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45nm Processors & Beyond
A
Presentation On
By
Ajaypal Singh Dhillon
Kurukshetra university
Contents• Introduction
• Process Features
• Transistor Process flow
• 45nm Techniques
• Intel Penryn features
• Differences between AMD & INTEL technology
• Beyond 45nm
• Conclusions
• Refrences
Solution• Use High-k material as gate dielectric
Benefit compared to 65nm technology
High-k Vs SiO2 Benefits
Capacitance 60% greater Much faster transistor
Gate dielectric leakage
>10% reduction Far cooler
What’s so hard aboutusing High-kReplacing SiO2 with high-k materials leads to two problems due to interaction with the the polysilicon gate electrode:
1. Charges got traped at gate/dielectric interface
Solution: Atomic layer Deposition
2. Phonon scattering- electrons are made less mobile (they slows down)
Solution: use metal gate
45nm techniquesImmersion lithography
• Immersion effectively decreases wavelength by putting water
between projection lens and silicon wafer
If a fluid of refractive index n fills the space between the lens and the wafer, then the effectivewavelength = the vacuumwavelength of the light ÷ by n
• Shorter effective wavelengths
enable smaller features to be patterned
Atomic layer Deposition
Intel Penryn features
• New Intel SSE4 Instructions
• Larger, Enhanced Intel Advanced Smart Cache
• High Speed Cores
• Fast Radix-16 Divider
• Nearly 400 million transistors in dual core and
about 800 millions of transistors in 45nm quad
core.
Difference between AMD & Intel Technology• Amd uses immersion lithography where as Intel uses
dry lithography at 45nm
• Amd uses Direct connect architecture for its processors
where as Intel still happy to stick with FSB.
• Amd follows “Gate first” approach where as Intel follow
“Gate Last”.
• Though Intel has not disclosed the metal it is using for
gate where as it is believe that Amd is cashing on
nickel in this prospective.
Beyond 45nm• 32nm process after about three years from now.
• 16nm to arrive in 2018 with gate length 5nm.
• If gate length approaches 3nm, a chip that contained
them would hypothetically overheat itself.
• 1.5nm is the minimum gate length a transistor can
hit.
• Use carbon nanotubes, HP crossbar switches, vGroove,
multiple gate transistors, 3D chips,Spintronics etc.
Conclusions• A 45 nm technology is described with
–Design rules supporting ~2X improvement in transistor density–193nm dry lithography at critical layers for low cost–8 standard Cu interconnect layers with extensive use of low-k–Thick Metal 9 Cu RDL with polymer ILD
• High-k + Metal gate transistors implemented for the first time in a high volume manufacturing process
–Integrated with 3RDgeneration strained silicon–Achieve record drive currents at low IOFFand tight gate pitch
• The technology is already in high volume manufacturing
–High yields demonstrated on SRAM and 3 microprocessors–High yields demonstrated in two 300mm fabs
Refrences1. Article “The High-k Solution By Mark T. Bohr, Robert S. Chau, Tahir Ghani, and Kaizad Mistry” Published on October 2007.
2. White Paper, Intel core micro architecture ”Introducing the 45nm next generation microarchitecture” October 2007.
3. Technical intel paper”A 45 logic technology with high-k +metal gate transistors,strained silicon,9cu interconnect layers,193 dry pattering, 100% Pb free packing”
4. www.intel.com/technology , www.wikipedia.com/wiki/45nm.
5 Amd press reports
Thank You
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