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Microscopy lecture 14. June 2019

Structured Illumination Microscopy (plus a little bit of 4Pi…)

Dr. Kai Wicker Team Head – Imaging and Smart Sensor Systems Carl Zeiss AG, Corporate Research and Technology

Revision: - McCutchen Aperture - Incoherent wide-field OTF Increasing the NA: - 4Pi Microscopy Beyond the Abbe-limit: Structured Illumination Microscopy (SIM) - Basic setup - PSF and OTF - SIM image formation and reconstruction

Today:

Quick revision: the incoherent wide-field OTF (and the missing cone)

Inverse

Fourier

Transform

Fourier

Transform

Inverse

Fourier

Transform

Fourier

Transform

Absolute square Convolution (Auto-correlation)

PSF

APSF

OTF

ATF

Optical Transfer Function (OTF): For incoherent microscopy techniques, e.g. fluorescence microscopy

Missing cone

Optical Transfer Function (OTF): For incoherent microscopy techniques, e.g. fluorescence microscopy

Lateral support

Missing cone

Optical Transfer Function (OTF): For incoherent microscopy techniques, e.g. fluorescence microscopy

Lateral support

Axial support

Missing cone

Optical Transfer Function (OTF): For incoherent microscopy techniques, e.g. fluorescence microscopy

Lateral support

Axial support

The missing cone and optical sectioning:

Missing cone

Lateral support

Axial support

The missing cone and optical sectioning:

Missing cone

Lateral support

Axial support

The missing cone and optical sectioning:

Missing cone

Lateral support

Axial support

Enlarging the NA:

4Pi Microscopy

Aperture increase: 4 Pi Microscope (Type C)

Fluorescence Intensity

z

z

Stefan W. Hell Max Planck Institute of Biophysical Chemistry

Göttingen, Germany

Aperture increase: 4 Pi Microscope (Type C)

Fluorescence Intensity

z

z

Stefan W. Hell Max Planck Institute of Biophysical Chemistry

Göttingen, Germany

Aperture increase: 4 Pi Microscope (Type C)

Fluorescence Intensity

z

z

Stefan W. Hell Max Planck Institute of Biophysical Chemistry

Göttingen, Germany

Aperture increase: 4 Pi Microscope (Type C)

Fluorescence Intensity

z

z

Stefan W. Hell Max Planck Institute of Biophysical Chemistry

Göttingen, Germany

Aperture increase: 4 Pi Microscope (Type C)

Sample between Coverslips

Fluorescence Intensity

z

z

Stefan W. Hell Max Planck Institute of Biophysical Chemistry

Göttingen, Germany

Aperture increase: 4 Pi Microscope (Type C)

Sample between Coverslips

Fluorescence Intensity

z

z

Stefan W. Hell Max Planck Institute of Biophysical Chemistry

Göttingen, Germany

Aperture increase: 4 Pi Microscope (Type C)

Sample between Coverslips

Illumination Emission

Fluorescence Intensity

z

z

Stefan W. Hell Max Planck Institute of Biophysical Chemistry

Göttingen, Germany

Aperture increase: 4 Pi Microscope (Type C)

Sample between Coverslips

Illumination Emission

Fluorescence Intensity

z

z

Stefan W. Hell Max Planck Institute of Biophysical Chemistry

Göttingen, Germany

Aperture increase: 4 Pi Microscope (Type C)

Sample between Coverslips

Illumination Emission

Fluorescence Intensity

z

z

Stefan W. Hell Max Planck Institute of Biophysical Chemistry

Göttingen, Germany

Aperture increase: 4 Pi Microscope (Type C)

Sample between Coverslips

Illumination Emission

Fluorescence Intensity

z

z

Stefan W. Hell Max Planck Institute of Biophysical Chemistry

Göttingen, Germany

Aperture increase: 4 Pi Microscope (Type C)

Sample between Coverslips

Illumination Emission

Fluorescence Intensity

z

z

Stefan W. Hell Max Planck Institute of Biophysical Chemistry

Göttingen, Germany

Aperture increase: 4 Pi Microscope (Type C)

Sample between Coverslips

Illumination Emission

Fluorescence Intensity

z

z

Dichromatic Beamsplitter

Stefan W. Hell Max Planck Institute of Biophysical Chemistry

Göttingen, Germany

Aperture increase: 4 Pi Microscope (Type C)

Sample between Coverslips

Illumination Emission

Detector Pinhole

Fluorescence Intensity

z

z

Dichromatic Beamsplitter

Stefan W. Hell Max Planck Institute of Biophysical Chemistry

Göttingen, Germany

Aperture increase: 4 Pi Microscope (Type C)

Sample between Coverslips

Illumination Emission

Detector Pinhole

High Sidelobes

Fluorescence Intensity

z

z

Dichromatic Beamsplitter

Stefan W. Hell Max Planck Institute of Biophysical Chemistry

Göttingen, Germany

Aperture increase: 4 Pi Microscope (Type C)

Sample between Coverslips

Illumination Emission

Detector Pinhole

High Sidelobes

Fluorescence Intensity

z

z

Dichromatic Beamsplitter

Stefan W. Hell Max Planck Institute of Biophysical Chemistry

Göttingen, Germany

Aperture increase: 4 Pi Microscope (Type C)

Sample between Coverslips

Illumination Emission

Detector Pinhole

High Sidelobes

Fluorescence Intensity

z

z

Dichromatic Beamsplitter

Stefan W. Hell Max Planck Institute of Biophysical Chemistry

Göttingen, Germany

2 Photon Effect

Aperture increase: 4 Pi Microscope (Type C)

ATF OTF

widefield

4Pi

widefield, l=500nm 4Pi, l=500nm

widefield, l=1000nm 4Pi, l=1000nm

4Pi PSFs

widefield, l=500nm 4Pi, l=500nm

widefield, l=1000nm 4Pi, l=1000nm

4Pi PSFs

widefield, l=500nm 4Pi, l=500nm

widefield, l=1000nm 4Pi, l=1000nm 2-photon, l=1000nm 4Pi, l=1000nm, 2-photon

4Pi PSFs

widefield, l=500nm 4Pi, l=500nm

widefield, l=1000nm 4Pi, l=1000nm

4Pi PSFs

widefield, l=500nm 4Pi, l=500nm

widefield, l=1000nm 4Pi, l=1000nm

4Pi PSFs

widefield, l=500nm 4Pi, l=500nm

widefield, l=1000nm 4Pi, l=1000nm 2-photon, l=1000nm 4Pi, l=1000nm, 2-photon

4Pi PSFs

Leica 4Pi

http://www.leica-microsystems.com

4Pi images Deviding Escherichia Coli

From: Bahlmann, K., S. Jakob, and S. W. Hell (2001). Ultramicr. 87: 155-164.

Image: Joerg Bewersdorf, Max-Planck-Institute for Biophysical Chemistry, Goettingen, Germany

Confocal

4Pi

Beyond the Abbe limit:

Structured Illumination Microscopy (SIM)

Real space Fourier space

Sample Sample frequencies

Structured Illumination Microscopy How it works

Real space Fourier space

Sample Sample frequencies

Structured Illumination Microscopy How it works

The moiré effect

The moiré effect

moiré patterns

high frequency

detail

Structured Illumination Microscopy How it works

The Moiré effect

high frequency

detail

high frequency

grid

Structured Illumination Microscopy How it works

The Moiré effect

high frequency

detail

high frequency

grid

low frequency

Moiré fringes

Structured Illumination Microscopy How it works

The Moiré effect

The Moiré effect

Sample

Illumination

The Moiré effect

Real space Real space

Sample Illumination

Structured Illumination Microscopy How it works

Real space Real space

Sample Illumination

Structured Illumination Microscopy How it works

Real space Real space

Sample Illumination ∙

Structured Illumination Microscopy How it works

Real space Real space

Sample Illumination ∙

Emission pattern

Structured Illumination Microscopy How it works

Sample ∙ Illumination

Real space Fourier space

„Convolution theorem“

Structured Illumination Microscopy How it works

Sample ∙ Illumination

Real space Fourier space

„Convolution theorem“

Structured Illumination Microscopy How it works

Sample ∙ Illumination

Real space Fourier space

FT

„Convolution theorem“

Multiplication

Structured Illumination Microscopy How it works

Sample ∙ Illumination

Real space Fourier space

FT

„Convolution theorem“

Multiplication

Structured Illumination Microscopy How it works

Sample ∙ Illumination

Real space Fourier space

FT

„Convolution theorem“

Multiplication

Sample Illumination

Convolution

Structured Illumination Microscopy How it works

Structured Illumination Microscopy How it works

Fourier space Fourier space

Sample Illumination

Convolution: Take the sample as a brush to „paint“ the illumination.

Structured Illumination Microscopy How it works

Fourier space Fourier space

Sample Illumination

Convolution: Take the sample as a brush to „paint“ the illumination.

Structured Illumination Microscopy How it works

Fourier space Fourier space

Sample Illumination

Convolution: Take the sample as a brush to „paint“ the illumination.

Structured Illumination Microscopy How it works

Fourier space Fourier space

Sample Illumination

Convolution: Take the sample as a brush to „paint“ the illumination.

Structured Illumination Microscopy How it works

Fourier space Fourier space

Sample Illumination

Convolution: Take the sample as a brush to „paint“ the illumination.

Real space Fourier space

Emission pattern Emission pattern frequencies

Structured Illumination Microscopy How it works

Real space Fourier space

Emission pattern Emission pattern frequencies

Structured Illumination Microscopy How it works

Real space Fourier space

Emission pattern Emission pattern frequencies SIM raw image

Structured Illumination Microscopy How it works

Real space Fourier space

Emission pattern Emission pattern frequencies SIM raw image SIM raw image frequencies

Structured Illumination Microscopy How it works

Real space Fourier space

SIM raw image SIM raw image frequencies

enhanced contrast

Moiré fringes

Structured Illumination Microscopy How it works

Structured Illumination Microscopy How it works

Real space Real space

Phase stepping of illumination pattern provides information for linear unmixing of components.

ZOOM

Structured Illumination Microscopy How it works

Real space Real space

Phase stepping of illumination pattern provides information for linear unmixing of components.

ZOOM

Structured Illumination Microscopy How it works

Real space Real space

Phase stepping of illumination pattern provides information for linear unmixing of components.

ZOOM

Structured Illumination Microscopy How it works

Real space Real space

Phase stepping of illumination pattern provides information for linear unmixing of components.

ZOOM

Structured Illumination Microscopy How it works

Real space Real space

Phase stepping of illumination pattern provides information for linear unmixing of components.

ZOOM

Structured Illumination Microscopy How it works

Real space Real space

Phase stepping of illumination pattern provides information for linear unmixing of components.

ZOOM

Structured Illumination Microscopy How it works

Real space Real space

Phase stepping of illumination pattern provides information for linear unmixing of components.

ZOOM

Fourier space

1. Separate the 3 components

Structured Illumination Microscopy How it works

Fourier space

1. Separate the 3 components

Structured Illumination Microscopy How it works

Fourier space

1. Separate the 3 components

Structured Illumination Microscopy How it works

Fourier space

1. Separate the 3 components

Structured Illumination Microscopy How it works

Fourier space

1. Separate the 3 components 2. Shift them to the correct frequencies

Structured Illumination Microscopy How it works

Fourier space

1. Separate the 3 components 2. Shift them to the correct frequencies 3. Recombine them (weighted averaging)

Structured Illumination Microscopy How it works

Fourier space

1. Separate the 3 components 2. Shift them to the correct frequencies 3. Recombine them (weighted averaging)

Structured Illumination Microscopy How it works

Fourier space

1. Separate the 3 components 2. Shift them to the correct frequencies 3. Recombine them (weighted averaging)

Structured Illumination Microscopy How it works

Fourier space

1. Separate the 3 components 2. Shift them to the correct frequencies 3. Recombine them (weighted averaging)

Real space

SIM image (x only)

Structured Illumination Microscopy How it works

Fourier space

1. Separate the 3 components 2. Shift them to the correct frequencies 3. Recombine them (weighted averaging)

Real space

SIM image (x only)

Structured Illumination Microscopy How it works

Real space Fourier space

SIM image (x only) SIM image frequencies

Structured Illumination Microscopy How it works

Real space Fourier space

SIM image (x only) SIM image frequencies

Structured Illumination Microscopy How it works

Real space Fourier space

SIM image (x only) SIM image frequencies Wide field image Wide field image frequencies

Structured Illumination Microscopy How it works

Full-field illumination

1 focus in back focal plane

Missing cone – no optical sectioning

Full-field illumination

1 focus in back focal plane

2-beam structured illumination

2 foci in back focal plane

Missing cone – no optical sectioning

2-beam structured illumination

2 foci in back focal plane

3-beam structured illumination

3 foci in back focal plane

Missing cone filled – optical sectioning

3-beam structured illumination

3 foci in back focal plane

Missing cone filled – optical sectioning

3-beam structured illumination

3 foci in back focal plane better

z-resolution

SIM-Setup

SIM-Setup

SIM-Setup

Image formation in SIM

Raw image: 𝐸 𝒓 = {𝐼 𝑆} ⊗ ℎ 𝒓

In real space

Raw image: 𝐸 𝒓 = {𝐼 𝑆} ⊗ ℎ 𝒓

Illumination pattern: 𝐼 𝒓 = 1 + cos 𝒌𝑔𝒓 + 𝜃

grating vector grating position

In real space

Raw image: 𝐸 𝒓 = {𝐼 𝑆} ⊗ ℎ 𝒓

Illumination pattern: 𝐼 𝒓 = 1 + cos 𝒌𝑔𝒓 + 𝜃

grating vector grating position

nth illumination pattern: 𝐼𝑛 𝒓 = 1 + cos 𝒌𝑔𝒓 + 𝜃𝒏

In real space

Raw image: 𝐸 𝒓 = {𝐼 𝑆} ⊗ ℎ 𝒓

Illumination pattern: 𝐼 𝒓 = 1 + cos 𝒌𝑔𝒓 + 𝜃

grating vector grating position

nth illumination pattern: 𝐼𝑛 𝒓 = 1 + cos 𝒌𝑔𝒓 + 𝜃𝒏

= 1 +1

2exp 𝑖{𝒌𝑔𝒓 + 𝜃𝒏} +

1

2exp −𝑖{𝒌𝑔𝒓 + 𝜃𝒏}

In real space

nth illumination pattern: 𝐼𝑛 𝒓 = 1 + cos 𝒌𝑔𝒓 + 𝜃𝒏

Raw image: 𝐸 𝒓 = {𝐼 𝑆} ⊗ ℎ 𝒓

= 1 +1

2exp 𝑖{𝒌𝑔𝒓 + 𝜃𝒏} +

1

2exp −𝑖{𝒌𝑔𝒓 + 𝜃𝒏} = 1 +

1

2exp 𝑖{𝒌𝑔𝒓 + 𝜃𝒏} +

1

2exp −𝑖{𝒌𝑔𝒓 + 𝜃𝒏}

Raw image: 𝐸 𝒓 = {𝐼 𝑆} ⊗ ℎ 𝒓

nth illumination pattern: 𝐼𝑛 𝒓 = 1 + cos 𝒌𝑔𝒓 + 𝜃𝒏

Illumination pattern: 𝐼 𝒓 = 1 + cos 𝒌𝑔𝒓 + 𝜃

grating vector grating position

In real space

nth illumination pattern: 𝐼𝑛 𝒓 = 1 + cos 𝒌𝑔𝒓 + 𝜃𝒏

Raw image: 𝐸 𝒓 = {𝐼 𝑆} ⊗ ℎ 𝒓

= 1 +1

2exp 𝑖{𝒌𝑔𝒓 + 𝜃𝒏} +

1

2exp −𝑖{𝒌𝑔𝒓 + 𝜃𝒏} = 1 +

1

2exp 𝑖{𝒌𝑔𝒓 + 𝜃𝒏} +

1

2exp −𝑖{𝒌𝑔𝒓 + 𝜃𝒏}

Raw image: 𝐸 𝒓 = {𝐼 𝑆} ⊗ ℎ 𝒓

nth illumination pattern: 𝐼𝑛 𝒓 = 1 + cos 𝒌𝑔𝒓 + 𝜃𝒏

Illumination pattern: 𝐼 𝒓 = 1 + cos 𝒌𝑔𝒓 + 𝜃

grating vector grating position

In real space In Fourier space

nth illumination pattern: 𝐼𝑛 𝒓 = 1 + cos 𝒌𝑔𝒓 + 𝜃𝒏

Raw image: 𝐸 𝒓 = {𝐼 𝑆} ⊗ ℎ 𝒓

= 1 +1

2exp 𝑖{𝒌𝑔𝒓 + 𝜃𝒏} +

1

2exp −𝑖{𝒌𝑔𝒓 + 𝜃𝒏} = 1 +

1

2exp 𝑖{𝒌𝑔𝒓 + 𝜃𝒏} +

1

2exp −𝑖{𝒌𝑔𝒓 + 𝜃𝒏}

Raw image: 𝐸 𝒓 = {𝐼 𝑆} ⊗ ℎ 𝒓

nth illumination pattern: 𝐼𝑛 𝒓 = 1 + cos 𝒌𝑔𝒓 + 𝜃𝒏

Illumination pattern: 𝐼 𝒓 = 1 + cos 𝒌𝑔𝒓 + 𝜃

grating vector grating position

In real space In Fourier space

𝐸 𝑛 𝒌 = 𝐼 𝑛 ⊗ 𝑆 ℎ 𝒌

𝐼 𝑛 𝒌 = 𝛿 𝒌 +1

2𝒆𝑖𝜃𝒏 𝛿 𝒌 − 𝒌𝑔 +

1

2𝒆−𝑖𝜃𝒏 𝛿 𝒌 + 𝒌𝑔

In Fourier space

𝐸 𝑛 𝒌 = 𝐼 𝑛 ⊗ 𝑆 ℎ 𝒌

𝐼 𝑛 𝒌 = 𝛿 𝒌 +1

2𝒆𝑖𝜃𝒏 𝛿 𝒌 − 𝒌𝑔 +

1

2𝒆−𝑖𝜃𝒏 𝛿 𝒌 + 𝒌𝑔

In Fourier space

𝐸 𝑛 𝒌 = 𝐼 𝑛 ⊗ 𝑆 ℎ 𝒌

𝐼 𝑛 𝒌 = 𝛿 𝒌 +1

2𝒆𝑖𝜃𝒏 𝛿 𝒌 − 𝒌𝑔 +

1

2𝒆−𝑖𝜃𝒏 𝛿 𝒌 + 𝒌𝑔

In Fourier space

𝐸 𝑛 𝒌 = 𝐼 𝑛 ⊗ 𝑆 ℎ 𝒌

𝐼 𝑛 𝒌 = 𝛿 𝒌 +1

2𝒆𝑖𝜃𝒏 𝛿 𝒌 − 𝒌𝑔 +

1

2𝒆−𝑖𝜃𝒏 𝛿 𝒌 + 𝒌𝑔

𝐸 𝑛 𝒌 = 𝑆 𝒌 ℎ 𝒌 + 𝒆𝑖𝜃𝒏1

2𝑆 𝒌 − 𝒌𝑔 ℎ 𝒌 + 𝒆−𝑖𝜃𝒏

1

2𝑆 𝒌 + 𝒌𝑔 ℎ 𝒌

In Fourier space

𝐸 𝑛 𝒌 = 𝐼 𝑛 ⊗ 𝑆 ℎ 𝒌

𝐼 𝑛 𝒌 = 𝛿 𝒌 +1

2𝒆𝑖𝜃𝒏 𝛿 𝒌 − 𝒌𝑔 +

1

2𝒆−𝑖𝜃𝒏 𝛿 𝒌 + 𝒌𝑔

𝐸 𝑛 𝒌 = 𝑆 𝒌 ℎ 𝒌 + 𝒆𝑖𝜃𝒏1

2𝑆 𝒌 − 𝒌𝑔 ℎ 𝒌 + 𝒆−𝑖𝜃𝒏

1

2𝑆 𝒌 + 𝒌𝑔 ℎ 𝒌

𝐶 0 𝒌 𝐶 1 𝒌 𝐶 −1 𝒌 Components:

Images:

In Fourier space

𝐸 𝑛 𝒌 = 𝐼 𝑛 ⊗ 𝑆 ℎ 𝒌

𝐼 𝑛 𝒌 = 𝛿 𝒌 +1

2𝒆𝑖𝜃𝒏 𝛿 𝒌 − 𝒌𝑔 +

1

2𝒆−𝑖𝜃𝒏 𝛿 𝒌 + 𝒌𝑔

𝐸 𝑛 𝒌 = 𝑆 𝒌 ℎ 𝒌 + 𝒆𝑖𝜃𝒏1

2𝑆 𝒌 − 𝒌𝑔 ℎ 𝒌 + 𝒆−𝑖𝜃𝒏

1

2𝑆 𝒌 + 𝒌𝑔 ℎ 𝒌

𝐶 0 𝒌 𝐶 1 𝒌 𝐶 −1 𝒌 Components:

Images:

In Fourier space

𝐸 𝑛 𝒌 = 𝐼 𝑛 ⊗ 𝑆 ℎ 𝒌

𝐼 𝑛 𝒌 = 𝛿 𝒌 +1

2𝒆𝑖𝜃𝒏 𝛿 𝒌 − 𝒌𝑔 +

1

2𝒆−𝑖𝜃𝒏 𝛿 𝒌 + 𝒌𝑔

𝐸 𝑛 𝒌 = 𝑆 𝒌 ℎ 𝒌 + 𝒆𝑖𝜃𝒏1

2𝑆 𝒌 − 𝒌𝑔 ℎ 𝒌 + 𝒆−𝑖𝜃𝒏

1

2𝑆 𝒌 + 𝒌𝑔 ℎ 𝒌

𝐶 0 𝒌 𝐶 1 𝒌 𝐶 −1 𝒌 Components:

Images:

In Fourier space

𝐸 𝑛 𝒌 = 𝐼 𝑛 ⊗ 𝑆 ℎ 𝒌

𝐼 𝑛 𝒌 = 𝛿 𝒌 +1

2𝒆𝑖𝜃𝒏 𝛿 𝒌 − 𝒌𝑔 +

1

2𝒆−𝑖𝜃𝒏 𝛿 𝒌 + 𝒌𝑔

𝐸 𝑛 𝒌 = 𝑆 𝒌 ℎ 𝒌 + 𝒆𝑖𝜃𝒏1

2𝑆 𝒌 − 𝒌𝑔 ℎ 𝒌 + 𝒆−𝑖𝜃𝒏

1

2𝑆 𝒌 + 𝒌𝑔 ℎ 𝒌

𝐶 0 𝒌 𝐶 1 𝒌 𝐶 −1 𝒌 Components:

Images:

In Fourier space

𝐸 𝑛 𝒌 = 𝐼 𝑛 ⊗ 𝑆 ℎ 𝒌

𝐼 𝑛 𝒌 = 𝛿 𝒌 +1

2𝒆𝑖𝜃𝒏 𝛿 𝒌 − 𝒌𝑔 +

1

2𝒆−𝑖𝜃𝒏 𝛿 𝒌 + 𝒌𝑔

𝐸 𝑛 𝒌 = 𝑆 𝒌 ℎ 𝒌 + 𝒆𝑖𝜃𝒏1

2𝑆 𝒌 − 𝒌𝑔 ℎ 𝒌 + 𝒆−𝑖𝜃𝒏

1

2𝑆 𝒌 + 𝒌𝑔 ℎ 𝒌

𝐶 0 𝒌 𝐶 1 𝒌 𝐶 −1 𝒌 Components:

Images:

In Fourier space

𝐸 𝑛 𝒌 = 𝐼 𝑛 ⊗ 𝑆 ℎ 𝒌

𝐼 𝑛 𝒌 = 𝛿 𝒌 +1

2𝒆𝑖𝜃𝒏 𝛿 𝒌 − 𝒌𝑔 +

1

2𝒆−𝑖𝜃𝒏 𝛿 𝒌 + 𝒌𝑔

𝐸 𝑛 𝒌 = 𝑆 𝒌 ℎ 𝒌 + 𝒆𝑖𝜃𝒏1

2𝑆 𝒌 − 𝒌𝑔 ℎ 𝒌 + 𝒆−𝑖𝜃𝒏

1

2𝑆 𝒌 + 𝒌𝑔 ℎ 𝒌

𝐶 0 𝒌 𝐶 1 𝒌 𝐶 −1 𝒌 Components:

Images:

𝐶 0 𝒌

𝐶 1 𝒌

𝐶 −1 𝒌

In Fourier space

𝐸 𝑛 𝒌 = 𝐼 𝑛 ⊗ 𝑆 ℎ 𝒌

𝐼 𝑛 𝒌 = 𝛿 𝒌 +1

2𝒆𝑖𝜃𝒏 𝛿 𝒌 − 𝒌𝑔 +

1

2𝒆−𝑖𝜃𝒏 𝛿 𝒌 + 𝒌𝑔

𝐸 𝑛 𝒌 = 𝑆 𝒌 ℎ 𝒌 + 𝒆𝑖𝜃𝒏1

2𝑆 𝒌 − 𝒌𝑔 ℎ 𝒌 + 𝒆−𝑖𝜃𝒏

1

2𝑆 𝒌 + 𝒌𝑔 ℎ 𝒌

𝐶 0 𝒌 𝐶 1 𝒌 𝐶 −1 𝒌 Components:

Images:

In Fourier space

𝐸 𝑛 𝒌 = 𝐼 𝑛 ⊗ 𝑆 ℎ 𝒌

𝐼 𝑛 𝒌 = 𝛿 𝒌 +1

2𝒆𝑖𝜃𝒏 𝛿 𝒌 − 𝒌𝑔 +

1

2𝒆−𝑖𝜃𝒏 𝛿 𝒌 + 𝒌𝑔

𝐸 𝑛 𝒌 = 𝑆 𝒌 ℎ 𝒌 + 𝒆𝑖𝜃𝒏1

2𝑆 𝒌 − 𝒌𝑔 ℎ 𝒌 + 𝒆−𝑖𝜃𝒏

1

2𝑆 𝒌 + 𝒌𝑔 ℎ 𝒌

𝐶 0 𝒌 𝐶 1 𝒌 𝐶 −1 𝒌 Components:

Images:

Matrix notation:

In Fourier space

𝐸 𝑛 𝒌 = 𝐼 𝑛 ⊗ 𝑆 ℎ 𝒌

𝐼 𝑛 𝒌 = 𝛿 𝒌 +1

2𝒆𝑖𝜃𝒏 𝛿 𝒌 − 𝒌𝑔 +

1

2𝒆−𝑖𝜃𝒏 𝛿 𝒌 + 𝒌𝑔

𝐸 𝑛 𝒌 = 𝑆 𝒌 ℎ 𝒌 + 𝒆𝑖𝜃𝒏1

2𝑆 𝒌 − 𝒌𝑔 ℎ 𝒌 + 𝒆−𝑖𝜃𝒏

1

2𝑆 𝒌 + 𝒌𝑔 ℎ 𝒌

𝐶 0 𝒌 𝐶 1 𝒌 𝐶 −1 𝒌 Components:

Images:

Matrix notation:

𝑬 𝒌 =

𝐸 1 𝒌

𝐸 2 𝒌

𝐸 3 𝒌

Vector of images:

In Fourier space

𝐸 𝑛 𝒌 = 𝐼 𝑛 ⊗ 𝑆 ℎ 𝒌

𝐼 𝑛 𝒌 = 𝛿 𝒌 +1

2𝒆𝑖𝜃𝒏 𝛿 𝒌 − 𝒌𝑔 +

1

2𝒆−𝑖𝜃𝒏 𝛿 𝒌 + 𝒌𝑔

𝐸 𝑛 𝒌 = 𝑆 𝒌 ℎ 𝒌 + 𝒆𝑖𝜃𝒏1

2𝑆 𝒌 − 𝒌𝑔 ℎ 𝒌 + 𝒆−𝑖𝜃𝒏

1

2𝑆 𝒌 + 𝒌𝑔 ℎ 𝒌

𝐶 0 𝒌 𝐶 1 𝒌 𝐶 −1 𝒌 Components:

Images:

Matrix notation:

𝑬 𝒌 =

𝐸 1 𝒌

𝐸 2 𝒌

𝐸 3 𝒌

Vector of images: 𝑪 𝒌 =

𝐶 −1 𝒌

𝐶 0 𝒌

𝐶 1 𝒌

Vector of components:

In Fourier space

𝐸 𝑛 𝒌 = 𝐼 𝑛 ⊗ 𝑆 ℎ 𝒌

𝐼 𝑛 𝒌 = 𝛿 𝒌 +1

2𝒆𝑖𝜃𝒏 𝛿 𝒌 − 𝒌𝑔 +

1

2𝒆−𝑖𝜃𝒏 𝛿 𝒌 + 𝒌𝑔

𝐸 𝑛 𝒌 = 𝑆 𝒌 ℎ 𝒌 + 𝒆𝑖𝜃𝒏1

2𝑆 𝒌 − 𝒌𝑔 ℎ 𝒌 + 𝒆−𝑖𝜃𝒏

1

2𝑆 𝒌 + 𝒌𝑔 ℎ 𝒌

𝐶 0 𝒌 𝐶 1 𝒌 𝐶 −1 𝒌 Components:

Images:

Matrix notation:

𝑬 𝒌 =

𝐸 1 𝒌

𝐸 2 𝒌

𝐸 3 𝒌

Vector of images: 𝑪 𝒌 =

𝐶 −1 𝒌

𝐶 0 𝒌

𝐶 1 𝒌

Vector of components:

𝑬 𝒌 = 𝑴 𝑪 𝒌

𝑴 =𝑒−𝑖𝜃1 1 𝑒𝑖𝜃1

𝑒−𝑖𝜃2 1 𝑒𝑖𝜃2

𝑒−𝑖𝜃3 1 𝑒𝑖𝜃3

Component mixing matrix:

Image reconstruction in SIM

Image reconstruction in SIM

a. Component separation

b. Component recombination

𝑬 𝒌 =

𝐸 1 𝒌

𝐸 2 𝒌

𝐸 3 𝒌

Vector of images: 𝑪 𝒌 =

𝐶 −1 𝒌

𝐶 0 𝒌

𝐶 1 𝒌

Vector of components:

𝑴 =𝑒−𝑖𝜃1 1 𝑒𝑖𝜃1

𝑒−𝑖𝜃2 1 𝑒𝑖𝜃2

𝑒−𝑖𝜃3 1 𝑒𝑖𝜃3

Component mixing matrix:

𝑬 𝒌 = 𝑴 𝑪 𝒌

Component separation

𝑬 𝒌 =

𝐸 1 𝒌

𝐸 2 𝒌

𝐸 3 𝒌

Vector of images: 𝑪 𝒌 =

𝐶 −1 𝒌

𝐶 0 𝒌

𝐶 1 𝒌

Vector of components:

𝑴 =𝑒−𝑖𝜃1 1 𝑒𝑖𝜃1

𝑒−𝑖𝜃2 1 𝑒𝑖𝜃2

𝑒−𝑖𝜃3 1 𝑒𝑖𝜃3

Component mixing matrix:

𝑬 𝒌 = 𝑴 𝑪 𝒌

invert equation

𝑪 𝒌 = 𝑴 −𝟏 𝑬 𝒌

Component separation

𝑬 𝒌 =

𝐸 1 𝒌

𝐸 2 𝒌

𝐸 3 𝒌

Vector of images: 𝑪 𝒌 =

𝐶 −1 𝒌

𝐶 0 𝒌

𝐶 1 𝒌

Vector of components:

𝑴 =𝑒−𝑖𝜃1 1 𝑒𝑖𝜃1

𝑒−𝑖𝜃2 1 𝑒𝑖𝜃2

𝑒−𝑖𝜃3 1 𝑒𝑖𝜃3

Component mixing matrix:

𝑬 𝒌 = 𝑴 𝑪 𝒌

invert equation

𝑪 𝒌 = 𝑴 −𝟏 𝑬 𝒌

𝐶 𝑚 𝒌 = 𝑴 𝒎𝒏−𝟏

𝟑

𝒏=𝟏

𝐸 𝑛 𝒌 Extracts the components from the recorded images.

Component separation

Component recombination

𝑪 𝒌 =

𝐶 −1 𝒌

𝐶 0 𝒌

𝐶 1 𝒌

=

1

2𝑆 𝒌 + 𝒌𝑔 ℎ 𝒌

𝑆 𝒌 ℎ 𝒌1

2𝑆 𝒌 − 𝒌𝑔 ℎ 𝒌

Vector of components:

Component recombination

𝑪 𝒌 =

𝐶 −1 𝒌

𝐶 0 𝒌

𝐶 1 𝒌

=

1

2𝑆 𝒌 + 𝒌𝑔 ℎ 𝒌

𝑆 𝒌 ℎ 𝒌1

2𝑆 𝒌 − 𝒌𝑔 ℎ 𝒌

Vector of components:

First step: shift components back to their true frequencies.

Component recombination

𝑪 𝒌 =

𝐶 −1 𝒌

𝐶 0 𝒌

𝐶 1 𝒌

=

1

2𝑆 𝒌 + 𝒌𝑔 ℎ 𝒌

𝑆 𝒌 ℎ 𝒌1

2𝑆 𝒌 − 𝒌𝑔 ℎ 𝒌

Vector of components:

First step: shift components back to their true frequencies.

𝐶 −1 𝒌 − 𝒌𝑔 =1

2𝑆 𝒌 ℎ 𝒌 − 𝒌𝑔

𝐶 0 𝒌 = 𝑆 𝒌 ℎ 𝒌

𝐶 1 𝒌 + 𝒌𝑔 =1

2𝑆 𝒌 ℎ 𝒌 + 𝒌𝑔

Component recombination

𝑪 𝒌 =

𝐶 −1 𝒌

𝐶 0 𝒌

𝐶 1 𝒌

=

1

2𝑆 𝒌 + 𝒌𝑔 ℎ 𝒌

𝑆 𝒌 ℎ 𝒌1

2𝑆 𝒌 − 𝒌𝑔 ℎ 𝒌

Vector of components:

First step: shift components back to their true frequencies.

𝐶 −1 𝒌 − 𝒌𝑔 =1

2𝑆 𝒌 ℎ 𝒌 − 𝒌𝑔

𝐶 0 𝒌 = 𝑆 𝒌 ℎ 𝒌

𝐶 1 𝒌 + 𝒌𝑔 =1

2𝑆 𝒌 ℎ 𝒌 + 𝒌𝑔

Component recombination

𝑪 𝒌 =

𝐶 −1 𝒌

𝐶 0 𝒌

𝐶 1 𝒌

=

1

2𝑆 𝒌 + 𝒌𝑔 ℎ 𝒌

𝑆 𝒌 ℎ 𝒌1

2𝑆 𝒌 − 𝒌𝑔 ℎ 𝒌

Vector of components:

First step: shift components back to their true frequencies.

𝐶 −1 𝒌 − 𝒌𝑔 =1

2𝑆 𝒌 ℎ 𝒌 − 𝒌𝑔

𝐶 0 𝒌 = 𝑆 𝒌 ℎ 𝒌

𝐶 1 𝒌 + 𝒌𝑔 =1

2𝑆 𝒌 ℎ 𝒌 + 𝒌𝑔

Second step: recombine components.

(e.g. simple averaging)

Final image: 𝐹 𝒌 =

1

3𝐶 −1 𝒌 − 𝒌𝑔 + 𝐶 0 𝒌 + 𝐶 1 𝒌 + 𝒌𝑔

= 𝑆 𝒌1

3

1

2ℎ 𝒌 − 𝒌𝑔 + ℎ 𝒌 +

1

2ℎ 𝒌 + 𝒌𝑔

Component recombination

𝑪 𝒌 =

𝐶 −1 𝒌

𝐶 0 𝒌

𝐶 1 𝒌

=

1

2𝑆 𝒌 + 𝒌𝑔 ℎ 𝒌

𝑆 𝒌 ℎ 𝒌1

2𝑆 𝒌 − 𝒌𝑔 ℎ 𝒌

Vector of components:

First step: shift components back to their true frequencies.

𝐶 −1 𝒌 − 𝒌𝑔 =1

2𝑆 𝒌 ℎ 𝒌 − 𝒌𝑔

𝐶 0 𝒌 = 𝑆 𝒌 ℎ 𝒌

𝐶 1 𝒌 + 𝒌𝑔 =1

2𝑆 𝒌 ℎ 𝒌 + 𝒌𝑔

Second step: recombine components.

(e.g. simple averaging)

Final image: 𝐹 𝒌 =

1

3𝐶 −1 𝒌 − 𝒌𝑔 + 𝐶 0 𝒌 + 𝐶 1 𝒌 + 𝒌𝑔

= 𝑆 𝒌1

3

1

2ℎ 𝒌 − 𝒌𝑔 + ℎ 𝒌 +

1

2ℎ 𝒌 + 𝒌𝑔

Effective SIM OTF

4.

Weighted averaging in Fourier space (not covered in lecture)

For signal-to-noise reasons, a simple averaging of components is not ideal!

Component recombination

𝐶 −1 𝒌 − 𝒌𝑔

𝐶 0 𝒌

𝐶 1 𝒌 + 𝒌𝑔

𝒌

𝐹 𝒌 =1

3𝐶 −1 𝒌 − 𝒌𝑔 + 𝐶 0 𝒌 + 𝐶 1 𝒌 + 𝒌𝑔

= 𝑆 𝒌1

3

1

2ℎ 𝒌 − 𝒌𝑔 + ℎ 𝒌 +

1

2ℎ 𝒌 + 𝒌𝑔

Example: For high frequencies, only one component will contribute

information, but all components will contribute to noise!

Solution: Weighted averaging!

Component recombination

𝐹 𝒌 =𝑤 −1 𝒌 𝐶 −1 𝒌 − 𝒌𝑔 + 𝑤 0 𝒌 𝐶 0 𝒌 + 𝑤 1 𝒌 𝐶 1 𝒌 + 𝒌𝑔

𝑤 −1 𝒌 + 𝑤 0 𝒌 + 𝑤 1 𝒌

= 𝑆 𝒌𝑤 −1 𝒌

12 ℎ 𝒌 − 𝒌𝑔 + 𝑤 0 𝒌 ℎ 𝒌 + 𝑤 1 𝒌

12 ℎ 𝒌 + 𝒌𝑔

𝑤 −1 𝒌 + 𝑤 0 𝒌 + 𝑤 1 𝒌

Solution: Weighted averaging!

Component recombination

𝐹 𝒌 =𝑤 −1 𝒌 𝐶 −1 𝒌 − 𝒌𝑔 + 𝑤 0 𝒌 𝐶 0 𝒌 + 𝑤 1 𝒌 𝐶 1 𝒌 + 𝒌𝑔

𝑤 −1 𝒌 + 𝑤 0 𝒌 + 𝑤 1 𝒌

= 𝑆 𝒌𝑤 −1 𝒌

12 ℎ 𝒌 − 𝒌𝑔 + 𝑤 0 𝒌 ℎ 𝒌 + 𝑤 1 𝒌

12 ℎ 𝒌 + 𝒌𝑔

𝑤 −1 𝒌 + 𝑤 0 𝒌 + 𝑤 1 𝒌

𝑤 −1 𝒌 =1

2ℎ 𝒌 − 𝒌𝑔

𝑤 0 𝒌 = ℎ 𝒌

𝑤 1 𝒌 =1

2ℎ 𝒌 + 𝒌𝑔

With weights:

Solution: Weighted averaging!

Component recombination

𝐹 𝒌 =

12 ℎ 𝒌 − 𝒌𝑔 𝐶 −1 𝒌 − 𝒌𝑔 + ℎ 𝒌 𝐶 0 𝒌 +

12 ℎ 𝒌 + 𝒌𝑔 𝐶 1 𝒌 + 𝒌𝑔

12 ℎ 𝒌 − 𝒌𝑔 + ℎ 𝒌 +

12 ℎ 𝒌 + 𝒌𝑔

= 𝑆 𝒌

14 ℎ 2 𝒌 − 𝒌𝑔 + ℎ 2 𝒌 +

14 ℎ 2 𝒌 + 𝒌𝑔

12 ℎ 𝒌 − 𝒌𝑔 + ℎ 𝒌 +

12 ℎ 𝒌 + 𝒌𝑔

Solution: Weighted averaging!

Component recombination

𝐹 𝒌 =

12 ℎ 𝒌 − 𝒌𝑔 𝐶 −1 𝒌 − 𝒌𝑔 + ℎ 𝒌 𝐶 0 𝒌 +

12 ℎ 𝒌 + 𝒌𝑔 𝐶 1 𝒌 + 𝒌𝑔

12 ℎ 𝒌 − 𝒌𝑔 + ℎ 𝒌 +

12 ℎ 𝒌 + 𝒌𝑔

= 𝑆 𝒌

14 ℎ 2 𝒌 − 𝒌𝑔 + ℎ 2 𝒌 +

14 ℎ 2 𝒌 + 𝒌𝑔

12 ℎ 𝒌 − 𝒌𝑔 + ℎ 𝒌 +

12 ℎ 𝒌 + 𝒌𝑔

Effective SIM OTF

Other things to consider

a. Separate and recombine components for several pattern orientations at once.

b. Wiener filter final reconstructed Fourier image.

SIM is available in the ZEISS Elyra S.1 & PS.1

ZEISS Elyra S.1 & PS.1 Example Images

SIM is available in the ZEISS Elyra S.1 & PS.1

ZEISS Elyra S.1 & PS.1 Example Images

Shigella sp. Actin (yellow) and Chromatin (cyan) Images by: • Volker Brinkmann,

MPI for Infection Biology • Stephan Kuppig

Carl Zeiss Microscopy

Shigella sp. Actin (yellow) and Chromatin (cyan) Images by: • Volker Brinkmann,

MPI for Infection Biology • Stephan Kuppig

Carl Zeiss Microscopy

Shigella sp. Actin (yellow) and Chromatin (cyan) Images by: • Volker Brinkmann,

MPI for Infection Biology • Stephan Kuppig

Carl Zeiss Microscopy

Shigella sp. Actin (yellow) and Chromatin (cyan) Images by: • Volker Brinkmann,

MPI for Infection Biology • Stephan Kuppig

Carl Zeiss Microscopy

Shigella sp. Actin (yellow) and Chromatin (cyan) Images by: • Volker Brinkmann,

MPI for Infection Biology • Stephan Kuppig

Carl Zeiss Microscopy

Shigella sp. Actin (yellow) and Chromatin (cyan) Images by: • Volker Brinkmann,

MPI for Infection Biology • Stephan Kuppig

Carl Zeiss Microscopy

Non-linear Structured Illumination

Microscopy

Images: Mats Gustafsson

Structured Illumination Microscopy How it works

Actin Filaments

488nm, > 510 nm

24 lp/mm = 88% of frequency limit

Plan-Apochromat 100x/1.4 oil iris

0.5 µm

We need powerful reconstruction algorithms! Otherwise we will get reconstruction artefacts.

Structured Illumination Microscopy How it works

Actin Filaments

488nm, > 510 nm

24 lp/mm = 88% of frequency limit

Plan-Apochromat 100x/1.4 oil iris

0.5 µm 0.5 µm

We need powerful reconstruction algorithms! Otherwise we will get reconstruction artefacts.

0.5 µm

Structured Illumination Microscopy How it works

We need powerful reconstruction algorithms! Otherwise we will get reconstruction artefacts.

Actin Filaments

488nm, > 510 nm

24 lp/mm = 88% of frequency limit

Plan-Apochromat 100x/1.4 oil iris

0.5 µm

Thank you for your attention!

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