Embed Size (px)
Citation preview
Auto-ID Research - A Global Perspective from the RFID Academic Convocations
AUTO-ID Labs - Stephen Miles, Research Affiliate Laboratory for Manufacturing ProductivityMassachusetts Institute of Technologyhttp://autoid.mit.edu
Excerpts from: “RFID Technology and Applications”Stephen Miles, Sanjay Sarma, John WilliamsCo-Editors; Cambridge University Press, 2008
Page 2, [email protected] “Evolution of an RFID Revolution;”, AIDC 100 Conference, October 15, 2008 Merrimack College
Research in Radio Frequency IdentificationHosted by
MIT Auto-ID LabsLaboratory for Manufacturing and
Productivity
Co-Chairs:
Steve MilesBill Hardgrave, U Arkansas
Duncan MacFarlane- Auto-ID Lab Camb ridge
Hao Min- Auto-ID Lab FudanJohn Williams
http://web.mit.edu/auto-id/www/
Page 3, [email protected] “Evolution of an RFID Revolution;”, AIDC 100 Conference, October 15, 2008 Merrimack College
RFID for Identification, Location and Telemetry
Ch 2. RFID Technology and its ApplicationsSanjay Sarma, Auto-ID Labs at MIT
Page 4, [email protected] “Evolution of an RFID Revolution;”, AIDC 100 Conference, October 15, 2008 Merrimack College
Optimizing RFID chip performance
Ch. 3 RFID tag performance optimization: a chip perspectiveHao Min, Director, Auto-ID Labs at Fudan University
Ant1
Ant2
Rect.
Rect
Modu-lator
Modu-lator
ESD
ClockBias
Regu-lator
Env. Detector
POR
Base-band and
Memory
n
Tag Chip
RF Analog
Page 5, [email protected] “Evolution of an RFID Revolution;”, AIDC 100 Conference, October 15, 2008 Merrimack College
Testing RFID – HF/UHF/FF/NF
Ch. 4 Resolution and Integration of HF & UHFMarlin Mickle, RFID Center of Excellence, University of Pittsburgh
Page 6, [email protected] “Evolution of an RFID Revolution;”, AIDC 100 Conference, October 15, 2008 Merrimack College
Integrating Sensors with RFID
Ch. 5 Integrating Sensors and Actuators into RFID Tags , Kang Lee, NIST
Page 7, [email protected] “Evolution of an RFID Revolution;”, AIDC 100 Conference, October 15, 2008 Merrimack College
Testing RTLS Systems
Ch. 6 Performance Evaluation of WiFi RFID Localization Technologies Kaveh Pahlavan WISC, WPI
Page 8, [email protected] “Evolution of an RFID Revolution;”, AIDC 100 Conference, October 15, 2008 Merrimack College
Modeling Supply Chain Network Traffic
Ch 7. Modeling Supply Chain Network Traffic John Williams, Director, Auto-ID Labs
Page 9, [email protected] “Evolution of an RFID Revolution;”, AIDC 100 Conference, October 15, 2008 Merrimack College
Active Tag Deployment Security Issues
Ch. 8 Deployment Considerations for Active RFID Systems, Gisele Bennett, Director EOSL, GaTech
User(s)
Application
3
567
EnterpriseSystem
RFID Reader
Reader to Enterprise- Air interface- Network- etc.
4
Scope of REG WG 5C - Security Scope of ISO/IEC 24791-6
Air InterfaceRF Tag
1 2Tag to Reader
Page 10, [email protected] “Evolution of an RFID Revolution;”, AIDC 100 Conference, October 15, 2008 Merrimack College
Testing tag read rates across portals
Ch. 9 RFID in the Retail Supply Chain: Issues andOpportunities, Bill Hardgrave Director ITRI, UArk
Tag Read Example
83.33%
100%
60%
20%
73%
10%
60%
0.00%
10.00%
20.00%
30.00%
40.00%
50.00%
60.00%
70.00%
80.00%
90.00%
100.00%
Tag 1 Tag 2 Tag 3 Tag 4 Tag 5 Tag 6 Tag 7
Read Rate
Page 11, [email protected] “Evolution of an RFID Revolution;”, AIDC 100 Conference, October 15, 2008 Merrimack College
Tag User Memory Encoding - Aerospace
Ch.10 Reducing Barriers to ID System Adoption in the Aerospace Industry: the Aerospace ID Technologies Programme, Duncan McFarlane, Dir AutoID Labs Cambridge Univeristy
Page 12, [email protected] “Evolution of an RFID Revolution;”, AIDC 100 Conference, October 15, 2008 Merrimack College
The Cold Chain
Ch. 11 The Cold Chain Jean-Pierre Emond, Co-Director Center for Food Distribution and retailing, University of Florida
Page 13, [email protected] “Evolution of an RFID Revolution;”, AIDC 100 Conference, October 15, 2008 Merrimack College
Anti-counterfeiting EPC network scenario
Ch. 12 The Application of RFID as Anticounterfeiting Technique: Issues & Opportunities, Florian Michahelles, Assoc DirectorAuto-ID Labs ETH Zurich
Manufacturer
EPC-IS EPC-IS
Distributor Checkpoint
Anti-CounterfeitingApplication
Discovery Service (DS)
CertificateAuthority (CA)
Produced t0
Shipped t1
Received t2
Shipped t3
Object-SpecificSecurity Service
Secret key k1
Feature f1
Productwith EPC
Physical flow of product
EPC
Reader
Middleware
1. DS query (EPC – list{URIs})
2. Mutual authentication against CA; EPC-IS query (EPC – event)
3. Mutual authentication against CA; Object authentication protocol (EPC – Challenge/Response – Result) (EPC – object-specific Feature – Result)
Reader
Middleware
Reader
Middleware
Stor
e Eve
nt
Stor
e Eve
ntEP
C
EPC
1
Page 14, [email protected] “Evolution of an RFID Revolution;”, AIDC 100 Conference, October 15, 2008 Merrimack College
Product Lifecycle Management EID’s
Ch. 13 Closing Product Information Loops with Product Embedded Information DevicesDimitris Kiritsis, STI-IPR-LICP, EPFL Lausanne
Page 15, [email protected] “Evolution of an RFID Revolution;”, AIDC 100 Conference, October 15, 2008 Merrimack College
Intelligent Material Handling
Ch 14. Moving from RFID to Autonomous Cooperating Logistic Processes, Dieter Ucklemann, DISA, Univ of Bremen
Page 16, [email protected] “Evolution of an RFID Revolution;”, AIDC 100 Conference, October 15, 2008 Merrimack College
Resources: MIT Auto-ID Labs Open Source EPCIS
Conclusion, Stephen Miles, Auto-ID Labs
Page 17, [email protected] “Evolution of an RFID Revolution;”, AIDC 100 Conference, October 15, 2008 Merrimack College
Resources: MIT/SAP Research EPC Network Simulator
Page 18, [email protected] “Evolution of an RFID Revolution;”, AIDC 100 Conference, October 15, 2008 Merrimack College
Auto-ID Labs around the world- architecting an Internet of Things.
