Categorisation of the remaining MCMsCategorisation of the remaining MCMsCategorisation of the remaining MCMsCategorisation of the remaining MCMs

Victor AndreiVictor Andrei

Kirchhoff-Institut für PhysikKirchhoff-Institut für PhysikRuprecht-Karls-Universität HeidelbergRuprecht-Karls-Universität Heidelberg

L1Calo Trigger Joint Meeting, CERN, 21/10/2011L1Calo Trigger Joint Meeting, CERN, 21/10/2011

CERN: CERN: 300300 spares (fully tested in Heidelberg) spares (fully tested in Heidelberg)

237 in the test rig237 in the test rig

63 in USA1563 in USA15

Heidelberg: Heidelberg: 531531 spares (validated during production tests) spares (validated during production tests)

501 currently/previously operated on PPMs501 currently/previously operated on PPMs

30 “factory-new”30 “factory-new”

Heidelberg: Heidelberg: manymany returns from CERN returns from CERN

failedfailed only DAC/Pedestal tests at CERN only DAC/Pedestal tests at CERN passedpassed again similar tests in again similar tests in HeidelbergHeidelberg

re-test & re-use them if necessaryre-test & re-use them if necessary

MCM SparesMCM SparesMCM SparesMCM SparesC

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Victor Andrei, KIPVictor Andrei, KIPL1Calo Trigger Joint Meeting, CERN, 21/10/2011L1Calo Trigger Joint Meeting, CERN, 21/10/2011 22

>1 year to operate with the current MCM>1 year to operate with the current MCM

test all ‘Heidelberg spares’ and sort them in three categories:test all ‘Heidelberg spares’ and sort them in three categories:

GOOD MCMsGOOD MCMs

flawless operationflawless operation

USABLE MCMsUSABLE MCMs

small deviations from expectation, but still functionalsmall deviations from expectation, but still functional

BAD MCMsBAD MCMs

large deviation or severe errors large deviation or severe errors no usable spares no usable spares

digital partdigital part

either GOOD or BADeither GOOD or BAD

“ “mixed-signal” part (ADC, PHOS4)mixed-signal” part (ADC, PHOS4)

more complex & critical requests the USABLE category

MCM CategorisationMCM CategorisationMCM CategorisationMCM CategorisationC

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Victor Andrei, KIPVictor Andrei, KIPL1Calo Trigger Joint Meeting, CERN, 21/10/2011L1Calo Trigger Joint Meeting, CERN, 21/10/2011 33

Test Platforms @KIPTest Platforms @KIPTest Platforms @KIPTest Platforms @KIP

Single PPM TestsSingle PPM Tests

(short-term &(short-term &

systematic checks)systematic checks)

Full Crate TestsFull Crate Tests

(long-term operation)(long-term operation)

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Victor Andrei, KIPVictor Andrei, KIPL1Calo Trigger Joint Meeting, CERN, 21/10/2011L1Calo Trigger Joint Meeting, CERN, 21/10/2011 44

Testing ApplicationsTesting ApplicationsTesting ApplicationsTesting Applications

large collection of testing and debugging applications that verify:large collection of testing and debugging applications that verify:

operating conditions (temperatures & voltages)operating conditions (temperatures & voltages)

ASIC configuration, readback and readoutASIC configuration, readback and readout

gain, offset and linearity of the ADCsgain, offset and linearity of the ADCs

stability of the PHOS4 operationstability of the PHOS4 operation

real-time LVDS outputreal-time LVDS output

based on the existing applications for testing the PPMsbased on the existing applications for testing the PPMs

added the experience gained with the running PPr system in USA15added the experience gained with the running PPr system in USA15

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Victor Andrei, KIPVictor Andrei, KIPL1Calo Trigger Joint Meeting, CERN, 21/10/2011L1Calo Trigger Joint Meeting, CERN, 21/10/2011 55

Observed Errors (1/6)Observed Errors (1/6)Observed Errors (1/6)Observed Errors (1/6)

so far fully tested so far fully tested 48 MCMs48 MCMs (i.e. 3 PPMs) (i.e. 3 PPMs)

for other for other 48 MCMs48 MCMs tests are in progress tests are in progress

in general results are goodin general results are good

most of the observed errors are well-knownmost of the observed errors are well-known

one digital errorone digital error: ASIC LoadLUT command fails in one channel: ASIC LoadLUT command fails in one channel

should generate a ramp in LUT according to predefined Slope and should generate a ramp in LUT according to predefined Slope and Pedestal parametersPedestal parameters

no calibration slope is loadedno calibration slope is loaded

LUT configuration over VME works properly !LUT configuration over VME works properly !

observed similar error on other MCMs (<10-15) in the past years observed similar error on other MCMs (<10-15) in the past years “weak” point in the design enhanced during manufacturing ? “weak” point in the design enhanced during manufacturing ?

keep an eye on it when porting the ASIC code to the FPGA of the new keep an eye on it when porting the ASIC code to the FPGA of the new MCMMCM

Victor Andrei, KIPVictor Andrei, KIPL1Calo Trigger Joint Meeting, CERN, 21/10/2011L1Calo Trigger Joint Meeting, CERN, 21/10/2011 66

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Observed Errors (2/6)Observed Errors (2/6)Observed Errors (2/6)Observed Errors (2/6)

mixed-signal area is more mixed-signal area is more criticalcritical

several effects observedseveral effects observed

FrameBitFrameBit effect effect

FrameBit FrameBit digital signal sent digital signal sent by ReM FPGA to all ASICsby ReM FPGA to all ASICs

improper analogue-digital improper analogue-digital ground decoupling in MCM ground decoupling in MCM layoutlayout

spikes in ADC data every 13 spikes in ADC data every 13 BCs (BCs (FrameBitFrameBit period) period)C

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Victor Andrei, KIPVictor Andrei, KIPL1Calo Trigger Joint Meeting, CERN, 21/10/2011L1Calo Trigger Joint Meeting, CERN, 21/10/2011 77

pedestal measurements

Observed Errors (3/6)Observed Errors (3/6)Observed Errors (3/6)Observed Errors (3/6)

consequences of the consequences of the FrameBitFrameBit effect:effect:

increased noise contentincreased noise content

large number of multiple peaks large number of multiple peaks in ADC (pedestal) distributions in ADC (pedestal) distributions

most affected: the two ADCs most affected: the two ADCs located near the ASIClocated near the ASIC

worse results for certain PHOS4 worse results for certain PHOS4 delay settingsdelay settings

ADC strobe positioned on the ADC strobe positioned on the maximum of the noise maximum of the noise amplitudesamplitudes

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Victor Andrei, KIPVictor Andrei, KIPL1Calo Trigger Joint Meeting, CERN, 21/10/2011L1Calo Trigger Joint Meeting, CERN, 21/10/2011 88

Observed Errors (4/6)Observed Errors (4/6)Observed Errors (4/6)Observed Errors (4/6)

also, worse results also, worse results through the upper part of through the upper part of the PPMthe PPM

effect of the temperatureeffect of the temperature

thermal (top-bottom) thermal (top-bottom) gradient on the PPMgradient on the PPM

increase in thermal increase in thermal noise with temperaturenoise with temperature

thermal noise adds with thermal noise adds with the analogue-digital the analogue-digital coupling noise coupling noise

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Victor Andrei, KIPVictor Andrei, KIPL1Calo Trigger Joint Meeting, CERN, 21/10/2011L1Calo Trigger Joint Meeting, CERN, 21/10/2011 99

top

bottom

bottom

top

Observed Errors (5/6)Observed Errors (5/6)Observed Errors (5/6)Observed Errors (5/6)

MCMs operated in the central MCMs operated in the central part of the PPM show additional part of the PPM show additional noise componentnoise component

slightly longer signal path slightly longer signal path from the AnIn boards to the from the AnIn boards to the respective MCM slots respective MCM slots

additional coupled noiseadditional coupled noise

more visible on the channels more visible on the channels with ADCs far from ASIC (less with ADCs far from ASIC (less affected by affected by FrameBitFrameBit effect) effect)

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Victor Andrei, KIPVictor Andrei, KIPL1Calo Trigger Joint Meeting, CERN, 21/10/2011L1Calo Trigger Joint Meeting, CERN, 21/10/2011 1010

Observed Errors (6/6)Observed Errors (6/6)Observed Errors (6/6)Observed Errors (6/6)

FrameBitFrameBit effect is responsible effect is responsible for most of the damagefor most of the damage

verification:verification:

disable the FrameBit disable the FrameBit transmission from ReM to ASICs transmission from ReM to ASICs digital activity on the PPM is digital activity on the PPM is reducedreduced

noise level drops considerablynoise level drops considerably

still visible a probable still visible a probable coupling of the 40 MHz clock coupling of the 40 MHz clock signalsignal

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Victor Andrei, KIPVictor Andrei, KIPL1Calo Trigger Joint Meeting, CERN, 21/10/2011L1Calo Trigger Joint Meeting, CERN, 21/10/2011 1111

ConclusionsConclusionsConclusionsConclusions

observed misbehaviours in the mixed-signal part affect all MCMs observed misbehaviours in the mixed-signal part affect all MCMs and are not changeableand are not changeable

nonenone of the tested MCMs is “ideal” ( of the tested MCMs is “ideal” (GOODGOOD))

all are all are USABLEUSABLE

the experience gained with the current design will be used for the new the experience gained with the current design will be used for the new MCMMCM

• the MCM showing the ASIC LoadLUT error will be entered in the the MCM showing the ASIC LoadLUT error will be entered in the BADBAD category category

summary of testing:summary of testing:

47 USABLE MCMs47 USABLE MCMs

1 BAD MCM1 BAD MCM

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Victor Andrei, KIPVictor Andrei, KIPL1Calo Trigger Joint Meeting, CERN, 21/10/2011L1Calo Trigger Joint Meeting, CERN, 21/10/2011 1212