2011 Apr Pub Digest

7/29/2019 2011 Apr Pub Digest

1/20

PUBLICATIONS CONTENTS

DIGEST

APRIL 2011


2/20

IEEE Communications Ma

IEEE Communications Society periodicals tables of content:April 2011

Direct links to magazine and journal abstracts and full paper pdfs via IEEE Xplore

ComSoc Vice President - Publications - Len CiminiDirector - Journals Larry GreensteinDirector - Magazines - Andrzej Jajszczyk

Magazine Editors

EIC, IEEE Communications Magazine - Steve GorsheEIC, IEEE Network Magazine - Tom ChenEIC, IEEE Wireless Communications Magazine - Michael FangAEIC, IEEE Wireless Communications Magazine - Dilip KrishnaswamyEditor, The Global Communications Newsletter- Stefano BregniEditor, Design and Implementation Series - Sean MooreArea Co-Editors, Optical Communications Series - Hideo Kuwahara | Osman Gebiziligoglu | Vijay Jain | John SpencerArea Editor, Radio Communications - Joseph Evans | Zoran Zvon

Journal EditorsEIC, IEEE Transactions on Communications - Michele ZorziEIC, IEEE Journal on Selected Areas In Communications (J-SAC) - Martha SteenstrupCo-EIC, IEEE/OSA Journal of Optical Communications & Networking (JOCN) - Vincent Chan

EIC, IEEE/ACM Transactions on Networking- Roch GuerinEIC, IEEE Communications Letters - Sarah Kate WilsonEIC, IEEE Transactions on Network & Service Management (TNSM) - Raouf BoutabaEIC, IEEE Transactions on Wireless Communications - Chengshan XiaoEIC, IEEE Journal of Communications & Networks (JCN) - Ezio BiglieriEditor, IEEE Communications Surveys & Tutorials - Nelson FonsecaMembers of Steering Committees for Co-Sponsored JournalsSteering Committee, IEEE/OSA Journal of Lightwave Technology- Karen Liu | Pat TrischittaSteering Committee, IEEE/OSA Journal of Optical Communications & Networking- Nim Cheung | Hideo KuwaharaSteering Committee, IEEE/ACM Transactions Networking- Victor Frost (Chair) | Marco Ajmone Marsan | IzhakRubinSteering Committee, IEEE Transactions on Mobile Computing- Tom La Porta(Chair) | Chiara PetrioliSteering Committee, IEEE Transactions on Multimedia - Byeong Gi Lee | Wenjun Zeng | Qian ZhangSteering Committee, Transactions on Wireless Communications - Zhi Ding (Chair) | Andrea Goldsmith | KhaledLetaief | Ted Rappaport

Submission and editorial instructions can be found on each publications home page.

For IEEE Communications Society membership and subscription information, please visit www.comsoc.org

IEEE Communications Society3 Park Avenue

New York, NY 10016 USA212 705 8900
http://www.comsoc.org/http://www.comsoc.org/http://www.comsoc.org/http://www.comsoc.org/


3/20

IEEE Communications Magazine CoverFull Text:PDF(178KB)

Table of contents Full Text:PDF(197KB)

ComSoc technical committees and emerging technologies[The President's Page]Lee, B.G. Karol, M. Ohta, N.

Abstract| Full Text:PDF(412KB)

WCET news briefs [Certification Corner]Frantz, R. Abstract| Full Text:PDF(1517KB)

Conference calendarAbstract| Full Text:PDF(964KB)Early T-carrier historyAndrews, F.T.


New productsAbstract| Full Text:PDF(61KB)Society members named to fellow grade [Society News]


Recent progress in machine-to-machine communicationsHu, R.Q. Yi Qian Hsiao-Hwa Chen Jamalipour, A.


GRS: The green, reliability, and security of emerging machineto machine communicationsLu, R. Li, X. Liang, X. Shen, X. Lin, X.


M2M: From mobile to embedded internetWu, G. Talwar, S. Johnsson, K. Himayat, N. Johnson, K.D.


Home M2M networks: Architectures, standards, and QoSimprovementZhang, Y. Yu, R. Xie, S. Yao, W. Xiao, Y. Guizani, M.


Machine-to-machine communications for home energymanagement system in smart gridNiyato, D. Xiao, L. Wang, P.


Toward intelligent machine-to-machine communications insmart gridFadlullah, Z.Md. Fouda, M.M. Kato, N. Takeuchi, A. Iwasaki,

N. Nozaki, Y.Abstract| Full Text:PDF(794KB)

Toward ubiquitous massive accesses in 3GPP machine-to-machine communicationsShao-Yu Lien Kwang-Cheng Chen Yonghua Lin


Recent advances in IETF standardsQuittek, J. Touch, J.


The coming of age of MPLS

Winter, R.Abstract| Full Text:PDF(134KB)

Stream control transmission protocol: Past, current, and futurestandardization activitiesDreibholz, T. Rathgeb, E.P. Rungeler, I. Seggelmann, R.Tuxen, M. Stewart, R.R.


An introduction to IP flow information export (IPFIX)Trammell, B. Boschi, E.


Internet geolocation and location-based servicesBarnes, R. Winterbottom, J. Dawson, M.


Topics in integrated circuits for communicationsChien, C. Xu, Z. Molloy, S.


Greendroid: Exploring the next evolution in smartphoneapplication processorsSwanson, S. Taylor, M.B.


Single-element and phased-array transceiver chipsets for 60-ghz Gb/s communicationsValdes-Garcia, A. Reynolds, S. Natarajan, A. Dong KamDuixian Liu Jie-Wei Lai Huang, Y.-L.O. Ping-Yu Chen Ming-Da Tsai Zhan, J.-H.C. Nicolson, S. Floyd, B.


Equalization techniques for nonlinear analog circuitsChiu, Y.


Worse-than-Rayleigh fading: Experimental results andtheoretical modelsMatolak, D.W. Frolik, J.


QoX: What is it really?Stankiewicz, R. Cholda, P. Jajszczyk, A.


Is the PHY layer dead?Dohler, M., Heath R.W., Lozano A., Papadias C.B., Valenzuela R.A.


Mobile video delivery with HTTPMa, K.J. Bartos, R. Bhatia, S. Nair, R.Abstract| Full Text:PDF(268KB)

Advertisers' indexAbstract| Full Text:PDF(63KB)

Connecting low-power and lossy networks to the internetJeonggil Ko Terzis, A. Dawson-Haggerty, S. Culler, D.E. Hui,J.W. Levis, P.

http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5741134http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5741134http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5741134http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5741135http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5741135http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5741135http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741136http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741136http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741136http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741136http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741136http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5741136http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5741136http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5741136http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741137http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741137http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741137http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741137http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5741137http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5741137http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5741137http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741138http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741138http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741138http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741138http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5741138http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5741138http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5741138http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741139http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741139http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741139http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741139http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5741139http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5741139http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5741139http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741140http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741140http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741140http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741140http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5741140http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5741140http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5741140http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741141http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741141http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741141http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741141http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5741141http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5741141http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5741141http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741142http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741142http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741142http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741142http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5741142http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5741142http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5741142http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741143http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741143http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741143http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741143http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741143http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5741143http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5741143http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5741143http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741144http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741144http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741144http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741144http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5741144http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5741144http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5741144http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741145http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741145http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741145http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741145http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741145http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5741145http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5741145http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5741145http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741146http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741146http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741146http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741146http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741146http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5741146http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5741146http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5741146http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741147http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741147http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741147http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741147http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741147http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5741147http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5741147http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5741147http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741148http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741148http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741148http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741148http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741148http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5741148http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5741148http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5741148http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741149http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741149http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741149http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741149http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5741149http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5741149http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5741149http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741150http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741150http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741150http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741150http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5741150http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5741150http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5741150http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741151http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741151http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741151http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741151http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741151http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5741151http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5741151http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5741151http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741152http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741152http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741152http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741152http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5741152http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5741152http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5741152http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741153http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741153http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741153http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741153http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5741153http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5741153http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5741153http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741154http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741154http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741154http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741154http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5741154http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5741154http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5741154http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741155http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741155http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741155http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741155http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741155http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5741155http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5741155http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5741155http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741156http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741156http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741156http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741156http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741156http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5741156http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5741156http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5741156http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741157http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741157http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741157http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741157http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5741157http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5741157http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5741157http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741158http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741158http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741158http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741158http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741158http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5741158http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5741158http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5741158http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741159http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741159http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741159http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741159http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5741159http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5741159http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5741159http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741160http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741160http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741160http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741160http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5741160http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5741160http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5741160http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741161http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741161http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741161http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741161http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5741161http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5741161http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5741161http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741162http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741162http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741162http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741162http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5741162http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5741162http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5741162http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741163http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741163http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741163http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741163http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5741163http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5741163http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5741163http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5741163http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741163http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741163http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5741162http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741162http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741162http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5741161http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741161http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741161http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5741160http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741160http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741160http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5741159http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741159http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741159http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5741158http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741158http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741158http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741158http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5741157http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741157http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741157http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5741156http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741156http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741156http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741156http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5741155http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741155http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741155http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741155http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5741154http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741154http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5741154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4/20

IEEE Wireless CommunicationsFull Text:PDF(239KB)

Table of contentsFull Text:PDF(62KB)

Localization and tracking for emerging wireless systems[Message from the Editor-In-Chief]Fang, Y.M.


Breaking the Gigabit-per-second barrier with 802.11ACNee, R.V.


Can cognitive radio technology help solve some difficultspectrum management issues by creating "virtualguardbands"?Marcus, M.J.


Scanning the literatureZhang, Y.


Emerging opportunities for localization and tracking [GuestEditorial]Moayeri, N. Mapar, J. Tompkins, S. Pahlavan, K.


Accurate and reliable soldier and first responder indoorpositioning: multisensor systems and cooperative localizationRantakokko, J. Rydell, J. Str??mb??ck, P. H??ndel, P.Callmer, J. T??rnqvist, D. Gustafsson, F. Jobs, M.Grud??n, M.


Accurate positioning in ultra-wideband systemsSoganci, H. Gezici, S. Poor, H.V.


Indoor navigation with foot-mounted strapdown inertialnavigation and magnetic sensors [Emerging Opportunities forLocalization and Tracking]Bird, J. Arden, D.


Extending GPS carrier phase availability indoors with a deeplyintegrated receiver architectureSoloviev, A. Dickman, J.


RFID-based localization and tracking technologiesNi, L.M. Zhang, D. Souryal, M.R.


Synthetic aperture navigation in multipath environmentsDraganov, S. Harlacher, M. Haas, L. Wenske, M.Schneider, C.


Military applications of localization, tracking, and targetingLowell, J.R.


Physical layer security in wireless networks: a tutorialShiu, YI-SHENG Chang, Shih Yu Wu, HSIAO-CHUN Huang,Scott C.-H. Chen, HSIAO-HWA


Adaptive wireless networks using learning automataNicopolitidis, P. Papadimitriou, G.I. Pomportsis, A.S.Sarigiannidis, P. Obaidat, M.S.


The promise of RFID-based sensors in the perishables supplychainDelen, D. Sharda, R. Hardgrave, B.C.

http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5751284http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5751284http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5751284http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5751285http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5751285http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5751285http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5751286http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5751286http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5751286http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5751286http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5751286http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5751286http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5751286http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5751286http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5751287http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5751287http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5751287http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5751287http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5751287http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5751287http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5751287http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5751288http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5751288http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5751288http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5751288http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5751288http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5751288http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5751288http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5751288http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5751288http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5751289http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5751289http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5751292http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5751292http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5751292http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5751292http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5751292http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5751290http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5751290http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5751290http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5751290http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5751290http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5751290http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5751290http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5751290http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5751291http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5751291http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5751291http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5751291http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5751291http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5751291http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5751291http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5751291http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5751292http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5751292http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5751292http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5751292http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5751292http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5751292http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5751292http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5751293http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5751293http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5751293http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5751293http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5751293http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5751293http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5751293http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5751293http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5751293http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5751294http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5751294http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5751294http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5751294http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5751294http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5751294http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5751294http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5751294http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5751295http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5751295http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5751295http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5751295http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5751295http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5751295http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5751295http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5751296http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5751296http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5751296http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5751296http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5751296http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5751296http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5751296http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5751297http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5751297http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5751297http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5751297http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5751297http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5751297http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5751297http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5751298http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5751298http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5751298http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5751298http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5751298http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5751298http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5751298http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5751299http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5751299http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5751299http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5751299http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5751299http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5751299http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5751299http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5751300http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5751300http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5751300http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5751300http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5751300http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5751300http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5751300http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5751300http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5751300http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5751300http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5751300http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5751300http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5751299http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5751299http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5751299http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5751298http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5751298http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5751298http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5751297http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5751297http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5751297http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5751296http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5751296http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5751296http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5751295http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5751295http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5751295http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5751294http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5751294http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5751294http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5751294http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5751293http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5751293http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5751293http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5751293http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5751293http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5751292http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5751292http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5751292http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5751291http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5751291http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5751291http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5751291http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5751290http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5751290http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5751290http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5751290http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5751292http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5751292http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5751289http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5751288http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5751288http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5751288http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5751288http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5751288http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5751287http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5751287http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5751287http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5751286http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5751286http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5751286http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5751286http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5751285http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5751284


5/20


Staff ListFull Text:PDF(58KB)

Noise Adaptive LDPC Decoding Using Particle FilteringWang, Shuang Cui, Lijuan Cheng, Samuel Zhai, Yan Yeary,Mark Wu, Qiang


Versatile, Accurate, and Analytically Tractable Approximationfor the Gaussian Q-FunctionLopez-Benitez, Miguel Casadevall, Fernando


Performance of L-Independent and Dual Correlated SelectionCombiners in Hoyt Fading ChannelsSubadar, Rupaban Sahu, P. R.


On Optimum Pilot Design for Comb-Type OFDM Transmissionover Doubly-Selective ChannelsIslam, K. M. Zahidul Al-Naffouri, Tareq Y. Al-Dhahir, Naofal


Computational Complexity of Decoding Orthogonal Space-Time Block CodesAyanoglu, Ender Larsson, Erik G. Karipidis, Eleftherios


1/f Baseband Noise Suppression in OFDM SystemsLandis, Shay Bobrovsky, Ben-Zion


To Code or Not to Code: Rate Optimality of Network Codingversus Routing in Peer-to-Peer NetworksShao, Ziyu Li, Shuo-Yen Robert


Tracking Nonlinear Noisy Dynamic Systems over NoisyCommunication ChannelsFarhadi, Alireza Ahmed, N. U.


Asymptotically-Exact Performance Bounds of AF Multi-Hop

Relaying over Nakagami FadingAmarasuriya, Gayan Tellambura, Chintha Ardakani, Masoud


Iterative Best Beam Selection for Random UnitaryBeamformingSon, Hyukmin Lee, Sanghoon


Error Detection and Correction in Communication ChannelsUsing Inverse Gray RSNS CodesPham, Duc-Minh Premkumar, A. B. Madhukumar, A. S.


Group-Decodable Space-Time Block Codes with Code Rate > 1Ren, Tian Peng Guan, Yong Liang Yuen, Chau Gunawan,Erry Zhang, Er Yang


Low Complexity Demapping Algorithms for Multilevel Codes

Gul, Gokhan Vargas, Aharon Gerstacker, Wolfgang H.Breiling, MarcoAbstract| Full Text:PDF(616KB)

Toward a Practical Scheme for Binary Broadcast Channelswith Varying Channel Quality Using Dirty Paper CodingKyung, Gyu Bum Wang, Chih-Chun


Message-Wise Unequal Error Protection Based on Low-DensityParity-Check CodesGong, Chen Yue, Guosen Wang, Xiaodong


Asymptotically Optimal Model Estimation for QuantizationOzerov, Alexey Kleijn, W. Bastiaan


Efficient Computation and Optimization of the Free Distance ofVariable-Length Finite-State Joint Source-Channel CodesDiallo, Amadou Weidmann, Claudio Kieffer, Michel


On Source Coding for Distributed Temperature Sensing withShift-Invariant GeometriesBeferull-Lozano, Baltasar Konsbruck, Robert L.


Performance of Soft Decision Decoded Synchronous FHSSMultiple Access Networks Using MFSK Modulation underRayleigh FadingHong, Sungnam Seol, Changkyu Cheun, Kyungwhoon


High-Throughput Low-Complexity Link Adaptation for MIMOBIC-OFDM SystemsShin, Cheolkyu Kim, Hyounkuk Kim, Kyeong Jin Park,Hyuncheol


Optimized Joint Fine Timing Synchronization and ChannelEstimation for MIMO SystemsWang, Chin-Liang Wang, Hung-Chin

http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5749763http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5749763http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5749763http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5749764http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5749764http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5749764http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5699415http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5699415http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5699415http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5699415http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5699415http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5699415http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5699415http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5706433http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5706433http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5706433http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5706433http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5706433http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5706433http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5706433http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5706433http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5715834http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5715834http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5715834http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5715834http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5715834http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5715834http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5715834http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5715834http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5715843http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5715843http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5715843http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5715843http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5715843http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5715843http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5715843http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5715843http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5708206http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5708206http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5708206http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5708206http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5708206http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5708206http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5708206http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5708206http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5708202http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5708202http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5708202http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5708202http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5708202http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5708202http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5708202http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5708205http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5708205http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5708205http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5708205http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5708205http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5708205http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5708205http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5708205http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5715837http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5715837http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5715837http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5715837http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5715837http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5715837http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5715837http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5715837http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5706430http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5706430http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5706430http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5706430http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5706430http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5706430http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5706430http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5706430http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5706432http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5706432http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5706432http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5706432http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5706432http://ieeexplore.ieee.org/stamp/stamp.js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bs_all.jsp?arnumber=5706433http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5706433http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5699415http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5699415http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5699415http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5749764http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5749763


6/20

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MIMO Systems with Limited Rate Differential Feedback inSlowly Varying ChannelsKim, Taejoon Love, David J. Clerckx, Bruno


On Performance of Cooperative Communication Systems withSpatial Random RelaysWang, Hongzheng Ma, Shaodan Ng, Tung-Sang


http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5719285http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5719285http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5719285http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5719285http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5719285http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5719285http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5719285http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5719285http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5706431http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5706431http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5706431http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5706431http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5706431http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5706431http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5706431http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5706431http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5715836http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5715836http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5715836http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5715836http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5715836http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5715836http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5715836http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5715836http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5715836http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5715836http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5715844http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5715844http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5715844http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5715844http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5715844http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5715844http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5715844http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5715844http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5719287http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5719287http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5719287http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5719287http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5719287http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5719287http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5719287http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5749765http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5749765http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5749765http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5749765http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5749765http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5749765http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5749765http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5749765http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5749766http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5749766http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5749766http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5749766http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5749766http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5749766http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5749766http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5749766http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5723047http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5723047http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5723047http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5723047http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5723047http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5723047http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5723047http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5723047http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5706435http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5706435http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5706435http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5706435http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5706435http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5706435http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5706435http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5706435http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5749767http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5749767http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5749767http://www.ieee-icc.org/2012/http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5749767http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5706435http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5706435http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5706435http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5706435http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5723047http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5723047http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5723047http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5723047http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5749766http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5749766http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5749766http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5749766http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5749765http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5749765http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5749765http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5749765http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5719287http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5719287http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5719287http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5715844http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5715844http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5715844http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5715844http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5715836http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5715836http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5715836http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5715836http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5706431http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5706431http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5706431http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5706431http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5719285http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5719285http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5719285http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5719285


7/20

Table of contents Full Text:PDF(120KB)

Staff List Full Text:PDF(67KB)

Guest Editorial Advances in Cognitive Radio Networking andCommunications (II)Abstract| Full Text:PDF(982KB)Simple Channel Sensing Order in Cognitive Radio NetworksCheng, Ho Ting Zhuang, Weihua


Control Channel Establishment in Cognitive Radio Networksusing Channel HoppingBian, Kaigui Park, Jung-Min Chen, Ruiliang


Opportunistic Multiple Access for Cognitive Radio NetworksEl-Sherif, Amr A. Sadek, Ahmed K. Liu, K. J. Ray


Opportunistic Spectrum Sharing Schemes for CDMA-BasedUplink MAC in Cognitive Radio NetworksZhang, Xi Su, Hang


Distributed Algorithms for Learning and Cognitive MediumAccess with Logarithmic RegretAnandkumar, Animashree Michael, Nithin Tang, Ao KevinSwami, Ananthram


Optimal Cognitive Access of Markovian Channels under TightCollision ConstraintsLi, Xin Zhao, Qianchuan Guan, Xiaohong Tong, Lang


Load-Balancing Spectrum Decision for Cognitive RadioNetworksWang, Li-Chun Wang, Chung-Wei Adachi, Fumiyuki


Stochastic Medium Access for Cognitive Radio Ad HocNetworksWang, Xiao Yu Wong, Alexander Ho, Pin-Han


Multicast Communications in Multi-Hop Cognitive RadioNetworksGao, Cunhao Shi, Yi Hou, Y. Thomas Sherali,Hanif D. Zhou, Huaibei


CRP: A Routing Protocol for Cognitive Radio Ad Hoc NetworksChowdhury, Kaushik R. Akyildiz, Ian F.


On the Connectivity and Multihop Delay of Ad Hoc CognitiveRadio NetworksRen, Wei Zhao, Qing Swami, Ananthram


QoS Provisioning for Heterogeneous Services in CooperativeCognitive Radio NetworksAlshamrani, Ammar Shen, Xuemin Sherman Xie, Liang-Liang


A Hybrid Approach for Radio Resource Management inHeterogeneous Cognitive NetworksHaddad, Majed Elayoubi, Salah Eddine Altman, EitanAltman, Zwi Abstract| Full Text:PDF(759KB)

Spectrum Trading in Cognitive Radio Networks: A Contract-Theoretic Modeling ApproachGao, Lin Wang, Xinbing Xu, Youyun Zhang, Qian


On a Truthful Mechanism for Expiring Spectrum Sharing inCognitive Radio NetworksSodagari, Shabnam Attar, Alireza Bilen, Sven G.


Purging the Back-Room Dealing: Secure Spectrum AuctionLeveraging Paillier CryptosystemPan, Miao Sun, Jinyuan Fang, Yuguang


An Anti-Jamming Stochastic Game for Cognitive RadioNetworksWang, Beibei Wu, Yongle Liu, K. J. Ray Clancy, T. Charles


Analysis of Coordinated Denial-of-Service Attacks in IEEE802.22 NetworksTan, Yi Sengupta, Shamik Subbalakshmi, K.P.


Spoofing or Jamming: Performance Analysis of a TacticalCognitive Radio AdversaryPeng, Qihang Cosman, Pamela C. Milstein, Laurence B.


Call for Papers Full Text:PDF(41KB)

Staff List Full Text:PDF(64KB)
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8/20



A Comment on "Performance Analysis of Uplink CognitiveCellular Networks with Opportunistic Scheduling"Fan, Lisheng Lei, Xianfu


Secure Code Dissemination and Remote Image ManagementUsing Short-Lived Signatures in WSNsLim, Chae Hoon


The Capacity of Gaussian Orthogonal Multiple-Access RelayChannelCui, Junyun


Distributed Beamforming Using a Consensus Algorithm forCooperative Relay NetworksChoi, Jinho


Capacity Sensitivity of UWB TR Receivers to SynchronizationErrorsZhao, Bo Chen, Yunfei Green, Roger J.


Interference Alignment over Lattices for MIMO InterferenceChannelsChoi, Jinho


Chunk-Based Resource Allocation in Distributed MISO-OFDMASystems with Fairness GuaranteePapoutsis, Vasileios D. Kotsopoulos, Stavros A.


Dynamic Power Allocation for Broadband Multi-Beam Satellite

Communication NetworksDestounis, Apostolos Panagopoulos, Athanasios D.


Group Based Interference AlignmentMa, Yanjun Li, Jiandong Liu, Qin Chen, Rui


Fast Retransmission for Concurrent Multipath Transfer (CMT)over Vehicular NetworksHuang, Chung-Ming Lin, Ming-Sian


Capacity and Optimal Power Allocation for Spectrum-Sharingwith Primary Transmission Consideration in Fading ChannelsPei, Errong Wang, Sheng Zhang, Zhizhong


An Approximate Queueing Model for Multi-Rate Multi-UserMIMO SystemsBellalta, Boris Daza, Vanesa Oliver, Miquel


Optimal Detection of Spatial Opportunity in Wireless NetworksYu, Seung Min Kim, Seong-LyunAbstract| Full Text:PDF(208KB)

Outage Performance of Multi-Antenna Relay Cooperation in theAbsence of Direct LinkKatiyar, Himanshu Bhattacharjee, R.


End-to-End Delay Guaranteed Proportional Fair Scheduling forWireless NetworksJeon, Jae-Han Byun, Hee-Jung Lim, Jong-Tae


Consensus-Based Detection of Malicious Nodes inCooperative Wireless NetworksTomasin, Stefano


Relay Selection and Resource Allocation Schemes forEffective Utilization of Relay Zones in Relay-Based CellularNetworksChoi, Bum-Gon Bae, Sueng Jae Cheon, Kyung-yul Park, Ae-Soon Chung, Min Young


Outage Analysis for Multiuser Two-Way Relaying in MixedRayleigh and Rician FadingDing, Haiyang Ge, Jianhua da Costa, Daniel BenevidesGuo, Yi


Tight Bounds for Ergodic Capacity of Dual-Hop Fixed-GainRelay Networks under Rayleigh FadingWaqar, Omer Ghogho, Mounir McLernon, Des


Coordinated Direct and Relay Transmission with InterferenceCancelation in Wireless SystemsThai, Chan Dai Truyen Popovski, Petar

http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5749433http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5749433http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5749433http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnu

Documents

2011 Apr Pub Digest