Berkeley Lab

IH Monitoring Issues at Accelerators

Jim Floyd

Advanced Light Source

LBL

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Chemical monitoring in user facilities

• Staff vs. Users

• Similar Exposure Groups (SEGs) for Users

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Engineered Nanomaterials

• Notice N456.1“Using best available hazard information, conduct

exposure assessment for all nanotechnology activities involving UNP.”

• Sampling issues—Desire to use real-time particle counters

• Signal to noise problems• Establishing technical bases

Berkeley Lab

Example

Collect

Particle counts and filters from: both the source material and the work observation

Analyze filters by microscopy and bulk analytical methods

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Nano example

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Nano example

•Nanostructures consistent with the source material accounted for ~0.3 particles/cc

•Nanoparticles/nanostructures not consistent with the source material accounted for ~40 particles/cc

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Nano

• Sampling—Developing this technical basis at our nano science

center

—Hope to be able to apply it at elsewhere

• Standards—Carbon nanotube (CNTs)

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Lasers

• Baseline eye exams—Standard practice—Acceptance of third-party exams (“portability”)—Exemptions if under escort

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Other non-ionizing radiation

• Magnetic fields—5 gauss work areas

• RF

• UV

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Noise

• Most work is well below below ACGIH thresholds— 85 dBA (for 8 hours)

• But ubiquitous “nuisance noise” —Starting to use Preferred Speech Interference Level (PSIL)

for guidance on prioritizing mitigations.— 72 dB (at 500, 1000, 2000 Hz)

Berkeley Lab

Oxygen Deficiency

Standardized application for accelerator tunnels, etc.

(FNAL, et al.)

Application to lab environments is a little tricky

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The Usual Suspects

Peeling Lead Paint on Dome Soldering Station