2222ndnd IEEE VLSI Test IEEE VLSI Test SymposiumSymposium(VTS 2004)(VTS 2004)

Napa Valley, CANapa Valley, CA

Welcome MessageWelcome Message

André IvanovAndré Ivanov

General ChairGeneral Chair

Keynote AddressKeynote Address

Ulrich SeifUlrich SeifSenior VP & Chief Information Officer Senior VP & Chief Information Officer

National SemiconductorNational Semiconductor

Program Program IntroductionIntroduction

Irith PomeranzIrith Pomeranz

Program ChairProgram Chair

The VTS ContentsThe VTS Contents Technical Paper SessionsTechnical Paper Sessions Special SessionsSpecial Sessions Innovative Practices TrackInnovative Practices Track

Technical Paper SelectionTechnical Paper Selection

Expert reviewers recommended by Expert reviewers recommended by the program committeethe program committee

At least three reviews for every At least three reviews for every submitted papersubmitted paper

Multi-site program committee Multi-site program committee meeting (Fremont, CA; Princeton, meeting (Fremont, CA; Princeton, NJ; Stuttgart, Germany)NJ; Stuttgart, Germany)

ThanksThanks 38 program committee members38 program committee members 13 organizing committee member13 organizing committee member 7 steering committee members7 steering committee members 237 reviewers237 reviewers 747 reviews747 reviews

Special ThanksSpecial Thanks Program committee membersProgram committee members

Hans ManhaeveHans Manhaeve Subhasish MitraSubhasish Mitra Sudhakar ReddySudhakar Reddy

Organizing committee membersOrganizing committee members Pritha RoyPritha Roy Burnie WestBurnie West

Technical Paper SessionsTechnical Paper SessionsTest Data Compression & Low-Speed ATEMemory Testing I,II Issues in Reliability

Logic BISTMEMs Testing and FPGA Testing

Wireless and System Testing

Current Based Testing

SoC Testing

Pattern Debug, Yield Analysis and FPGA Testing

Low-Voltage and Thermal Testing

Defect-Oriented Testing

Defect Analysis and Fault Simulation

DelayTesting

Analog Testing I,II,III

IP TrackIP Track Silicon Debug and DiagnosisSilicon Debug and Diagnosis Test and Repair of Large Memory SystemsTest and Repair of Large Memory Systems Test CompressionTest Compression Latest Results in Wireless TestLatest Results in Wireless Test SoC Test Practice in JapanSoC Test Practice in Japan Leading Edge Practices for Yield Leading Edge Practices for Yield

EnhancementEnhancement Optimizing Manufacturing ProcessOptimizing Manufacturing Process

Special SessionsSpecial Sessions Embedded Tutorials:Embedded Tutorials:

Challenges in Embedded Memory Test and DiagnosisChallenges in Embedded Memory Test and Diagnosis Advances in Wafer Probe TestAdvances in Wafer Probe Test Reliability and DependabilityReliability and Dependability Design for YieldDesign for Yield Design for ManufacturabilityDesign for Manufacturability

Hot Topics:Hot Topics: Testing of Nanocircuits with High Defect DensitiesTesting of Nanocircuits with High Defect Densities Advances in 3D PackagingAdvances in 3D Packaging Software Based Embedded TestSoftware Based Embedded Test

Panels:Panels: Elevator TalksElevator Talks Process Variation: How Severe is the Problem of D&T?Process Variation: How Severe is the Problem of D&T? Defect-Based Testing and Burn-In: A Test Solution for Scaled Defect-Based Testing and Burn-In: A Test Solution for Scaled

Technology?Technology?

Invited KeynoteInvited Keynote

Kamalesh RuparelKamalesh RuparelSenior DirectorSenior Director

Cisco SystemsCisco Systems

TTTC Ned Kornfield TTTC Ned Kornfield Memorial Memorial

PresentationPresentation

Yervant ZorianYervant Zorian

TTTC Senior Past ChairTTTC Senior Past Chair

AwardsAwards

TTTC Naveena Nagi TTTC Naveena Nagi AwardAward

TTTC Most Successful TTTC Most Successful Technical Meeting Technical Meeting

AwardAward

TTTC Most Populous TTTC Most Populous Technical Meeting Technical Meeting

AwardAward

VTS 2003 Best Paper VTS 2003 Best Paper AwardAward

VTS 2003 Best Panel VTS 2003 Best Panel AwardAward

VTS 2003 Best IP VTS 2003 Best IP Session AwardSession Award