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半導體量測技術 Semiconductor Materials and Device Characterization Topic 7: time-of-flight technique and carrier mobility Instructor: Dr. Yi-Mu Lee Department of Electronic Engineering National United University. Review and new topics:. Charge pumping method (p. 379) - PowerPoint PPT Presentation
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半導體量測技術Semiconductor Materials and Device Characterization
Topic 7: time-of-flight technique and carrier mobility
Instructor: Dr. Yi-Mu Lee
Department of Electronic Engineering
National United University
Review and new topics:
• Charge pumping method (p. 379)• Haynes-Shockley experiment (time of flight)• Photoelectric effect (time of flight)• Introduction to mobility• Presentation: 12/29 = 3 students
01/05 = 5 students
• Final exam: (3:00pm~5:30pm)
Time-of-flight (drift mobility)
QA
Mobility
• MOSFET mobility
• Effective mobility
• Field-effect mobility
• Time-of-flight or drift mobility– Mobility and carrier velocity at high E-field
D. K. Schroder, p. 540
D. K. Schroder, p. 541
D. K. Schroder, p. 541
D. K. Schroder, p. 541
D. K. Schroder, p. 542~543
Continue to study p. 545
D. K. Schroder, p. 541
D. K. Schroder, p. 547
D. K. Schroder, p. 548
D. K. Schroder, p. 549
D. K. Schroder, p. 549
Continue to study p. 551
D. K. Schroder, p. 550
Review suggested
• 8.4 8.5• 8.6 8.8• (in D. K. Schroder)
*You are welcome to submit the above homework to get extra bonus for your semester grade!!
**These questions are still in the range of final exam!!