1
Blue-noise Dithered Sampling Iliyan Georgiev Solid Angle Marcos Fajardo Solid Angle Random pixel decorrelation Our dithered wavelength sampling Random pixel decorrelation Our dithered volume sampling Random pixel decorrelation Our dithered light source sampling Fourier pow. spec. 1D-sample mask Fourier pow. spec. 2D-sample mask 1spp 1spp 1spp 1spp 1spp 1spp 9spp 9spp 9spp 9spp 1spp 1spp 1spp 1spp 1spp 1spp Figure 1: Our method uses blue-noise dither masks tiled over the image to correlate the samples between pixels and thus minimize the low- frequency content in the distribution of the estimation error. Without actually reducing the amount of error, this correlation produces images with higher visual fidelity than traditional random pixel decorrelation, especially when using a small number of samples per pixel (spp). Keywords: Monte Carlo, sampling, blue noise, dithering Concepts: Computing methodologies Rendering; The visual fidelity of a Monte Carlo rendered image depends not only on the magnitude of the pixel estimation error but also on its distribution over the image. To this end, state-of-the-art methods use high-quality stratified sampling patterns, which are randomly scrambled or shifted to decorrelate the individual pixel estimates. While the white-noise image error distribution produced by random pixel decorrelation is eye-pleasing, it is far from being perceptually optimal. We show that visual fidelity can be significantly improved by instead correlating the pixel estimates in a way that minimizes the low-frequency content in the output noise. Inspired by digital halftoning, our blue-noise dithered sampling can produce substan- tially more faithful images, especially at low sampling rates. Blue-noise dithering. In digital halftoning, dithering is the in- tentional application of noise to randomize the error from quantiz- ing a continuous-tone image [Lau and Arce 2008]. An efficient ap- proach is to threshold the pixels using a blue-noise mask, which is a 2D array of scalar values arranged such that the Fourier power spec- trum of any thresholded gray-level is isotropic and devoid of low frequencies. That is, neighboring pixels get very different thresh- olds, and similar thresholds are assigned to pixels far apart. Dithered sampling. Our idea is to apply the concept of dithering to correlate pixel estimates in Monte Carlo distribution ray tracing. Given a d-dimensional sampling pattern, we toroidally shift it for every pixel, but rather than choosing the offset randomly, as done traditionally, we look it up in a blue-noise sample mask tiled over the image. The value of every pixel in such a pre-computed mask is a d-dimensional vector, and for d =1 the mask is very similar to a halftoning mask. In this setting, traditional random-offset pixel decorrelation is equivalent to using a white-noise sample mask. (rev.1) Permission to make digital or hard copies of part or all of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for third- party components of this work must be honored. For all other uses, contact the owner/author(s). c 2016 Copyright held by the owner/author(s). SIGGRAPH ’16, July 24-28, 2016, Anaheim, CA, ISBN: 978-1-4503-4282-7/16/07 DOI: http://dx.doi.org/10.1145/2897839.2927430 When using a blue-noise sample mask, neighboring pixels evalu- ate different locations in the sampling domain, yielding a high- frequency noise distribution in the rendered image. Mitchell [1991] also observed that this is a desirable property and proposed a sam- ple distribution optimality condition along with a simple algorithm to approximate it. Our approach aims to efficiently meet this con- dition and improve over Mitchell’s algorithm. Sample mask construction. Our blue-noise sample masks are scene-independent and can be built offline. Starting from a random (white-noise) mask M, we repeatedly swap random pixel pairs to minimize the following energy function via simulated annealing: E(M)= X p6=q E(p, q)= X p6=q exp - kp i -q i k 2 σ 2 i - kps -qs k d/2 σ 2 s ! . The energy function is a product of image- and sample-space Gaus- sians, where p and q are pixels, p i and q i are their integer 2D coordi- nates, and ps and qs are their associated d-dimensional sample val- ues. Image-space distances are computed on wrapped boundaries so that the mask can be tiled seamlessly over the image. Following Ulichney [1993] we use σ i =2.1, and for the sample-space Gaus- sian we set σ s =1. The d /2 exponent corrects for the difference in the average distance between points in the d-dimensional sample space and the 2D image space. Results. Figure 1 shows our 1D- and 2D-sample dither masks along with their corresponding Fourier power spectra. We also demonstrate how these masks compare against random pixel decor- relation for offsetting patterns with 1 and 9 samples. Thanks to the blue-noise error distribution, the images produced by our approach appear less noisy, even though the amount of estimation error is the same as that of traditional white-noise decorrelation. Note that we plot masks of size 64 2 , but we used size 128 2 to render our images. References LAU, D., AND ARCE, G. 2008. Modern Digital Halftoning, Sec- ond Edition. CRC Press. MITCHELL, D. P. 1991. Spectrally optimal sampling for distribu- tion ray tracing. ACM SIGGRAPH Comput. Graph. 25, 4. ULICHNEY, R. A. 1993. The void-and-cluster method for dither array generation. Proc. SPIE 1913, 332–343.

Blue-noise Dithered Sampling - Solid Angle · Blue-noise Dithered Sampling Iliyan Georgiev Solid Angle Marcos Fajardo Solid Angle ... scrambled or shifted to decorrelate the individual

Embed Size (px)

Citation preview

Blue-noise Dithered Sampling

Iliyan GeorgievSolid Angle

Marcos FajardoSolid Angle

Random pixel decorrelation

Our dithered wavelength sampling

Random pixel decorrelation

Our dithered volume sampling

Random pixel decorrelation

Our dithered light source sampling

Fourier pow. spec.

1D-sample mask

Fourier pow. spec.

2D-sample mask1spp1spp

1spp1spp

1spp1spp 9spp9spp

9spp9spp1spp1spp

1spp1spp

1spp1spp

Figure 1: Our method uses blue-noise dither masks tiled over the image to correlate the samples between pixels and thus minimize the low-frequency content in the distribution of the estimation error. Without actually reducing the amount of error, this correlation produces imageswith higher visual fidelity than traditional random pixel decorrelation, especially when using a small number of samples per pixel (spp).

Keywords: Monte Carlo, sampling, blue noise, ditheringConcepts: •Computing methodologies→ Rendering;

The visual fidelity of a Monte Carlo rendered image depends notonly on the magnitude of the pixel estimation error but also on itsdistribution over the image. To this end, state-of-the-art methodsuse high-quality stratified sampling patterns, which are randomlyscrambled or shifted to decorrelate the individual pixel estimates.

While the white-noise image error distribution produced by randompixel decorrelation is eye-pleasing, it is far from being perceptuallyoptimal. We show that visual fidelity can be significantly improvedby instead correlating the pixel estimates in a way that minimizesthe low-frequency content in the output noise. Inspired by digitalhalftoning, our blue-noise dithered sampling can produce substan-tially more faithful images, especially at low sampling rates.

Blue-noise dithering. In digital halftoning, dithering is the in-tentional application of noise to randomize the error from quantiz-ing a continuous-tone image [Lau and Arce 2008]. An efficient ap-proach is to threshold the pixels using a blue-noise mask, which is a2D array of scalar values arranged such that the Fourier power spec-trum of any thresholded gray-level is isotropic and devoid of lowfrequencies. That is, neighboring pixels get very different thresh-olds, and similar thresholds are assigned to pixels far apart.

Dithered sampling. Our idea is to apply the concept of ditheringto correlate pixel estimates in Monte Carlo distribution ray tracing.Given a d-dimensional sampling pattern, we toroidally shift it forevery pixel, but rather than choosing the offset randomly, as donetraditionally, we look it up in a blue-noise sample mask tiled overthe image. The value of every pixel in such a pre-computed maskis a d-dimensional vector, and for d = 1 the mask is very similarto a halftoning mask. In this setting, traditional random-offset pixeldecorrelation is equivalent to using a white-noise sample mask.

(rev. 1) Permission to make digital or hard copies of part or all of this workfor personal or classroom use is granted without fee provided that copies arenot made or distributed for profit or commercial advantage and that copiesbear this notice and the full citation on the first page. Copyrights for third-party components of this work must be honored. For all other uses, contactthe owner/author(s). c© 2016 Copyright held by the owner/author(s).SIGGRAPH ’16, July 24-28, 2016, Anaheim, CA,ISBN: 978-1-4503-4282-7/16/07DOI: http://dx.doi.org/10.1145/2897839.2927430

When using a blue-noise sample mask, neighboring pixels evalu-ate different locations in the sampling domain, yielding a high-frequency noise distribution in the rendered image. Mitchell [1991]also observed that this is a desirable property and proposed a sam-ple distribution optimality condition along with a simple algorithmto approximate it. Our approach aims to efficiently meet this con-dition and improve over Mitchell’s algorithm.

Sample mask construction. Our blue-noise sample masks arescene-independent and can be built offline. Starting from a random(white-noise) mask M , we repeatedly swap random pixel pairs tominimize the following energy function via simulated annealing:

E(M) =∑p 6=q

E(p, q) =∑p 6=q

exp

(−‖pi−qi‖2

σ2i− ‖ps−qs‖d/2

σ2s

).

The energy function is a product of image- and sample-space Gaus-sians, where p and q are pixels, pi and qi are their integer 2D coordi-nates, and ps and qs are their associated d-dimensional sample val-ues. Image-space distances are computed on wrapped boundariesso that the mask can be tiled seamlessly over the image. FollowingUlichney [1993] we use σi = 2.1, and for the sample-space Gaus-sian we set σs = 1. The d/2 exponent corrects for the differencein the average distance between points in the d-dimensional samplespace and the 2D image space.

Results. Figure 1 shows our 1D- and 2D-sample dither masksalong with their corresponding Fourier power spectra. We alsodemonstrate how these masks compare against random pixel decor-relation for offsetting patterns with 1 and 9 samples. Thanks to theblue-noise error distribution, the images produced by our approachappear less noisy, even though the amount of estimation error is thesame as that of traditional white-noise decorrelation. Note that weplot masks of size 642, but we used size 1282 to render our images.

References

LAU, D., AND ARCE, G. 2008. Modern Digital Halftoning, Sec-ond Edition. CRC Press.

MITCHELL, D. P. 1991. Spectrally optimal sampling for distribu-tion ray tracing. ACM SIGGRAPH Comput. Graph. 25, 4.

ULICHNEY, R. A. 1993. The void-and-cluster method for ditherarray generation. Proc. SPIE 1913, 332–343.