ABC130 ASIC Total Ionizing Dose Irradiation Campaign: Project … · 2018. 11. 19. · Introduction - The ATLAS Semiconductor Tracker Nicholas Quirk ABC130 TID Testing 10 Dec 2015

Nicholas QuirkUniversity of Michigan, Georgetown University

Supervisor: Prof. Richard Teuscher (University of Toronto)

With Dr. Nicola Venturi (University of Toronto) and Kyle Cormier (University of Toronto)

ABC130 ASIC Total Ionizing Dose Irradiation Campaign: Project Summary and Preliminary Results

10 December 2015

• One of three parts of the ATLAS Inner Detector

• Reconstructs particle tracks through silicon interaction in over six million read

out channels

• Over 200,000 read out chips in current SCT

Introduction - The ATLAS Semiconductor Tracker

2Nicholas Quirk ABC130 TID Testing 10 Dec 2015

ATLAS Detector SCT Stave and Petal ModulesATLAS Inner Detector

• In 2025 the integrated luminosity of the LHC will increase ten-fold to 3000 fb-1 for the upgrade to the HL-LHC

• More than five times the pile-up in this higher radiation environment

• SCT and Transition Radiation Tracker (TRT) will not withstand this radiation and by then will have reached the end of their lifetimes

• Higher luminosity means that the new electronics must be more radiation-hard, faster and more powerful

Introduction - ATLAS Phase-II Upgrade


Pile-up at the LHC

• 256-channel read out chip that uses 130 nm Complimentary Metal Oxide (CMOS) technology

• Designed to be more radiation-hard, smaller, and have higher granularity than the current SCT ASICs

• Same number of ABC130’s will process 70 million more channels

The ABC130 Application-Specific Integrated Circuit (ASIC)


Semiconductor tracker particle interaction

• Ionizing energy changes SiO2 characteristics; electron hole pairs do not recombine as quickly, holes get trapped at defect centers and at the Si-SiO2 interface

• Defects cause leakage current and change

threshold voltage of transistors

• Annealing depends on temperature and

dose rate

Total-Ionizing Dose Tests-Background


• This summer ATLAS Toronto did ABC130 TID tests at ambient temperature with a 2.2 Mrad/hr dose rate (X-ray)

• Noticed a very large digital current increase in

the first few Mrad of accumulated dose but set

current limit so as not to destroy chip

• As total dose increased the current diminished

to the baseline level

First Irradiation Tests - August 2015


Plan for secondary TID testing campaign


• Same X-ray machine as August tests

• Main Goal: Low Dose Rate, Low Temperature Measurements

• Secondary objectives: Check for hot spots with thermal camera, view effect of short term annealing, follow up on pre-irradiated chip

• Solid state thermo-electric devices that can produce temperature differences of ~60 C with little power consumption

• The efficiency of the cold side depends on the heat dissipation of the hot side.

• For TID set-up used two Peltier modules in series on a metal chuck cooled to 6 C to achieve a stable low temperature of -30 C

Peltier Module Cooling Set-Up


Cooled chip card on chuck (Peltiers underneath)

Example Peltier Module

• Designed a graphical user interface to monitor the power levels and temperature

• Runs scans and controls data logging

for easy post-test analysis

• Henceforth all testing can be done

remotely and can be sustained for

long irradiation cycles (for very low

dose rates)

TID Testing Logging and Monitoring Interface


X-ray Facility Set-Up for November TID tests


X-ray source in Building 14Contained cabinet supplied with dry air

Cooling effects of Peltier/chuck set-up in X-ray cabinet for low dose tests

Chip aligned to X-ray source and dose rate configured

Currents vs. TID 62 krad/h, T ~-15C

• Expected increase seen in digital currents

• Analog currents almost constant

Results-Low Temperature Low Dose Rate


Gain vs. TID 62 krad/h, T ~-15C

• Gain and Threshold Voltage decrease with accumulated dose



Noise vs. TID 62 krad/h, T ~-15C

• Noise increases with TID



Gain vs. TID 2.25 Mrad/hr

~30 C ~-18 C

• Both decrease in first few Mrad and return to initial levels with increasing TID

Results-High Dose Rate Temperature Comparison


Voltage Threshold vs. TID 2.25 Mrad/hr

~30 C ~-18 C

• Vt-50 measurements show similar behavior to gain

Results-High Dose Rate Temperature Comparison


~-18 C

• Injected charge of 1.5 fC

Results-Dose Rate Comparison at Low Temperature


Noise Plots ~-18 C

• Low dose rate trend closely follows high dose rate trend

Results-Dose Rate Comparison at Low Temperature


Results-Digital Current Comparison


Summer Tests: 2.25 Mrad/hr, 30 C

November Tests: Temperature and Dose Rate Comparisons

• Do another low temperature, low dose test with only a few krad/hr and at a colder temperature, trying to make conditions as close as possible to those during the operation of the Inner Detector

• Use our results and those of future tests to aid in the final design of the SCT read out ASIC for the Phase-II upgrade

• Share our cooling techniques and chip monitoring software with ITk partners

Investigating these low

dose radiation sources at CERN:

(Présvessin)

Plans from here


RP Calibration Hall, Cobalt-60 GIF++, Cesium-137

This has been a fabulous experience and thanks to Dr. Steven Goldfarb, Dr. Jean Krisch and Dr. Thomas Schwarz for making it happen.

Also, I give my greatest thanks to my mentor Prof. Richard Teuscher and my Total-Ionizing Duo Nicola and Kyle. They really made this special and gave my work real meaning.

Finally, thank you to Dr. Edward Van Keuren of Georgetown University for supporting my experience at CERN with credit for an independent study course at Georgetown and for maintaining a lively interest in our weekly technical correspondence.

Also, thank you Madame Valery Gouteaux, elle est le meilleur professeur de français dans le monde!


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Extra Slides

Nicholas Quirk ABC130 TID Testing 10 Dec 2015

Results-Strobe Delay Comparison


Low Temperature Low Dose Low Temperature High Dose

• Re-irradiated chip used in summer testing (77 Mrad accumulated dose) to a few Mrad to see long-term annealing effect: no significant increase in currents (few mA)

• Took thermal images of the chip at TID-induced current peak (room temperature): showed no unforeseen hotspot

Other Results


Thermal image of an ABC130 when the peak current had been

reached during a high dose, ambient temperature test:

Documents

ABC130 ASIC Total Ionizing Dose Irradiation Campaign: Project … · 2018. 11. 19. · Introduction - The ATLAS Semiconductor Tracker Nicholas Quirk ABC130 TID Testing 10 Dec 2015