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ADVANCED RECONSTRUCTION FOR ELECTRON MICROSCOPY SUHAS SREEHARI S. V. VENKATAKRISHNAN (VENKAT) CHARLES A. BOUMAN PURDUE UNIVERSITY AUGUST 15, 2014 1

ADVANCED RECONSTRUCTION FOR ELECTRON MICROSCOPYmuri.materials.cmu.edu/.../2014/08/Sreehari-Purdue-2014.pdf · 2014. 9. 11. · SUHAS SREEHARI S. V. VENKATAKRISHNAN (VENKAT) CHARLES

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Page 1: ADVANCED RECONSTRUCTION FOR ELECTRON MICROSCOPYmuri.materials.cmu.edu/.../2014/08/Sreehari-Purdue-2014.pdf · 2014. 9. 11. · SUHAS SREEHARI S. V. VENKATAKRISHNAN (VENKAT) CHARLES

ADVANCED RECONSTRUCTION FOR ELECTRON MICROSCOPY

SUHAS SREEHARI S. V. VENKATAKRISHNAN (VENKAT) CHARLES A. BOUMAN PURDUE UNIVERSITY AUGUST 15, 2014

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Page 2: ADVANCED RECONSTRUCTION FOR ELECTRON MICROSCOPYmuri.materials.cmu.edu/.../2014/08/Sreehari-Purdue-2014.pdf · 2014. 9. 11. · SUHAS SREEHARI S. V. VENKATAKRISHNAN (VENKAT) CHARLES

OUTLINE

1.  Overview of MBIR 2.  Previous work 3.  Leading to advanced prior models 4.  The denoising problem 5.  Non-local means 6.  Rotationally-invariant non-local means (proposed

method) 7.  Results 8.  Conclusion and on-going work

Future directions

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Page 3: ADVANCED RECONSTRUCTION FOR ELECTRON MICROSCOPYmuri.materials.cmu.edu/.../2014/08/Sreehari-Purdue-2014.pdf · 2014. 9. 11. · SUHAS SREEHARI S. V. VENKATAKRISHNAN (VENKAT) CHARLES

1. OVERVIEW OF MBIR

φ

Prior Model:

p(x) Forward model : h(.)

Physical system

Difference

x̂, φ̂

y

h(x,φ)

x

Optimization engine

x̂, φ̂( )← argmaxx,φ

p x,φ y( ){ }= argminx, φ

− log p y x,φ( )− log p x( ){ }

1. p y x,φ( ) : Likelihood

2. p(x) : Prior Model

Iteratively update the parameters to minimize a cost function.

p(.) : Probability density function

3

Likelihood Prior

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2. PREVIOUS WORK

The next few slides pertaining to the previous work are courtesy of S. V. Venkatakrishnan (Venkat) who sends his

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x (nm)

y (n

m)

100 200 300

50

100

150

200

250

300

350

MBIR FOR HAADF-STEM TOMOGRAPHY*

Displayed slice

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•  Polystyrene functionalized titanium dioxide nanoparticles**

•  87 tilts from -70° to +70°

Data at zero tilt

*S. Venkatakrishnan, L. Drummy, M. Jackson, M. De Graef, J. Simmons, and C. Bouman, “A model based iterative reconstruction algorithm for high angle annular dark field - scanning transmission electron microscope (HAADF- STEM) tomography,” IEEE Trans. on Image Processing, Nov. 2013.

x (nm)

y (n

m)

100 200 300

50

100

150

200

250

300

350140

160

180

200

220

240

x (nm)

y (n

m)

100 200 300

50

100

150

200

250

300

350 −1000

−500

0

500

1000

1500

x (nm)

y (n

m)

100 200 300

50

100

150

200

250

300

350

2

4

6

8

x 10−5x

y

FBP SIRT MBIR

Page 6: ADVANCED RECONSTRUCTION FOR ELECTRON MICROSCOPYmuri.materials.cmu.edu/.../2014/08/Sreehari-Purdue-2014.pdf · 2014. 9. 11. · SUHAS SREEHARI S. V. VENKATAKRISHNAN (VENKAT) CHARLES

MBIR FOR BF-(S)TEM TOMOGRAPHY*

FBP Conventional MBIR Proposed MBIR

x

*S. Venkatakrishnan, L. Drummy, M. Jackson, M. De Graef, J. Simmons, and C. Bouman, “Model based iterative reconstruction for bright field electron tomography,” under review IEEE Trans. on Image Processing.

x

y

•  Aluminum nanoparticles in a carbon matrix

•  36 tilts from -70° to +70°

Data at zero tilt

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Page 7: ADVANCED RECONSTRUCTION FOR ELECTRON MICROSCOPYmuri.materials.cmu.edu/.../2014/08/Sreehari-Purdue-2014.pdf · 2014. 9. 11. · SUHAS SREEHARI S. V. VENKATAKRISHNAN (VENKAT) CHARLES

MBIR FOR LOW-DOSE TOMOGRAPHY*

7 *S. Venkatakrishnan, L. Drummy, M. Jackson, M. De Graef, J. Simmons, and C. Bouman, “Model based iterative reconstruction for low-dose electron tomography,” Microscopy and Microanalysis 2014 (Presidential Scholar Award)

Data at zero tilt •  Ferritin – protein

used for iron storage

•  Sample degrades when exposed to a high electron-dose

FBP Proposed MBIR x

y

Page 8: ADVANCED RECONSTRUCTION FOR ELECTRON MICROSCOPYmuri.materials.cmu.edu/.../2014/08/Sreehari-Purdue-2014.pdf · 2014. 9. 11. · SUHAS SREEHARI S. V. VENKATAKRISHNAN (VENKAT) CHARLES

3. LEADING TO ADVANCED PRIOR MODELS

•  MBIR for tomography – use of “simple” Markov Random Field priors.

•  Using advanced image models – enable improved reconstruction quality/ reduce data collected.

•  Can reduce collection times and sample damage for bio-imaging.

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Page 9: ADVANCED RECONSTRUCTION FOR ELECTRON MICROSCOPYmuri.materials.cmu.edu/.../2014/08/Sreehari-Purdue-2014.pdf · 2014. 9. 11. · SUHAS SREEHARI S. V. VENKATAKRISHNAN (VENKAT) CHARLES

CHALLENGES INVOLVED IN ADVANCED PRIOR MODELING

•  Choice of prior effects choice of optimization algorithm for MBIR – tight coupling of forward and prior model.

•  Tremendous progress in simple inverse problem – denoising - using advanced “priors” based on non-local similarities in images.

•  But we have no clear algorithmic framework to use these advanced denoising techniques in applications like tomography.

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Page 10: ADVANCED RECONSTRUCTION FOR ELECTRON MICROSCOPYmuri.materials.cmu.edu/.../2014/08/Sreehari-Purdue-2014.pdf · 2014. 9. 11. · SUHAS SREEHARI S. V. VENKATAKRISHNAN (VENKAT) CHARLES

SOLUTION: PLUG-AND-PLAY PRIORS+

Invert based on forward model and a “simple” quadratic regularizer –

De-noise based on advanced prior

Converged No

Yes

y : Data

x̂x̂ +u

v̂ − u

u : Intermediate variablex : Volume to reconstructλ : Forward model regularization parameterβ :Denoising parameter

u = u+ (x̂ − v̂)

To plug in prior - design denoising routine using that

prior!

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(β )

λ

+ Singanallur V. Venkatakrishnan, Charles A. Bouman, and Brendt Wohlberg, “Plug-and-Play Priors for Model Based Reconstruction”, Proceedings of IEEE GlobalSIP, Dec 3rd – 5th, 2013

Page 11: ADVANCED RECONSTRUCTION FOR ELECTRON MICROSCOPYmuri.materials.cmu.edu/.../2014/08/Sreehari-Purdue-2014.pdf · 2014. 9. 11. · SUHAS SREEHARI S. V. VENKATAKRISHNAN (VENKAT) CHARLES

4. THE DENOISING PROBLEM •  General inverse problem:

Estimating x from y = Ax + w. •  Denoising problem (A = I; w: AWGN; GGMRF prior):

Estimating x from y = x + w.

•  MAP estimate for x:

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x̂ = argminx≥0

12σW

2 y− x2

2+1pσ x

p gi, j xi − x jp

{i, j}∈C∑

%&'

('

)*'

+'

Design parameter, p = 1.05

− log p(y | x) = 12σW

2 y− x2

2

− log p(x) = 1pσ x

p gi, j xi − x jp

{i, j}∈C∑

σW : Noise Std. Deviationσ x : Regularization parameter

Page 12: ADVANCED RECONSTRUCTION FOR ELECTRON MICROSCOPYmuri.materials.cmu.edu/.../2014/08/Sreehari-Purdue-2014.pdf · 2014. 9. 11. · SUHAS SREEHARI S. V. VENKATAKRISHNAN (VENKAT) CHARLES

5. NON-LOCAL MEANS (NLM) DENOISING Basic idea: •  NLM filtering takes mean of all pixels in the image, weighted

by how similar these pixels (and their neighborhoods) are to the target pixel (and its neighborhood). [1]

Advantage:

•  Works great when there are repeating structures. Most images have plenty of similarities within themselves.

Drawbacks:

•  Patch match computation is very expensive. 3D implementation can be unreasonably slow (about 8 hours to denoise 50×50×50 volume).

•  It is not rotationally invariant.

12 Animation: http://josephsalmon.eu/

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NLM IMPLEMENTATION Implementation:

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NLM Filtering: x̂i =wijyj

j∈S∑

wijj∈S∑

Notation :yi : Pixel being denoised.Pi :N ×N neighborhood patch around the pixel ("reference patch")S : Set of all pixels.

Reference patch is compared with all other patches, PjEvery pixel, yi, is then weighted as a function of how much its neighborhood Pj matches with Pi.

Weight computation equation: wij = exp −Pi −Pj 2

2

h2

%

&

''

(

)

**

Page 14: ADVANCED RECONSTRUCTION FOR ELECTRON MICROSCOPYmuri.materials.cmu.edu/.../2014/08/Sreehari-Purdue-2014.pdf · 2014. 9. 11. · SUHAS SREEHARI S. V. VENKATAKRISHNAN (VENKAT) CHARLES

6. ROTATIONALLY-INVARIANT NON-LOCAL MEANS (RINLM) Motivation: Regular NLM does not see that the patches in these boxes are exactly the same as the shape outside the boxes. Our solution: Use rotated versions of the patches to see if they match the patch around the target pixel.

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NLM VS. RINLM: AN ILLUSTRATION

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Weight assigned in (i) NLM = 4.9997e-04, (ii) RINLM = 1.63e-02. Weight assigned in RINLM / Weight assigned in NLM = 32.6897

Page 16: ADVANCED RECONSTRUCTION FOR ELECTRON MICROSCOPYmuri.materials.cmu.edu/.../2014/08/Sreehari-Purdue-2014.pdf · 2014. 9. 11. · SUHAS SREEHARI S. V. VENKATAKRISHNAN (VENKAT) CHARLES

CHALLENGES WITH ROTATION Two major problems: •  In traditional literature, each patch is rotated Q – 1

times, where Q is the total number of pixels in the image.

•  For each of those rotation pursuits, every possible angle has to be tried – to see the best match.

Max. total rotational effort in the naïve case: 360(Q-1) rotations + 360(Q-1) norm computations!

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SOLUTION: PRE-ROTATION

Idea: Pre-rotate each patch in the image in a pre-specified way. •  Each patch is binarized (to separate foreground from

background) and “Center of Mass” (CoM) is computed for each patch.

•  The original patch is rotated so that the CoM lies on the negative y-axis. This way all similar shapes are aligned after the pre-rotation step.

Advantage: Each patch has to be rotated only ONCE.

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CoMi =

i.yiji, j∑

yiji, j∑

; CoM j =

j.yiji, j∑

yiji, j∑

yij is the (i, j)th pixel of the patch to be rotated.

Page 18: ADVANCED RECONSTRUCTION FOR ELECTRON MICROSCOPYmuri.materials.cmu.edu/.../2014/08/Sreehari-Purdue-2014.pdf · 2014. 9. 11. · SUHAS SREEHARI S. V. VENKATAKRISHNAN (VENKAT) CHARLES

“CENTER OF MASS” ALIGNMENT

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y

x

y

x

Page 19: ADVANCED RECONSTRUCTION FOR ELECTRON MICROSCOPYmuri.materials.cmu.edu/.../2014/08/Sreehari-Purdue-2014.pdf · 2014. 9. 11. · SUHAS SREEHARI S. V. VENKATAKRISHNAN (VENKAT) CHARLES

PRE-ROTATION ILLUSTRATION

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Before pre-rotation

After pre-rotation

Page 20: ADVANCED RECONSTRUCTION FOR ELECTRON MICROSCOPYmuri.materials.cmu.edu/.../2014/08/Sreehari-Purdue-2014.pdf · 2014. 9. 11. · SUHAS SREEHARI S. V. VENKATAKRISHNAN (VENKAT) CHARLES

7A. RESULTS: PHANTOM Phantom: super ellipses Super ellipses model certain structures in materials closely[2].

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Size: 256x256 pixels Type: 8-bit gray-level Background gray level: 100 Foreground gray level: 200

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Noisy image Std. Dev. = 10

GGMRF (p = 1.05) RMSE = 4.6764

NLM (N = 9, h = 39) RMSE = 3.9913

Case 1: Low noise level (Std. Dev. = 10)

N is the side length of the patch.

RINLM (N = 9, h = 39) RMSE = 3.2880

K-SVD RMSE = 3.8096

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Noisy image Std. Dev. = 22.67

GGMRF (p = 1.05) RMSE = 13.0669

Case 2: Medium noise level (Std. Dev. = 22.67)

NLM (N = 5, h = 48) RMSE = 9.3443

RINLM (N = 5, h = 48) RMSE = 7.1974

K-SVD RMSE = 7.7943

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GGMRF (p = 1.05) RMSE = 21.8152

Noisy image Std. Dev. = 35

NLM (N = 5, h = 61) RMSE = 14.2237

Case 3: High noise level (Std. Dev. = 35)

RINLM (N = 5, h = 61) RMSE = 10.2308

K-SVD RMSE = 12.5512

Page 24: ADVANCED RECONSTRUCTION FOR ELECTRON MICROSCOPYmuri.materials.cmu.edu/.../2014/08/Sreehari-Purdue-2014.pdf · 2014. 9. 11. · SUHAS SREEHARI S. V. VENKATAKRISHNAN (VENKAT) CHARLES

7B. RESULTS: PHANTOM WITH SYMMETRIES Phantom: snowflakes Snowflakes embody symmetry and fine structure.

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Size: 256x256 pixels Type: 8-bit gray-level Background gray level: 56 Foreground gray level: 200

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Noisy image Std. Dev. = 20

Noise Std. Dev. = 20

K-SVD RMSE = 12.8670

RINLM (N = 5, h = 48) RMSE = 8.6697

NLM (N = 5, h = 48) RMSE = 10.1690

Page 26: ADVANCED RECONSTRUCTION FOR ELECTRON MICROSCOPYmuri.materials.cmu.edu/.../2014/08/Sreehari-Purdue-2014.pdf · 2014. 9. 11. · SUHAS SREEHARI S. V. VENKATAKRISHNAN (VENKAT) CHARLES

7C. RESULTS: NATURAL IMAGE Image: Cameraman

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Size: 256x256 pixels Type: 8-bit gray-level

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Noisy image Std. Dev. = 20

GGMRF (p = 1.05) RMSE = 12.1717

NLM (N = 9, h = 83) RMSE = 10.2821

RINLM (N = 9, h = 83) RMSE = 7.9606

Medium noise level (Std. Dev. = 20)

KSVD RMSE = 9.9874

Page 28: ADVANCED RECONSTRUCTION FOR ELECTRON MICROSCOPYmuri.materials.cmu.edu/.../2014/08/Sreehari-Purdue-2014.pdf · 2014. 9. 11. · SUHAS SREEHARI S. V. VENKATAKRISHNAN (VENKAT) CHARLES

8. CONCLUSION & ON-GOING WORK •  Patch-based methods show a lot of promise when applied as

prior models, specially when there are repeating patterns in the image.

•  NLM/RINLM are not typically set up as optimization problems. Therefore, we need to employ ADMM-based methods (like the Plug-and-Play framework) to use them for tomography in electron microscopy.

•  Ongoing work:

•  Further speed-up techniques for extending RINLM to 3D. •  Applying RINLM as a prior model (within the Plug-and-

Play framework) for tomographic applications.

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Page 29: ADVANCED RECONSTRUCTION FOR ELECTRON MICROSCOPYmuri.materials.cmu.edu/.../2014/08/Sreehari-Purdue-2014.pdf · 2014. 9. 11. · SUHAS SREEHARI S. V. VENKATAKRISHNAN (VENKAT) CHARLES

FUTURE DIRECTIONS •  Cryo-Electron Microscopy to Cryo-Electron

Tomography: Finding a balance between Cryo-EM reconstruction and tomographic reconstruction, use a tilt sequence to reconstruct a single particle à we can make use of additional constraints for better reconstruction as a result of all foreground shapes in a 2D slice resulting from different orientations of one master particle.

•  Try to fuse separate models for background (like MRF-based) and foreground (dictionary learning based) à this helps achieve dimensionality reduction.

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Page 30: ADVANCED RECONSTRUCTION FOR ELECTRON MICROSCOPYmuri.materials.cmu.edu/.../2014/08/Sreehari-Purdue-2014.pdf · 2014. 9. 11. · SUHAS SREEHARI S. V. VENKATAKRISHNAN (VENKAT) CHARLES

(EXTERNAL) REFERENCES [1] A. Buades, B. Coll, and J-M. Morel, “A non-local algorithm for image denoising,” Computer Vision and Pattern Recognition, 2005 2: 60–65. [2] H. Zhao and M.L. Comer, “Marked Point Process Models for Materials Microstructures,” MURI report, July 2013. [3] M. Aharon, M. Elad, and A.M. Bruckstein, “The K-SVD: An Algorithm for Desioning of Overcomplete Dictionaries for Sparse Representation”, IEEE Trans. On Signal Processing, Vol. 54, no. 11, pp. 4311-4322, November 2006.

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Thank you!

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