200 300 400 500 800 1G

Leve

l in

dBμV

/

Frequency in Hz

EMI 30-1000MHz Transmitter Auto Test ESU8

EN 55022 Electric Field Strength 3m ClassB QP

Frequency

(MHz) QuasiPeak (dBμV/m)

Meas. Time (ms)

Bandwidth (kHz)

Height (cm)

Polarization Azimuth (deg)

Corr. (dB)

Margin - QPK (dB)

Limit - QPK (dBμ

31.980000 26.0 1000.0 120.000 157.0 V 340.0 18.9 14.0 40.0 187.500000 35.7 1000.0 120.000 172.0 H 0.0 9.1 4.3 40.0 562.500000 40.1 1000.0 120.000 110.0 H 157.0 20.1 6.9 47.0 750.000000 39.4 1000.0 120.000 126.0 H 0.0 23.4 7.6 47.0 812.520000 38.8 1000.0 120.000 110.0 H 356.0 24.3 8.2 47.0 937.500000 41.3 1000.0 120.000 100.0 H 25.0 25.9 5.7 47.0


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1 – 6GHz

20

25

30

35

40

45

50

55

60

65

70

75

80

1G 2G 3G 4G 5G 6G

Leve

l in

dBμV

/

Frequency in Hz

20110215 EN 55022 EMI Auto Test 1-6GHz by ESU8+Preamplifier+HF906-2

EN 55022 Electric Field Strength 3m ClassB Peak 1-6GHz

EN 55022 Electric Field Strength 3m ClassB AV 1-6GHz

Frequency

(MHz) MaxPeak

(dBμV/m)

Meas. Time (ms)

Bandwidth (kHz)

Height (cm)


Corr. (dB)

Margin - PK+ (dB)

Limit - PK+

(dBμ 1566.000000 50.8 30.0 1000.000 100.0 H 9.0 -3.6 19.2 70.0

2389.500000 49.6 30.0 1000.000 235.0 H 103.0 -0.7 20.4 70.0 2393.500000 56.4 30.0 1000.000 165.0 V 257.0 -0.7 13.6 70.0 2400.000000 55.0 30.0 1000.000 204.0 V 177.0 -0.7 15.0 70.0 5000.000000 53.9 30.0 1000.000 299.0 V 70.0 3.5 20.1 74.0

Frequency

(MHz) Average

(dBμV/m)

Meas. Time (ms)

Bandwidth (kHz)

Height (cm)


Corr. (dB)

Margin - AVG (dB)

Limit - AVG (dBμ

1000.000000 39.5 30.0 1000.000 100.0 V 2.0 -4.9 10.5 50.0 1065.000000 32.3 30.0 1000.000 100.0 H 352.0 -4.8 17.7 50.0 1562.500000 41.5 30.0 1000.000 100.0 H 18.0 -3.6 8.5 50.0 1755.500000 38.4 30.0 1000.000 100.0 V 88.0 -2.7 11.6 50.0 2602.500000 39.3 30.0 1000.000 100.0 H 2.0 -0.2 10.7 50.0 5000.000000 46.5 30.0 1000.000 176.0 V 10.0 3.5 7.5 54.0


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Photograph 3: Radiated Emission Test Configuration, Front below 1G

Photograph 4: Radiated Emission Test Configuration, Back below 1G


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Photograph 5: Radiated Emission Test Configuration, Front above 1G

Photograph 6: Radiated Emission Test Configuration, Back above 1G


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5.3 HARMONIC CURRENT TEST

5.3.1 Requirements

According to EN 61000-3-2:2006+A2:2009 Clause 7:

For the following categories of equipment, limits are not specified in this standard: – equipment with a rated power of 75 W or less, other than lighting equipment;

Since the EUT Power level is below 75 Watts and therefore has no defined limits.

5.4 VOLTAGE FLUCTUATIONS & FLICKER

5.4.1 Requirements


Reference Standard: EN 61000-3-3:2013 Clause 5


No. Name Manufactor Type Serial Num Calibration

Date

Next Calibration

Date

1 Harmonic & Flicker Test System

EM TEST ACS 500 V0606101152 15.12.2011 15.12.2014

2 Harmonic & Flicker Test System

EM TEST DPA 500 V0606101151 15.12.2011 15.12.2014

5.4.3 Block Diagram of Test Setup

5.4.4 Test Procedure

The EUT was placed on the top of a wooden table 0.8 meters above the ground and operated to produce the most unfavorable sequence of voltage changes under normal conditions During the flick measurement, the measure time shall include that part of whole operation changes. The observation period for short-term flicker indicator is 10 minutes and the observation period for long-term flicker indicator is 2 hours.


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5.4.5 Limits of Voltage Fluctuation and Flick

Test Item Limit Note Pst 1.0 Pst means Short-term flicker indicator Plt 0.65 Plt means long-term flicker indicator Tdt 500ms Tdt means maximum time that dt exceeds 3.3%

dmax(%) 4% dmax means maximum relative voltage change. dc(%) 3.3% dc means relative steady-state voltage change.


None.

5.4.7 Test Results

Table 6 provides the test results for Voltage Fluctuation and Flick. Photograph 7 shows the Voltage Fluctuation and Flick test configuration.

Table 6: Flicker Test Data

EUT values Limit Result

Pst 0.028 1.00 PASS

Plt 0.028 0.65 PASS

dc [%] 0.004 3.30 PASS

dmax [%] 0.173 4.00 PASS

dt [s] 0.000 0.50 PASS


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Photograph 7: Voltage Fluctuation and Flick Test Configuration


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5.5 Electrostatic Discharge

5.5.1 Requirements


Compliance Standard: EN 550024:2010 Clause 10

Reference Standard: IEC 61000-4-2:2008 Clause 5

Compliance Requirement:

Air = ±8kV, Severity Level 3, Performance Criterion B

Contact = ±4kV, Severity Level 2, Performance Criterion B


Test Name: Electrostatic Discharge Immunity

Asset # Manufacturer/Model Description Cal Due Date Electrostatic Discharge

Simulator EM TEST/ dito V06060101143 15.12.2014

5.5.3 Test Setup


The requirements of IEC 61000-4-2:2008 call out an Electrostatic Discharge (ESD) test level and procedure. The intent of this test is to determine the effect of electrostatic discharge events on equipment operation. ESD is the result of potential build-up and the subsequent rapid discharge and equalization of that potential. The result of the discharge is a transient waveform that produces peak voltages up to tens of kilovolts, peak currents of a few amperes, and rise times on the order of a few nanoseconds (ns). This discharge may produce malfunction and damage to sensitive electronic equipment.

Table-top EUTs are placed on a Horizontal Coupling Plane (HCP) and isolated from it by 0.5mm. The HCP was connected to a Ground Reference Plane (GRP) via a bonding strap with 470k-ohm resistors located at each end. When the Vertical Coupling Plane (VCP) was used, it was also connected to the GRP with a second bonding strap with 470k-ohm resistors located at each end.


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The VCP is located 10 cm from the EUT for test. The earth cable of the ESD generator was attached to the GRP.

Contact discharge points were metallic points on the EUT that are subject to contact by operators or maintenance personnel. Air discharge points were non-conductive surfaces, indicators, and other points subject to contact.

The voltage was stepped at 1 kV, 2 kV, 4 kV for contact discharge and 2 kV, 4 kV, 8 kV for air discharges. The ESD simulator was then set at the test voltage and applied 10 times (positive and negative) at intervals of one second at each discharge test point. Two ESD modes were applied: direct application of the discharge to the EUT, and indirect application of the discharge to the horizontal and vertical coupling planes. Direct application simulates a static discharge to the EUT itself and indirect application simulates a static discharge to objects placed or installed near the EUT.

During test the system was monitored for performance degradation. Environmental Conditions during Electrostatic Discharge Testing

Ambient Temperature: 25 °C

Relative Humidity: 35 %


The EUT complied with the required performance throughout the test. Table 7 shows the ESD test results.

Photograph 8 shows the ESD test configuration.


None.

5.5.7 Test Results


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Table 7: ESD Test Results

Type of Discharge ESD Severity Level (±kV)

Surface/Location of Discharge Results/Notes

VCP/HCP ±1 / ±2 / ±4 VCP/HCP A

Contact

±1 / ±2 / ±4 Front, Top A

±1 / ±2 / ±4 Back, Bottom A

±1 / ±2 / ±4 Left A

±1 / ±2 / ±4 Right A

Air

±2 / ±4 / ±8 Front, Top A

±2 / ±4 / ±8 Back, Bottom A

±2 / ±4 / ±8 Left A

±2 / ±4 / ±8 Right A

Photograph 8: ESD Test Configuration, V Plate


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5.6 Radiated RF Susceptibility

5.6.1 Requirements

Test Arrangement : Table Top



Compliance Limits: Severity Level 2

3V/m (80%AM, 1kHz), 80MHz-1GHz,

Performance Criterion A


Test Name: Radiated RF Susceptibility

Asset # Manufacturer/Model Description Cal Due Date Signal Generator R&S/ SML 03 102694 12.12.2014

Power Amplifier BONN/ BLWA 066220 12.12.2014

Power Meter R&S/ NRVD 101484 12.12.2014

Antenna R&S/ HL046E 100028 12.12.2014

Field Probe ETS/ HI 6005 00059665 12.12.2014

5.6.3 Test Setup


The requirements of IEC 61000-4-3:2010 call out a Radiated Immunity test level and procedure. The system was placed in an anechoic chamber calibrated for IEC 61000-4-3 testing. The system was oriented to face the radiating antenna and cables were configured to expose at least one meter of each cable bundle.


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The antenna was positioned 3 meters from the equipment under test and the signal generator/amplifier operated under computer control to generate the radiated field and sweep the interfering signal through the test frequency range. The test level is maintained by computer control along with application of the 80% AM.

During test the system was monitored for performance degradation. Environmental Conditions during Radiated RF Susceptibility Testing




The EUT complied with the required performance throughout the test. Table 8 shows the Radiated RF Susceptibility test results.

Photograph 9 and 10 show the Radiated RF Susceptibility test configuration.


None.

Table 8: Radiated RF Susceptibility Test Results

Frequency [MHz]

Test level [V]

Amplitude Modulated

Antenna Polarity

EUT Orientation

Pass/Fail Performance criterion

80MHz~1000MHz 3 80%AM (1kHz) H Front P A

80MHz~1000MHz 3 80%AM (1kHz) V Front P A

80MHz~1000MHz 3 80%AM (1kHz) H Right P A

80MHz~1000MHz 3 80%AM (1kHz) V Right P A

80MHz~1000MHz 3 80%AM (1kHz) H Rear P A

80MHz~1000MHz 3 80%AM (1kHz) V Rear P A

80MHz~1000MHz 3 80%AM (1kHz) H Left P A

80MHz~1000MHz 3 80%AM (1kHz) V Left P A


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Photograph 9: Radiated RF Susceptibility Test Configuration, Front

Photograph 10: Radiated RF Susceptibility Test Configuration, Back


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5.7 Electrical Fast Transient/Burst

5.7.1 Requirements




Compliance Limits:

Severity Level 2, AC Power, ±1kV, Performance Criterion B


Test Name: Electrical Fast Transient/Burst

Asset # Manufacturer/Model Description Cal Due Date Burst interference simulator EM TEST/ EFT500 V0606101144 15.12.2014

5.7.3 Test Setup

Mains Port


The requirements of IEC 61000-4-4:2012 call for testing the immunity of the device to "Electrical Fast Transients" or "EFTs”. The EFT requirement simulates the effect on the EUT of noise generated by other users connected to the same power mains, such as that caused by contact arcing, switch closure and relay operation. EFT simulators produce a series of bursts that contain a collection of high frequency transients at predetermined intervals.

Both positive and negative transient bursts were applied at the required transient repetition rate and burst repetition rate for a period not less than one minute for each line or bundle under test.

During test the system was monitored for performance degradation. Environmental Conditions during Electrical Fast Transient/Burst Testing




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The EUT complied with the required performance throughout the test. Table 9 shows the Electrical Fast Transient/Burst test results.

Photograph 11 shows the test configuration.


None.

Table 9: Electrical Fast Transient/Burst Test Results

Location Amplitude (kV) Cable Type Compliance

Notes

AC Line ±1 kV AC Power Cable A

No performance degradation

Photograph 11: Electrical Fast Transient/Burst Test Configuration Mains


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5.8 Voltage Surge

5.8.1 Requirements




Compliance Limits:

Severity Level 2

AC Power, ±0.5kV, ±1kV (Line to Line);

Performance Criterion B


Test Name: Voltage Surge Immunity

Asset # Manufacturer/Model Description Cal. Due Surge Generator EM TEST/ VCS500M67 V0606101145 22.12.2014

5.8.3 Test Setup

Mains Port


For line-to-line coupling mode, provide a 1kV 1.2/50us voltage surge (at open-circuit condition) and 8/20us current surge to EUT selected points. At least 5 positive and 5 negative (polarity) tests with a maximum 1/min repetition rate are applied during test. Different phase angles are done individually. Record the EUT operating situation during compliance test and decide the EUT ,immunity criterion for above each test.

During test the system was monitored for performance degradation. Environmental Conditions during Voltage Surge Testing

Ambient Temperature: 23 °C Relative Humidity: 46 %


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The EUT complied with the required performance throughout the test. Table 10 shows the Voltage Surge test results.

Photograph 12 shows the Voltage Surge test configuration.


None.

Table 10: Voltage Surge Test Results

Location

Volt 500V 1kV

Phase Performance Performance

Required + - Required + -

L-N

0° A A A A A A 90° A A A A A A 180° A A A A A A 270° A A A A A A

Photograph 12: Voltage Surge Immunity Test Configuration Mains


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5.9 Conducted RF Susceptibility

5.9.1 Requirements




Compliance Limits:

Severity Level 2

3Vrms (80%AM, 1kHz), 150kHz-80MHz, Performance Criterion A


Test Name: Conducted RF Susceptibility

Asset # Manufacturer/Model Description Cal Due Date Continuous Wave Simulator EM TEST/ CWS500 V0606101150 20.12.2014

Attenuator EM TEST/ ATT6/75 0206-25 20.12.2014

CDN EM TEST/ M2/M3 1006-03 20.12.2014

5.9.3 Test Setup

Mains Port


Let the EUT work in test mode and test it.

The EUT are placed on an insulating support 0.1m high above a ground reference plane. CDN (coupling and decoupling device) is placed on the ground plane about 0.3m from EUT. Cables between CDN and EUT are as short as possible, and their height above the ground reference plane shall be between 10 and 30 mm (where possible).

The disturbance signal described below is injected to EUT through CDN. The EUT operates within its operational mode(s) under intended climatic conditions after power on. The frequency range is swept from 0.150MHz to 80MHz using 3V signal level, and with the disturbance signal


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80% amplitude modulated with a 1kHz sine wave. The rate of sweep shall not exceed 1.5*10-3decades/s. Where the frequency is swept incrementally, the step size shall not exceed 1% of the start and thereafter 1% of the preceding frequency value.

Recording the EUT operating situation during compliance testing and decide the EUT immunity criterion.

During test the system was monitored for performance degradation. Environmental Conditions during Conducted RF Susceptibility Testing




The EUT complied with the required performance throughout the test. Table 11 shows the Conducted RF Susceptibility test results.

Photograph 13 shows the Conducted RF Susceptibility test configuration.


None.

Table 11: Conducted RF Susceptibility Test Results

Test POINT Frequency [MHz]

Test level [V]

Amplitude Modulated

Pass/Fail Performance criterion

AC power 150kHz~80MHz 3 80%AM (1kHz) P A

Photograph 13: Conducted RF Susceptibility Test Configuration Mains / Port


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5.10 Magnetic field immunity test

5.10.1 Test Equipments

No. Name Manufactor Type Serial Num Cal Due Date

1 magnetic

field immunity

test

EM TEST MS100 0606-84 24.12.2014

2

magnetic field

immunity test i t

EM TEST MS2630 0506-36 24.12.2014


5.10.3 Test Standard



Compliance Requirement:

Severity Level 1, 1A/m, Performance Criterion A

5.10.4 Severity Levels and Performance Criterion

Severity Level Magnetic Field Strength A/m Performance criterion

1. 1

A

2. 3

3. 10

4. 30

5. 100

X. Special


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5.10.5 Test Procedure

The EUT was subjected to the test magnetic field by using the induction coil of standard dimensions (1m*1m) and shown in Section 5.10.2. The induction coil was then rotated by 90°in order to expose the EUT to the test field with different orientations.

5.10.6 Test Results

The EUT complied with the required performance throughout the test. Table 12 shows the Magnetic field immunity test results.

Photograph 14 shows the Magnetic field immunity test configuration.

Table 12: Magnetic field immunity Test Results

Test Level Testing Duration Coil Orientation Result

1A/m 5 min / coil X A

1A/m 5 min / coil Y A

1A/m 5 min / coil Z A

Photograph 14: Magnetic field immunity Test Configuration Mains /Port


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5.11 VOLTAGE DIPS AND INTERRUPTIONS TEST


No. Name Manufactor Type Serial Num Cal Due Date

1 Voltage Drop Simulator EM TEST UCS500M4 V0606101146 24.12.2014

2 Automatic

voltage regulator

EM TEST MV2616 V0606101148 24.12.2014


5.11.3 Requirements




Compliance Requirement: Performance Criterion: B, C

5.11.4 Severity Levels and Performance Criterion

Test Level

%UT

Voltage dip and short interruptions

%UT

Duration

(in period)

Performance

Criterion

0 100 0.5 B

70 30 25 B

0 100 250 C

5.11.5 Test Results

The EUT complied with the required performance throughout the test. Table 13 shows the Voltage Dips/Interrupts test results.

Photograph 15 shows the Voltage Dips/Interrupts test configuration.

EUT Main Interference Simulator

AC Mains AC Mains

0.8m


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Table 13: Voltage Dips/Interrupts Test Results

Test Type Test Parameters Number of Repetitions Results/Notes

Voltage Dips >95% drop for 10 ms or

0.5 cycle 3 dips, 10 s interval

A


Voltage Dips 30% drop for 500 ms or

25 cycles 3 dips, 10 s interval

A


Short Interruptions

>95% drop for 5000 ms or

250 cycles 3 dips, 10 s interval

B

The packets lost within permitted. The EUT recovered after

disturbance ceased, and operated without operator intervention

Photograph 15: Voltage Dips/Interrupts Test Configuration


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6 Attachment (EUT Photograph) EUT Model: EPU3C- EPU3C-A0A0B100M

EUT Photo #1– Front View

EUT Photo #2– Uncover View


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EUT Photo #3– PCB Top View

EUT Photo #4– PCB Bottom View

EUT Photo #5– SuperTT Dongle Adaptor View


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7 Appendix

A. Declaration of Conformity


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According to the European EMC Directive (2004/108/EC), the conformity of a device to the Directive shall be certified by an EC declaration of conformity issued by the manufacturer or his authorized representative established within the European Community. If neither the manufacturer nor his authorized representative is established in the European Community, the EC declaration of conformity shall be the responsibility of the person who places the device on the European Community market.

The EC declaration of conformity shall be held at the disposal of the competent authority for ten years following the last placement of the device on the market (i.e., 10 years after that last device has been sold) and must contain the following information:

- Description of the device to which the declaration refers,

- Reference to the specifications under which conformity is declared, and, where appropriate, the national measures implemented to ensure the conformity of the provisions of the Directive,

- Identification of the signatory empowered to bind the manufacturer or his authorized representative.

An example of an EC declaration of conformity is shown on the next page.

Please note that Metrology and Test Center of Radio and TV, Academy of Broadcasting Planning operates as a contract-testing laboratory and provides test results to support the EC declaration of conformity. However, under the EC's current regulations, it is up to the manufacturer/importer to declare conformity to the proper standards. Although WLL can provide technical guidance, the final determinations as to which standards apply to the product and whether the product conforms to the standards is the responsibility of the manufacturer/importer.

.


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S a m p l e

DECLARATION OF CONFORMITY Application of Council Directive(s):

2004/108/EC

Standard(s) to which Conformity is Declared:

EN 55022:2010+AC:2011

EN 55024:2010

Manufacturer's Name : EverPro Technologies Company Ltd.

Manufacturer's Address: 4# Guanshan Er Road, Wuhan 430073 P, R, China

Importer's Name:

Importer's Address:

Type of Equipment: USB3.0 AOC Cable

Model Number: EPU3C-NNMMXYYYM

Year of Manufacture:

I, the undersigned, hereby declare that the equipment specified above

conforms to the above Directive(s) and Standard(s).

Place: ________________________ ____________________________________

(Signature)

Date: _________________________ ____________________________________

(Full Name)


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B. Marketing and Labeling Instructions Labeling Requirements

According to the European EMC Directive (2004/108/EC), the EC conformity marking for a device shall be affixed by the manufacturer, or his authorized representative established within the European Community. The EC conformity marking can be affixed to the device, packaging, instructions for use, or guarantee certificate.

The EC conformity marking shall consist of the letters "CE" (as shown below).

NOTE: The grid is to show proportions only.

Marketing Requirements

This report and the manufacturer's subsequent EC declaration of conformity are only valid for the technical standards (i.e. European Norms) noted in this report. If these technical standards are updated or additional technical standards are adopted, that are applicable to this device, then the device should be tested to these updated or new standards to ensure continued compliance with the EMC Directive (2004/108/EC). If changes to the original equipment are made, then these changes should be reviewed to ensure that they do not effect compliance with the technical standards. If the changes are determined to change the EMC characteristics of the device then the device should be retested to the applicable technical standards.


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C. Abbreviations A Ampere

AC alternating current AM Amplitude Modulation

Amps Amperes b/s bits per second BW Bandwidth CAB Conformity Assessment Body CE Conducted Emission cm centimeter CW Continuous Wave dB decibel dc direct current

EFT Electrically Fast Transient EMI Electromagnetic Interference ESD ElectroStatic Discharge EUT Equipment Under Test FM Frequency Modulation G giga - prefix for 109 multiplier Hz Hertz IF Intermediate Frequency k kilo - prefix for 103 multiplier

LISN Line Impedance Stabilization Network M Mega - prefix for 106 multiplier m meter

NB Narrowband PC Personal Computer

PCB Printed Circuit Board PCI Peripheral Component Interconnect RE Radiated Emissions RF Radio Frequency rms root-mean-square

S second S/A EMI Receiver SN Serial Number V volt µ micro - prefix for 10-6 multiplier

D. Measurement Uncertainty

All results reported herein relate only to the equipment tested. The basis for uncertainty calculation uses ANSI/NCSL Z540-2-1997 with a type B evaluation of the standard uncertainty. Elements contributing to the standard uncertainty are combined using the method described in Equation 1 to arrive at the total standard uncertainty. The standard uncertainty is multiplied by the coverage factor to determine the expanded uncertainty which is generally accepted for use in


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commercial, industrial, and regulatory applications and when health and safety are concerned (see Equation1 and Equation 2). A coverage factor was selected to yield a 95% confidence in the uncertainty estimation.

Equation 1: Standard Uncertainty

.......2

2

2

2

2

2

+++±=cba

c divc

divb

divau

where uc = standard uncertainty

a, b, c,.. = individual uncertainty elements

diva, b, c = the individual uncertainty element divisor based on the probability distribution

divisor = 1.732 for rectangular distribution

divisor = 2 for normal distribution

divisor = 1.414 for trapezoid distribution

Equation 2: Expanded Uncertainty

ckuU =

where U = expanded uncertainty

k = coverage factor

k ≤ 2 for 95% coverage (ANSI/NCSL Z540-2 Annex G)

uc = standard uncertainty

The measurement uncertainty complies with the maximum allowed uncertainty from CISPR 16-4-2. Measurement uncertainty is not used to adjust the measurements to determine compliance. The expanded uncertainty values for the various scopes in the WLL accreditation are provided in Table 14


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Table 14: Expanded Uncertainty List

Scope Standard(s) Expanded Uncertainty

Conducted Emissions CISPR11, CISPR22, CISPR14, FCC Part 15 2.19 dB

Radiated Emissions CISPR11, CISPR22, CISPR14, FCC Part 15 3.98 dB

Harmonics EN 61000-3-2 0.3%

Flicker EN 61000-3-3 2%

Electrostatic Discharge IEC 61000-4-2 4%

Radiated Immunity IEC 61000-4-3 1.51 dB

Electrically Fast Transients IEC 61000-4-4 4%

Surge IEC 61000-4-5 4%

Conducted Immunity IEC 61000-4-6 2.13 dB

Magnetic Immunity IEC 61000-4-8 1.57 dB

Dips & Interrupts IEC 61000-4-11 5%

--------------------------------------------------------The End--------------------------------------------------------

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CE Marking EMI/EMC Test Report For the - EverPro Tech · 2018-01-04 · Certificates and reports shall not be reproduced except in full. CE Marking EMI/EMC Test Report For the EverPro