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1 C2M0080120D Rev. C, 10-2015
C2M0080120DSilicon Carbide Power MOSFET C2M
TM MOSFET Technology
N-Channel Enhancement Mode Features
• High Blocking Voltage with Low On-Resistance• High Speed Switching with Low Capacitances• Easy to Parallel and Simple to Drive• Avalanche Ruggedness• Halogen Free, RoHS Compliant
Benefits
• HigherSystemEfficiency• Reduced Cooling Requirements• Increased Power Density• Increased System Switching Frequency
Applications
• Solar Inverters• Switch Mode Power Supplies • High Voltage DC/DC Converters• Battery Chargers• Motor Drives• Pulsed Power applications
Package
TO-247-3
Part Number Package
C2M0080120D TO-247-3
VDS 1200 V
ID @ 25˚C 36 A
RDS(on) 80 mΩ
Maximum Ratings (TC=25˚Cunlessotherwisespecified)
Symbol Parameter Value Unit Test Conditions Note
VDSmax Drain - Source Voltage 1200 V VGS = 0 V, ID=100μA
VGSmax Gate - Source Voltage -10/+25 V Absolute maximum values
VGSop Gate - Source Voltage -5/+20 V Recommended operational values
ID Continuous Drain Current36
AVGS = 20 V, TC =25˚C Fig. 19
24 VGS = 20 V, TC =100˚C
ID(pulse) Pulsed Drain Current 80 A Pulse width tP limited by Tjmax Fig. 22
PDPower Dissipation 192 W TC=25˚C,TJ=150˚C Fig. 20
TJ , TstgOperating Junction and Storage Temperature -55 to
+150 ˚C
TLSolder Temperature 260 ˚C 1.6mm(0.063”)fromcasefor10s
Md Mounting Torque 18.8
Nmlbf-in M3 or 6-32 screw
2 C2M0080120D Rev. C, 10-2015
Electrical Characteristics (TC=25˚Cunlessotherwisespecified)
Symbol Parameter Min. Typ. Max. Unit Test Conditions Note
V(BR)DSS Drain-Source Breakdown Voltage 1200 V VGS = 0 V, ID=100μA
VGS(th) Gate Threshold Voltage2.0 2.6 4 V VDS = VGS, ID = 5 mA
Fig. 112.1 V VDS = VGS, ID = 5 mA, TJ = 150ºC
IDSS Zero Gate Voltage Drain Current 1 100 μA VDS = 1200 V, VGS = 0 V
IGSS Gate-Source Leakage Current 250 nA VGS = 20 V, VDS = 0 V
RDS(on) Drain-Source On-State Resistance80 98
mΩVGS = 20 V, ID = 20 A Fig. 4,
5, 6128 VGS = 20 V, ID = 20A, TJ = 150ºC
gfs Transconductance8.1
SVDS= 20 V, IDS= 20 A
Fig. 77.8 VDS= 20 V, IDS= 20 A, TJ = 150ºC
Ciss Input Capacitance 950
pFVGS = 0 V
VDS = 1000 V
f = 1 MHzVAC = 25 mV
Fig. 17, 18
Coss Output Capacitance 80
Crss Reverse Transfer Capacitance 7.6
Eoss Coss Stored Energy 45 μJ Fig. 16
EAS Avalanche Energy, Single Pluse 1 J ID = 20A, VDD = 50V Fig. 29
EON Turn-On Switching Energy 265μJ
VDS = 800 V, VGS = -5/20 V, ID = 20A, RG(ext)=2.5Ω,L=142μH
Fig. 25EOFF Turn Off Switching Energy 135
td(on) Turn-On Delay Time 11
ns
VDD = 800 V, VGS = -5/20 VID = 20 A, RG(ext)=2.5Ω,RL=40Ω,TimingrelativetoVDS Per IEC60747-8-4 pg 83
Fig. 27tr Rise Time 20
td(off) Turn-Off Delay Time 23
tf Fall Time 19
RG(int) Internal Gate Resistance 4.6 Ω f = 1 MHz, VAC = 25 mV
Qgs Gate to Source Charge 15
nCVDS = 800 V, VGS = -5/20 VID = 20 APer IEC60747-8-4 pg 21
Fig. 12Qgd Gate to Drain Charge 23
Qg Total Gate Charge 62
Reverse Diode Characteristics
Symbol Parameter Typ. Max. Unit Test Conditions Note
VSD Diode Forward Voltage3.3 V VGS = - 5 V, ISD = 10 A
Fig. 8, 9, 10
3.1 V VGS = - 5 V, ISD = 10 A, TJ = 150 °C
IS Continuous Diode Forward Current 36 A TC =25˚C Note 1
trr Reverse Recover time 32 nsVGS = - 5 V, ISD = 20 A, VR = 800 Vdif/dt = 2400 A/µs Note 1Qrr Reverse Recovery Charge 192 nC
Irrm Peak Reverse Recovery Current 10 A
Note(1):WhenusingSiCBodyDiodethemaximumrecommendedVGS = -5V
Thermal Characteristics
Symbol Parameter Typ. Max. Unit Test Conditions Note
RθJC Thermal Resistance from Junction to Case 0.60 0.65°C/W Fig. 21
RθJA Thermal Resistance From Junction to Ambient 40
3 C2M0080120D Rev. C, 10-2015
0
10
20
30
40
50
60
70
0.0 2.5 5.0 7.5 10.0 12.5
Drai
n-So
urce
Cur
rent
, IDS
(A)
Drain-Source Voltage, VDS (V)
Conditions:TJ = 150 °Ctp < 200 µs VGS = 20 V
VGS = 10 V
VGS = 18 V
VGS = 16 VVGS = 14 V
VGS = 12 V
0
10
20
30
40
50
60
70
0.0 2.5 5.0 7.5 10.0 12.5
Drai
n-So
urce
Cur
rent
, IDS
(A)
Drain-Source Voltage, VDS (V)
Conditions:TJ = -55 °Ctp < 200 µs
VGS = 20 V
VGS = 10 V
VGS = 18 V
VGS = 16 V
VGS = 14 V
VGS = 12 V
0
10
20
30
40
50
60
70
0.0 2.5 5.0 7.5 10.0 12.5
Drai
n-So
urce
Cur
rent
, IDS
(A)
Drain-Source Voltage, VDS (V)
Conditions:TJ = 25 °Ctp < 200 µs
VGS = 20 V
VGS = 10 V
VGS = 18 V
VGS = 16 V VGS = 14 V
VGS = 12 V
Figure 2. Output Characteristics TJ = 25 ºC
Typical Performance
Figure 5. On-Resistance vs. Drain CurrentFor Various Temperatures
Figure 1. Output Characteristics TJ = -55 ºC
Figure 3. Output Characteristics TJ = 150 ºC
0.0
0.2
0.4
0.6
0.8
1.0
1.2
1.4
1.6
1.8
2.0
-50 -25 0 25 50 75 100 125 150
On R
esist
ance
, RDS
On
(P.U
.)
Junction Temperature, TJ (°C)
Conditions:IDS = 20 AVGS = 20 Vtp < 200 µs
0
20
40
60
80
100
120
140
160
180
200
0 10 20 30 40 50 60 70
On R
esist
ance
, RDS
On
(mOh
ms)
Drain-Source Current, IDS (A)
Conditions:VGS = 20 Vtp < 200 µs
TJ = 150 °C
TJ = -55 °C
TJ = 25 °C
Figure 4. Normalized On-Resistance vs. Temperature
0
40
80
120
160
200
240
280
-50 -25 0 25 50 75 100 125 150
On
Resi
stan
ce, R
DS O
n(m
Ohm
s)
Junction Temperature, TJ (°C)
Conditions:IDS = 20 Atp < 200 µs
VGS = 20 V
VGS = 18 V
VGS = 16 V
VGS = 14 V
Figure 6. On-Resistance vs. TemperatureFor Various Gate Voltage
4 C2M0080120D Rev. C, 10-2015
Typical Performance
Figure 8. Body Diode Characteristic at -55 ºC
Figure 9. Body Diode Characteristic at 25 ºC
0
10
20
30
40
0 2 4 6 8 10 12 14
Drai
n-So
urce
Cur
rent
, IDS
(A)
Gate-Source Voltage, VGS (V)
Conditions:VDS = 20 Vtp < 200 µs
TJ = 150 °C
TJ = -55 °C
TJ = 25 °C
-70
-60
-50
-40
-30
-20
-10
0-7 -6 -5 -4 -3 -2 -1 0
Drai
n-So
urce
Cur
rent
, IDS
(A)
Drain-Source Voltage, VDS (A)
VGS = 0 V
VGS = -2 V
VGS = -5 V Condition:TJ = -55 °Ctp < 200 µs
-70
-60
-50
-40
-30
-20
-10
0-7 -6 -5 -4 -3 -2 -1 0
Drai
n-So
urce
Cur
rent
, IDS
(A)
Drain-Source Voltage, VDS (A)
VGS = 0 V
VGS = -2 V
VGS = -5 VCondition:TJ = 25 °Ctp < 200 µs
-70
-60
-50
-40
-30
-20
-10
0-7 -6 -5 -4 -3 -2 -1 0
Drai
n-So
urce
Cur
rent
, IDS
(A)
Drain-Source Voltage, VDS (A)
VGS = 0 V
VGS = -2 V
VGS = -5 V
Condition:TJ = 150 °Ctp < 200 µs
0.0
0.5
1.0
1.5
2.0
2.5
3.0
3.5
-50 -25 0 25 50 75 100 125 150
Thre
shol
d Vo
ltage
, Vth
(V)
Junction Temperature TJ (°C)
ConditionsVDS = 10 VIDS = 0.5 mA
ConditionsVDS = VGSIDS = 5 mA
Figure 10. Body Diode Characteristic at 150 ºC
-5
0
5
10
15
20
25
0 10 20 30 40 50 60 70
Gate
-Sou
rce V
olta
ge, V
GS
(V)
Gate Charge, QG (nC)
Conditions:IDS = 20 AIGS = 100 mAVDS = 800 VTJ = 25 °C
Figure 7. Transfer Characteristic for Various Junction Temperatures
Figure 11. Threshold Voltage vs. Temperature Figure 12. Gate Charge Characteristics
5 C2M0080120D Rev. C, 10-2015
Typical Performance
Figure 15. 3rd Quadrant Characteristic at 150 ºC
Figure 13. 3rd Quadrant Characteristic at -55 ºC
-70
-60
-50
-40
-30
-20
-10
0-6 -5 -4 -3 -2 -1 0
Drai
n-So
urce
Cur
rent
, IDS
(A)
Drain-Source Voltage, VDS (V)
Conditions:TJ = -55 °Ctp < 200 µs
VGS = 0 V
VGS = 5 V
VGS = 10 V
VGS = 15 V
VGS = 20 V
-70
-60
-50
-40
-30
-20
-10
0-6 -5 -4 -3 -2 -1 0
Drai
n-So
urce
Cur
rent
, IDS
(A)
Drain-Source Voltage, VDS (V)
Conditions:TJ = 25 °Ctp < 200 µs
VGS = 0 V
VGS = 5 V
VGS = 10 V
VGS = 15 V
VGS = 20 V
-70
-60
-50
-40
-30
-20
-10
0-6 -5 -4 -3 -2 -1 0
Drai
n-So
urce
Cur
rent
, IDS
(A)
Drain-Source Voltage, VDS (V)
Conditions:TJ = 150 °Ctp < 200 µs
VGS = 0 V VGS = 5 V
VGS = 10 V
VGS = 15 V
VGS = 20 V
Figure 14. 3rd Quadrant Characteristic at 25 ºC
0
5
10
15
20
25
30
35
40
45
50
0 200 400 600 800 1000 1200
Stor
ed En
ergy
, EO
SS(µ
J)
Drain to Source Voltage, VDS (V)
Figure 16. Output Capacitor Stored Energy
Figure 17. Capacitances vs. Drain-Source Voltage(0-200V)
1
10
100
1000
10000
0 50 100 150 200
Capa
cita
nce
(pF)
Drain-Source Voltage, VDS (V)
Ciss
Coss
Conditions:TJ = 25 °CVAC = 25 mVf = 1 MHz
Crss
1
10
100
1000
10000
0 200 400 600 800 1000
Capa
cita
nce
(pF)
Drain-Source Voltage, VDS (V)
Ciss
Coss
Conditions:TJ = 25 °CVAC = 25 mVf = 1 MHz
Crss
Figure 18. Capacitances vs. Drain-Source Voltage(0-1000V)
6 C2M0080120D Rev. C, 10-2015
1E-3
10E-3
100E-3
1
1E-6 10E-6 100E-6 1E-3 10E-3 100E-3 1
Junc
tion
To C
ase
Impe
danc
e, Z t
hJC
(o C/W
)
Time, tp (s)
0.5
0.3
0.1
0.05
0.02
0.01
SinglePulse
Typical Performance
0
5
10
15
20
25
30
35
40
-55 -30 -5 20 45 70 95 120 145
Drai
n-So
urce
Con
tinou
s Cur
rent
, IDS
(DC)
(A)
Case Temperature, TC (°C)
Conditions:TJ ≤ 150 °C
0
50
100
150
200
250
-55 -30 -5 20 45 70 95 120 145
Max
imum
Dis
sipa
ted
Pow
er, P
tot(
W)
Case Temperature, TC (°C)
Conditions:TJ ≤ 150 °C
0.01
0.10
1.00
10.00
100.00
0.1 1 10 100 1000
Drai
n-So
urce
Curr
ent,
I DS
(A)
Drain-Source Voltage, VDS (V)
100 µs
1 ms
10 µs
Conditions:TC = 25 °CD = 0, Parameter: tp
100 ms
Limited by RDS On
Figure 22. Safe Operating AreaFigure 21. Transient Thermal Impedance(Junction-Case)
0
200
400
600
800
1000
1200
1400
1600
0 10 20 30 40 50
Switc
hing
Ener
gy (u
J)
Drain to Source Current, IDS (A)
Conditions:TJ = 25 °CVDD = 800 VRG(ext) = 2.5 ΩVGS = -5/+20 VFWD = C4D10120AL = 142 μH
EOff
EOn
ETotal
Figure 23. Clamped Inductive Switching Energy vs. Drain Current (VDD=800V)
Figure 24. Clamped Inductive Switching Energy vs. Drain Current (VDD=600V)
0
200
400
600
800
1000
1200
0 10 20 30 40 50
Switc
hing
Ener
gy (u
J)
Drain to Source Current, IDS (A)
Conditions:TJ = 25 °CVDD = 600 VRG(ext) = 2.5 ΩVGS = -5/+20 VFWD = C4D10120AL = 142 μH
EOff
EOn
ETotal
Figure 19. Continuous Drain Current Derating vs. Case Temperature
Figure 20. Maximum Power Dissipation Derating vs. Case Temperature
7 C2M0080120D Rev. C, 10-2015
Typical Performance
0
100
200
300
400
500
600
700
800
900
1000
0 5 10 15 20 25 30
Switc
hing
Loss
(uJ)
External Gate Resistor RG(ext) (Ohms)
EOff
EOn
ETotal
Conditions:TJ = 25 °CVDD = 800 VIDS = 20 AVGS = -5/+20 VFWD = C4D10120AL = 142 μH
0
10
20
30
40
50
60
70
0 5 10 15 20 25 30
Tim
e (n
s)
External Gate Resistor, RG(ext) (Ohms)
Conditions:TJ = 25 °CVDD = 800 VRL = 40 ΩVGS = -5/+20 V
td (off)
td (on)
tf
tr
0
100
200
300
400
500
600
-50 -25 0 25 50 75 100 125 150
Swith
cing
Loss
(uJ)
Junction Temperature, TJ (°C)
Conditions:IDS = 20 AVDD = 800 VRG(ext) = 2.5 ΩVGS = -5/+20 VFWD = C4D10120AL = 142 µH
EOff
EOn
ETotal
Figure 26. Clamped Inductive Switching Energy vs. Temperature
Figure 27. Switching Times vs. RG(ext)
Figure 25. Clamped Inductive Switching Energy vs. RG(ext)
Figure28.SwitchingTimesDefinition
0
5
10
15
20
25
30
35
0 25 50 75 100 125 150 175 200
Aval
anch
e Cu
rren
t (A)
Time in Avalanche TAV (us)
Conditons:VDD = 50 V
Figure 29. Single Avalanche SOA curve
8 C2M0080120D Rev. C, 10-2015
Test Circuit Schematic
ESD Test Total Devices Sampled Resulting Classification
ESD-HBM All Devices Passed 1000V 2(>2000V)
ESD-MM All Devices Passed 400V C(>400V)
ESD-CDM All Devices Passed 1000V IV(>1000V)
ESD Ratings
D1 C4D10120A10A, 1200VSiC Schottky
D.U.TC2M0080120D
L=142 uH
Q2
VDC
D.U.TC2M0080120D
Q1
VGS= - 5V
C2M0080120D
RG
RG
CDC=42.3 uF
L=142 uH
Q2
VDC
RG
CDC=42.3 uF
Figure 30. Clamped Inductive Switching Waveform Test Circuit
Figure 31. Body Diode Recovery Test Circuit
9 C2M0080120D Rev. C, 10-2015
Package Dimensions
Package TO-247-3
Recommended Solder Pad Layout
TO-247-3
POSInches Millimeters
Min Max Min Max
A .190 .205 4.83 5.21
A1 .090 .100 2.29 2.54
A2 .075 .085 1.91 2.16
b .042 .052 1.07 1.33
b1 .075 .095 1.91 2.41
b2 .075 .085 1.91 2.16
b3 .113 .133 2.87 3.38
b4 .113 .123 2.87 3.13
c .022 .027 0.55 0.68
D .819 .831 20.80 21.10
D1 .640 .695 16.25 17.65
D2 .037 .049 0.95 1.25
E .620 .635 15.75 16.13
E1 .516 .557 13.10 14.15
E2 .145 .201 3.68 5.10
E3 .039 .075 1.00 1.90
E4 .487 .529 12.38 13.43
e .214 BSC 5.44 BSC
N 3 3
L .780 .800 19.81 20.32
L1 .161 .173 4.10 4.40
ØP .138 .144 3.51 3.65
Q .216 .236 5.49 6.00
S .238 .248 6.04 6.30
T 9˚ 11˚ 9˚ 11˚
U 9˚ 11˚ 9˚ 11˚
V 2˚ 8˚ 2˚ 8˚
W 2˚ 8˚ 2˚ 8˚
Pinout Information:
• Pin 1 = Gate• Pin 2, 4 = Drain • Pin 3 = Source
T U
WV
Part Number Package Marking
C2M0080120D TO-247-3 C2M0080120
1010 C2M0080120D Rev. C, 10-2015
Copyright © 2015 Cree, Inc. All rights reserved. The information in this document is subject to change without notice. Cree, the Cree logo, and Zero Recovery are registered trademarks of Cree, Inc.
Cree, Inc.4600 Silicon Drive
Durham, NC 27703USA Tel: +1.919.313.5300
Fax: +1.919.313.5451www.cree.com/power
• RoHSCompliance The levels of RoHS restricted materials in this product are below the maximum concentration values (also referred to as the threshold limits) permitted for such substances, or are used in an exempted application, in accordance with EU Directive 2011/65/EC (RoHS2), as implemented January 2, 2013. RoHS Declarations for this product can be obtained from your Cree repre-sentative or from the Product Documentation sections of www.cree.com.
• REAChCompliance REACh substances of high concern (SVHCs) information is available for this product. Since the European Chemical Agency (ECHA) has published notice of their intent to frequently revise the SVHC listing for the foreseeable future,please contact a Cree representative to insure you get the most up-to-date REACh SVHC Declaration. REACh banned substance information (REACh Article 67) is also available upon request.
• This product has not been designed or tested for use in, and is not intended for use in, applications implanted into the human body nor in applications in which failure of the product could lead to death, personal injury or property damage, including but not limitedtoequipmentusedintheoperationofnuclearfacilities,life-supportmachines,cardiacdefibrillatorsorsimilaremergencymedicalequipment,aircraftnavigationorcommunicationorcontrolsystems,airtrafficcontrolsystems.
Notes
Related Links
• C2M PSPICE Models: http://wolfspeed.com/power/tools-and-support
• SiC MOSFET Isolated Gate Driver reference design: http://wolfspeed.com/power/tools-and-support
• SiC MOSFET Evaluation Board: http://wolfspeed.com/power/tools-and-support
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