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Appendix 3.
Electrical Subsystem
3.1 Analog to Digital Converter Datasheet p1
3.2 LS 14250 Batteries Datasheet p1
3.3 High Precision Accelerometers Datasheet p1 3.4 Accelerometer Pack ASC 5721 Datasheet p1
3.5 Compass Datasheet p1
3.6 Voltage regulators Datasheet p1
3.7 Linear 3 axis Accelerometer Datasheet p1
3.8 Voltage regulators Datasheet p1
3.9 LPC2364 Microcontroller Datasheet p1
3.10 Molex Memory Card pcb mount
3.11 PCB Board Top and Bottom Signal Layers
3.12 PCB Board Power Layer and Ground Plane
3.13 FISH Schematic part 1
3.14 FISH Schematic part 2
3.15 FISH Schematic part 3
3.16 PCB Front 3D Simulation
3.17 PCB Back 3D Simulation
3.18 PCB Side 3D Simulation
3.19 Part list w/ prices
3.20 Requirements Verification Table
3.21 Test Chart Flow
3.22 Calibration System Picture
3.23 Test Descriptions
3.24 Components Derating
3.25 Datasheets Main Payload
3.1 Analog to Digital Converter Datasheet p1
3.2 LS 14250 Batteries Datasheet p1
3.3 High Precision Accelerometers Datasheet p1
3.4 Accelerometer Pack ASC 5721 Datasheet p1 (Based in
Colibrys, only difference with ASC 5421 is the size)
3.5 Compass Datasheet p1
3.6 Voltage regulators Datasheet p1
3.7 Linear 3 axis Accelerometer Datasheet p1
3.8 Voltage regulators Datasheet p1
3.9 LPC2364 Microcontroller Datasheet p1
3.10 Molex Memory Card pcb mount
3.11 PCB Board Top and Bottom Signal Layers
3.12 PCB Board Power Layer and Ground Plane
3.12 PCB Board All Layers
3.13 FISH Schematic part 1
3.14 FISH Schematic part 2
3.15 FISH Schematic part 3
3.16 PCB Front 3D Simulation
3.17 PCB Back 3D Simulation
3.18 PCB Side 3D Simulation
3.19 Part list w/ prices
Part # Description Company provider
Price
Eur Qty Total
Accelerometer Colibrys
Precise accelerometer,10mg
bias,40Hz bandwidth ASC GmbH ASC GmbH 1000 1 1000.00
TMP275
Precise temperature sensor,i2c,
o.5 accuracy TI Farnell 4.68 1 4.68
LIS3L02AQ3
Medium-g, 3 axis, high
bandwidth ST Farnell 25.99 1 25.99
ADC1274
Precise,wide bandwidth
converter,sync mode 4 Channel Farnell 45.64 1 45.64
batteries saft 0.00
micro lpc2368 Philips Farnell 11.68 1 11.68
memory mount microSD Molex Farnell 3.19 1 3.19
memory microSD 1GB - 2GB Sandisk VerkkoKaupa 10 1 10.00
INA128UAE4 Opamp TI Farnell 6.26 3 18.78
HMC6352 Compass I2C Honeywell Farnell 110.98 1 110.98
Capacitor 22pF, Ceramic, 0805, 100V AVX Farnell 0.11 4 0.44
Capacitor 1uF, ceramic, 0805, 25V AVX Farnell 0.112 12 1.34
Capacitor 10uF, ceramic, 0805, 16V AVX Farnell 0.24 2 0.48
Capacitor 0.1uF, Ceramic, 0805, 50V AVX Farnell 0.24 4 0.96
Resistor 10Kohm,0805, 0.125W, 150V Yageo Farnell 0.054 15 0.81
LD1117AV18 1.8V Regulator ST Farnell 1.42 1 1.42
LM1086IT-3.3/NOPB 3.3V Regulator ST Farnell 2.83 1 2.83
LM1086IT-5.0/NOPB 5.0V Regulator ST Farnell 2.94 1 2.94
ADR445 B grade
Precise 5V reference,2mV max
error,10mA source
Vin Max
18V 10.09 1
3.20 Requirements Verification Table
Electrical
Subsystem
Req. ID # Test
ID # Test Title Test Model
Verified
by
Design
(YES/NO)
Verified by test
(PASS/FAIL/NYA)
Responsible
Member
F.E.6 , F.E.9 ,
F.E.15, T.E.7 E.1 Subsystem Basic FISH and MAIN David/Mikulas
F.E.1, T.E.1 ,
T.E.2, T.E.3 ,
T.E.4m O.E.2 E.2 Sensor Basic FISH and MAIN David/Mikulas
F.E.10 , F.E.11 ,
O.E.6 E.3 Motor Basic MAIN Mikulas
F.E.12 , O.E.1 ,
O.E.3 E.4 Battery Charging /Discharging
Electronics Test
Bench David/Mikulas
O.E.4 E.5 Battery Thermo Shock
Electronics Test
Bench David/Mikulas
O.E.4 E.6 Battery Temperature
Electronics Test
Bench David/Mikulas
O.E.4 E.7 Battery Drop
Electronics Test
Bench David/Mikulas
F.E.1, T.E.1 ,
T.E.2, T.E.3 ,
T.E.4 E.8
Data Acquisition AC and DC
Calibration FISH David
F.E.2 , F.E.3 E.9 Data Acquisition Data Rate FISH David
F.E.4 E.10 Communication Synchronization FISH and MAIN David/Mikulas
F.E.4,T.E.6 E.11 Communication Distance vs Data Rate FISH and MAIN David/Mikulas
F.E.4,T.E.6 E.12 Communication Interference FISH and MAIN David/Mikulas
F.E.16 E.13 Power Supply Capacity FISH and MAIN David/Mikulas
F.E.16 E.14 Power Supply Maximal Current FISH and MAIN David/Mikulas
F.E.16 E.15 Power Supply Voltage Regulators FISH and MAIN David/Mikulas
F.E.1, T.E.1 ,
T.E.2, T.E.3 ,
T.E.4 E.16 Accelerometer Temperature Stability FISH David
F.E.1, T.E.1 ,
T.E.2, T.E.3 ,
T.E.4 E.17 Accelerometer Bias FISH David
F.E.7 E.18 Optical Proximity Sensors MAIN Mikulas
F.E.8, F.E.14 E.19 Hall Proximity Sensors MAIN Mikulas
E.20 Magnetic Compass MAIN Mikulas
3.21 Test Chart Flow
3.21 Calibration quote
3.22 Calibration System Picture
3.23 Test Descriptions
ID T01
Name Performance of Data Acquisition System Components Tested
Analog to Digital Converter TI ADS1278, Precision Voltage Reference TI REF5025, Precise Instrumentation Amplifiers
Purpose To test and evaluate overall performance of Data Acquisition system
in both DC and AC measurement with the variable temperature.
Justification Objectives regarding precision
Location IRF Electronic Lab Conditions Normal humidity, Normal pressure(this refers to normal
pressure and humidity), Temperature between -40 and +20 deg C
Required Resources
HP 34401A
GPIB- USB converter
PC with USB interface
HP 33220A Function/Arbitrary Waveform Generator
Tested components
Microcontroller LPC2368
USB-RS232 Converter
Temperature Chamber
Temperature Sensor number
NI LabWindows™/CVI
Matlab
Unsecured Resources
Unsecured does it mean that we have not bought it yet (in that everything is unsecured)?
Date Duration 1 day Dependencies Participants Mikulas Jandak, and / or David Leal Procedure a) Signal generator is to set to the voltage of 2.5V
b) Signal Generator HP33220A 1 is to be connected to the
channel 0 on the analog front part of the tested data
acquisition
c) Reference Millimeter HP 34401A 1 is to be connected to the
Signal Generator 1
d) RS-232/USB Converter is to be used for connection between
PC and microcontroller
e) Signal Generator HP33220A 2 is to be connected to the
channel 2 of the analog front part of the data acquisition
system. The reference signal is to be 1V peak-peak sin with
the frequency of 100Hz
f) Reference Millimeter HP 34401A 2 is to be connected to the
Signal Generator 1
g)
h) Measurement is to start by applying peak DC Voltage on the
Channel 0 on the analog front part. Microcontroller starts
sending data to PC with corresponding time stamps. The
sampling rate is to be 1kHz. Microcontroller is to also
measure temperature connected via SPI interface at the rate
of 1Hz.
i) Temperature is to change from -20 to +40 with the change of
1deg/minute?
Expected Results
The measured voltages by ADC TI ADS1278 and reference
multimeters of both AC and DC signal should be similar and there
should be only small variation with the temperature.
ID T02 Name Performance of Data Acquisition System Components Tested
Analog to Digital Converter TI ADS1278, Precision Voltage Reference TI REF5025, Precise Instrumentation Amplifiers
Purpose To test reliability of the communication between ADC,
microcontroller and external memory under varying work load. To
test microcontroller capabilities when processing data.
Justification Objectives regarding sampling rate
Location IRF Electronic Lab Conditions Normal humidity, Normal pressure(this refers to normal
pressure and humidity), Temperature 25 deg C Required Resources
Microcontroller NXP LPC2368
AD Converter ADS1278
Micro SD card
HP 33220A Function/Arbitrary Waveform Generator
GPIB- USB converter
PC with USB interface
GCC compiler
MatLab
Unsecured Resources
Date Duration 1 day
Dependencies T01 Participants Mikulas Jandak, and / or David Leal Procedure a) Signal Generator HP33220A 1 is to be connected to
channel 0 of the AD Converter
b) Signal Generator HP33220A 1 is to be interface with PC
via GPIB-USB converter
c) Signal Generator HP33220A 2 is to be connected to the
external interrupt pin of the microcontroller
d) Signal Generator HP33220A 2 is to be interface with PC
via GPIB-USB converter
e) Sine wave of frequency of 250Hz is to be used as a
reference signal
f) TTL signal of variable frequency is to be used to impose
work load on the microcontroller by the means of
executing high priority interrupt routine, which should
last 500us.
g) Microcontroller is to sample all 8 channels with the
sampling frequency of 1kHz
h) The frequency of the TTL signal is to be changed in
discrete intervals of 5s from 1kHz to 50kHz with the step
of 10kHz.
i) All data are to be saved on the SD card and after the
measurement transfer to PC
j) Data is to be analyzed with the help of Matlab.
Evaluation is based on examining total harmonic
distortion(THD) of sampled sine waves
Expected Results
The sampled sine waves should show certain THS when the
microcontroller is not able to proceed all channel in real time.
ID T03 Name Components Tested
Analog to Digital Converter TI ADS1278, Precision Voltage Reference TI REF5025, Precise Instrumentation Amplifiers
Purpose To test the interference between channel 14 (2470MHz), 15
(2475MHz) and 16 (2480MHz) of the 2.4Ghz band.
Justification Constraint regarding EMC Location IRF Electronic Lab Conditions Normal humidity, Normal pressure(this refers to normal
pressure and humidity), Temperature 25 deg C
Required Resources
XBee Starter Development Kit
2x PC
Microcontroller NXC LPC2368
Spectrum Analyzer #
HP 33220A Function/Arbitrary Waveform Generator
2.4GHz omnidirectional antenna with BNC connector
Matlab
Unsecured Resources
Date
Duration 10 hours
Dependencies Participants Mikulas Jandak, and / or David Leal, technicians Procedure a) XBee evaluation boards are to be connected to PCs
b) PC starts sending sequence of known data to other Zigbee in
loop using only channel 15 (16) with the data rate of 115kb/s
c) Zigbee 2 is in close proximity to Zigbee 1 and is to receive
data and logged the number of data lost.
d) Procedure b) to c) is to be repeat with the third Zigbee
connected to microcontroller, which sends random
sequence in a loop. Alternatively, the interference could be
induced by signal generator with 2.4GHz omnidirectional
antenna (if powerful enough)
e) The data lost is to be analyzed with respect to the
interference. The interference could be visually inspected by
using spectrum analyzer.
Expected Results
The interference between channel should be miniscule (-28dB
crosstalk between) and both times should be almost identical with
only small variation
ID T04 Name Synchronization Test
Components Tested
Maxstream XBee OEM RF module with whip antenna 2xMircocontroler NXC LPC2368
Purpose To test the delay of communication subsystems within certain
temperature range and data rate for the synchronization purposes.
Justification There should be something about the correlation between xyz and xyz of the fish –flight simulator
Location IRF Electronic Lab Conditions Normal humidity, Normal pressure(this refers to normal
pressure and humidity), Temperature 25,0 and -10 deg C Required Resources
2 x XBee development boards
2xMircocontroler NXC LPC2368
Unsecured Resources
Date
Duration 10 hours Dependencies
Participants Mikulas Jandak, and / or David Leal, technicians Procedure a) Both Zigbee modules set the communication rate to the
fix value
b) First Zigbee after receiving 1 Byte from second one,
sends 1 Byte to second one. Both keep track of the time
when received the packet
c) Procedure above will be repeated for different data
rates and different temperature (room temperature, two
different outside temperature)
d) Analysis based on the correlation between data rate and
ambient temperature
Expected Results
The delay should be mainly function of the delay caused by the
reaction of the communication subsystem (UART, interrupts) and
independent of the data rate. There may be negligible correlation
between temperature and delay. The delay should be constant for all
packets.
ID T05
Name EMC Test
Components Tested
Entire electrical subsystems with motors
Purpose evaluate the EMI caused by motors, magnets and rapidly changing
electrical field
Justification EMI within the required range Location Lulea EMC chamber
Conditions Normal humidity, Normal pressure(this refers to normal pressure and humidity), Temperature 25,0 and -10 deg C
Required Resources
EMI chamber
Unsecured Resources
EMI chamber
Date Duration 1 day Dependencies Participants Mikulas Jandak, and / or David Leal, technicians Procedure a) Entire electronic and motors are to be put into shielded EMI
chamber
b) The EMI radiation is be measured when the motors are
turning on and off.
Expected Results
The result should be a variable level of EMI. The level of EMI should
be highest when the motor s are turn on.
ID T06 Name Maximal Current Test
Components Tested
Entire electrical subsystems with motors
Purpose evaluate the EMI caused by motors, magnets and rapidly changing
electrical field
Justification Battery safety issue Location IRF Electronic Lab Conditions Normal humidity, Normal pressure(this refers to normal
pressure and humidity), Temperature 25,0 and -10 deg C Required Resources
HP 34401A
1Ohm 20W sensing resistor
Motor
Power Supply Pack
Unsecured Resources
Date Duration 2 hours Dependencies Participants Mikulas Jandak, and / or David Leal, technicians Procedure a) Shaft of the motor is to be fixed so it cannot spin.
b) Motor is to be connected to power supply pack capable of
delivering high current (>20A) for short period of time (long
enough to measure the current).
c) Current is to be measured as a voltage drop across the
sensing resistor by the multimeter.
Expected Results
The in-rush current should not be higher than stall current stated in
the motor datasheet.
ID T07 Name Maximal Current Test
Components Tested
Entire electrical subsystems with motors.
Purpose Evaluate the EMI caused by motors, magnets and rapidly changing
electrical field.
Justification Battery safety issue
Location IRF Electronic Lab Conditions Normal humidity, Normal pressure(this refers to normal
pressure and humidity), Temperature 25,0 and -10 deg C. Required Resources
HP 34401A
1Ohm 20W sensing resistor
Motor
Power Supply Pack
Unsecured Resources
Date Duration 2 hours Dependencies
Participants Mikulas Jandak, and / or David Leal, technicians Procedure a) Shaft of the motor is to be fixed so it cannot spin.
b) Motor is to be connected to power supply pack capable of
delivering high current (>20A) for short period of time (long
enough to measure the current).
c) Current is to be measured as a voltage drop across the
sensing resistor by the multimeter.
Expected Results
The in-rush current should not be higher than stall current stated in
the motor datasheet.
ID T08
Name Power Budget Test
Components Tested
Power Supply Pack
Purpose To test capacity and reliability of power supply with respect to the
low temperature.
Justification Battery safety issues Location IRF Electronic Lab Conditions Normal humidity, Normal pressure(this refers to normal
pressure and humidity), Temperature 25,0 and -10 deg C. Required Resources
2x HP 34401A
GPIB/ USB converter
GPIB –GPIB connecting cable
8Ohm 20W resistor
Power Supply Pack
Low Temperature Chamber
NI LabView
Unsecured Resources
Gas for the temperature chamber
Date Duration 10 hours Dependencies Participants Mikulas Jandak, and / or David Leal, technicians Procedure a) Power pack with sensing resistor should be put into low
temperature chamber.
b) Multimeters should be connected to PC and program written
in NI LabView is to be used to acquire the data. The
multimeters should monitor with the sampling rate of 1Hz
current and voltage.
c) After the voltage reaches x volt the experiment is to be ???
d) The capacity of the battery pack is to be evaluated with
respect to the voltage across the battery pack
Expected The capacity of the battery pack should be reduced by 20%. The
Results battery pack should operate during whole experiment and it should
be able to deliver 3A of current. There should be clear correlation
between the voltage across the battery pack and the battery
capacity.
ID T08 Name Power Budget Test
Components Tested
Power Supply Pack
Purpose To test capacity and reliability of power supply with respect to the
low temperature
Justification Battery safety issues
Location IRF Electronic Lab Conditions Normal humidity, Normal pressure(this refers to normal
pressure and humidity), Temperature 25,0 and -10 deg C Required Resources
2x HP 34401A
GPIB/ USB converter
GPIB –GPIB connecting cable
8Ohm 20W resistor
Power Supply Pack
Low Temperature Chamber
NI LabView
Unsecured Resources
Gas for the temperature chamber
Date
Duration 10 hours Dependencies
Participants Mikulas Jandak, and / or David Leal, technicians Procedure a) Power pack with sensing resistor should be put into low
temperature chamber
b) Multimeters should be connected to PC and program written
in NI LabView is to be used to acquire the data. The
multimeters should monitor with the sampling rate of 1Hz
current and voltage.
c) After the voltage reaches x volt the experiment is to be ???
d) The capacity of the battery pack is to be evaluated with
respect to the voltage across the battery pack
Expected Results
The capacity of the battery pack should be reduced by 20%. The
battery pack should operate during whole experiment and it should
be able to deliver 3A of current. There should be clear correlation
between the voltage across the battery pack and the battery
capacity.
ID T09
Name Heat Dissipation Test
Components Tested
Voltage Regulators
Purpose To make sure the amount of heat needed to be dissipated can be
done so properly.
Justification Ensure proper regulator operation
Location IRF Electronic Lab Conditions Normal humidity, Varying pressure from normal, to expected
pressure at maximum height, Normal room Temperature. Required Resources
HP 34401A
Resistor equivalent to the load as seen from the regulator
Voltage source
Temperature sensors
Low pressure chamber
NI LabView
GPIB –GPIB connecting cable
GPIB/ USB converter
Unsecured Resources
Low pressure chamber
Date
Duration 10 hours Dependencies Participants Mikulas Jandak, and / or David Leal, technicians
Procedure a) Setup the voltage regulator with the corresponding resistor.
b) Multimeters should be connected to PC and program written
in NI LabView is to be used to acquire the data. The
multimeters should monitor with the sampling rate of 1Hz
current and voltage.
c) Set Temperature sensors on the regulator
d) As the pressure on the chamber decreases, the electrical and
physical properties of the regulator will be measured and
evaluated.
Expected Results
The voltage regulators should be able to properly dissipate the heat
that results from the voltage conversion, and this way, continue to
operate properly during the entire test. In case the heat cannot be
properly dissipated, heat sinks will be added and the test redone.
ID T10 Name Regulator Low Voltage performance
Components Tested
Voltage Regulators
Purpose To test what the voltage threshold when the systems will stop
operating.
Justification Ensure proper regulator operation Location IRF Electronic Lab
Conditions Normal humidity, , Normal pressure(this refers to normal pressure and humidity), Regular room temperature.
Required Resources
HP 34401A
Resistor equivalent to the load as seen from the regulator
Voltage source
NI LabView
GPIB –GPIB connecting cable
GPIB/ USB converter
Unsecured Resources
Date Duration 2 Hours Dependencies Participants Mikulas Jandak, and / or David Leal, technicians Procedure a) Setup the voltage regulator with the corresponding resistor.
b) Multimeters should be connected to PC and program written
in NI LabView is to be used to acquire the data. The
multimeters should monitor with the sampling rate of 1Hz
current and voltage.
c) Voltage being fed into the regulator will vary to find the real
limits at which the voltage regulator will still work properly.
Expected Results
The Voltage regulator should be able to work with over voltage, and
should be able to work properly with voltage as low as the desired
voltage plus the voltage drop in the device.
ID T11
Name Emergency Parachute deploying system
Components Tested
Emergency Parachute deploying system
Purpose To make sure the parachute deploying system works properly.
Justification Make sure the Emergency parachute deploying system works properly, to eliminate the risk of the FISH going into freefall and being a security threat to people.
Location IRF Electronic Lab Conditions Normal humidity, , Normal pressure(this refers to normal
pressure and humidity), Regular room temperature. Required Resources
Signal Generator
Emergency Parachute deploying system
Unsecured Resources
Date Duration 2 Hours Dependencies Participants Mikulas Jandak, and / or David Leal, technicians Procedure a) Send a signal to the system that would correspond to the
signal send by the free fall detector when in free fall.
b) Send random data, test for possible failures.
Expected The system should be triggered only by detecting the payload has
Results been in free fall for more that one minute.
Battery Test
ID B01 Name Battery Temperature Test
Components Tested
Power Supply Pack
Purpose To test capacity and reliability of power supply with respect to the
low temperature
Justification Battery safety issues Location Kiruna, dormitory Conditions Normal humidity, Normal pressure(this refers to normal
pressure and humidity), Temperature 25,0 and -10 deg C Required Resources
Metal Container
Battery Pack
Freezer
Oven
Unsecured Resources
Date
Duration 21 hours Dependencies Participants Mikulas Jandak, Jan Speidel Procedure a) Fully charged battery in the metal container is to be stored
in the temperature of -18 in the freezer for 2 hours
b) Battery is to be then stored in the temperature of +50 in the
oven.
c) The procedure above is to be repeat 5 times
Expected Results
There should be no electrolytes leakage
ID B02 Name Battery Drop Test
Components Tested
Power Supply Pack
Purpose To ensure that the battery pack is capable of surviving high level of
vibration
Justification Battery safety issues Location Kiruna Conditions Normal humidity, Normal pressure(this refers to normal
pressure and humidity), Temperature 0 deg C Required Resources
Battery Pack
Unsecured Resources
Date Duration 20 hours Dependencies Participants Mikulas Jandak Procedure Drop the battery from 10m height onto concrete surface
Expected Results
There should be no electrolytes leakage, no explosition, no fire
ID B03 Name Battery Thermo Shock Test
Components Tested
Power Supply Pack
Purpose To test safety performance of the power pack
Justification Battery safety issues Location Kiruna, dormitory Conditions Normal humidity, Normal pressure(this refers to normal
pressure and humidity), Temperature 0 deg C Required Resources
Battery Pack
Metal Container
Temperature sensor
Oven
Unsecured Resources
Date Duration 2 hours Dependencies Participants Mikulas Jandak Procedure a) The battery in the metal container is to be put in the oven
b) The temperature of the oven is to be raised at 5±1℃ per minute to
a temperature of 130±2℃ and remain there 60 minutes.
Expected Results
There should be no electrolytes leakage, no exposition, no fire
ID B04
Name Battery Discharging test
Components Tested
Power Supply Pack
Purpose To test safe charging and discharging of the battery power supply
pack
Justification Battery safety issues Location IRF Electronic lab, Kiruna Conditions Normal humidity, Normal pressure(this refers to normal
pressure and humidity), Temperature 0 deg C Required Resources
Battery Pack
2x multimeter HP 34401A
Smart Charger (1.5A) for 11.1V Li-ion/Polymer Rechargeable Battery
Pack
Resistor
Unsecured Resources
Date Duration 5 hours Dependencies Participants Mikulas Jandak Procedure a) The battery pack is to be charge by the smart charger, the current
and the voltage across the batter is to be monitor
b) When the charger indicates complatition, the current must drop to 0
and the voltage across battery must be less than 12.7 V
c) The battery pack is to be discharge at the approximate discharge
rate of 1C (2.2A) through the resisitor
d) When the voltage reaches 7.2V, the PCM (protection circuit
module) should disconnect the battery pack so no current should
flow through the resisitor.
Expected Results
The PCM should not allow the battery to be deeply discharge and
overcharge
Sensor Test, Calibration
ID S01 Name Infrared sensor calibration test
Components Tested
Sharp GP2D120
Purpose To test behavior of optical sensor with respect to temperature and
to test reaction of the system., to set threshold constant for ADC
Justification Overall objectives
Location IRF, Kiruna Conditions Normal humidity, Normal pressure(this refers to normal
pressure and humidity), Temperature 0 deg C,-20 deg C Required Resources
GP2D120
Multimeter HP 34401A
Assembled main payload and fish
Freezer
Ruler
Unsecured Resources
Date Duration 3 hours
Dependencies Participants Mikulas Jandak
Procedure a) The output of GP2D120 is to be measured with anything in the
sensor proximity. The measurement is to be repeated for several
turn on/off cycles. The output is to be measured by multimeter HP
34401A.
b) The procedure a) is to be repeated but with the fish in the entrance
to the main payload.
c) The appropriate threshold from the sensor is set and the reaction
time is to be evaluated. The delay is proportional to the distance
between bottom of the main payload and the fish. When the
approaching fish is sensed by the sensor, the main reeling motor is
to be stopped and the distance is to be measured. This is repeated
for several turn on/off cycles.
d) The sensor is put into a freezer for 1 hour in the temperature -20
deg C and the procedures above are to be repeated.
Expected Results
The reaction time should be constant for both 20 deg and -20 deg C
and there should be clear difference in the output of the sensor
when the fish is in the entrance and there is nothing in the close
proximity.
ID S02 Name Hall sensor calibration test
Components Tested
Radiometric Linear Hall Effect Sensor A1321
Purpose To test the behavior of hall sensors with respect to temperature, the
distance between the sensor and the magnet, and the operation of
the motor.
Justification Overall objectives Location IRF, Kiruna Conditions Normal humidity, Normal pressure(this refers to normal
pressure and humidity), Temperature 0 deg C,-20 deg C Required Resources
A1321
Multimeter HP 34401A
Counter
Assembled main payload
Freezer
Ruler
Unsecured Resources
Counter
Date Duration 10 hours Dependencies
Participants Mikulas Jandak Procedure a) The motor is off. The output of the hall sensor is to be measured by
HP 34401A with respect to the distance between the magnet
mounted on the bail and the number of pulses provided by the
incremental sensor mounted on the shaft. The pulses are to be
measured by the counter.
b) The emergency motor is to be put in proximity to the hall sensor
and the procedure a) is to be repeated.
c) The reel with hall sensors and motors is to be put into freezer in the
temperature of -20 deg and the procedure a) and b) is to be repeated
Expected Results
There should be linear dependency among the distance of the
magnet, number of pulses and the sensor voltage. The temperature
should have negligible effect of the output voltage.
ID S03 Name Inertial sensors bias temperature stability
Components Tested
MS8002.D, ADXRS150, LIS3L02AQ3
Purpose To measure the bias temperature coefficient.
Justification Overall objectives (precision) Location IRF, Kiruna Conditions Normal humidity, Normal pressure(this refers to normal
pressure and humidity), Temperature -40 deg C 85 deg C Required Resources
ADXRS150(6x)
LIS3L02AQ3(2x)
MS8002.D(1x)
15 x Multimeter HP 34401A
GPIB/USB converter
GPIB/GPIB connections cables
1x PC
Low temperature chamber
Precise temperature sensor
Oven
NI LabWindows™/CVI
Matlab
Unsecured Resources
Precise temperature sensor
Date It could accompanied other tests in the low temperature chamber which not produce vibrations
Duration 1-2days Dependencies
Participants Mikulas Jandak Procedure a) Inertial sensor are to be put into the low temperature chamber
b) The temperature, the voltages from 15 different sources (6 gyros, 3
3-axis accelerometers) are to be simultaneously measured by HP
34401A at the rate of 10Hz.
c) The temperature is to be changed from +25 de C to -40 deg C
d) The procedures above are to be repeated in the oven with the
temperature change between +25 to +80 for almost identical
position of the accelerometers.
e) The noise is to be filtered in matlab and the temperature bias
coefficient is to evaluated
Expected Results
The temperature bias coefficient should be linear within -40 to +80
range and it should be within the value specified in the datasheet.
ID S04 Name The calibration of the compass
Components Tested
Honeywell HMC6352
Purpose To calibrate the compass with the respect to the small magnet
positioning in the entrance to the main payload. To select
appropriate magnet in terms of size and optimally position it.
Justification Overall objectives (flight simulator) Location IRF, Kiruna
Conditions Normal humidity, Normal pressure(this refers to normal pressure and humidity), Temperature -40 deg C 85 deg C
Required Resources
Angular ruler
Assembled platform
Unsecured
Resources Date Duration 1 days Dependencies Participants Mikulas Jandak
Procedure a) The heading of the magnetometer is to be measured with respect to
the position and size of the magnet
b) The true heading is to be measured by angular ruler
Expected Results
The temperature heading should show precision of less than 5 deg.
ID S05 Name Accelerometer bias calibration test
Components Tested
MS8002.D
Purpose To measure the bias of the precise accelerometer
Justification Overall objectives (axis alignment) Location IRF, Kiruna
Conditions Normal humidity, Normal pressure(this refers to normal pressure and humidity), Temperature 20 deg C
Required Resources
Rotating platform
MS8002.D(1x)
Microcontroller LPC2368, AD Converter ADIS2178 and its analog front
part, micro sd card
NI LabWindows™/CVI
Matlab
Unsecured Resources
Rotation platform
Date Duration 1days Dependencies
Participants Mikulas Jandak Procedure a) MS8002.D with the microcontroller and the analog/digital converter
is to be put onto the platform which is positioned vertically with
respect to the surface
b) MS8002.D is to be fixed so it cannot move and the the z-axis is
positioned perpendicular to the rotation axis so the change in the
acceleration is maximal.
c) The platform I to be rotated at the constant speed of 1 Hz.
d) The acceleration from all 3 axis is to be measured at the rate of
10kHz and stored at external memory
e) The data is to be filtered and proceeded in matlab and the dc
components is to be determined.
Expected Results
The DC components of the measured acceleration should be within
the range stated in the datasheet and used as a value for 0g
acceleration
3.24 Components Derating
Appendix Derating
a) Component derating
Device: LM1086 Regulators
Device Value Design Value Required
Derated Value
Margin Note
Maximum
operating
voltage
250V 24V 48V 80 The circuit
includes
inductive load
so the design
value may be
more but 80%
margin should
enough
Hot spot
temperature
150C 60C 130 46 Temperature
analysis based
on mechanical
subsystem
Device: POWER-CHOKE WE-HCFT
Device Value Design Value Required
Derated
Value
Margin Note
Maximum
operating voltage
- 24V 48V - Not stated in
datasheet
Hot spot
temperature
150C 60C 130 46 Temperature
analysis based
on mechanical
subsystem
1) Diode Derating
a) Criteria
Parameter Load ratio or limit
Forward surge
current (IFSM
):
‐ non‐repetitive
operation
‐ repetitive
operation
80 %
60 %
Reverse voltage
(VR)
75 %
Dissipated
power (PD)
50 % (only if dissipated power is defined by the manufacturer)
Maximum
junction
temperature (Tx)
110 °C or Tj max
– 40 °C (whichever is lower).
Device: Power Rectifier MBR1045
Device Value Design Value Required
Derated
Value
Margin Note
Forward Surge
Repetitive
150 15 18.75 87 To deliver stall
torque of
600% of the
nominal
Forward Surge
Non-Repetitive
20 3.5 5.8 70 Based on
assumption
that the 2.5A
motor
current,1A
system
current, all
going through
one diode
2) Ceramic Capacitor Derating
a) Criteria
Parameters Load ratio or limit Voltage:
rated voltage ≤ 500 V 60 %
Voltage:
rated voltage > 500 V 50 %
ceramic, X7R Dielectric
Device
Value
Design
Value
Required
Derated
Value
Margin Note
Voltage: 100V <63V <105V <-5% In
most
cases,
the
design
value
is less
then
12V
3) Electrolytic Capacitors
The electrolytic capacitors were not listed in ESA derating manual
4) Connector Derating
a) Criteria
Parameters Load ratio or limit
Working voltage 50 % of specified voltage at any altitude (pin-to-pin
and
pin-to-shell).
Current 50 %
Maximum operating temperature 30 ºC below maximum rated temperature.
Maximum mating and demating
cycles 50
b) Component Derating
Device: Hirschmann GDM 3016
Device
Value
Design Value Required
Derated
Value
Margin Note
Working voltage 250 24 48 66
Current 32 15 30 6 When two
pins are used
Maximum
operating 125 60 95 58
Maximum
mating and
demating
cycles
- Value not
stated in
thedatasheet
Device: Cannon ZD connector zd solder cup
Device
Value
Design Value Required
Derated
Value
Margin [%] Note
Working voltage 500 24 48 90
Current 2 1 2 0 When two
pins are used
Maximum
operating 105 60 95 10
Maximum
mating and
demating
cycles
- Value not
stated in the
datasheet
The electrolytic capacitors were not listed in ESA derating manual
Chip resistor (RM), network resistor derating table
Part type Derating
Voltage 80 %
Power 50 % up to 85 °C, decreasing
to 0 % at 125 °C
3.25 Datasheet Main Payload
Recommended