AUTOTESTCON September, 2008 - IEEE-SAgrouper.ieee.org/groups/scc20/ATML/Demonstrations/Phase1... · 2009-03-10 · Program Custom Component / Process The Mathworks EADS Test & Services

AUTOTESTCON

September, 2008

• ATML = Automatic Test Markup Language

• Common Exchange Format for all Test and

Maintenance Information

• Developed by joint DoD – Industry Working

Group

• Standardized by the IEEE

• In course of adoption by DoD services and

commercial companies

11.19.2008 ATML Demonstration 2


• Enable integrated multi-vendor COTS-based

solutions: Integrated Diagnostics, Enterprise

Health Management, etc.

• Support improvement of diagnostic accuracy,

reducing repair time and cost

• Facilitate ATE technology insertion and TPS

rehost

• Improve life cycle support of Weapon Systems


• Validate operation of ATML standards in system-level use cases

• Demonstrate feasibility of multi-vendor COTS-based solution

• Demonstrate integration on DoD (RTCASS-IP) and commercial (LM-STAR) platforms

• Provide feedback for DoD procurement and IEEE standardization

• Publish examples and guidelines for future users of ATML standards



Hardware & Integration

ATML Capability

Test Definition

(TPL)

ATML Test

Description

ATML

Instrument

Description

ATML Test

Station

ATML Test

Adaptor

ATML UUT

Description

TestStand

ATML Importer

Sequence

File

C Source File

DLL

Instrument

Description

Tool

Test

Description

Tool

Resource

Analysis

ATML Test

Results

Instrument

Support

Handlers

Instrument

Driver

VISA

Compiler

(LabWindows/

CVI)

Test

Executive

(TestStand)

Graphical

Visualisation

Test Results

Analyzer

Signal

Modelling

Library

ATML

Capability

Create/edit/

view

ATML like

newWaveX

HTML

Viewerxslt

HTML

Viewerxslt

Path Analysis

(Xpress

Services)

xslt

Generate Test

Program

Custom Component /

Process

The Mathworks

EADS Test & Services

Vektrek

National Instruments

Teradyne

Northrop Grumman

ATML Standard

xslt XML StyleSheet

Legend

Switch

Control

Lockheed Martin

HTML

Viewerxslt

Bayesian

Reasoner

MAC Panel

PIDESO

Summit Test Solutions

Virginia Panel

UUT

ITA/

Engineering

Services

ITA/

Engineering

Services

Integration

Support

Integration

Support

Integration

Support


• Schematic and Connector

Q1

R1

12K

R2

1.2K

R3

5.6K

R4

470

C1

10uF

C2

10uF

C3

1uF

VCC

VI

VE

VB

VC

K6K2

K1 K4

K7

K5

K10

K8K3

GND

K9

VO

R5

12K

GND

GND

811.19.2008 ATML Demonstration

• Fault Insertion

Switch and Position Fault

K1 OFF C1.OP

K2 OFF R2.OP

K3 OFF R1.OP

K4 OFF Q1.B.OP

K5 OFF Q1.E.OP

K6 OFF R4.OP

K7 OFF Q1.C.OP

K8 OFF R3.OP

K9 OFF C2.OP

K10 ON Q1.CE.SR


• Demo UUT


• Flowchart


• Tests & Limits

Test Name Stimuli Measurement Low Limit Nominal Value

High Limit

VCC Resistance Test none 3.0KΩ 13.2 KΩ

VO AC Voltage Test VCC = 12VVI = 4mVP-P @ 1KHz

VO, peak-to-peak 40 mVP-P 44 mVP-P

VC AC Voltage Test VCC = 12VVI = 4mVP-P @ 1KHz

VC, peak-to-peak 40 mVP-P 44 mVP-P

VC DC Voltage Test VCC = 12V VC, DC voltage 4.7 V 6.54 V 8.0 V

VE DC Voltage Test VCC = 12V VE, DC voltage 0.37 V 0.46 V 0.55 V

VB DC Voltage Test VCC = 12V VB, DC voltage 0.99 V 1.09 V 1.2 V


UUT Connector

P1Amphenol

Part Number

L717-TWB13W3PCoax Pins Part

NumberL17-DM53740-5001

P1 Pin 5

(#25)

P1 Pin 2

(#2)

P1 Pin A3(Coax)

(#34)

P1 Pin 4(#2)

P1 Pin A1

(Coax)

(#45)

P1 Pin 6

(#2)

Single Point Ground

(Power Feedthru)

Vcc

Vo

RTCASS/CASS Receiver Fixture Interface/Pinout

CASS Waveform Recorder Digitizer (WFRD)

RTCASS: Scope

(Coax Feedthru)RG-316

CASS: Arbitrary Waveform Function Generator (AWFG)RTCASS: Arb Wave Gen

(Coax Feedthru)

RG-316

ITA Open & UUT Open

(Signal Feedthru)

Vi

Receiver

J3-70A

J3-70B

J3-70C

J1-1B

CASS: Low Voltage DC Power Supply Type A (DCPSLVA)RTCASS: DC Power

(Power Feedthru)HI

+ Sense

- Sense

Channel A

Vc

LO

J2-17A

Channel A J2-2B

J3-1B

J3-2B

J3-3B

J3-2AJ3-1A

Low Frequency Switching

(1 X 4 Relays)NO2

Com

NC1

NC2NO1


(1 X 4 Relays)NO2

ComNC1

NC2NO1

CASS:DMM

RTCASS: DMM

(Signal Feedthru) HI

LOSense LO

Sense HI

Shield


(1 X 4 Relays)NO2

Com

NC1

NC2NO1


(1 X 4 Relays)NO2

Com

NC1

NC2

NO1

Coax Switching

(1 X 4 Relays)

Power Switching

(1 X 4 Relays)

Power Switching

(1 X 4 Relays)

Coax Switching

(1 X 4 Relays)

J9-1A

J9-3A----

--------

J9-1B

J9-3BJ9-2B

J9-4B

J9-5B

J9-1C

J9-3CJ9-2C

----J9-5C

P1 Pin 7

(#5)

P1 Pin 8

(#4)

P1 Pin 9

(#3)J9-6A

J9-8A

----

----J9-10A

NO1

Com

NC2

NO2NC1

NO1

Com

NC2

NO2NC1

J6-3B

J6-4B----

J6-5AJ6-5B

J6-6A

J6-7A----

----J6-8A

NO1

ComNC2

NO2

NC1

NO1

Com

NC2

NO2NC1

J1-3BJ3-10B

J3-10A

J1-3A

J5-1A

J5-2A

----

----J5-3A

J5-3B

----

----

----J5-5B

Ve

Vb

ATML Demonstration Interface Test AdapterDraft 1.7

File: ATML Demonstration ITA Drawing Draft 1.7.vsd

Mike Seavey Working Copy

dated:08/2/2008

UUT Connector

J1Amphenol

Part Number

L77-TWB13W3SCoax Pins Part

NumberL17-DM53742-5001

J1 Socket 5

J1 Socket 2

J1 Socket A3

(Coax)

J1 Socket 4

J1 Socket A1

(Coax)

J1 Socket 6

J1 Socket 7

J1 Socket 8

J1 Socket 9

P1 Pin 1 J1 Socket 1


P1 Pin A2

(Coax)

J1 Socket A2

(Coax)


TB01

(All pins are shorted)

GND

TB01

TB01

Type 2 Type 3 Type 1 Type 2 Type 3 Type 1

J1 J2 J3 J5 J6 J9

1B

3A

3B

2B

17A

1A

1B

2A

2B

3B

10A

10B

70A

70B

70C

1A

2A

3A

3B

5B

3B

4B

5A

5B

6A

7A

8A

1A

1B

1C

2B

2C

3A

3B

3C

5C

6A

8A

10A

5B



MAC Panel ITA


Virginia Panel ITA

• Implementing Test Strategy using Test Groups

– Enables code reuse

VCC Resistance

TestC3.SR

VO AC Voltage

TestVBE Tests R4.OP

Q1.B.OP,

Q1.E.OP

Q1.BE.SR,

Q1.C.OP,

R1.OP

PASS

PASS

VE_H_VB_LVC DC Voltage

Test

VBE Tests

R3.OP

Q1.CE.SR

R2.OP,

Q1.BC.SR

PASS

FAIL

HIGH

FAIL

LOW

PASS

VC AC Voltage

Test

PASS

C2.OP

C1.OPFAIL

LOW

No Fault

FAIL

LOW

FAIL

LOW

VB DC Voltage

Test

VE DC Voltage

Test

VE_H_VB_P

VE_H_VB_H

VE_L_VB_L

VE_L_VB_P

VE_H_VB_H

VE_H_VB_P

VE_L_VB_P

Seq2

VE_P

PASS

VB DC Voltage

Test

VE_L_VB_P

VE_H_VB_H

VE_H_VB_L

VE_H_VB_P

VE_L_VB_H

VE_L_VB_L

FAIL

HIGH

FAIL

LOW

FAIL

HIGH

FAIL

LOW

FAIL

LOW

FAIL

HIGH

PASS

PASS

VE_P

Error

VE_P

Error


• Manually create ATML Test Description instance

document


• Vektrex Test Description Tool – Define Test

Sequence


• Vektrex Test Description Tool – Characterize Test

and Test Parameter


• Vektrex Test Description Tool – Characterize Test

Result


• Vektrex Test Description Tool – Define IEEE 1641

Signals


• Vektrex Test Description Tool – Describe Test

Behavior



• EADS newWaveX – Process

Test

Description

<Actions/>

IEEE 1671.1

Test

Description

<Actions/>

IEEE 1671.1

newWaveX

TestDefinition

TPL

newWaveX

TestDefinition

TPL

Resource

Allocation

Code

IEEE 1641

Resource

Allocation

Code

IEEE 1641

Test

Program

‘C’ Code

Test

Program

‘C’ CodeAdd To Test ProgramAdd To Test Program

Add to Test DescriptionAdd to Test Description


• EADS newWaveX – Define Signals


• EADS newWaveX – Define “Test” Action


• EADS newWaveX – Define “Test” Action (cont’d)

• EADS newWaveX – Characterize “Setup” Operation



• EADS newWaveX – Characterize “Connect” Operation


• EADS newWaveX – Generate <Action/> elements

• Merged manually into ATML Test Description instance

document

• NI TestStand – ATML Importer – Configuration and

Report


• NI TestStand ATML Importer – Generate TestStand

Sequence File – Sequences & Steps


• NI TestStand ATML Importer - Generate TestStand

Sequence File - Locals


• NI TestStand ATML Importer - Generate

LabWindows/CVI Code Module


• EADS newWaveX - Generate Code

– Implements signal operations extracted from ATML Test

Description


• Insert code generated by newWaveX in code

module generated by the TestStand importer

(manual operation)


• Manual changes to sequence - handling outcomes

and qualifiers in test group calls


• Manual changes to sequence - displaying Repair

Instructions


• Manual changes to sequence - calling utility

functions


• Manual changes to test code - reference Lockheed

& Teradyne libraries


• Manual changes to test code - Initialization, Error

Handling


• Manual changes to test code - Unit Conversions


• Manual changes to test code - retrieving IEEE 1641

signal information from TestStand data structures


• Manual changes to test code - compensate for

instrument & control peculiarities (as necessary)


• Build DLL in LabWindows/CVI


• Teradyne iStudio

– ATML-like hardware description files

• Equivalent to ATML Instrument Description, ATML Test

Station and ATML Test Adapter

• Used to execute demo TPS

• Compared with ATML files developed with other tools

and manually


• Teradyne iStudio (cont’d)

– Screen captures TBD


• Vektrex Instrument Description Tool

– GUI guides user in entering data to describe

instrument

– Tool outputs an ATML compliant instance

document


Vektrex Instrument Description Editor Tool

ATML InstrumentDescription File

• Vektrex Instrument Description Tool – Begin by

opening a sample ATML Instrument Description file


• Vektrex Instrument Description Tool – Populate

instrument Identification & Manufacture data


• Vektrex Instrument Description Tool – Populate

additional elements to describe instrument as required.


• Vektrex Instrument Description Tool


• EADS newWaveX

– Use newWaveX generates IEEE Std 1641

compliant signal models

– Manually insert signal models in the

Instrument Description and Test Station

instance documents to populate the

Capabilities section


EADS newWaveX Signal Modeling Tool

ATML InstrumentDescription File(no capabilities)

Signal Models1641 Compliant

ATML InstrumentDescription File(with capabilities)

• EADS newWaveX (cont’d)


• EADS newWaveX – Create Test Station entity


• EADS newWaveX – Add Resources, Ports, Capability,

Instruments


• EADS newWaveX – Add Signal Models


• EADS newWaveX – Define API Parameters


• EADS newWaveX – Generate Resource Signal Model

Library


• EADS newWaveX – Model Test Station

Resources to Capabilities


• EADS newWaveX – Generate ATML Test Station

instance document


• Manual creation using XML Spy

– XML Spy guides in the manual creation of files


• Created manually using XML Spy

• The instance document was not used as part

of the demonstration, but was created to

reflect the ATML demo


• NI TestStand Operator Interface; Displaying

Repair Instructions


• NI TestStand XML Stylesheet



Vektrex Test Results Analyzer


Vektrex Test Results Analyzer (cont’d)


MATLAB script


• Lockheed Martin Bayesian Reasoner

• Screen captures TBD

Documents

AUTOTESTCON September, 2008 - IEEE-SAgrouper.ieee.org/groups/scc20/ATML/Demonstrations/Phase1... · 2009-03-10 · Program Custom Component / Process The Mathworks EADS Test & Services