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AUTOMATED MONITORING OF STACK GAS EMISSIONS BY EDXRF
0. Haupt’, R. Harrnel’, C. Schafer2 and W. Dannecker’
‘University of Hamburg, Institute of Inorganic and Applied Chemistry, Martin-Luther-King-Platz 6, D-20 146 Hamburg, Germany
2Spectro Analytical Instruments, BoschstraRe 10, D-47533 Kleve, Germany
ABSTRACT
A continuously working sampling and analysing device for monitoring of hazardous air
pollutant (HAP) metals in the form of particulate matter was developed and tested at an industrial metal smelter
INTRODUCTION Monitoring and control of stack gas emissions from industrial furnaces are important fields in environmental analysis. Stack gas emissions in this case means the emission of toxic elements in the form of particulate matter. The toxic and ecological harmful effects of emitted heavy metals are well known and were taken into account by the German law (TA-Luft [l] and 17NmSchV [2]) and the EPA urban air toxic program for hazardous air pollutants (HAP) [3]. The concentration of heavy metals in the emissions is usually low because of good cleaning devices. Small sized particles with an aerodynamic diameter (AD) below 2.5 microns are poorly separated (and have a tendency to accumulate in biosystems) while carrying significant metal loads. Several authors used optical emission spectrometry with an inductive coupled plasma (ICP- OES) for continuous emission monitoring [4][5][6]. This technique shows mndamental problems relating to the isokinetic sampling, the highly changing particle sizes, the stack gas temperatures and stack moisture which have an effect on the plasma temperature and thus on the achieved intensities and determined element concentrations. Also, the argon needed is too expensive for a continuous monitoring system. The main disadvantage is the destruction of the samples during the analysis.
The goal here is an automated monitoring system which combines an aerosol sampler with a rapid element analysis. Usually aerosols were collected on membrane or fiber filter substrates. In cooperation with SPECTRO A. I. (Kleve, Germany) we built up an automated and continuously working sampling and analysis system called X-DUST. For precipitating the stack gas aerosols and analyzing them by a fast, nondestructive and robust method like energy- dispersive x-ray fluorescence spectroscopy, a newly developed quartz fiber filter tape named MK 370 was used [7]. Quartz fiber filter materials have a lot of advantages, specifically the low blank values for most elements, the resistance to hot and corrosive gases and the high loading capacity. A disadvantage of the fiber filters is the high mass per unit area, which leads to a higher background in x-ray fluorescence analysis.
INSTRUMENTAL The combined sampling and analysis system X-DUST shown in Figure I, provides a multielement analysis of toxic elements within 30 minutes after sampling from the stack gas channel. For the entire system we had to develop and combine several components in close cooperation with industrial partners. Stack gas samples are taken by a heated titanium probe
Copyright(C)JCPDS-International Centre for Diffraction Data 2000, Advances in X-ray Analysis, Vol.42 44Copyright(C)JCPDS-International Centre for Diffraction Data 2000, Advances in X-ray Analysis, Vol.42 44ISSN 1097-0002
This document was presented at the Denver X-ray Conference (DXC) on Applications of X-ray Analysis. Sponsored by the International Centre for Diffraction Data (ICDD). This document is provided by ICDD in cooperation with the authors and presenters of the DXC for the express purpose of educating the scientific community. All copyrights for the document are retained by ICDD. Usage is restricted for the purposes of education and scientific research. DXC Website – www.dxcicdd.com
ICDD Website - www.icdd.com
ISSN 1097-0002
while using an isokinetic flow control unit from the PAUL GOTHE company (Bochum, Germany) to ensure representative particle sampling. Due to the high water load of stack gases the temperature of the probe and the titanium filter holder in the sampling unit are kept at high temperatures, up to 120 degrees centigrade, to prevent condensation. The filter medium is a trace clean quartz fiber tape developed in cooperation with MUNKTELL FILTER AB (Sweden). At the end of the preadjusted sampling period the filter tape with the aerosol loaded filter area of about 7 cm2 (30 mm in diameter) is moved automatically into the energy dispersive x-ray fluorescence spectrometer for element analysis.
The excitation source of the spectrometer unit is a 400 W end-window Rh-tube with an angle of 40” to the filter tape surface. The detection system is a silicon drift chamber called ,,XFlash detector“ manufactured by RGNTEC (Berlin, Germany) and positioned vertical to the excited filter surface. The detector and the x-ray tube are adapted in cooperation with SPECTRO A.I. onto the sampling unit - a reconstructed emission sampling system F 904 by VEREWA (Hamburg, Germany). For optimum excitation of most elements different absorption-filter materials can be inserted between x-ray source and aerosol loaded filter. The distance between sampling position and analysis system is exactly 100 mm, therefore it is possible to get about 400 samples while using a 40 meter quartz fiber tape. If the sampling period is 30 minutes there is a weekly maintenance interval required.
1 heated titanium probe 6 heated titanium blocks 11 drying agent 2 flange 7 rhodium-end window tube 12 automatic isokinetic regulate 3 stack gas channel 8 XFlashdetector 13 bypass 4 sampling device 9 personal computer 14 pump 5 quartz fibre filter band 10 gas cooling device 15 volume
Fig. 1: Emission sampling and analysis device X-DUST.
After passing the filter (5) the water vapor of the stack gas sample is removed in a titanium condenser (10). The dry gas sample then passes the isokinetic control unit consisting of a pressure gauge, control circuitry (12) by-pass valve (13) and pump (14). Finally, the sample gas volume is measured by a flow meter (15) and then converted to standard temperature volume. The entire system is software controlled by a PC (9). The data collected by the spectrometer are evaluated based on calibrations with reference filter materials. The obtained concentrations in ng/cm2 are converted into rig/m3 based on the standardized sample gas volume.
Copyright(C)JCPDS-International Centre for Diffraction Data 2000, Advances in X-ray Analysis, Vol.42 45Copyright(C)JCPDS-International Centre for Diffraction Data 2000, Advances in X-ray Analysis, Vol.42 45ISSN 1097-0002
CALIBRATION
For the calibration of the X-DUST spectrometer we produced multielement standard materials by precipitating multielement standard solutions with predetermined element concentrations onto quartz fiber filters. For this task we used an aerosol generator described in earlier publications [S][9]. The aerosol loaded reference materials were first measured by the x-ray fluorescence spectrometer of the X-DUST. The normalized intensities (counts s-l mA-‘) from the XRF spectrometer were plotted against the elemental concentrations (ng/cm2) determined by optical emission spectrometry using inductive coupled plasma (ICP-OES), mass spectrometry using inductive coupled plasma (ICP-MS) and atomic absorption spectroscopy (AAS) after dissolving the filters by oxidative digestion [lo]. Table I displays the calibration ranges (ng/cm2), the limits of detection (ng/cm2) using the IUPAC-definition [ll], the limits of detection (ng/m3) calculated for a sampling volume of 1.9 m3/h and a filter area of 7.069 cm2, and the coefficients of correlation (r) for filter calibration method of the X-DUST. Additionally the blank values of the used quartz fiber filter tape MK 370 (ng/cm2) are given.
Tab. 1: Calibration parameters of X-DUST.
Element Calibration Limits of Limits of Blank Value coefficients Range Detection’ Detection2 MK370 of
correlation [@cm21 [ng/cm2] [ ug/m3] [@cm21 r
Cl 200 - 24000 14,62 0.054 96 0.9982 K 1700 - 20000 19,os 0.071 <20 0.9975 Ca 200 - 25000 19,64 0.073 130 0.9988 Ti 25 - 25000 21,90 0.082 <54 0.9992 V 10 - 11500 4,30 0.016 Cl2 0.9999 Cr 30 - 6500 2,30 0.009 13 0.9996 Mn 60 - 6500 2,22 0.008 Cl2 0.9994 Fe 270 - 24000 11,33 0.042 287 0.9978 co 35 - 13200 0,89 0.003 27 0.9995 Ni 40 - 4200 0,49 0.002 32 0.9952 cu 20 - 4000 2,04 0.008 17 0.9956 Zn 300 - 6400 3,22 0.012 35 0.9991 As 200 - 35000 4,12 0.015 6 0.9992 Se 15 - 660 3,15 0.012 10 0.9954 Cd 50 - 50000 27,45 0.102 <30 0.9995 Sn 400 - 14000 40,88 0.152 <40 0.9990 Sb 150 - 1500 41,50 0.154 <40 0.8689 Tl 20 - 60 2,34 0.009 <23 0.6850 Pb 25 - 5500 8167 0.032
’ Calculated with IUPAC-definition [ 111 2 Calculated for a sampling volume of 1.9 mVh and a filter area of 7.069 cm2
29 0.9987
In Figure 2 the calibration curve for Cu on the quartz fiber filter tape MK 370 for the X-DUST x-ray fluorescence spectrometer is given together with the coefficient of correlation Y, the slope a as a value of sensitivity and the y-intercept b.
Copyright(C)JCPDS-International Centre for Diffraction Data 2000, Advances in X-ray Analysis, Vol.42 46Copyright(C)JCPDS-International Centre for Diffraction Data 2000, Advances in X-ray Analysis, Vol.42 46ISSN 1097-0002
Calibration Curve of Copper
50-
40- r = 0.996 a = 0.013 b = 0.29
/’ _,
/' ,/' .
/ /'
/' n ,‘m
n
,/,,'
,/
30-
v ,/Y
/" ./
ZO- ,'/ /"
/' /
IO-
A /
I I I I 0 1000 2000 3000 4000
Concentration [ng/cm2]
Fig. 2: Calibration curve of Cu on quartz fiber filter MK 370 for the X-DUST.
Most elements have a wide calibration range of about two orders of magnitude and a sufficient
coefficient of correlation.
Sampling
The first field experiment with the X-DUST was carried out between 22 and 24 of May in 1998 at the NORDDEUTSCHE AFFINERIE (NA). It is one of the biggest copper smelters in
Europe with 365.000 tons a year output of 99.99 % pure copper. The NA was founded in 1866
near downtown Hamburg (Germany) directly at the harbor. Additional products are, for
example, Ag, Au, Pt, Pb, Ni, Sb and last but not least, 750.000 tons a year of 98 % pure
sulfuric acid.
The sampling site was at the electric oven of the metal smelter directly behind a formation of tube filters. These tube filters are the first cleaning stage for separation of coarse particles. It is
essential to point out that the main cleaning facilities for the stack gases, like washers and different types of cyclones are installed behind our sampling site. So the results determined by
our sampling and analysis system listed in this paper are not the concentrations being released into the ambient air.
Within two days about 100 samples with sampling periods of 30 minutes were collected. The
sampling parameters are given in Table 2
Copyright(C)JCPDS-International Centre for Diffraction Data 2000, Advances in X-ray Analysis, Vol.42 47Copyright(C)JCPDS-International Centre for Diffraction Data 2000, Advances in X-ray Analysis, Vol.42 47ISSN 1097-0002
5/22/l 998 to 5/24/l 998
100
Tab. 2: Sampling parameters at the NORDDEUTSCHE AFFINERIE.
sampling date
number of samples sampling period
stack gas flow avrg. Stack gas velocity sampling volume filter diameter / area Temperature in stack gas
Temperature at heated titanium blocks
30 minutes 12500 m3/h
5.46 m/s 1.9 m3/h
30 mm / 7,069 cm2
78 “C
70 “C
The split sampling volume was about 950 liters within half an hour. This means a sample flow
of 1.9 m3/h obtained by isokinetic sampling using a probe with 10 mm in diameter. The stack
gas temperature was about 78 degrees centigrade and to prevent condensation on the filter material the temperature at the titanium blocks was set in advance to 70 degrees centigrade. After determination of the element concentrations by the integrated spectrometer the aerosol samples on the quartz fiber filter tape were automatically covered with a MYLAR foil to enable further investigations with other analytical methods.
RESULTS
In our laboratory all samples were punched out of the filter tape to reanalyze them with the
laboratory energy dispersive x-ray
fluorescence spectrometer X-LAB
(SPECTRO A.I.). To give an idea how
the MK 370 quartz fiber filter material
looks, Figure 3 displays one of the
aerosol loaded filters with a diameter of 30 mm. The structure on the filter surface results from the production
process of this material. Further
investigations by scanning electron
microscopy (SEM Model 44 CAM
SCAN, UK) were carried out, and in
Figure 4 a magnification of a MK 370 blank filter is given. The diameters of the quartz fibers are up to 1.5 urn and the fiber length can be up to
Fig. 3: Aerosol loaded filter MK 370 (32 mm in diameter)
centimeters. Figure 5 shows a
magnification of the aerosol loaded filter sample ,,NA21.49“ taken out of the stack gas channel
at the NORDDEUTSCHE AFFINERIE.
Copyright(C)JCPDS-International Centre for Diffraction Data 2000, Advances in X-ray Analysis, Vol.42 48Copyright(C)JCPDS-International Centre for Diffraction Data 2000, Advances in X-ray Analysis, Vol.42 48ISSN 1097-0002
Fig.4: 6000x magnification of MK 370 blank. Fig.5: 6000x magnification of ,,NA2 1.49“.
The optical single particle size is up to 1 microns but the single particles can accumulate to agglomerations with diameters of 1 urn to 10 urn. The particles were separated onto the filter
almost by impact processes and penetrated into the first 100 to 150 urn of the 650 urn thick
filter material. Figure 6 displays the two spectra of the same typical real filter sample from May 23 at 5:34 a.m. received by the X-DUST while using two different absorption filter materials
for optimum excitation of each element in one measuring method. First absorption lilter is a
MO-filter for excitation of K-lines from potassium to bromine and the L-line of lead using a measuring time of 700 seconds. Second one is a Ta-filter for excitation of K-lines from
palladium to barium using a measuring time of 1000 seconds. While analyzing this sample in the spectrometer, the next aerosol sample was taken out of the stack gas isokinetically and
precipitated on the filter material at the sampling position of the combined system.
Rh-tube, MO-filter, 30 kV, 10 mA
- _ -. . ,e Fig. 6: Two spectra ofthe same tilter sample trom May 23 at 5:34 a.m..
WI, , I , , , I I - ! ’ 2 4 6 8 10 12 14 16
energy [keV]
Rh-tube, Ta-filter, 50 kV, 6 mA
I
1adI , , , , 1 , , I I I, I- 10 12 14 16 18 20 22 24 26
energy[keV]
Industrial furnaces like metal smelters have to comply with the emission limits set by the technical advisory for air (TA-Luft) in the German law for toxic elements in the year 1986.
Table 3 gives the limits of emission (LOE) for different element groups in ug/m3. The
regulations classify the following elements and their compounds in three classes.
Copyright(C)JCPDS-International Centre for Diffraction Data 2000, Advances in X-ray Analysis, Vol.42 49Copyright(C)JCPDS-International Centre for Diffraction Data 2000, Advances in X-ray Analysis, Vol.42 49ISSN 1097-0002
The first class combines
cadmium, mercury,
thallium and their
compounds with a LOE
of 200 ug/m3. Second class is arsenic, cobalt,
nickel, selenium, tellurium and their compounds with a LOE of 1000 ug/m3. Last but not least, the LOE for the sum of
antimony, lead, chromium
copper, manganese and
their compounds with a value of 5000 ug/m3. The
calculated detection limits
given in Table 1 in ug/m3 are four to five orders of
magnitude below the limits of emission set in the German regulation
act.
Tab.3: TA-LuR (1986).
element group LOE [ug / m3] class I (by a mass flow 2 1 g/h) Cd, Hg, Tl and their compounds
total < 200
class II (by a mass flow 2 5 g/h) As, Co, Ni, Se, Te and their compounds
total < 1000
class III (by a mass flow 2 25 g/h) Sb, Pb, Cr, CN-, F-, Cu, Mn, Pt, Pd, Rh, V, Sn and their compounds
total < 5000
Emission of C” Monitored On-line by X-DUST
100
i 4 7.5
I/ 60
25
0 22 05.199806:ll 22.051998 1707 x3.05.1998 05:02 23.06.1998 16-58 24.05.1998 0‘154
date/time
Emission of C” Monitored Off-line by X-LAB
Figure 7 displays the results of the field experiment. First, the half
hour values for the
100
i g 75
50
25
copper concentration
determined ,,on-line“ by
the X-DUST during the
sampling period (May 22 5: 11 a.m. to 24 4:54 a.m.) are shown. The averaged
element concentration
over the entire sampling
period was about 50 ug/m3. Obviously there
are two high values, first on May 22 at 5:07 p.m., second on May 23 at 3 :56
0 22 05.1998 05’11 22.051998 ITO7 23.05.1998 05:02 23.05.1998 ,658 24 06.1998 0‘1-54
statelbime
lsoklnetlc Sampling Volume
2 E
,000
11 n _, ,/-\
900
\I+
h/v;- \ d
--J--
800 ‘/ i 1 I
700 4 I
600 22 05,998 05’11 22.05.1998 17:07 23.051998 05:02 2305.1998 16’56 24.05.1996 0‘154
dedtlme
Fig. 7: Results of the emitted Cu concentrations obtained by X-DUST and X-LAB; isokinetic sampling volume.
p.m. and there is a plateau in front of the higher value at May 22. For further evaluation of
Copyright(C)JCPDS-International Centre for Diffraction Data 2000, Advances in X-ray Analysis, Vol.42 50Copyright(C)JCPDS-International Centre for Diffraction Data 2000, Advances in X-ray Analysis, Vol.42 50ISSN 1097-0002
i 3 750 =L
500
250
0 552 l&m3 (X-
these results each filter sample was punched out of the quartz fiber filter tape and additional
analysis of these filter samples were carried out ,,off-line“ by the laboratory x-ray fluorescence spectrometer X-LAB in our institute. The concentrations obtained by the X-LAB spectrometer
are also given in Figure 7. The consequence was that there were obviously some missing filter samples caused by transportation problems of the sampling device. Because of these
transportation problems the same filter area was covered a few times and the spectrometer of the X-DUST analyzed the previous sample again and again. After a while the X-DUST restarted the transportation and finally moved the multiple covered filter area into the
spectrometer of the X-DUST resulting in higher values.
On May 23 around 4 pm another irregular Cu concentration was observed which cannot be
explained by a sampling error. We learned from the technical manager of the plant that this was
due to a change in the melting process. At the end of the copper melting process at 3 p.m. on
23 May the slag was removed. In order to do this, the oven needs to be shut down which is reflected in the isokinetic sampling volume from the stack gas channel registered by the X-
DUST (Figure 7). Restarting the process with a new batch of materials obviously causes short term releases of high Cu emissions.
More importantly though, the figures show very good agreement for the results obtained by X- DUST and X-LAB, even for low concentrations. The coefficient of correlation for both
analyzing sys- Emission of Elements in TA-Luft Class 3:
V, Cr, Mn, Cu, Sn, Sb, Rh, Pd, Pt, Pb; LOE: 5000 pg/m3 tems is 0.928
due to the great
difference be-
tween the results
for the very high
XDUST
X-LAB .__-.
loaded filter of sample
4047 ug/m3 (X-
DUST) com-
pared with
22.05.1998 05.11 22 05 1998 17:07 23.05.1998 05 02 23.05.1998 16:58 24 05 1998 04:54
date/time LAB). Figure 8 summarizes the emission rates
FIG. 8: Summarized values of emission tar class 3 elements. for all elements mentioned in
class 3 of the TA-Luft observed by the X-DUST and the X-LAB. The data agree well with the
production process. Besides controlling and measuring metal emission rates for regulatory
purposes the data can also be valuable in order to monitor critical steps of the production process and for trouble shooting.
Copyright(C)JCPDS-International Centre for Diffraction Data 2000, Advances in X-ray Analysis, Vol.42 51Copyright(C)JCPDS-International Centre for Diffraction Data 2000, Advances in X-ray Analysis, Vol.42 51ISSN 1097-0002
CONCLUSIONS
An automated monitoring system for emission sampling of stack gas aerosols was developed.
The combination of an isokinetic sampling device and nondestructive analyzing system by x-ray fluorescence analysis in one instrument was successfully tested at a stack gas channel of a copper smelter. The results of the X-DUST showed that this system allows the observation of
industrial furnaces for regulatory purposes and for trouble shooting.
The particles were precipitated ,,out of stack“ on a quartz fiber filter tape MK 370 with low
blanks and high resistance to hot and aggressive gases. Due to the nondestructive analyzing method the aerosol samples can be used for further analysis like SEM, AAS, ICP and so on. The detection limits of the X-DUST were sufficient for quantitative analysis at four to five orders of magnitude below the limits of emission set in the German regulation act.
ACKNOWLEDGEMENT
Many thanks to the DLR (Deutsche Forschungsanstalt fir Luft- und Raumfahrt eV) and the
BMBF (Bundes-Ministerium f%r Bildung und Forschung) for financial support.
REFERENCES
[l] Technische Anleitung zur Reinhaltung der Luft-TA Luft, Bonn 27.02.1986. (GMBI. S. 95)
[2] Bundes-Immissionsschutzgesetz-Verordnung, 17. BImSchV, Bundesminister fir Umwelt und Reaktorsicherheit, Bonn 23.11.1990. (BGBl. I s,2545,2832)(BGBl. III 2129-8-1-17)
[3] Revised Standards for Hazardous Waste Combustors. Proposed Rules. Fed. Regist. 61 (1996) 17357-17536
[4] M.D. Seltzer, Applied Spectroscopy, 52 (1998) 195-199
[5] A.M. Gomes, J.P. Sarrette, L. Madon, A. Almi, Spectrochimica Acta, Part B 51 (1996)1695-1705
[6] M.D. Seltzer, G. A. Meyer, Emviron. Sci. Technol., 31 (1997) 2665-2672
[7] T. Stahlschmidt, 0. Haupt, M. Schulz, W. Dannecker, Gefahrstofi Reinhaltung der Lz@; 58 (1998) 199-204
[S] 0. Haupt, B. Klaue, C. Schafer, W. Dannecker, X-Ray Spectrom. 24 (1995) 267
[9] 0. Haupt, C. Schafer, S. Strauss, W. Dannecker, Fresenius’Z. Anal. Chem. 355 (1996)375 [lo] M. Kriews, Ph. D. Thesis, University of Hamburg, Germany (1992)
[l l] J.D. Winefordner, G.L. Long, Anal. Chem., 55 (1983) 712-724
Copyright(C)JCPDS-International Centre for Diffraction Data 2000, Advances in X-ray Analysis, Vol.42 52Copyright(C)JCPDS-International Centre for Diffraction Data 2000, Advances in X-ray Analysis, Vol.42 52ISSN 1097-0002