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MODULE 8

DIAGNOSTIC TOOLS

Overview 8-3

Objective 8-3

Purpose 8-3

Instructions 8-3

Introduction 8-4

Diagnostic Access 8-4

Diagnostic Options 8-5

Diagnostic Suites 8-6

Logs 8-8Utilities 8-9

Transmitter Test (non NTHI) 8-11

Transmit Loopback Test (NTHI systems) 8-12

Video Test Patterns 8-14

Manual Diagnostics 8-15

Executing Tests using Manual Diagnostics 8-15

Continuous Tests 8-15

Logs 8-16

Hardware/Software Config 8-16

Interpreting Diagnostic Failures 8-17

Finding the Cause of Diagnostic Failures 8-17

Diagnosing AEGIS problems 8-17

Power On Diagnostics 8-18

Power-On Bypass 8-18

Power-On Diagnostic Configuration 8-18

Power-On Error Log 8-18

Troubleshooting Diagnostics 8-19

Diagnostic Questions 8-20

Diagnostic Test List 8-21

VPB FRU LIST 8-52

http://aspen.pdf/

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Module 8 - Diagnostic Tools Acuson Confidential

Module 8-2 Aspen Service Training Manual P/N 59163 Rev. 1

REVISION HISTORY

QRC P/N-REVISION INITIATOR APPROVAL DATE CHANGE

59163 Rev. X3Beta

J. Koeper S. Williams 7/16/99 Incorporate reviewer comments

A3174 59163 Rev. 1 J. Madarasz S. Williams Dec. 2000 Initial Release

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P/N 59163 Rev. 1 Aspen Service Training Manual Module 8- 3

Acuson Confidential Overview

OVERVIEW

OBJECTIVE Be able to run hardware diagnostics on an Aspen™ Ultrasoundsystem including verification suites and individual tests.

PURPOSE It is important to understand how to run diagnostics to verifysystem functionality and to help diagnose a failing FRU when asystem problem is apparent.

INSTRUCTIONS 1 Access the service diagnostics. The instructor will provide an accessnumber and password.

2 View and CLEAR the power on and system diagnostic logs.

3 Execute the keyboard test.

4 Execute the power supply test. Understand what it is displaying.

5 View the SMPTE test pattern.

6 Start the System Verification suite from the Manufacturing menuand then cancel out of it.

7 Run the transmitter test.

8 Go to manual diagnostics and run the Z command.

9 In manual diagnostics:

• type H <RETURN> to view the help menu

• select the S & H commands to see the help menu all the optionsavailable

• type S <RETURN> to see a list of board tests.

10 Enable and run the SVC board suite and then cancel out of it.

11 Run the individual DCI tests 6C4 and 6E8. Understand what theyare testing. The instructor will provide a scratch MO.

12 Enable and run the NI suite continuously. (Make sure to tell thesystem not to stop on errors or fail too many times in a continuousloop.) Cancel out of this test when necessary to move on to the nextmodule.

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INTRODUCTION

Diagnostics are built into the system software and are availablethrough a menu-driven user interface. The system contains power-on diagnostics, diagnostics available to the customer anddiagnostics for Service. The diagnostics used by Service areproprietary to Acuson and controlled by an access number andpassword.

DIAGNOSTIC ACCESS 1 First, go to the CUSTOMER LEVEL of diagnostics.

• Hold the TEST button immediately after power on, or pressRESET, then hold TEST.

• RESET is the button closest to the trackball under the righthandle. The TEST button is just to the right of it.

• Wait for 5 seconds until the menu appears. If power ondiagnostics begin, press RESET-TEST again.

2 Request access to the Service diagnostics.• Highlight CONFIGURATION in the Customer Menu using the

trackball, then highlight and click on SERVICE ACCESS. SeeFigure 1.

Figure 8-1 Customer Menu: Configuration

3 Input your ACCESS NUMBER at the prompt and press RETURN. Theaccess number format is: a12345 (Acuson employees) or b12345

(biomeds). Replace the 12345 with your employee number orsystem serial number (for biomeds). If the number is less than fivedigits, include enough leading zeros to follow the access numberformat, for example a00123.

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DIAGNOSTIC SUITES

Figure 8-2 Manufacturing Menu with Diagnostic Suites

1 Highlight the suite desired and click the trackball select key to start

the suite.

2 Results will display when the test is complete. See approximatecompletion times in the table below.

• CODE-C will exit a test or diagnostic suite.

• While the tests are running the screen is blank except for the testnumber. No pass/fail information is displayed until the suite iscomplete.

• After the test is complete, any failures are displayed on thesystem screen and also recorded in the system diagnostic log.

Table 8-3 Diagnostic Suite Descriptions

DIAGNOSTIC SUITE DESCRIPTION APPROX.TIME

System Verification(PM)

Designed to verify the system’sperformance.

30 minutes

All non interactive(NI)

The complete set of non-interactivediagnostics, equivalent to what is run inthe factory during production testing.

1 hour, 15minutes

2-D Imaging (2-D) 2-D imaging hardware: AQP, CDM, RP,SVC, VPB, DCC, ZDT, IOB, SCP4, PPS,UIC, MEX, ZDL and ZIP.

30 minutes

Color Doppler(CD) Color Doppler hardware: FEC, FEB andCRP. 10 minutes

Internal AEGIS(AEGIS)

AEGIS hardware: DCI and JPEG. 15 minutes

M-mode (CARD) M-mode hardware: WFP 5 minutes

Pulse Doppler (PD) Pulse Doppler hardware: DAQ, DSP andWFP

5 minutes

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Acuson Confidential Diagnostic Suites

Scan ConverterControl

(SCC)

Scan Converter Control hardware: RP,AQP, and CDM

15 minutes

Video (VID) Video hardware: VPB 20 minutes

User Interface (UI) Non-interactive test of keyboard and UI. 5 minutes

DIAGNOSTIC SUITE DESCRIPTION APPROX.

TIME

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LOGS

Table 8-4 Log Descriptions

While viewing a log, use the trackball to highlight and click on oneof the available options:

• CLEAR LOG: erases data in the power on or diagnostic log.

• DUMP LOG: to send the data in the log out of the serial port J20 ata baud rate of 9600.

• EXIT: to return to the diagnostic menu.

• NEXT: to view the next page of the log.

LOG DESCRIPTION

Power On Log Stores power on errors encountered until log is cleared.

System DiagnosticLog

Stores any errors found by running diagnostic suites ormanual diagnostics.

Current KeystrokeLog

Displays Current Keystroke Log from EngineeringMenu. Displays the most recent user keystrokes.

Error KeystrokeLog

Displays Error Keystroke Log from Engineering Menu.Displays the user keystrokes immediately prior to thenewest message in the Error Message Log.

Error Message Log Displays Error Message Log from Engineering Menu.

View this log to check for intermittent problems thatmay occur between site visits.

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Acuson Confidential Utilities

UTILITIES

Table 8-5 Utility Descriptions

UTILITY DESCRIPTION

KeyboardFunctionality

Allows keyboard verification with interaction. This is the sameas the utility given in the Customer Menu.

Power Supply

Measurement

Displays average and peak voltages for the power supplies.

Store BBM Stores BBM settings to a file on a laptop via the serial port.

Restore BBM Restores BBM settings from a file on your laptop via the serialport. Described in Section 9.4.

System Noise Not yet available. Measures the noise floor of the Scannerreceive chain using a custom DL board.

Transmitter Verifies gross transmitter functionality. See Section 4.2 ontransmitter test for full instructions.

Memexchecksum

Verifies Memex checksum - use after upgrade. Can also beinvoked from Manual Diagnostics, test 7F8.

Lock system Disables repeat diagnostic access to the Manufacturing Menuwithout a password. Without selecting lock system, a userautomatically gains access to the Manufacturing Menu for onehour after entering a valid password.

Clear all BBM Caution! This will clear all Battery-Backed Memory in thesystem. Does not affect AEGIS system exams. Read the section

on Clearing BBM to find all the steps to recover.

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Figure 8-3 Keyboard Functionality Test

Figure 8-4 Power Supply Measurement

NOTE: Scanner +50V -120V are not used in the system and should be 0.0volts.

• System 120VAC measurement display is usually 10VAC to 12VAC

^low. Measure the system line voltage at the wall outlet or power

supply (MDI) to obtain an accurate measurement.

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TRANSMITTER TEST (NON NTHI)

The transmitter test under utilities allows testing of all transmitchannels in the system. This test is used on Aspen system instead ofthe Transmit Chain test used on XP systems.

1 Connect a DLX2 board to one of the DL ports on the front of thesystem using the DL adapter. Use any transducer ID.

2 Select the TRANSMITTER TEST under UTILITIES from theManufacturing Menu.The test describes exactly how to set up the scope and DLX2 board.The procedure is listed below for reference.

3 Enter 1 to select DL1 (left), 2 to select DL2 (right)

4 Enter number of transducer thermistors (0 to 2)Enter 2 to test both of the thermistors.

5 After selecting 2 thermistors, do the following:Set the DLX2 toggle switches as follows:

6 Upper set (CH 1N) to OPEN and CAL1

7 Lower set (CH 1P) to OPEN and CAL1

8 Press any key to continue when the switches are set properly.9 Turn the oscilloscope on and connect it to the DLX2 with a BNC.

Disconnect the 50 ohm BNC terminator, if present.

10 Set up the oscilloscope as follows:

• Vertical sensitivity: 0.5 volts/div

• Horizontal sweep speed: 2 ms/div (5ms preferred)

• Trigger source: <channel connected to DLX2 BNC>

• Trigger level: -2 volts to -7 volts

11 Type 0 to start the transmit/receive starting line number at 0.12 Check for the following signal to confirm that the transmit channel

is good.

Figure 8-5 Transmit channel pulse

13 Press the period key, “.”, on the keyboard to advance the transmitchannels one by one.

14 Test the other DL port using the same procedure.

NOTE: Ignore the values on the Aspen screen; use the following values.

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TRANSMIT LOOPBACK TEST (NTHI SYSTEMS)

Requirements In order to run this diagnostic successfully you will need thefollowing:

• an Aspen system• 3.5 or higher software. Note that the test has even better error

reporting at Aspen 4.0 and higher

• NTHI hardware (including XMT5, XDY4, IFD2 boards)

• L7, V4, or 4V2c transducer (or DLX card simulating one of thesetransducers.)

To run the transmit loopback test (NTHI systems)

1 Turn on the system and go to Manual Diagnostics.

2 Plug in an L7, V4, or 4V2c transducer (or DLX card simulating oneof the following: L7 - 10100101, V4 - 10000111.)

3Execute diagnostic test 4A3.

4 Read the troubleshooting section if you have any failures.

Theory ofOperation

This test verifies the boards involved in the transmit chain (XMT,XDY) as well as the transducer and ZDL.

The test fires many short ultrasound lines with only 1 transmitchannel turned on during each line fire. Several sets of pulses arefired on each channel with different apodization levels. The pulsesare fed back into a receive channel by the ZDL and travel from: RCV> SDL > DBL > IFD > VDT > DBL and then to the Scan ConverterIOB > AQP > SVC.

This test verifies transmit channels 1 to 126 if using an L7 or V4. Ifusing a 4V2, channels 0-15 and 112-127 do not get tested due tophysical limitations of the transducer. The test also uses Receiverchannels 0 and 127 to pass the information. Note that if there is aproblem on either of these receiver channels, the test will fail forhalf of the transmit channels.

Troubleshooting This is a new test and is still being optimized. If there is a failure,analyze the data. If the channel is just barely out of tolerance, it may be acceptable.

“System too

Noisy” Failures

If the test sees too much variation ( > 25%) in the baseline signalamplitude, it gives the error message “system too noisy” and fails.Failures like this are caused by FRUs which affect ALL 128 channelsin the system, including: VDT, IFD, IGD, DBL, ZDL, AQP, IOB, RP,

SVC, cables. It may be helpful to run additional diagnostics.

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Individual ChannelFailures

If an individual channel (or several channels) fail, the test reportsthe channel number along with the measurement for that channel. Italso reports the upper and lower limits for the area it expected toget for that case of pulse count and apodization. The tricky part oftroubleshooting individual channel failures is that you don’t knowwhich board in the system is causing that failure. It could be atransducer, XMT, RCV, SDL, ZDL, XDY, MXK, or APD. Rememberthat the RCVs and SDLs are only using and testing channels 0 and127.

• To determine if a transducer is causing the failure, use adifferent transducer or test using a DLX2.

• Swap boards and locations to try to determine if a PCB iscausing the problem. Take careful notes while you move boardsaround in the system.

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VIDEO TEST PATTERNS

The following video test patterns are available to both the Customerand Service.

Table 8-5 Video Test Pattern Descriptions

TEST PATTERN DESCRIPTION

SMPTE EG 1-1990Color Bar TestPattern

Used to calibrate accessory monitors and colorperipherals.

SMPTE RP 133-1986Medical Diag Pattern

Used to calibrate B/W printers.

Crosshatch Pattern Used to evaluate monitor geometry and convergence.

100% WHITE Flat

Field

Recommended for locating any missing GBR triplets

on the monitor.100% GREEN FlatField

Recommended for locating any missing green pixelsfrom monitor.

100% BLUE Flat Field Recommended for locating any missing blue pixelsfrom monitor.

100% RED Flat Field Recommended for locating any missing red pixelsfrom monitor.

GBR Crosshatch Recommended for easier evaluation of monitorconvergence.

100% Window

Pattern

Recommended for QV100 Pendant Calibration.

Others... As desired.

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Acuson Confidential Manual Diagnostics

MANUAL DIAGNOSTICS

EXECUTING TESTS USING MANUAL

DIAGNOSTICS

The operation in manual diagnostics mode is similar to diagnosticson the XP system. There are selections to run individual tests,

enable board suites, and run tests continuously.1 Highlight and select MANUAL DIAGNOSTICS from the Manufacturing

Menu in Diagnostics.

2 Type H followed by [RETURN] for help and S to show the test suites.See Appendix A and B for printouts of these commands.

3 Run tests as desired. For example:

• Suites: type the abbreviated suite name followed by [RETURN]to begin the tests. e.g., NI [RETURN] will run the All non-interactive suite.

• Board tests: type BE (board test number) [RETURN] to enablethe board tests, then type R to run the tests, e.g., BE2 [RETURN],R

[RETURN

] will enable and run all tests for the CRP board.• Individual tests: type X (test number) [RETURN], e.g., type X7F8

[RETURN] to run the MEMEX checksum test.

4 Type STAT [RETURN] to display any failures that occurred whilerunning a diagnostic suite.

5 Type STAT! [RETURN] to display all tests run regardless of failures ornot.

6 Press CODE-C to exit from a test or diagnostic suite.

CONTINUOUS TESTS Enable a test suite and run it continuously to help find intermittentproblems.

1 Type STATCLEAR [RETURN] to clear any diagnostic failures inmemory.

2 Type FLIMIT=2 [RETURN] to limit the failures on any given test to 2.

3 Type SOE=OFF [RETURN] if you do not want the diagnostics to stopwhen an error is found.

4 Enable the test suite or board suite you desire.

• Suites: type E=(suite) [RETURN] to enable the desired suite. TypeO=(suite) [RETURN] to disable any suites you don’t want to run.e.g., E=NI [RETURN] will enable the All non interactive suite;O=AEGIS [RETURN] will remove the AEGIS suite from the teststo be run.

• Board tests: type BE (board test number) [RETURN] to enablethe board tests. e.g., BE2 [RETURN], will enable all tests for theCRP board.

• Individual tests: type A (test number) [RETURN] to enablespecific tests. e.g., type A7F8 [RETURN] to enable the MEMEXchecksum test.

NOTE: Contents of STAT will be lost on power off. Failures in ManualDiagnostics are also stored in the system diagnostic log.

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5 Type C [RETURN] to run the tests continuously.

6 The test suite will not stop until you press CODE-C to cancel.

7 Type STAT [RETURN] to display any failures that occurred whilerunning a diagnostic suite.

LOGS The SYSCON and diagnostic logs available from the ManufacturingMenu of Diagnostics as described in Section 2.0 are also available inManual Diagnostics. See Appendix A for the commands to viewthese logs, e.g. type SHOW SYSLOG [RETURN] to view the systemdiagnostic log.

HARDWARE / SOFTWARE CONFIG

Diagnostics provides a way to verify the software in the system. Itallows verification of the bootproms installed on specific boards inthe Aspen system. This information is NOT included in the VersionReport of the Engineering Menu. Use this command after upgradesto verify all bootproms in the system are the correct version.

• Type Z [RETURN] to display a hardware and software config ofthe system. See Appendix C for an example printout using thiscommand.

NOTE: Contents of STAT will be lost on power off, but are stored in the system

diagnostic log.

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Acuson Confidential Interpreting Diagnostic Failures

INTERPRETING DIAGNOSTIC FAILURES

If a diagnostic failure is encountered during a test suite, alwaysproceed to manual diagnostics (as described in the next section) andrun the test again. This will serve two purposes:

• Manual diagnostics will give you more information about thetest and the failure. Running the test in the suite will only giveyou pass/fail information.

• Some tests may fail in the diagnostic suites due to dependenciesand are not true hardware failures. If a diagnostic test failswhen run from a test suite, run the failing test again fromManual Diagnostics. If it then passes, ignore the original failurefrom the test suite. Always assume a diagnostic failure is realunless 1) Manual diagnostics proves otherwise, or 2) the failingtest is shown in a known false failure list for that Aspen release,or 3) you’ve verified with the STAT or FSE that it is a knownfalse failure.

FINDING THE CAUSE OF DIAGNOSTIC FAILURES

1 Verify that the failure is not a known diagnostic failure.

2 Check Appendix D of this document for possible FRU causing theproblem.

3 Call the STAT center for more troubleshooting informationregarding the diagnostic failure.

DIAGNOSING AEGISPROBLEMS

1 Always run the AEGIS suite of diagnostics if the customercomplains of lockups while using AEGIS or if AEGIS will notrespond at power on. The diagnostics will usually find anyproblems with hardware.

2 If all AEGIS diagnostics pass, then software corruption is suspected.

The AEGIS software should be reinstalled on the hard drive.

NOTE: Do NOT swap the hard drive until after running diagnostics andreloading software. Very rarely are problems related to a hardwarefailure of the hard disk.

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Acuson Confidential Troubleshooting Diagnostics

TROUBLESHOOTING DIAGNOSTICS

Table 8-2 Troubleshooting Diagnostics

PROBLEM SOLUTION

1 Diagnostic “PasswordDisabled”

Type in access number. At password

prompt type LOCK RETURN. The systemdisplays an 8 digit number. Call STAT oran FSE and request a “key” for the lockdisplayed on the system. Do not reset orthe lock will change.

2 Diagnostic “PasswordInvalid”

Verify that the access number andpassword are entered correctly. Check forany values that could be mis-interpretedas other numbers or letters.

Check that the system date is set properly.

3 Diagnostic Failure Run the test in Manual Diagnostics if testwas previously run using a diagnosticsuite. This verifies the failure and providesmore information.

Call the Helpdesk for details on the failureif needed. Some software levels may haveknown failures that should be ignored.

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DIAGNOSTIC QUESTIONS

1 Which diagnostic suite is the most thorough? ________

2 There is a section of the Scanner that is not verified by diagnostics, but can be verified by a separate diagnostic tool. Please name thesection, FRUs and the tool used to verify it.

3 What command in manual diagnostics provides helpful softwareinformation? _________

What information provided is NOT provided anywhere else?____________________________

4 What commands are necessary to program the system to run theDCI board suite in a continuous loop?

5 A RCV test failed during a PM suite. What are the next steps introubleshooting?

6 Which individual tests can be used to quickly verify if the AEGISsystem SCSI chain is functional?

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Acuson Confidential Diagnostic Test List

DIAGNOSTIC TEST LIST

The table below is a list of executable tests in the diagnosticsdatabase. Next to each test is a list of external sources required forthe test and major FRUs which could be the cause of failures foreach test. The FRU list associated with each test failure is a smallindication of POSSIBLE FRUs. The list of FRUs are given left toright in the order of highest probability of failure. Any FRUs with aprobability of having less than 10% being the cause of failure are notincluded.

TES

T

TEST DESCRIPTION FRUS

4D DAQ Cw Initialization Mode DAQ, IOB, SVC, WFP, STG, FEC, scanner controlcable

4E DAQ Cw Normal Mode DAQ, IOB, SVC, WFP, STG, FEC, scanner control

cable

4F DAQ ADC Gain Linearity test DAQ, IOB, SVC, WFP, STG, FEC, scanner controlcable

50 DAQ Offset Calibration test DAQ, IOB, SVC, WFP, STG, FEC, scanner controlcable

51 DAQ Cal On Non-Doppler Lines DAQ, IOB, SVC, WFP, STG, FEC, scanner controlcable

52 DAQ Fifo Low Nibble test DAQ, IOB, SVC, WFP, STG, FEC, scanner controlcable

53 DAQ Fifo Middle Nibble test DAQ, IOB, SVC, WFP, STG, FEC, scanner controlcable

54 DAQ Fifo Hi Nibble test DAQ, IOB, SVC, WFP, STG, FEC, scanner controlcable

55 DAQ Alpha Analog test DAQ, IOB, SVC, WFP, STG, FEC, scanner controlcable

56 DAQ2/3 Rg Acc Digital test DAQ, IOB, SVC, WFP, STG, FEC, scanner controlcable

57 DAQ2/3 Alpha Digital test DAQ, IOB, SVC, WFP, STG, FEC, scanner controlcable

58 DAQ External SOL test DAQ, STG, IOB, ZDT, scanner control cable

73 FEB Cine Ram Quick Addr test FEB

74 FEB Cine Ram Quick Data test FEB

9A FEC - SVC2 DPR Bak test FEC, SVC

9B FEC - SVC2 DPR Inc test FEC, SVC

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9C FEC Dual Port Ram Bak test FEC

9D FEC Dual Port Ram Inc test FEC

9E FEC Up External Ram Bak test FEC

9F FEC Up External Ram Inc test FEC

A0 FEC Time Slice Ram Bak test FEC

A1 FEC Time Slice Ram Inc test FEC

A2 FEC Input Path test FEC, DAQ, ZDT, IOB, SCP

A3 FEC Range Gate Accumulator test FEC, DAQ, ZDT, IOB, SCP

A4 FEC Write Address Counter test FEC, DAQ, ZDT, IOB, SCP

A5 FEC Line Type/Number test FEC, ZDT, IOB, SCP

A6 FEC Output Path test FEC

A7 FEC High Pass Filter Addr 1 FEC

A8 FEC High Pass Filter Addr 2 FEC

A9 FEC X0 M.A.C. test FEC

AA FEC X1 M.A.C. test FEC

AB FEC M.P.Y. (A) test FEC

AC FEC M.P.Y. (B) test FEC

AD FEC Read Address Counter test FEC

AE FEB Cine Ram Bak test FEB

AF FEB Cine Ram Inc test FEB

B0 FEB Cine Ram Refresh test FEB

B1 FEB V Ram Bak test FEB

D8 FEC Code RAM Data Bus test FEC

D9 FEC Code RAM March-C test FEC

DA FEC Code RAM Data Bus test Utility N/A (utility tool)

DB FEC Code RAM March-C test Utility N/A (utility tool)

112 FEC Output Interleave test FEC

113 FEC Input Interleave test FEC, DAQ, ZDT, IOB, SCP

114 FEC Group Info Msg test FEC

115 FEC Overflow Check test FEC, DAQ, ZDT, IOB, SCP

TES

T


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116 FEC - SVC2 DPR Arbitration FEC, SVC

118 DAQ Accumulator Full test - need externalvoltage source

DAQ, SVC

119 DAQ Accumulator Fd test - need externalvoltage source

DAQ, SVC

11A DAQ Sig Loop N/A (utility tool)

11B DAQ3 Ampl Thresh Loop N/A (utility tool)

11C DAQ ADC Display N/A (utility tool)

11D DAQ ADC Gain Linearity Adj N/A (utility tool)

11F FEC Input O-Scope Loop 1 N/A (utility tool)

120 FEC Input O-Scope Loop 2 N/A (utility tool)

121 FEC Output O-Scope Loop 1 N/A (utility tool)

122 FEC Output O-Scope Loop 2 N/A (utility tool)

123 FEC Prom Checksum N/A (utility tool)

125 FEC Signature Analysis N/A (utility tool)

126 FEB V Ram Inc test FEB

127 FEB Vet Ram Bak Tst FEB

128 FEB Vet Ram Inc Tst FEB

129 FEB Peak Map Ram Bak test FEB12A FEB Peak Map Ram Inc test FEB

12B FEB Depth Gain Comp Ram Bak test FEB

12C FEB Depth Gain Comp Ram Inc test FEB

12-D

FEB Per R/W Address Ram Bak test FEB

12E FEB Per R/W Address Ram Inc test FEB

136 FEB Vel to CRP Xfer test CRP, FEB, FEC, SVC

137 FEB Var to CRP Xfer test CRP, FEB, FEC, SVC138 FEB Energy to CRP Xfer test CRP, FEB, FEC, SVC

139 FEB Per. Eng Data Func test FEB

13A FEB Per. Eng ALU Func test FEB

13B FEB Per. Eng Const Sel Func test FEB

13C FEB Va/Th Compare test FEB

TES

T


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13D FEB Th/E Compare test FEB

13E FEB Ve/Th Compare test FEB

13F FEB Cine Read Eol Compare test FEB

140 FEB Per. R/W Eol Compare test FEB

141 FEB Status test FEB

143 FEB FEC to FEB Cine Ram Xfer Tst FEB, FEC

144 FEB FEC to FEB Xfer Enable test FEB, FEC

149 FEB Peak Detect test FEB

154 DSP TMS 320C10 Audio Test N/A (utility tool)

155 DSP Program Memory Bak Test DSP, SVC

156 DSP Program Memory Inc Test DSP, SVC

157 DSP Program Memory Address Test DSP, SVC

158 DSP Program Memory Data Test DSP, SVC

159 DSP Output Buffer Memory Bak Test DSP, SVC

15A DSP Output Buffer Memory Inc Test DSP, SVC

15B DSP Output Buffer Memory Address Test DSP, SVC

15C DSP Output Buffer Memory Data Test DSP, SVC

15D DSP TMS 320C10 Diagnostics DSP, SVC

163 DAQ Pv Lo-Nibble Memory Bak DAQ

164 DAQ Pv Lo-Nibble Memory Inc DAQ

165 DAQ Pv Lo-Nibble Memory Addr DAQ

166 DAQ Pv Lo-Nibble Memory Data DAQ

167 DAQ Pv Hi-Byte Memory Bak DAQ

168 DAQ Pv Hi-Byte Memory Inc DAQ

169 DAQ Pv Hi-Byte Memory Addr DAQ

16A DAQ Pv Hi-Byte Memory Data DAQ

16B DAQ Pd Memory Bak DAQ

16C DAQ Pd Memory Inc DAQ

16D DAQ Pd Memory Addr DAQ

16E DAQ Pd Memory Data DAQ

TES

T


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171 FEB Fi/Sp test FEB, CRP

172 FEB Shifter/Normalizer test FEB

173 FEB Per Eng V Operations test FEB

174 FEB V to Vt Transfer test FEB

175 FEB Cine to Cine Transfer test FEB

1A3 SPT SCNR SDL Gain SDL, RCV, VDT, IFD, AQP, scanner analog cable,DCC, MXK, MEX

1A4 SPT SCNR SDL Delay SDL,RCV,VDT,IFD,AQP, scanner analog cable,DCC,MXK,MEX

1A5 SPT SCNR SNR (noise/gain) - need FTB scanner analog cable, IOB, ZDT, ZDL, APD, VDT,IFD, DBL, RCV, power supplies, scannermotherboard, AQP

1A8 SPT SCNR Thermal SDL Delay SDL, RCV, VDT, IFD, AQP, scanner analog cable,DCC, MXK, MEX

200 WFP Dual Port RAM SVC Address WFP, SVC

201 WFP Dual Port RAM SVC Data WFP, SVC

202 WFP Code RAM WFP

203 WFP Video Clocks WFP

204 WFP Dual Port RAM WFP Address WFP, SVC

205 WFP Dual Port RAM WFP Data WFP, SVC

206 WFP Writes/SVC Reads Dual Port RAMContention

WFP, SVC

207 SVC Writes/WFP Reads Dual Port RAMContention

WFP, SVC

208 WFP Cine RAM CPU Address WFP

209 WFP Cine RAM CPU Data WFP

20A WFP Cine RAM CPU Exhaustive WFP

20B WFP Erase Bar RAM CPU Address WFP

20C WFP Erase Bar RAM CPU Data WFP

20D WFP Erase Bar RAM CPU Exhaustive WFP

20E WFP M Mode RAM CPU Address WFP

20F WFP M Mode RAM CPU Data WFP

210 WFP M Mode RAM CPU Exhaustive WFP

TES

T


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211 WFP M Mode Buffer Select WFP

212 WFP M Mode Acquisition Rate WFP

213 WFP M Mode Depth Delay WFP

214 WFP M Mode End of Acquisition WFP

215 WFP M Mode RAM Transfer-in WFP

216 WFP M Mode RAM Read-out WFP

217 WFP Line Segment RAM CPU Address WFP

218 WFP Line Segment RAM CPU Data WFP

219 WFP Line Segment RAM CPU Exhaustive WFP

21A WFP Waveform RAM CPU Address WFP

21B WFP Waveform RAM CPU Data WFP

21C WFP Waveform RAM Exhaustive WFP

21D WFP Waveform RAM Refresh WFP

21E WFP Non-Encoded Single Scroll Waveform WFP

21F WFP Non-Encoded Dual Scroll Waveform WFP

220 WFP Encoded Waveform with External EraseBar

WFP

221 WFP Non-Encoded Waveform with Four

Internal Erase Bars

WFP

222 WFP DMA Single Line WFP

223 WFP DMA Start and End Address WFP

224 WFP DMA Waveform WFP

225 WFP DMA Scale WFP

226 WFP Scanner 10MHZ Timer Interrupt IOB, WFP, STG, scanner control cable

27F CRP Dev_Test N/A (development tool)

280 CRP Write Mask Register Test CRP, FEC, SVC

281 CRP Config2 Register Test CRP, FEC, SVC



284 CRP Vidcontrol1 Register Test CRP, FEC, SVC

285 CRP Vidcontrol0 Register Test CRP, FEC, SVC

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2A3 CRP input buffer AB linear format coeff gentest

CRP, FEC, SVC

2A4 CRP input buffer BC linear format coeff gen

test

CRP, FEC, SVC

2A5 CRP input buffer CA linear format coeff gentest

CRP, FEC, SVC

2A6 CRP lower unsigned interpolation test CRP, FEC, SVC

2A7 CRP upper unsigned interpolation test CRP, FEC, SVC

2A8 CRP lower signed interpolation test CRP, FEC, SVC

2A9 CRP upper signed interpolation test CRP, FEC, SVC

2AA

CRP Linear Interpolation Test CRP, FEC, SVC

2AB CRP Sector Interpolation Test CRP, FEC, SVC

2FE Read CRP Status Register N/A (utility tool)

300 Display EEPROM table Rev Check VPB FRU listing at the end of this Appendix.

301 Convert EEPROM table to Rev 0 Check VPB FRU listing

302 Convert EEPROM table to Rev 1 Check VPB FRU listing

305 Engineering THOMA Evaluation Tool N/A (development tool)

30A VPB Manually calibrate RAMDACs Check VPB FRU listing at the end

30B VPB Manually calibrate selected RAMDAC Check VPB FRU listing

30C VPB Sync CAL Tool Check VPB FRU listing

30D VPB GEN subc cal - need CAL station Check VPB FRU listing

30E VPB GEN rot phase cal - need CAL station Check VPB FRU listing

30F VPB GEN aqlut cal Check VPB FRU listing

310 VPB GEN mon bal - need Thoma/ref CRT Check VPB FRU listing

311 VPB GEN mon gamma curve - need Thoma/ref CRT

Check VPB FRU listing

312 VPB LOAD gamma curves - WARNING: usewith caution


313 VPB LOAD tint settings - WARNING: use withcaution


314 VPB SELECT Gamma Curve Check VPB FRU listing

315 VPB SELECT Tint Setting Check VPB FRU listing

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316 VPB Show EEPROM Values Check VPB FRU listing

317 VPB auto-calibrate (VM700)

need CAL station


318 Field monitor balance entry tool Check VPB FRU listing

319 Field monitor tint entry tool Check VPB FRU listing

31A Edit Gamma Curve - WARNING: use withcaution


320 Playback External Video Source - need videosource


321 VPB Playback SVC digital Check VPB FRU listing

322 VPB Playback VHS loop Check VPB FRU listing

323 VPB Playback SVHS loop Check VPB FRU listing

324 VPB Playback BETACAM loop Check VPB FRU listing

325 VPB Playback AEGIS loop Check VPB FRU listing

326 VPB Playback AUX VHS loop Check VPB FRU listing

327 VPB Playback AUX SVHS loop Check VPB FRU listing

328 VPB enable svc video loop Check VPB FRU listing

329 VPB Playback Progressive GBR loop Check VPB FRU listing

32A VPB Playback Progressive CRT loop Check VPB FRU listing

340 VPB Reset Video Check VPB FRU listing

341 VPB Debug Menu - WARNING: use withcaution


342 Digital Pipeline Display Check VPB FRU listing

343 VPB/IOB Drift Report (All Paths) Check VPB FRU listing

344 VPB/IOB Prog Drift Report Check VPB FRU listing

345 VPB/IOB GBR Drift Report Check VPB FRU listing

346 VPB/IOB YUV Drift Report Check VPB FRU listing

347 VPB/IOB YC Drift Report Check VPB FRU listing

348 VPB/IOB YC Aux Drift Report Check VPB FRU listing

349 VPB/IOB Store Drift References

WARNING: use with caution


36A VPB Progressive Accuracy Test Check VPB FRU listing

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387 VPB AC Capture Data Test Check VPB FRU listing

388 VPB AC Capture Cell Test Check VPB FRU listing

389 VPB AQLUT Address Test Check VPB FRU listing

38A VPB AQLUT Data Test Check VPB FRU listing

38B VPB AQLUT Cell Test Check VPB FRU listing

38C VPB AC Generate Address Test Check VPB FRU listing

38D VPB AC Generate Data Test Check VPB FRU listing

38E VPB AC Generate Cell Test Check VPB FRU listing

38F VPB IO Test Check VPB FRU listing

390 VPB SPOT Interface Test Check VPB FRU listing

391 VPB XILINX Interface Test Check VPB FRU listing

392 VPB P2I Input Buffer Test Check VPB FRU listing

393 VPB P2I Conversion Test Check VPB FRU listing at the end

394 VPB Luma Delay Accuracy Test Check VPB FRU listing

395 VPB Comb Filter Test Check VPB FRU listing

396 VPB AQL/ACC Line Registration Test Check VPB FRU listing

397 VPB AQL/ACC Pixel Registration Test Check VPB FRU listing

398 VPB AQLUT AC Filter Test Check VPB FRU listing

399 VPB AQLUT Comb Filter Test Check VPB FRU listing

39A VPB AQLUT Test Check VPB FRU listing

39B VPB TBC FIFO Test Check VPB FRU listing

39C VPB AC Capture Int Test Check VPB FRU listing

39D VPB AC Capture Isolation Test Check VPB FRU listing

39E VPB AC Generate Test Check VPB FRU listing

39F VPB Taped AC Generate Test Check VPB FRU listing

3A0 VPB I2P Input Buffer Test Check VPB FRU listing

3A1 VPB I2P Control Test Check VPB FRU listing

3A2 VPB I2P Conversion Test Check VPB FRU listing

3A3 VPB I2P Output Buffer Test Check VPB FRU listing

3A4 VPB Sync Input Test Check VPB FRU listing

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3A5 VPB Dynamic Track Test Check VPB FRU listing

3A6 VPB Calibration Accuracy Test Check VPB FRU listing

3A7 VPB Lithotripsy Video Path Test Check VPB FRU listing

3A8 VPB Superbright Test Check VPB FRU listing

3A9 VPB YC Input Filters Test Check VPB FRU listing

3AA

VPB Failure Detection Test Check VPB FRU listing

3AB VPB Failure Isolation Test Check VPB FRU listing

3AC VPB Temporary Test A N/A (development tool)

3AD

VPB Temporary Test B N/A (development tool)

3AE VPB Temporary Test C N/A (development tool)

3AF VPB CRT Calibration Range Test Check VPB FRU listing

3B0 VPB CRT Calibration Accuracy Test Check VPB FRU listing

3B1 VPB Sync Phase Test Check VPB FRU listing

3E2 VPB Display Progressive Colorbar (VM700only)


3E3 VPB Display MDF Test Pattern Check VPB FRU listing

3E4 VPB Display I2P Test Pattern Check VPB FRU listing

3E5 VPB Display P2I2P Debug Pattern Check VPB FRU listing

3E6 VPB Display Maximum BandwidthCheckerboard Pattern


3E7 VPB Display Vertical Ramp Test Pattern Check VPB FRU listing

3E8 VPB Display Horizontal Ramp Test Pattern Check VPB FRU listing

3E9 VPB Display P2I First Pixel Test Pattern Check VPB FRU listing

3EA VPB Display 100% White Pattern Check VPB FRU listing

3EB VPB Display 100% Green Pattern Check VPB FRU listing

3EC VPB Display 100% Blue Pattern Check VPB FRU listing

3ED VPB Display 100% Red Pattern Check VPB FRU listing

3EE VPB Display GBR Crosshatch Pattern Check VPB FRU listing

3EF VPB Display Colorbar Test Pattern Check VPB FRU listing

3F0 VPB Display SMPTE Colorbar Pattern Check VPB FRU listing

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3F1 VPB Display Quadrature Test Pattern Check VPB FRU listing

3F2 VPB Display Comb Test Pattern Check VPB FRU listing

3F3 VPB Display Crosshair Pattern Check VPB FRU listing

3F4 VPB Display Linear Test Pattern Check VPB FRU listing at the end

3F5 VPB Display YUV Ramp Test Pattern Check VPB FRU listing

3F6 VPB Display AQLUT COMB Test Pattern Check VPB FRU listing

3F7 VPB Display Linear Test Pattern2 Check VPB FRU listing

3F8 VPB Display Variable Gray Box Check VPB FRU listing

3F9 VPB Display Luma Ramp Pattern Check VPB FRU listing

3FA VPB Display SMPTE RP-133-1986 Check VPB FRU listing

3FB VPB Display 100% Window Check VPB FRU listing

3FC VPB Display 50% Window Check VPB FRU listing

3FD VPB Display 10% Window Check VPB FRU listing

3FE VPB Display 0% Window Check VPB FRU listing

3FF VPB Display Crosshatch Pattern Check VPB FRU listing

400 RP Dev_Test N/A (development tool)

401 RP Slave Side Code/Data Ram Memory Test RP, SVC

402 RP Slave Side Dual Port RAM Memory Test RP, SVC

403 RP Xilinx Initialization Test RP, SVC

404 RP Output Clock Ram Data Bus Test RP, SVC

405 RP Output Clock Ram Address Bus Test RP, SVC

406 RP Output Clock Ram Test RP, SVC

407 RP Output Clock Line Draw I/O Test RP,SVC

408 RP Output Clock Ram Transfer Test RP, SVC

409 RP Output Clock Draw Lines Test RP, SVC

40A RP Output Clock Video Ram Data Test RP, SVC

40B RP Output Clock Line Draw Full Test RP, SVC

40C RP Output Clock Fast Verification Test RP, SVC

40D RP Removal Addr Table Data Bus Test RP, SVC

40E RP Removal Addr Table Addr Bus Test RP, SVC

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42-D

RP Interrupt Test 6 (RMTE_BUSY) N/A (development tool)

42E RP Interrupt Test 7 (SPB_INTR) RP, SVC

42F RP Interrupt Test 8 (CDM_INT*) CDM, RP, SVC

430 RP Interrupt Test 9 (AQP_INT*) AQP, RP

431 RP Interrupt Test 10 (SPARE_INT*) N/A (development tool)

432 RP Input Buffer Write Address Generator Test RP

433 AQP To RP Interface Test AQP, RP

434 WFP-RP M-mode Remote Line Transfer Test WFP, RP

435 DSP-RP Remote Buffer Transfer Test scan converter remote bus cable, DSP, WFP, RP

436 ECRI Ram Data Bus Test RP

437 ECRI Ram Address Bus Test RP

438 ECRI Ram Memory Test RP

439 ECRI ID/IC Path Test RP

43A ECRI Azimuthal Filter Test

43B ECRI Axial Filter Test RP

43C ECRI Side Lobe Reduction (SLR) Filter Test RP

43D ECRI Line Test RP

43E ECRI Frame Test AQP, RP

43F AQP_DEV_TEST N/A (development tool)

440 AQP Arctan Translation Table Data Bus Test AQP, RP, SVC

441 AQP Arctan Translation Table Address BusTest

AQP, RP, SVC

442 AQP Arctan Translation Table Memory Test AQP, RP, SVC

443 AQP Input Ultrasound Line Map Table DataBus Test

AQP, RP,SVC

444 AQP Input Ultrasound Line Map TableAddress Bus Test AQP, RP, SVC

445 AQP Input Ultrasound Line Map TableMemory Test

AQP, RP, SVC

446 AQP Output Ultrasound Line Map Table DataBus Test

AQP, RP,SVC

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447 AQP Output Ultrasound Line Map TableAddress Bus Test

AQP, RP, SVC

448 AQP Output Ultrasound Line Map Table

Memory Test

AQP, RP, SVC

449 AQP Needle Visualization Peak Table Data BusTest

AQP, RP, SVC

44A AQP Needle Visualization Peak Table AddressBus Test

AQP, RP, SVC

44B AQP Needle Visualization Peak Table MemoryTest

AQP, RP, SVC

44C AQP Frame Sequence Register File Data BusTest

AQP, RP, SVC

44D AQP Frame Sequence Register File AddressBus Test

AQP, RP, SVC

44E AQP Frame Sequence Register File MemoryTest

AQP, RP, SVC

44F AQP Axial Filter Xilinx Internal Register Test AQP, RP, SVC

452 AQP Control/Status Registers Test AQP, RP, SVC

453 AQP Transmit Zone Crossfade Data StructureTest

AQP, RP, SVC

454 AQP Azimuthal Filter Table (1,1) Data Bus Test AQP, RP, SVC

455 AQP Azimuthal Filter Table (1,1) Address BusTest

AQP, RP, SVC

456 AQP Azimuthal Filter Table (1,1) Memory Test AQP, RP, SVC



AQP, RP, SVC


45A AQP Azimuthal Filter Table (5,1) Data Bus Test AQP, RP, SVC

45B AQP Azimuthal Filter Table (5,1) Address BusTest

AQP, RP, SVC

45C AQP Azimuthal Filter Table (5,1) Memory Test AQP, RP, SVC

45D AQP Azimuthal Filter Table (3,1) Data Bus Test AQP, RP, SVC

45E AQP Azimuthal Filter Table (3,1) Address BusTest

AQP, RP, SVC

45F AQP Azimuthal Filter Table (3,1) Memory Test AQP, RP, SVC

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AQP, RP, SVC




AQP, RP, SVC




AQP, RP, SVC



46A AQP Azimuthal Filter Table (2,1) Address BusTest

AQP, RP, SVC

46B AQP Azimuthal Filter Table (2,1) Memory Test AQP, RP, SVC

46C AQP Azimuthal Filter Table (6,1) Data Bus Test AQP, RP, SVC

46D AQP Azimuthal Filter Table (6,1) Address BusTest

AQP, RP, SVC

46E AQP Azimuthal Filter Table (6,1) Memory Test AQP, RP, SVC

46F AQP Azimuthal Filter Table (6,2) Data Bus Test AQP, RP, SVC


AQP, RP, SVC


472 AQP Post Axial Filter Table Data Bus Test AQP, RP, SVC

473 AQP Post Axial Filter Table Address Bus Test AQP, RP, SVC

474 AQP Post Axial Filter Table Memory Test AQP, RP, SVC

475 AQP Acoustic Frame Buffer 0.0 Data Bus Test AQP, RP, SVC

476 AQP Acoustic Frame Buffer 0.0 Address BusTest

AQP, RP, SVC

477 AQP Acoustic Frame Buffer 0.0 Memory Test AQP, RP, SVC



AQP, RP, SVC

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47A AQP Acoustic Frame Buffer 1.0 Memory Test AQP, RP, SVC

47B AQP Acoustic Frame Buffer 2.0 Data Bus Test AQP, RP, SVC

47C AQP Acoustic Frame Buffer 2.0 Address BusTest

AQP, RP, SVC

47D AQP Acoustic Frame Buffer 2.0 Memory Test AQP, RP, SVC

47E AQP Acoustic Frame Buffer 0.1 Data Bus Test AQP, RP, SVC

47F AQP Acoustic Frame Buffer 0.1 Address BusTest

AQP, RP, SVC



482 AQP Acoustic Frame Buffer 1.1 Address Bus

Test

AQP, RP, SVC




AQP, RP, SVC




AQP, RP, SVC


48A AQP Acoustic Frame Buffer 1.2 Data Bus Test AQP, RP, SVC

48B AQP Acoustic Frame Buffer 1.2 Address BusTest

AQP, RP, SVC

48C AQP Acoustic Frame Buffer 1.2 Memory Test AQP, RP, SVC

48D AQP Acoustic Frame Buffer 2.2 Data Bus Test AQP, RP, SVC

48E AQP Acoustic Frame Buffer 2.2 Address BusTest

AQP, RP, SVC

48F AQP Acoustic Frame Buffer 2.2 Memory Test AQP, RP, SVC



AQP, RP, SVC



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AQP, RP, SVC




AQP, RP, SVC


499 AQP Test Registers Test AQP, RP, SVC

49A AQP Start of Frame Interrupt Test AQP, IOB, ZDT, STG

49B AQP Frame Acquisition Interrupt Test AQP, ZDT

49C AQP Acquisition Pipeline Partition A Test AQP, ZDT

49D AQP Acquisition Pipeline Partition B Test AQP, ZDT

49E AQP Acquisition Pipeline Partition C Test AQP, ZDT

49F AQP Acquisition Pipeline Partition D Test AQP, ZDT

4A0 AQP Crossfade Test AQP, ZDT

4A1 AQP Readout Sequence Complete InterruptTest

AQP, RP, SVC

4A2 AQP Axial Filter Xilinx Initialization Test AQP, RP, SVC

4A3 RP Interrupt Test 9 (AQP_INT*) AQP, RP, SVC

4A4 AQP J-TAG Instruction Register Test AQP, RP, SVC

4A5 AQP J-TAG Boundary Scan Register Test AQP, RP, SVC

4A6 AQP J-TAG Pseudo Signature Test AQP, RP, SVC

4A7 AQP AD CONVERTER TEST N/A (development tool)

4EA AQP Readout Path Signature Test 0 AQP, RP, SVC

4EB AQP Readout Path Signature Test 1 AQP, RP, SVC

4EC AQP Readout Path Signature Test 2 AQP, RP, SVC

4ED AQP Readout Path Signature Test 3 AQP, RP, SVC4EE AQP Readout Path Signature Test 4 AQP, RP, SVC

4EF AQP Readout Path Signature Test 5 AQP, RP, SVC

4F0 AQP Readout Path Signature Test 6 AQP, RP, SVC



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4FD Digitize AQP Reference Voltage

need precision voltage board

AQP, RP, SVC

4FE Is AQP 10Mhz there N/A (utility tool)

500 CDM Jumper ID Status Test CDM, RP

501 CDM Window Enable Status Test CDM, RP

502 CDM Initialization Status Test CDM, RP

528 CDM Persistence LUT SRAM Data March Test CDM

529 CDM Persistence LUT SRAM Address MarchTest

CDM

52A CDM Persistence LUT SRAM March C- Test CDM

52B CDM Persistence Reg File Memory Test CDM

52C CDM Persistence Bypass Mode Test CDM, RP

52-D

CDM Persistence Strip Mode Test CDM, RP

52E CDM Persistence Pass Through Mode Test CDM, RP

52F CDM Persistence Standard Primary Mode Test CDM, RP

530 CDM Persistence Standard Secondary ModeTest

CDM, RP

531 CDM Persistence Triggered Frame Mode Test CDM, RP

532 CDM Persistence Contrast Echo Mode Test CDM, RP

533 CDM Persistence Cine Playback Mode Test CDM, RP

534 CDM Persistence Alpha Coefficient Test CDM, RP

540 CDM Cine Counter Test CDM, RP

548 CDM Cine DRAM Data March Test CDM

549 CDM Cine DRAM March C- Test CDM

550 CDM Clear Image Memory VRAM Test CDM

558 CDM Image Memory (Ping) VRAM DataMarch Test

CDM

TES

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559 CDM Image Memory (Pong) VRAM DataMarch Test

CDM

55A CDM Image Memory (Ping) VRAM March C-

Test

CDM

55B CDM Image Memory (Pong) VRAM March C-Test

CDM

55C RP-CDM Interface Test CDM, RP

560 CDM Logical Region Map SRAM Data MarchTest

CDM

561 CDM Logical Region Map SRAM AddressMarch Test

CDM

562 CDM Logical Region Map SRAM March C-

Test

CDM

563 CDM Column Start Address SRAM DataMarch Test

CDM

564 CDM Column Start Address SRAM AddressMarch Test

CDM

565 CDM Column Start Address SRAM March C-Test

CDM

566 CDM SAM Controller SRAM Data March Test CDM

567 CDM SAM Controller SRAM Address MarchTest

CDM

568 CDM SAM Controller SRAM March C- Test CDM

569 CDM Image Controller Row Address StatusTest

CDM

56A CDM Image Controller Column AddressSignature Test

CDM

570 CDM Interpolation SRAM Data March Test CDM

571 CDM Interpolation SRAM Address March Test CDM

572 CDM Interpolation SRAM March C- Test CDM

573 CDM Interpolation Progressive PipelineSignature Test

CDM

574 CDM Interpolation Single Image SignatureTest

CDM, RP

575 CDM Interpolation Dual Image Signature Test CDM, RP

576 CDM Interpolation Quad Image Signature Test CDM, RP

TES

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577 CDM Interpolation Decimate Mask SignatureTest

CDM, RP

578 SCC Scope Loop N/A (utility tool)

579 WFP-RP-CDM Subsystem M-mode Test CDM, RP, WFP

57A AQP-RP-CDM Subsystem B-Mode Test CDM, AQP, RP

57B RP_H1_clk_loop N/A (utility tool)

580 UIC Master Side Dual Port RAM Data Bus Test UIC, IOB, SVC

581 UIC Master Side Dual Port RAM Addr Bus Test UIC, IOB, SVC

582 UIC Master Side Dual Port RAM Memory Test UIC, IOB, SVC

583 UIC Slave Side Dual Port RAM Memory Test UIC, IOB

584 UIC Slave Side SRAM Memory Test UIC, IOB

590 UIC Identification Test UIC, UIP, UIQ, UDC

591 UIC Reference Voltage Test UIC, IOB, MDI

592 UIC LCD Test UIC, UIP

593 UIC LED Driver Test UIC

594 UIC LED Test UIC, UIP

595 UIC Keyboard Legend DAC Test UIC

596 UIC Keyboard Push Button Indicator DAC Test UIC

597 UIC Keyboard Encoder Assignment DAC Test UIC

598 UIC LCD Contrast DAC Test UIC

599 UIC Downlighting DAC Test QWL, UIC

59A UIC LCD Backlighting DAC Test UIC

59B UIC UDC ID and EEPROM Data VerificationTests

UDC, UIC

59C UIC Sound Generator and Audio PROMOutput Test

UIC

59D UIC Audio Sound DAC Test UIC59E UIC Audio Volume DAC Test UIC

59F UIC EEPOT Wiper Counter and RegisterMemory Test

UIC

5C0 User Interface Keyboard Test N/A (utility tool)

5C1 UIC Interactive Test Menu N/A (utility tool)

TES

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5C2 UIC Interactive Keyboard Scan Test N/A (utility tool)

5C3 UIC Interactive Optical Encoder Test N/A (utility tool)

5C4 UIC Interactive DGC Slide Pot Test N/A (utility tool)

5C5 UIC Interactive Trackball Test N/A (utility tool)

5C6 UIC Interactive Audio Test N/A (utility tool)

5D0 UIC Interactive Four Corners Test N/A (development tool)

600 SVC2 PIC Internal Registers Test SVC

601 SVC2 MASK Register Test SVC

602 SVC2 System Memory Address and DataBusses Test

SVC

603 SVC2 System Memory Background Test SVC

604 SVC2 System Memory Increment Test SVC

605 SVC2 System Memory March C Test SVC

606 SVC2 Graphic Memory Data Test SVC

607 SVC2 Graphic Memory Address Test SVC

608 SVC2 Graphic Memory Background Test SVC

609 SVC2 Graphic Memory Increment Test SVC

60A SVC2 Graphic Memory Mask Test SVC

60B SVC2 Pixel Region Memory Background Test SVC

60C SVC2 Pixel Region Memory Increment Test SVC

60D SVC2 Pixel Region Memory Transfer CycleTest

SVC

60E SVC2 Battery Backed Memory Data Test SVC, RP

60F SVC2 Battery Backed Memory Address Test

WARNING: do not power off in middle of testor BBM data will be lost

SVC, RP

610 SVC2 Battery Backed Memory BackgroundTest


SVC, RP

611 SVC2 Battery Backed Memory Increment Test


SVC, RP

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612 SVC2 Coprocessor Test SVC

613 SVC2 Region Control Map Background Test SVC

614 SVC2 Region Control Map Increment Test SVC

615 SVC2 Graphic Palette Background Test SVC

616 SVC2 Graphic Palette Increment Test SVC

617 SVC2 Image Palette Background Test SVC

618 SVC2 Image Palette Increment Test SVC

619 SVC2 Field Control Background Test SVC

61A SVC2 Field Control Increment Test SVC

61B SVC2 Accumulator Input Map Background

Test

SVC

61C SVC2 Accumulator Input Map Increment Test SVC

61D SVC2 Real Time Clock Interrupt Test SVC

61E SVC2 Graphic B/W Patterns Test SVC

61F SVC2 Graphic Color Patterns Test SVC

620 SVC2 Constant Accumulation Test SVC

621 SVC2 Pixel Region Memory Checksum Test SVC

622 SVC2 Image and Graphic Mixing Test SVC

623 SVC2 WFP Waveforms System GraphicsSignature Test

WFP, SVC

625 SVC2 Serial Port Test N/A (utility tool)

626 CDM2 SVC2 B-Mode Image Signature Test CDM, SVC

627 CRP SVC2 Expanded Color Doppler MapSignature Test

CRP, SVC

628 SVC2 B/W and CDI Mix Low Signature Test CRP, CDM, SVC

629 SVC2 B/W and CDI Mix High Signature Test SVC, CRP, CDM

62A SVC2 B/W and CDI Threshold Signature Test SVC, CRP, CDM62B SVC2 System Accumulation Test SVC, CRP, CDM

64E SVC2 CDI Color Display N/A (utility tool))

64F SVC2 B/W B-Mode Display N/A (utility tool)

650 IOB Audio Control Port Test IOB, SVC

651 IOB Scanner Address Port Test IOB, SVC

TES

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674 Temperature sensor tests (0 to 40 C) scanner and scan converter temperature sensor

675 Temperature sensor tests (8 to 50 C: ESS)

same as test 674 but has wider limits fortemperature stress cycles in manufacturing

scanner and scan converter temperature sensor

676 Temperature to fan servo tests temperature maximum detector and +12V fan

677 PPS setpoint voltage accuracy tests PPS

678 Scanner power supply noise tests N/A (utility tool)

679 Scan converter power supply noise tests N/A (utility tool)

67A 300 VDC power supply noise test N/A (utility tool)

67B Internal 120 VAC noise test N/A (utility tool)

67C Temperature sensor noise tests N/A (utility tool)67D Temperature to fan servo noise tests N/A (utility tool)

67E PPS setpoint voltage noise tests N/A (utility tool)

69F IOB Developmental Tests N/A (development tool)

6A0 IOB External Composite Sync Test

needs custom external cables

IOB, VPB

6A1 IOB VIDEO PATH 0 Test IOB, VPB





6A6 IOB VIDEO PATH A Test IOB,VPB

6A7 IOB Margin Control Test IOB

6A8 IOB Auto Area Measurement Test IOB

6A9 IOB BCD Status Port Test

needs custom external cables

IOB

6AA

IOB Color Pattern IOB, VPB

6AB IOB Video Test Sequence IOB, VPB

6AC IOB DAS System Voltage Measurements N/A (utility tool)

6AD

IOB Serial Debug N/A (utility tool)

TES

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701 SCP/scanner set report level N/A (utility tool)

702 SCP UART enable N/A (utility tool)

703 SCP UART disable N/A (utility tool)

704 SCP BREAKPOINT toggle N/A (development tool)

705 SCP BREAKPOINT status N/A (development tool)

71e SCP development test N/A (development tool)

71f SCP boot PROM based DRAM “march c-” test SCP

720 SCP ID port read N/A (utility tool)

721 SCP LED blink test N/A (utility tool)

722 SCP DRAM data march test SCP

723 SCP DRAM address march test SCP

724 SCP DRAM “march c-” test SCP

725 SCP pointer sequence RAM data march test SCP

726 SCP pointer sequence RAM address march test SCP

727 SCP pointer sequence RAM “march c-” test SCP

728 SCP flash EEPROM SIMM test N/A (utility tool)

729 SCP timer 1 access test SCP

72A SCP timer 2 access test SCP

72B SCP interrupt controller 1 access test SCP

72C SCP interrupt controller 2 access test SCP

72-D

SCP software interrupt test SCP

72E SCP timer 1 element 0 interrupt test SCP

72F SCP timer 1 element 1 interrupt test SCP

730 SCP timer 1 element 2 interrupt test SCP




734 PBUS timeout test SCP

740 SCP ZDT RAM data march test ZDT, SCP

741 SCP ZDT RAM address march test ZDT, SCP

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742 SCP ZDT RAM “march c-” test ZDT, SCP

743 SVC2 ZDT RAM data march test SVC

744 SVC ZDT RAM address march test SVC

745 SVC2 ZDT RAM “march c-” test SVC

746 ZDT memory write line number and type N/A (utility tool)

747 ZDT DMA write line number and type (uservalues)

N/A (utility tool)

748 ZDT get board ID N/A (utility tool)

749 ZDT get interrupt status register N/A (utility tool)

74A ZDT AQP line number I/O write test AQP,IOB, ZDT, SCP, RP, SVC

74B ZDT AQP line type I/O write test AQP,IOB, ZDT, SCP, RP, SVC

74C ZDT AQP line number dma I/O write test AQP,IOB, ZDT, SCP, RP, SVC

74D ZDT AQP line type dma I/O write test AQP,IOB, ZDT, SCP, RP, SVC

74E ZDT ZBUS read timeout test ZDT, SCP, ZDL, ZIP

74F ZDT ZBUS write timeout test ZDT, SCP, ZDL, ZIP

751 ZBUS timeout and interrupt test ZDT, SCP

752 ZDT scanner state port test ZDT, STG, SCP

760 ZDL DL Switch time test ZDT, ZDL, SCP

761 ZDL get board ID N/A (utility tool)

762 ZDL get diag/aux port N/A (utility tool)

763 ZDL get transducer IDs N/A (utility tool)

764 ZDL select DL N/A (utility tool)

765 ZDL select thermal sense N/A (utility tool)

766 ZDL Tx test amp control N/A (utility tool)

767 ZDL cal amp control N/A (utility tool)

768 ZBUS status read N/A (utility tool)

769 ZBUS data read N/A (utility tool)

76A ZBUS data write N/A (utility tool)

77F ZDL relay check utility N/A (utility tool)

7A0 ZIP read PCA ID ZIP, ZDT, SCP

7A2 ZIP read XDCR ID N/A (utility tool)

TES

T


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7A4 ZIP read DIAG PORT N/A (utility tool)

7A5 ZIP select XDCR N/A (utility tool)

7A6 ZIP select thermal sense N/A (utility tool)

7A7 ZIP control ATDI power supplies N/A (utility tool)

7A8 ZIP get interrupt status N/A (utility tool)

7AE ZIP XDCR switch time ZIP, ZDT, SCP

7AF ZIP ATDI MCTA read/write test N/A (utility tool)

7B0 ZIP initialize board N/A (utility tool)

7B1 ZIP ATDI BAT ROM write N/A (utility tool)

7E0 PBUS SCP test mode DMA_II to DCC0 RAM

test (8 bytes)

DCC0, SCP

7E1 PBUS SCP timer initiated test mode DMA_II toDCC0 (8 bytes)

DCC0, SCP

7E2 PBUS DMA timeout (SCP error trap) interrupttest

SCP

7E4 Fire one tx/rx line once N/A (utility tool)

7E5 Fire each tx/rx line once N/A (utility tool)

7E6 Fire tx/rx line continuous, incr line on kbhit N/A (utility tool)

7E7 Get thermal sense A/D reading N/A (utility tool)

7E8 Put hex PPS command N/A (utility tool)

7E9 Get hex PPS status N/A (utility tool)

7EA PPS3 readback status calibration accuracy test PPS, ZDT, SCP, OVP

7ED PPS3 setpoint settling time test PPS, ZDT, SCP

7EE DCC0 memory page test DCC0, SCP

7EF DCC1 memory page test DCC1, SCP

7F0 DCC0 background memory test DCC0, SCP

7F1 DCC1 background memory test DCC1, SCP7F2 DCC0 increment memory test DCC0, SCP

7F3 DCC1 increment memory test DCC1, SCP

7F6 DCC0 signature test DCC0, SCP

7F7 DCC1 signature test DCC1, SCP

7F8 Memex checksum test MEX0, MEX1, MEX2, SCP

TES

T


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VPB FRU LIST The following error codes are reported only when running remotediagnostics and there is a VPB test failure. In the current version ofthe diagnostics, the error codes will only be displayed on the remoteterminal screen (i.e., these error codes are not displayed on theAspen system monitor).

7F9 Interrupt SVC2->SCP test ZDT, IOB, SCP, SVC

7FA Interrupt SCP->SVC2 test ZDT, IOB, SVC, SCP

7FB Interrupt SVC2->SCP NMI test ZDT, IOB, SCP, SVC

7FC SCP scanner state 0 interrupt test STG, SCP

7FF PPS3 setpoint settling time utility PPS, ZDT, SCP

TES

T


ERRORNUMBERS

ERROR CODES FRU INDICTMENTS

0 NO FAILURE None

1 UNKNOWN FAILURE N/A

2 HW CONFIG VPB, RP, SVC

3 SVC VIDEO SVC,RP

4 DIGITAL INPUT VPB, SVC-VPB digital cable, SVC

5 DIGITAL PIPELINE VPB

6 DIGITAL OUTPUT VPB, SVC, RP, SCMB

7 ANALOG INPUT VPB, IOB, RP

8 RP RASTER RP, SVC

9 LOCAL RASTER VPB,RP

10 SYSTEM RAM VPB, SVC, RP

11 IO REGISTERS VPB, RP

12 LOCAL INTERFACES VPB

13 SVC INTERRUPT VPB, SVC

14 CALIBRATED ANALOG LOOP VPB, IOB

Documents

08_59163