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MU Sigma GroupJan 2017

() : A

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DOE(DOE Program)

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Design of Experiments, DOE

DOEDOEMinitabDOEDOE

DOEDMAICDOE 3-4 6 - 12

3

1. 2.

3. DOE

4. 5. DMAIC6. Minitab

4

DOE

5

DOE

6

7

-- 4

()

DOEDOE

Box-Behnken

Minitab (CCCCCICCF)

Minitab, Box-Behnken DOERoadmap

DOE

, Minitab

,

Minitab

DOE, ,

, , ,

Minitab

Minitab

Minitab (PSA) ()

Skills of DOE

Plackett-Burman DOE

Q & A

DOE DOE

, DOE)LunchDOE Video

8

TTF

Perc

ent

2000150010005000

100

80

60

40

20

0

Table of Statistics

Median 743.927IQR 602.563Failure 10Censor 0AD* 1.277

Shape

Correlation 0.995

1.90180Scale 902.043Mean 800.416StDev 437.815

Parametric Survival Plot for TTF

Complete Data - LSXY EstimatesWeibull

Taguchi

Process or Product Name: Prepared by:

Responsible: FMEA Date (Orig) ______________ (Rev) ___

Process Step/Part Number Potential Failure Mode Potential Failure Effects

SEV Potential Causes

OCC Current Controls

DET

RPN

Spin Draw Process

Fiber Breakouts Undersized package, High SD panel-hours lost 2

Dirty Spinneret8

Visual Detection of Wraps and broken Filaments 9 144

5Filament motion

2Visual Sight-glass

8 80

8Polymer defects

2Fuzzball Light

9 144

0

Process/Product Failure Modes and Effects Analysis

(FMEA)

FMEA

DOE/RSM

f(x) CPM

;

9

(RSM) Plackett-Burman

10

(Sequential Experimentation)

(POA)

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Plackett-Burman()

C.C.D

()

()

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///DMAIC/MFSS/ DFSSDFX/DFA/DFM /DFT/DFP

MBA /

/MBB 09-10;

/MBB 03-08 BMG (MBB) 02-03 (GE)

/MBB(EHS) 95-02

92-95/ 91-92 NPI 88-90 1987

: 2000 GE(ACFC) 2001 GEe(eGE) 2007 DSS 2009.02 2013.08 DFX

: 36Netgear5Arris4

DFSS/DFX: 1313552233224/////// 9255 22 ABB24

(Steven Lee) /MBB

13

www.musigmagroup.com/twwww.musigmagroup.com/cn

Steven.Lee@musigmagroup.com : 0921-815-656 (tw) 139-1037-3627(cn)Candy.Wu@musigmagroup.com : 0920-786-055 (tw) 135-2004-2907(cn): +886-2-2603-9225 Fax: +886-2-2603-1987

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