Download pdf - N9080A LTE FDD and Technical Overview N9082A LTE · PDF file3 Multiple access technology Downlink and uplink transmission in LTE are based on the use of multiple access technologies:

N9080A LTE FDD and N9082A LTE TDD

Measurement Applications

Technical Overview with Self-Guided Demonstration

Agilent X-Series Signal Analyzers (PXA/MXA/EXA)

N9080A and N9082A LTE measurement applications provide LTE FDD and TDD signal analysis with hardkey/softkey manual

user interface and familiar SCPI programming.

2

The complexity of LTE systems

requires signal analysis with in-

depth modulation analysis as well

as RF power measurements. The

Agilent X-Series signal analyzers

(PXA/MXA/EXA), in combination

with the N9080A LTE FDD and

N9082A LTE TDD measurement

applications, measure complex LTE

signals with world-class accuracy

and repeatability. Its hardkey/softkey

manual user interface plus SCPI

programming capability is ideal for

speedy design validation and/or early

manufacturing.

• High-quality modulation analysis

measurement for both FDD and

TDD frame structure signals

according to 3GPP TS 36.211

v 8.6.0 (2009-03)

• Support for all TDD uplink-

downlink configurations (0-6) and

special subframe lengths (0-8)

• Downlink (OFDMA) and uplink

(SC-FDMA) measurement

capability in a single option

• All uplink and downlink channels

and signals plus all bandwidths

and modulation formats

• Comprehensive transmit signal

quality measurements including

frequency error, EVM (composite

EVM, data EVM, RS EVM),

Reference Signal Tx Power (RSTP),

OFDM Symbol Transmit Power

(OSTP), time alignment between

transmitter branches, DL RS power

plus more

• Support for E-UTRA Test Models

(E-TMs) for transmit signal quality

measurements as well as RF

power measurements as defined in

3GPP TS 36.141 V8.2.0 (2009-03)

• One button RF power

measurements with pass/fail per

3GPP TS 36.141 V8.2.0 and 3GPP

TS 36.521-1 V8.1.0. Measurements

including channel power, transmit

ON/OFF power (for TDD), ACP,

spectrum emission mask (SEM),

spurious emissions, occupied

bandwidth and more

• Analysis of Tx diversity encoded

signals

• Analysis of timing and phase

offset for both Tx diversity and

spatial multiplexing MIMO signals

• Auto detection of both uplink and

downlink signals

• Flexible measurements let you

view your signal in multiple ways:

by resource block, sub-carrier, slot,

or symbol—select all or a specific

region for analysis

• Color coding by channel type

highlights signal errors

• Add/delete users and edit

parameters for each user for

realistic testing

• Support for 3GPP-compliant

equalization and EVM minimization

• The automatic resource block

detection or manual user allocation

using graphical resource allocation

tool simplifies measurement setup

• Error and frame summary tables

provide at-a-glance presentation of

key measurement parameters

• Common tracking error, equalizer

frequency, and impulse response

let you view the channel from your

signal’s perspective

Accelerate Your Time to Market with the LTE Measurement Application

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► Multiple access technology

Downlink and uplink transmission in

LTE are based on the use of multiple

access technologies: specifically,

orthogonal frequency division multiple

access (OFDMA) for the downlink,

and single-carrier frequency division

multiple access (SC-FDMA) for the

uplink.

► Transmission bandwidth

In order to address the international

wireless market and regional

spectrum regulations, LTE includes

varying channel bandwidths selectable

from 1.4 to 20 MHz, with sub-carrier

spacing of 15 kHz. In the case of

multimedia broadcast multicast

service (MBMS), a sub-carrier

spacing of 7.5 kHz is also possible.

Sub-carrier spacing is constant

regardless of channel bandwidth. To

allow for operation in different sized

spectrum allocation, the transmission

bandwidth is instead altered by varying

the number of OFDM sub-carriers as

shown in Table 1.

► Frame structure

There are two radio frame structures

for LTE: frame structure type 1 (FS1)

for full duplex and half duplex FDD,

and frame structure type 2 (FS2) for

TDD. The frame structure for full

duplex FDD is shown in Figure 1.

This structure consists of ten 1 ms

sub-frames, each composed of two

0.5 ms slots, for a total duration of 10

ms. The FS1 is the same in the uplink

and downlink in terms of frame, sub-

frame, and slot duration although the

allocation of the physical signals and

channels is quite different. Uplink and

downlink transmissions are separated

in the frequency domain.

Background Information

This background information will provide a quick review of some of the physical layer characteristics of an LTE signal. For in-depth LTE technical information, please visit http://www.agilent.com/find/lte

Transmission bandwidth [MHz] 1.4 3 5 10 15 20

Number of sub-carriers 72 180 300 600 900 1200

Table 1. Number of sub-carriers for the different transmission bandwidths

Figure 1. LTE frame structure type 1 (TS 36.211 V8.6.0)

One radio frame, Tf = 307200Ts = 10 ms

One slot, Tslot = 15360 x Ts = 0.5 ms

One subframe

#0 #1 #2 #3 #18 #19

Subframe 0 Subframe 1

, ,Subframe 9

,

4

FS2 is defined for TDD mode. Two

switching point periodicities are

supported – 5 ms and 10 ms, each

with an overall length of 10 ms and

divided into 10 subframes. The 5 ms

switch-point periodicity TDD frame

structure is shown in Figure 2.

For the 5 ms switch-point periodicity

case, subframe 6 is a special

subframe identical to subframe 1. For

the 10 ms switch-point periodicity,

subframe 6 is a regular downlink

subframe. Table 2 illustrates the

possible UL/DL allocations which

have been specified in the 3GPP

standard for TDD mode.

As show in Figure 2, the special

subframe consists of special fields

- downlink pilot timeslot (DwPTS),

guard period (GP) and uplink

pilot timeslot (UpPTS). Their total

length is 1 ms. However, within the

special subframe the length of each

field may vary depending on co-

existence requirement with legacy

TDD systems and supported cell

size. Table 3 provides the supported

special configurations which are also

specified in 3GPP.

Figure 2. Type 2 TDD frame structure with 5 ms switch-point periodicity. (TS 36.211 V8.6.0)

Table 2. Uplink-downlink confi gurations (TS 36.211 Table 4.2-2)

Table 3. Confi guration of special subframe length (by Ts unit) (TS 36.211 Table 4.2-1)

5

► Resource block

The smallest time-frequency unit

used for transmission is called a

resource element, defined as one

symbol on one sub-carrier. A group of

contiguous sub-carriers and symbols

form a resource block (RB). Data is

allocated to each user in terms of RBs.

For a Type 1 frame structure using

normal cyclic prefix (CP), an RB spans

12 consecutive sub-carriers at a

sub-carrier spacing of 15 kHz, and

seven consecutive symbols over a

slot duration of 0.5 ms. Even though

an RB is defined as 12 sub-carriers

during one 0.5 ms slot, scheduling

is carried out on a sub-frame (1 ms)

basis. Using normal cyclic prefix,

the minimum allocation the base

station uses for user equipment

(UE) scheduling is 1 sub-frame (14

symbols) by 12 sub-carriers. The

size of an RB is the same for all

bandwidths, therefore, the number

of available physical RBs depends on

the transmission bandwidth as shown

in Table 4.

Transmission

bandwidth [MHz]1.4 3 5 10 15 20

Number of

resource blocks6 15 25 50 75 100

Number of sub-carriers 72 180 300 600 900 1200

Table 4. Number of resource blocks (RB) and sub-carriers for the different uplink and

downlink transmission bandwidths

► Physical layer channels

and signals

The LTE air interface consists

of physical signals and physical

channels. Physical signals are

generated in Layer 1 and used

for system synchronization, cell

identification, and radio channel

estimation. Physical channels carry

data from higher layers including

control, scheduling, and user payload.

Physical signals are summarized in

Table 5. In the downlink, primary,

and secondary synchronization

signals encode the cell identification,

allowing the UE to identify and

synchronize with the network. In both

the downlink and the uplink there are

RSs, known as pilot signals in other

standards, which are used by the

receiver to estimate the amplitude

and phase flatness of the received

signal.

DL signals Full name Modulation sequence Purpose

P-SS Primary

synchronization

signal

One of 3 Zadoff-Chu sequences Used for cell search and identifi cation by the UE; carries

part of the cell ID (one of 3 orthogonal sequences)

S-SS Secondary

synchronization

signal

Two 31-bit BPSK M-sequence Used for cell search and identifi cation by the UE;

carries the remainder of the cell ID (one of 168 binary

sequences)

RS Reference

signal (pilot)

Complex I+jQ pseudo random

sequence (length-31 Gold

sequence) derived from cell ID

Used for DL channel estimation; exact sequence

derived from cell ID, (one of 3 * 168 = 504)

UL signals Full name Modulation sequence Purpose

DM-RS Demodulation

reference signal

Zadoff-Chu Used for synchronization to the UE and UL channel

estimation

S-RS Sounding

reference signal

Based on Zadoff-Chu Used to monitor propagation conditions with UE

Table 5. LTE physical signals

6

Alongside the physical signals are

physical channels, which carry the

user and system information. These

are summarized in Table 6.

DL

channels Full name

Modulation

format Purpose

PBCH Physical broadcast

channel

QPSK Carries cell-specifi c

information

PDCCH Physical downlink

control channel

QPSK Scheduling, ACK/NACK

PDSCH Physical downlink

shared channel

QPSK, 16QAM,

64QAM

Payload

PMCH Physical multicast

channel

QPSK, 16QAM,

64QAM

Payload for multimedia

broadcast multicast

service (MBMS)

PCFICH Physical control

format indicator

channel

QPSK Carries information about

the number of OFDM

symbols (1, 2, 3 or 4)

used for transmission of

PDCCHs in a sub-frame.

PHICH Physical hybrid ARQ

indicator channel

BPSK

modulated on

I and Q with

the spreading

factor 2 or

4 Walsh codes

Carries the hybrid-ARQ

ACK/NAK

UL

channels Full name

Modulation

format Purpose

PRACH Physical random

access channel

uth root

Zadoff-Chu

Call setup

PUCCH Physical uplink

control channel

BPSK,QPSK Scheduling, ACK/NACK

PUSCH Physical uplink

shared channel

QPSK, 16

QAM, 64 QAM

Payload

Table 6. LTE Physical Channels

7

► FDD mapping to resource

elements

Figure 3 gives a more detailed view

of FS1 for the downlink, showing the

downlink slot structure and color

coded for the different signals and

channels. The frame structure is

referenced to Ts which is the shortest

time interval of the system defined as

1/(15000 x 2048) seconds or 32.552 ns

► TDD mapping to resource

elements

Figures 4 and 5 show examples of

5 ms and 10 ms TDD switch point

periodicities with slot structures and

colors coded for the different signals

and channels

The Figures 4 and 5 show detailed

physical layer definition of FS2 for

5 ms and 10 ms downlink-to-uplink

switch-point periodicities. From

these frame structures we can find,

unlike in FDD where the primary and

secondary synchronization signals

are contiguously placed within one

subframe, for TDD the two signals

are placed in different subframes and

separated by two OFDM symbols.

As a result, there is no operational

difference between the FDD and

TDD modes at higher layers or in the

system architecture. At the physical

layer, the fundamental design goal

is to achieve as much commonality

between the two modes as possible.

With this background, we can now

begin to examine LTE signals using

the N9080A LTE FDD measurement

application and the N9082A LTE TDD

measurement application.

Figure 3. Example of downlink mapping (normal cyclic prefi x)

Figure 4. Example of LTE TDD 5 ms switch periodicity mapping

Figure 5. Example of LTE TDD 10 ms switch periodicity mapping

8

All demonstrations utilize the

X-Series signal analyzer with N9080A

and N9082A LTE measurement

application and the Agilent MXG

vector signal generator with

3GPP LTE Signal Studio software.

Demonstration Preparation

Instruments Model number Required options

MXG vector

signal generator

Note: ESG-C can

also be used

N5182A 503 or 506 – frequency range at 3 GHz

or 6 GHz

651, 652 or 654 – internal baseband

generator

Option 654 – 125 MSa clock rate

required for MXG, but not for ESG-C

Signal Studio

software

N7624B version

7.5.0.1 or later

3GPP LTE FDD

1FP – Connectivity to ESG

3FP – Connectivity to MXG

HFP – Basic LTE FDD

SFP – Advanced LTE FDD

3GPP LTE

TDD Signal

Studio software

N7625B version

2.0.1.0 or later

1FP – Connectivity to ESG

3FP – Connectivity to MXG

EFP – Basic LTE TDD

QFP – Advanced LTE TDD

X-Series signal

analyzer

N9030A PXA

N9020A MXA

N9010A EXA

503, 508 (507 for EXA), 513, or 526 –

frequency range up to 26.5 GHz

B25, B40 or B1X - 25 MHz, 40 MHz, or

140 MHz analysis bandwidth for PXA

B25 – 25 MHz analysis bandwidth for

MXA and EXA

X-Series LTE

measurement

application

N9080A-1FP or 1TP

N9082A-1FP or 1TP

LTE FDD measurement application

LTE TDD measurement application

Controller PC for

Signal Studio

Install N7624B/N7625B to generate

and download the signal waveform

into MXG via GPIB or LAN (TCP/IP);

refer the online documentation for

installation and setup.

9

Keystrokes surrounded by [ ] indicate

hard keys on X-Series analyzers,

while key names surrounded by {}

indicate soft keys located on the right

edge of the X-Series display.

This demonstration will cover

transmitter tests for eNBs according

to 3GPP TS 36.141 V8.2.0 (2009-03).

The eNB transmitter conformance

tests are carried out using downlink

configurations known as E-UTRA

Test Models (E-TM). There are three

distinct classes of E-TM defined,

known as E-TM1, E-TM2 and E-TM3.

E-TM1 and E-TM3 have further

subclasses. Table 7 lists the various

downlink transmitter tests as well as

the E-TMs used for each test:

Demonstration 1: LTE Transmitter Tests for Downlink

Demonstrations

3GPP TS 36.141

paragraph number Transmitter test case E-TM

6.2 Base station output power E-TM1.1

6.3

6.3.1

6.3.2

Output power dynamics

Power control dynamic range

Total power dynamic range

E-TM 2; E-TM 3.1; E-TM 3.2; E-TM 3.3

E-TM 2; E-TM 3.1

6.4 Transmit ON/OFF power Note: this is for TDD only

6.5

6.5.1

6.5.2

6.5.3

6.5.4

Transmitted signal quality

Frequency error

Error vector magnitude

Time alignment between

transmitter branches

DL RS Power

E-TM 2; E-TM 3.1; E-TM 3.2; E-TM 3.3

E-TM 2; E-TM 3.1; E-TM 3.2; E-TM 3.3

E-TM 1.1

E-TM 1.1

6.6

6.6.1

6.6.2

6.6.3

6.6.4

Unwanted emissions

Occupied bandwidth

Adjacent channel leakage

power ratio

Operating band unwanted

emissions

Transmitter spurious emissions

E-TM 1.1

E-TM 1.1; E-TM 1.2

E-TM 1.1; E-TM 1.2

E-TM 1.1

6.7 Transmitter Intermodulation E-TM 1.1

Table 7. Evolved Test Model (E-TM) mapping to test cases

10

► Demonstration 1.1:

Base station output power

(3GPP test case 6.2)

This measurement is defined to

verify the accuracy of the maximum

output power across the frequency

range. Accurate broadband power

measurements can be made using

general power meter. However, due

to the nature of the LTE downlink

signal characteristics, 3GPP specifies

a test mode (E-TM1.1) for BS

output power measurement. The

Agilent X-series signal analyzer

with the embedded LTE FDD or TDD

measurement application software

provides a one-button “Channel

Power” measurement to report

the mean power in the appropriate

integrated bandwidth, which is

automatically set according to the

selected pre-defined standard for all

bandwidths of LTE signals.

Signal Studio instructions Software operations

Start the Signal Studio software Start > All Programs > Agilent Signal

Studio > 3GPP LTE FDD > 3GPP LTE FDD

Confi gure the MXG as a hardware

connected via GPIB or LAN (TCP/IP)

Follow the Signal Studio instructions

to connect to MXG N5182A

Set the basic parameters of the signal:

2.14 GHz center frequency, –10 dBm

amplitude and RF Output turned ON

In the tree view, left pane of the main

window, select Instrument under

Hardware

Set Frequency to 2.14 GHz

Set Amplitude = –10 dBm,

RF Output = On

Set the downlink LTE signal for

10 MHz LTE profi le and E-TM 1.1


window, select eNB Setup under

Waveform Setup

In the right pane of the main

window, click the Wizard button

to access a dialog box from which

you can select System Bandwidth and

Test Model Type.

Select 10 MHz (50 RB) for

System Bandwidth

Select E-TM1.1 for Test Model Type

Click OK

11

Setup the X-Series analyzer to

analyze the downlink LTE signal.

For TDD mode, the Agilent N9082A software provides flexible selection for

specific analysis slot(s) or symbols by turning on the gate view under the

[Sweep/Control] hardkey on the front panel of the analyzer and adjusting the

gate length.

X-Series instructions Keystrokes

Select LTE analysis [Mode]> {More 1 of 3} > {LTE}

Note: The location of the {LTE} softkey depends

on the number of applications installed on the

X-Series analyzer; therefore the softkey might

show up on a different softkey under [Mode]

Change frequency to 2.14 GHz [Freq] > {Center Freq} > [2.14] {GHz}

Active Channel Power

measurement

[Meas] > {Channel Power}

Select Downlink and 10 MHz

system bandwidth and

confi gurations

[Mode Setup] > {Direction: Downlink/Uplink};

{Preset To Standard} > {10 MHz (50 RB)}

Your display should look similar to Figure 6.

Figure 6. Channel power for a 10 MHz downlink FDD signal Figure 7. Channel power for TDD signal with Gate View On

For TDD mode, this measurement requires a timing trigger to capture the burst power on period. To make time-gated signal analysis of bursted signals, the gated LO function is required. For TDD signals, an external trigger signal from a device under test (DUT) must be connected to the X-Series Trigger 1 IN, found on the rear panel of the X-Series signal analyzer. Otherwise, a “waiting for trigger” or “star” message will be displayed on the screen.

12




Demonstration 1.2a:

Power control dynamic range:

The Resource Element (RE) power

control dynamic range is the

difference between the power of an

RE and the average RE power for

a BS. There is no specific test for

RE power control dynamic range.

The Error Vector Magnitude (EVM)

test provides enough test coverage

for this requirement. See the EVM

demonstration, demonstration 1.4a of

this demonstration guide.

Demonstration 1.2b:

Total power dynamic range:

The total power dynamic range is the

difference between the maximum and

the minimum transmit power of an

OFDM symbol. The upper limit of the

dynamic range is the OFDM symbol

power for a BS at maximum output

power. The lower limit of the dynamic

range is the OFDM symbol power

for a BS when one resource block is

transmitted. The OFDM symbol must

carry PDSCH and not contain RS,

PBCH or synchronisation signals.

The N9080A/N9082A modulation

analysis measurement provides

the OFDM Symbol Transmit Power

(OSTP) measurement under the

Error Summary trace. This OSTP

value is only calculated for PDSCH

only as required by this test. Refer

to demonstration 1.4, Transmitted

Signal Quality, for the modulation

analysis measurement procedure.


Transmit On/OFF power


Similar to TD-SCDMA, LTE TDD mode

separates the uplink and downlink

signals by using a time-slot-based

transmission format. A burst or

transmit signal in a given time must

fit within a tight mask so as not to

interfere with adjacent time slots.

3GPP specifies the BS transmitter off

power spectral density shall be less

than –85 dBm/MHz, and the transient

period length (from off to on and from

on to off) shall be shorter than 17 us.

Agilent makes a novel solution of the

on/off power measurement using a

dual-sweep technique with different

pre-amplifier and attenuation setups

in each. The first sweep minimizes

the instrument internal noise floor,

with the internal preamp enabled and

attenuation minimized to measure

the noise floor. The second sweep

is made with the preamp off and

attenuation optimized to ensure

accurate measurement of the Tx

on signal power level as calculated

by the auto RF range algorithm.

Then the two measurement results

are combined into a single-trace

display. In this way the measurement

exhibits the true power variations

throughout the burst or time slots.

It also provides a pass/fail function

to quickly indicate if the signal

is entirely within the mask and

conforms to the standard.

13

Since 3GPP has not defined a specific

test mode for this transmit on/off

power measurement for both BS

and UE, the following demonstration

uses a 10 MHz full filled 16QAM TDD

downlink signal as an example.

Key features:

• Uses a standard-compliant,

consecutive timeslot power versus

time mask

• One-button measurement with

pass/fail indication

• Measures Tx on and off power in a

signal measurement

• Supports both 5 ms and 10 ms

switch-point periodicity

• Measures traffic slots, DwPTS/

UpPTS average power, and slot

width

• Ramp up and ramp down period

can be zoomed-in by x-scale

changes


Start the Signal Studio software Start > All Programs > Agilent Signal Studio >

3GPP LTE TDD > 3GPP LTE TDD



Follow the Signal Studio instructions to connect to

MXG N5182A

Set the basic parameters of

the signal: 2.14 GHz center

frequency, –10 dBm amplitude

and RF Output turned ON

In the tree view, select Instrument under

Hardware Set Frequency to 2.14 GHz

Set Amplitude = –10 dBm, RF Output = On

Set the downlink signal for 10

MHz (50 RB) LTE TDD and 16QAM

modulation format

In the tree view, left pane of the main window,

select Carrier 1 under Waveform Setup.

In the right pane of the main window, under

Channel Confi guration, select Full fi lled QPSK

5 MHz (25 RB). From drop down list, select Full

fi lled 16QAM 10 MHz (50 RB)

Set the Uplink-Downlink

Confi guration for 3 and Special

Subframe Confi guration to 8

Under the LTE TDD Frame Confi guration change

Uplink Downlink Confi guration from 0 to 3

(default is 0, drop down the menu to select). Select

8 from drop-down menu for Special Subframe

Confi guration

Download the signal to MXG Press Generate and Download button

on the top tool bar; if you encounter

any errors, please refer the online help

of Signal Studio software

14

Setup the X-Series analyzer to analyze

the downlink LTE signal.


Select LTE TDD analysis [Mode] > {More 1 of 3} > {More 2 of 3}

{LTE TDD}

Note: The location of the {LTE TDD} softkey depends on the number of applications installed on the X-Series analyzer; therefore the softkey might show up on a different softkey under [Mode]


Active Transmit On/Off Power

measurement

[Meas] > { Transmit On/Off Power}

Select Downlink and 10 MHz system

bandwidth and Confi gurations

[Mode Setup] > {Radio} > {Direction:

Downlink/Uplink} {ULDLAlloc} >

{Confi guration 3}; {Dw/GP/Up Len} >

{ More 2 of 2} > {Confi guration 8}


Select Slot 10 as the fi rst time slot

for view of the whole burst signal

[Mode Setup] > {Predefi ned Parameters}

> {Analysis Slot} > { More 2 of 4} > { TS10};

{Meas Interval} > Type [20] > {Enter}

Make a 20 time slots Tx On/Off

measurement (Figure x)

Press [Restart]

Zoom in for ramp-up details (Figure x) [SPAN X Scale] > {Scale/Div}

Enter 20 us of Scale/div

Turn On the Trigger Line and Burst

Line for trigger delay adjustment

[View/Display] > {Trigger Line On } and

{Burst Line On}

Your display should look similar to Figures 8 and 9.

Figure 8. Transmit On/Off power of 10 ms frame (20 slots) Figure 9. A view of ramp up with burst line and trigger line on

15


Transmitted signal quality


The transmit signal quality

measurements are divided into

four categories: Frequency Error,

EVM, Time Alignment between

Transmit Antennas and Reference

Signal Power. We will look at

each one of these in the following

demonstrations. (Demonstrations 1.4a

thru 1.4c)

Demonstration 1.4a:

Frequency error (3GPP test case

6.5.1) and EVM (3GPP test case 6.5.2)

Frequency error is a measurement of

the center frequency offset from the

desired carrier frequency. If the error

is larger than a few sub-carriers, the

receiver demod may not operate and

could cause network interference.

Errors in RF frequency, LO frequency,

or digitizer clock rate could all appear

as carrier frequency error.

EVM is one of the most critical

transmitter tests. It is a measure

of the amount of distortion in the

transmission, ultimately affecting the

ability of a receiver to decode and

process the signal with minimum

errors.

The Frequency Error and EVM tests

are carried out using E-TM 2, 3.1, 3.2

and 3.3. This demonstration uses

E-TM 3.3 for frequency error and

EVM. The measurement methodology

remains the same for the other

E-TMs.

Generate a E-TM 3.3 signal using Agilent Signal Studio


Start the Signal Studio software Start > All Programs > Agilent

Signal Studio > 3GPP LTE FDD >

3GPP LTE FDD



Follow the Signal Studio instructions

to connect to MXG N5182A

Set the basic parameters of the

signal: 2.14 GHz center frequency,

–10 dBm amplitude and RF Output

turned ON



Hardware



RF Output = On

Select a Downlink waveform per

the March 2009 release of the 3GPP

standard.

In the tree view, left pane of the

main window, select Carrier 1 under

Waveform Setup

In the right pane of the main window,

if the default carrier is not “Basic

LTE FDD Downlink (2009-03)”

delete the carrier by pressing

and add a new carrier by pressing

and from drop down list,

select Basic LTE FDD

Downlink (2009-03)





Waveform Setup

In the top right pane of the main


to access a dialog box from

which you can select System

Bandwidth and Test Model Type.

Select 10MHz (50RB) for System

Bandwidth


Click OK

Download the signal to MXG Press Generate and Download

button on the top tool bar.

If you encounter any errors, please

refer the online help of Signal Studio

software

16

Setup the X-Series analyzer to analyze

the frequency error and EVM of the

downlink E-TM 3.3 signal generated

by Signal Studio.

Trace 1: Ch1 Error Summary Trace

– shows frequency error as well as

various EVM results. These EVM

results include an overall RMS

EVM for all selected channels, Peak

EVM, Data only EVM and RS EVM.

Under data EVM, 3GPP-defined

data EVM values are also reported.

This value is the average EVM for

PDSCH allocations. Only the resource

elements allocated to PDSCH are

included in the EVM calculation.

PDSCHs that do not have at least 150

resource elements for BW > 1.4 MHz

or at least 138 resource elements for

BW = 1.4 MHz are not included in the

EVM average.

Trace 2: Ch1 Frame Summary Trace –

shows the individual EVM as well

as power, modulation format, and

number of resource blocks occupied

for the channels that are present in

a frame. In this case, the individual

EVM for all control channels and

signals as well as individual EVM of

the 20 PDSCHs present in E-TM 3.3

are reported.



Note: The location of the {LTE} softkey depends on the number of applications

installed on the X-Series analyzer; therefore the softkey might show up on a different softkey under [Mode]


Note: You should see the spectrum of the signal. If you do not, make sure the signal is downloaded to the MXG and the RF is ON

Select modulation analysis

measurement

[Meas] > {More 1 of 2} > {Modulation

Analysis}


bandwidth

[Mode Setup] > {Direction: Downlink/

Uplink}

{Preset To Standard} > {10 MHz (50

RB)}

Adjust input power level range [AMPTD Y Scale] >{ Range} > [2] {dBm}

Recall a preset limit mask E-TM 3.3 [Recall] > {Data (import) EVM Setup}

> {Open…} > scroll down the list and

select TM3.3-BW10MHz.evms and

click Open

Include all active channels and signals [Meas Setup] > {Chan Profi le Setup}

> {Composite Include} > {Include All}

Change the measurement interval to

display the entire frame (20 slots)

[Meas Setup] > {Meas Time Setup} >

{Meas Interval Slot} > [20] {Enter}

Change the display to show Error

Summary

[View/Display] > {Preset View: Meas

Summary}


Figure 10. EVM and Frequency Error

17

Now we will look at some of the

modulation analysis traces that will

help troubleshoot if the EVM and/

or frequency error results are not as

expected.

Trace 1: Layer0 OFDM Meas – Shows

the composite constellation diagram

color-coded by the channel type

as shown in Trace 3. The P-SS

constellation is unique compared

to the other channels and signals.

P-SS is transmitted as a Zadoff-

Chu sequence, which is one of the

many Constant Amplitude Zero Auto

Correlation (CAZAC) sequences and

thus appears as irregularly spaced

points on a circle (pink color).

Trace 2: Layer0 Detected Allocations

Time – Shows the allocations of the

selected layer in a two dimensional

grid with frequency (subcarrier) on

the vertical axis and time (symbol)

on the horizontal axis. Each point on

the grid represents a single resource

element (1 subcarrier x 1 symbol).

Only channels and signals that are

selected under the channel profile

setup key are displayed on this trace.

In this example, there are 20 PDSCHs

along with all the control channels

and signals therefore you see a fully

occupied 10 MHz LTE profile. You

can deselect some of the channels

and signals to see a less populated

allocation. The points are color coded

according to channel type. The Frame

Summary trace, Trace 3, displays all

channels and their corresponding

colors.

Trace 3: Ch1 Frame Summary –

Shows the summary of all active

channels including the EVM for

each channel, their relative power,

modulation format used, and number

of resource block occupied by each

active channel.

Note: In order to view the “number

of occupied RB” column and all of

the active users (in this case there

are 20 user channels) select Trace

3 and change the display layout to

single: [View/Display] > {Layout}

> {Single}. The color of the channel

mirrors the color-coding used in other

displays, such as the constellation

diagram, detected allocations time

and the various EVM traces.

Trace 4: Ch1 Error Summary – Shows

information about the quality of the

signal being analyzed and information

about cyclic prefix and the Cell ID

used in the downlink transmission. It

provides a number of different EVM

metrics, including measurements

for the composite signal, the data

channels only and RS only.


Change the display to show four

traces

[View/Display] > {Preset view: Basic}

Change trace 2 to show the

detected allocation

[Trace/Detector] > {Select Trace}

> {Trace 2} > {Data} > {Demod} >

{Detected Allocations}

Auto scale the trace by going under

[AMPTD Y Scale] > {Auto Scale [Trace2]}

Change trace 3 to show Frame

Summary

[Trace/Detector] > {Select Trace} >

{Trace 3} > {Data} > {Tables} > {Frame

Summary}


Figure 11. LTE constellation, detected allocation, frame and error summary information

More information on the EVM measurement is available in the Appendix of this document.

18

Demonstration 1.4b:

Time alignment between transmitter

branches (3GPP test case 6.5.3)

Currently, all LTE transmitter tests

are defined for a single antenna

case except for this test here,

which is time alignment between

transmitter branches. This test is

required for eNBs supporting Tx

diversity and/or spatial multiplexing

MIMO systems. The signals from

the multiple antennas must be

aligned. The purpose of this test is

to measure time delay between the

signals from the multiple transmit

antennas. The current definition is

for the two transmit antenna case. If

four antennas are available, the other

antenna ports must be terminated.

The timing offset measurement

is a reference signal (pilot) based

measurement. In LTE, the reference

signals are not precoded and they

do not overlap in frequency between

the multiple transmit antennas,

therefore they uniquely identify each

transmitter. Because of that, the

output of the two transmitters can be

combined using a power combiner

and cross channel measurements

such as timing and phase

measurements can be made using a

single input analyzer.

The N9080A/N9082A LTE

measurement application performs

these cross channel measurements

(for 2x2, 4x2 and 4x4 antenna

systems) using a single X-Series

signal analyzer. The output signals

from the multiple transmit antennas

will need to be combined using a

power combiner prior to applying the

signal to the RF input of the X-Series

signal analyzer as shown below:

The Signal Studio setup procedure is

not included for this demo; only the

X-Series LTE are included. Please

refer to the Signal Studio help file

on how to configure two antenna Tx

diversity and/or spatial multiplexing

MIMO signals.

3GPP specifies to use E-TM 1.1 for

this measurement and this demo

assumes the transmitter under test is

transmitting E-TM 1.1.

Figure 12. Connection diagram for two Tx antenna confi guration

19

Trace 1: Ch1 OFDM MIMO Eq Ch Freq

Resp – shows the equalizer frequency

response as calculated by the MIMO

decoder. Channel responses of the

paths from the two transmitter

antenna ports are overlaid on top of

each other. Markers can be used to

distinguish the different signal paths

and response information.

Trace 2: Ch1 MIMO Info – Timing

offset is one of the many metrics

reported. Timing offset for both Tx

diversity and spatial multiplexing

MIMO signals are supported. This

is an RS-based measurement that

corresponds to each Tx/Rx path.

The RS based power, timing, phase,

symbol clock and frequency offset are

set to zero for the reference antenna

port (i.e., antenna 0 in this example

but can also be selected to be

antenna 1), and the values for these

metrics on the other antenna ports

(i.e., antenna port 1 in this example)

are reported relative to the reference

antenna port. In this example, the

timing offset of Tx1 is approximately

–21 nsec relative to antenna 0.


Preset the LTE mode [Mode Preset] green key on top right hand

corner of the X-Series hardware



measurement

[Meas] > {More (1 of 2)} > {Modulation

Analysis}

Select Downlink and 10 MHz

system bandwidth

[Mode Setup] > {Direction: Downlink/Uplink}



Recall a preset limit mask

E-TM 1.1

[Recall] > {Data (import) EVM Setup} >

{Open…} > scroll down the list and select

TM1.1-BW10MHz.evms and click Open

Select 2 Tx Antenna [Meas Setup] > {Sync/Format Setup} >

{TX Antenna} > {Number TX Antenna} >

{2 antennas}

Turn on Tx Diversity [Meas Setup] > {Chan Profi le Setup} > {More 1

of 3} > {More 2 of 3} > {Edit User Mapping} >

Make sure Precoding is set to Tx Div.

Change the display to show

MIMO specifi c traces

[View/Display] > {PresetView: MIMO

Summary}

Auto Scale Trace 1 [AMPTD Y Scale] > {Auto Scale [Trace 1]}

Put Marker on Path 0 (Tx Ant. 0) [M arker] > {Select Marker} > {Marker 1} →

by default marker 1 is placed on Path 0 (Tx

antenna 0)

Put Marker on Path 1 (Tx Ant. 1) [Marker] > {Select Marker} > {Marker 2} >

{Normal} > {More 1 of 2} > {Position} >

{Marker Z} > [1] {Enter} → Now marker 2 is

placed on path 1

Turn on Marker Table [Marker] > {More 1 of 2} > {Marker Table On/Off}

Figure 13. Timing offset measurement


20

Demonstration 1.4c:

DL RS power (3GPP test case 6.5.4)

Downlink reference signal power is

the resource element (RE) power of

the downlink reference symbol. There

are two types of RE Tx power defined

in 3GPP Technical Specification

36.141 v8.2.0, section F.3.3

1) RS Tx Power (RSTP)

It is the average reference signal

power for all input antenna ports

for the data within a sub frame.

This average power is calculated

by summing the powers of all

resource elements occupied by

RS in a subframe and dividing

by the total number of resource

elements in a subframe.

2) OFDM Symbol Tx Power (OSTP)

It accumulates all sub carrier

powers of the 4th OFDM symbol.

The 4th (out of 14 OFDM

symbols within a subframe (in

case of frame type 1, normal CP

length)) contains exclusively

PDSCH so this metric can

be interpreted as an average

data subcarrier power.

Note: The RSTP value is used for the

DL RS power test as defined by 3GPP

TS36.141 test case 6.5.4. OSTP is

used for Total Power Dynamic Range

test as defined by 3GPP TS36.141 test

case 6.3.

3GPP specifies to use E-TM 1.1 for

DL RS Power measurement. We

will generate a E-TM 1.1 signal for

analysis.






Follow the Signal Studio instructions to

connect to MXG N5182A




turned ON



Hardware



RF Output = On

Select a Downlink waveform per

the March 2009 release of the 3GPP

standard.



Waveform Setup

In the right pane of the main window, if

the default carrier is not “Basic

LTE FDD Downlink (2009-03)”

delete the carrier by pressing


and from drop down list, select

Basic LTE FDD Downlink (2009-03)





Waveform Setup

On the top right pane of the main


to access a dialog box from which you

can select System Bandwidth and Test

Model Type.

Select 10 MHz(50 RB) for System Bandwidth


Click OK



any errors, please refer the online

help of Signal Studio software

21

As shown on the screen image, the

RS Tx power result is displayed under

error summary trace and this is the

value used as the DL RS power.

OFDM Sym Tx Power (OSTP) is not

part of 3GPP test case 6.5.4 (DL RS

power). OSTP is used for Total Power

Dynamic Range, 3GPP test case 6.3,

but it is reported under the Error

Summary Trace.

We will now set up the X-Series to analyze this E-TM 1.1 signal.



Note: The location of the {LTE} softkey depends on the number of applications installed on the X-Series analyzer; therefore the softkey might show up on a different softkey under [Mode]



measurement


Analysis}


bandwidth


Uplink}


Adjust input power level range [AMPTD Y Scale] > { Range} > [0] {dBm}

Recall a preset limit mask E-TM 1.1 [Recall] > {Data (import) EVM Setup}

> {Open…} > select TM1.1-BW10MHz.

evms and click Open

Include all active channels and

signals

[Meas Setup] > {Chan Profi le Setup} >

{Composite Include} > {Include All}

Change the display to show Error

Summary


Summary}


Figure 14. DL RS Power

22


Unwanted emissions


Unwanted emissions consist of out-

of-channel emissions and out-of-band

emissions (also known as spurious

emissions). Out of channel emissions

are unwanted emissions immediately

outside the channel bandwidth. The

out-of-channel emissions requirement

for the BS transmitter is specified in

terms of Adjacent Channel Leakage

power Ratio (ACLR) and operating

band unwanted emissions (also

known as spectrum emission mask).

3GPP specifies to use E-TM 1.1 and

E-TM 1.2 for the unwanted emissions

test. For demonstration purpose,

we will use E-TM 1.1. The test

methodology remains the same when

using E-TM 1.2.

Configure E-TM 1.1 signal. This signal will be used for the next four

demonstrations: demonstration 1.5a thru 1.5d.











turned ON



Hardware



RF Output = On




window, select Downlink of Carrier1

under Waveform Setup

On the top right pane of the main

window, click the Wizard button to access a dialog box from which you

can select System Bandwidth and Test

Model Type.

Select 10MHz(50RB) for System Bandwidth


Click OK



any errors, please refer the online

help of Signal Studio software

23

Demonstration 1.5a:

Occupied bandwidth

(3GPP test case 6.6.1)

Occupied bandwidth measures the

bandwidth of the LTE signal that

contains 99% of the channel power.

3GPP specifies to use E-TM1.1

for the OBW measurement. This

demonstration will measure the

occupied bandwidth of a 10 MHz LTE

FDD signal as an example.

Demonstration 1.5b:

Adjacent channel leakage power

ratio (3GPP test case 6.6.2)

Adjacent channel leakage power ratio

(ACLR) is a measure of the power

in adjacent channels relative to the

transmitted power. ACLR for LTE is

defined for two cases. First case is

for the 1st and 2nd adjacent E-UTRA

(LTE) carriers of the same bandwidth.

Second case is for the 1st and 2nd

adjacent UTRA (W-CDMA) carriers.

Separate limits and measurement

filters are defined for adjacent LTE

and for adjacent W-CDMA carriers.

The W-CDMA adjacent channel is

measured with a 3.84 MHz RRC filter

with roll-off factor alpha = 0.22. The

LTE channel is measured with a square

measurement filter.

The LTE FDD and TDD measurement

applications provide a pre-defined

limit mask for the ACLR measurement

for both UL and DL. This limit mask

contains the configuration for carrier,

offset, limit settings and LTE profile

BW. This pre-defined limit mask allows

the user to make one-button ACLR

measurement with pass/fail indication

per 3GPP TS 36.141 v8.2.0 (2009-03)

standard. This demo uses the pre-

defined limit mask for 10 MHz LTE

Downlink carrier using E-TM 1.1

Set up the X-Series analyzer to make the OBW measurement.



Note: The location of the {LTE} softkey

depends on the number of applications

installed on the X-Series analyzer,

therefore, the softkey might show up

on a different softkey under [Mode]


Select OBW measurement [Meas] > {Occupied BW}


bandwidth and confi gurations

[Mode Setup] > {Radio} > {Direction:

Downlink/Uplink};



Figure 15. Occupied bandwidth of a 10 MHz LTE-FDD signal

For those who choose not to use

the E-TM recall function, the ACP

measurement provides flexibility

for manual configuration. The

measurement supports up to 12

carriers, which is key for multi-carrier

ACP measurements. It allows users to

choose up to six channel offsets, each

with adjustable integration bandwidth,

offset frequency and pass/fail limit.

The measurement can be adjusted

and displayed in both absolute and

relative power with either bar graph or

spectrum view. For cases where the

adjacent carrier is W-CDMA, the ACP

measurement provides RRC filter with

flexible filter alpha.

24

Set up the X-Series analyzer to make an ACP measurement.





Select ACP measurement [Meas] > {ACP}

Select Downlink and 10 MHz system bandwidth [Mode Setup] > {Direction: Downlink/Uplink}


Recall a preset limit mask E-TM 1.1 [Recall] > {Data (import) Mask} > {Mask}

{Open…} > open ACP_BS folder and select ACP_BS_10 MHz_

pairE-UTRA_CatA.maskNote: ACP measurement is defi ned for both Category A and B as well as for paired and unpaired spectrum. The ACP measurement supports all these requirements. This example is for paired spectrum Category A signal.

Optimize dynamic range [AMPTD Y Scale] > {Attenuation} > {Enable Elec Atten On/Off}

> {Mech Atten} > [6] {dB} Note: The ACP dynamic range can be optimized by adjusting the attenuation level. For this example, 6 dB of attenuation is the optimum level. Depending on the input power, the attenuation level will need to be adjusted to obtain maximum dynamic range.

Compare the measured result with noise correction

turned On. A better ACP dynamic range is achieved

with noise correction turned on.

[Meas Setup] > {More} > {Noise Correction On Off}


Figure 16. ACLR with limit test and noise near noise correction ON

25

Demonstration 1.5c:

Operating band unwanted emissions


The operating band unwanted

emissions are defined to measure

the out-of-channel emissions with up

to 10 MHz spacing from the lowest

and highest carrier frequencies.

This operating band unwanted

emissions measurement, also known

as spectrum emission mask (SEM)

measurement, can be made using

the X-Series LTE measurement

application.

Similar to the ACP measurement,

the LTE FDD and TDD measurement

applications provide a pre-defined

limit mask for the SEM measurement

for both UL and DL. This limit mask

contains the configuration for carrier,

offset, limit settings and LTE profile

BW. This pre-defined limit mask

allows the user to make one-button

SEM measurement with pass/fail

indication per the 3GPP TS 36.141

v8.2.0 (2009-03) standard. The SEM

measurement also provides flexibility

for a user to manually set up the

measurement.

The test mode E-TM 1.1 and E-TM

1.2 are defined for this measurement.

This demo uses one of the pre-

defined limit masks for a 10 MHz LTE

downlink carrier using E-TM 1.1

Set up the X-Series analyzer to make SEM measurement.



Note: The location of the {LTE} softkey depends on the number of applications installed on the X-Series analyzer, therefore the softkey might show up on a different softkey under [Mode]


Select SEM measurement [Meas] > {Spectrum Emission Mask}


bandwidth


Uplink}


Recall a preset limit mask E-TM 1.1 [Recall] > {Data (import) Mask} > {Mask}

> {Open…} > open SEM_BS folder and

select SEM_BS_10 MHz_above1GHz_

CatA.maskNote: SEM measurement is defi ned for various confi gurations such as Category A, Category B, above 1 GHz, below 1 GHz etc. The SEM measurement supports all these requirements. This example is for above 1 GHz Category A signal confi guration.

View customizable offsets and limits.

Measurement parameters as well as

limit values may be customized for

any of the six offset pairs A through

F or for any individual offset.

[Meas Setup] > {Offset/Limits} > {More

1 of 3} {Limits}


Figure 17. SEM with limit test

26

Demonstration 1.5d:

Transmitter spurious emissions


Spurious emissions are out-of-band

emissions. These emissions are

regulated to ensure compatibility

between different radio systems.

The primary requirement is for control

of spurious emissions from very

low (9 kHz) frequencies to very high

(12.75 GHz) frequencies.

The spurious emissions measurement

in the LTE measurement application

identifies and determines the power

level of spurious emissions in

3GPP defined frequency bands. The

measurement allows the user to

set pass/fail limits and a reported

spur threshold value. The results are

conveniently displayed in a result

table that can show up to 200 values.

This demo procedure shows how to

edit the range table and how to look

up the detected spurs.





Select Spurious Emissions

measurement

[Meas] > {Spurious Emissions}

Change the attenuation to 0 dB [AMPTD Y scale] > { Attenuation} > [0] {dB}

Edit the range table under [Meas

Setup] > {Range Table} with the

following table. The range table is

set per 3GPP TS36.141 v8.2.0 Section

6.6.4.5.2 Table 6.6.4.5.2-1 (Category B)

excluding the frequency range from

10 MHz below the lowest frequency

of the downlink operating band up to

10 MHz above the highest frequency

of the downlink operating band. (This

example is for DL carrier frequency of

2140 MHz.)

Set up the X-Series analyzer to make a spurious emissions measurement.

27

[Meas Setup] > {Range Table} and enter the following ranges plus the

associated parameters for each range.

Range Start Freq Stop Freq Res BW Filter Type Abs Start Limit

1 9 kHz 150 kHz 1 kHz Gaussian –36 dBm

2 150 kHz 30 MHz 10 kHz Gaussian –36 dBm

3 30 MHz 1 GHz 100 kHz Gaussian –36 dBm

4 1 GHz 2.1 GHz 1 MHz Gaussian –36 dBm

5 2.165 GHz 12.75 GHz 1 MHz Gaussian –36 dBm

Make sure all the other ranges are OFF.

Run a single spurious measurement and search a spurious detected as

the 10th spur: [Single] > [Meas Setup] > {Spur} > [10] > {Enter}. The

results are conveniently displayed in a result table that can show up to

200 spurs


Figure 18. Spurious emissions


transmitter intermodulation


The transmit intermodulation

measurement verifies the ability

of the BS transmitter to inhibit

the generation of intermodulation

products in devices such as power

amplifiers (PAs). The LTE standard

specifies a very detailed procedure in

sub-clause 6.7. The measurements

require performing the ACP, SEM

and spurious emissions for the third-

order and fifth-order intermodulation

interfering signals at specified

channel bandwidth and offset center

frequencies.

For each measurement of the ACP,

SEM and spurious emissions please

refer to the demonstration associated

in this demo guide.

28

This demonstration will cover

transmitter tests for uplink according

to 3GPP TS 36.521-1 V8.2.0 (2009-03).

The concepts and methods of the

LTE UE transmitter measurements

are similar as the other 3G mobile

stations. But the requirements for

the LTE UE are more complex.

The March 2009 release of the 3GPP

uplink conformance test document,

TS 36.521 v8.2.0, is still a work in

progress. For example, the maximum

power requirement is defined only

for class 3 (one of the four power

classes defined for the LTE UE) and

is specified as 23 dBm ±2 dB for all

bands.

To perform the UE transmitter

characteristics test defined in the

standard, a System Simulator (SS)

or One-box-tester (OBT) is required

to provide relative uplink and

downlink Reference Measurement

Channels (RMCs) for setting the test

condition. In general, the spectrum

analyzer can make the channel power

measurement and signal analysis

for uplink with similar features and

functionality as in downlink. In the

details, the scope of the UE RF

transmitter tests is modified as it

pertains to LTE and SC-FDMA uplink

modulation format.

Table 8 shows the list of UE transmitter test items defined in 3GPP TS 36.521-1

along with reference to the measurements in the X-Series signal analyzers.

36.521

Subclause Test Case

Measurements on

X-Series analyzer

6.2.2 UE Maximum Output Power (MOP) Channel Power

6.2.3 Maximum Power Reduction (MPR) Channel Power

6.2.4 Additional Maximum Power Reduction

(A-MPR)

Channel Power

6.2.5 Confi gured UE transmitted Output Power Channel Power

6.3.2 Minimum Output Power Channel Power

6.3.3 Transmit OFF Power Channel Power

6.3.4 ON/OFF time mask N/A

6.3.5 Power Control Channel Power

6.5.1 Frequency Error Modulation

Analysis

6.5.2 Transmit Modulation – EVM, In-Band,

Flatness

Modulation

Analysis

6.6.1 Occupied Bandwidth Occupied BW

6.6.2.1 Spectrum Emission Mask Spectrum Emission

Mask

6.6.2.2 Additional Spectrum Emission Mask Spectrum Emission

Mask

6.6.2.3 Adjacent Channel Leakage Power Ratio (ACLR) ACP

6.6.2.4 Additional ACLR Requirements ACP

6.6.3.1 Transmitter Spurious Emission Spurious Emissions

6.6.3.2 Spurious Emission Band UE Co-existence Spurious Emissions

6.6.3.3 Additional Spurious Emissions Spurious Emissions

6.7 Transmit intermodulation ACP, Spurious

Emissions

Table 8. List of the UE transmitter test items defi ned in TS 36.521-V8.1.0 (2009-03)

Demonstration 2: LTE Transmitter Tests for Uplink

29


Transmit power


The transmit power measurement

for UE transmitter consists of four

requirements: UE maximum output

power (MOP), maximum power

reduction (MPR), additional maximum

power reduction (A-MPR) and

configured UE transmitted output

power.

MOP and MPR measure the

maximum output power. The channel

power measurement on the

X-Series signal analyzer is used for

this measurement. The setting for

the channel power measurement is

described in the downlink portion

of this demo guide. Please refer to

Demonstration 1.1 of this demo guide

for instructions on how to set up the

channel power measurement.

In the standard, the A-MPR is

defined to measure power reduction

capability to meet additional ACLR

and spectrum emission requirement.

Please refer to the Demonstration

1.5a and 1.5b respectively in this

demo guide.

PCMAX

is defined in 3GPP TS 36.101 as

the configured UE transmitted power.

The standard has given the maximum

power specifications and defines a

relation between them:

PCMAX

= MIN {PEMAX

, PUMAX

}. PEMAX

is

defined in 36.331 and is the maximum

allowed power defined by higher

layers. PUMAX

is defined in 36.101 and

is the maximum power for the UE

power class adjusted according to the

rules for MPR and A-MPR.




The requirements for open loop

power control accuracy (± 9 dB),

minimum output power (–40 dBm)

and transmit off power (–50 dBm)

is similar to UMTS. In the X-Series

signal analyzers, channel power

measurement can be used for these

measurements. Refer to Channel

Power Demonstration, Demonstration

1.1 of this document. For the On/

Off time mask, 3GPP TS 36.521-1

V8.1.0 (2009-03) does not provide

details therefore the X-Series analysis

software does not provide the time

mask at this time.


Transmit signal quality


The transmit signal quality

measurements for uplink are divided

into five categories: frequency

error, EVM, IQ-component, In-band

emission and spectrum flatness.

We will look at each one of these in

the following five demonstrations.

(Demonstrations 2.4a thru 2.4e)

As previously mentioned, the

3GPP uplink conformance test

document, TS 36.521 v8.2.0, is still

a work in progress. There are no

reference measurement channels

(RMCs) defined for all of the uplink

transmitter tests. Therefore, we

will generate a basic 5 MHz uplink

signal and use this signal for the five

transmit signal quality measurements.

30

Generate a 5 MHz uplink signal with a single user occupying five out of the available 25 RBs.


Start the Signal Studio software Start > All Programs > Agilent Signal Studio > 3GPP LTE FDD >

3GPP LTE FDD



Follow the Signal Studio instructions to connect to MXG N5182A

Set the basic parameters of the signal:

1.92 GHz center frequency, –10 dBm

amplitude and RF Output turned ON

In the tree view, left pane of the main window, select Instrument under

Hardware



Change the confi guration from default

downlink, to uplink.

In the tree view, left pane of the main window, select Carrier 1 under

Waveform Setup.

On the top right pane of the main window, press the Predefi ned

Confi guration button and from the list of predefi ned confi guration select

LTE UL 1 Carrier (2009-03)

Click OK

Change the uplink carrier confi guration to

Full fi lled 16QAM 5 MHz LTE profi le

In the tree view, left pane of the main window, select Carrier 1 under

Waveform Setup.

Under Channel Confi guration, right pane of the main window,

click Full fi lled QPSK 5MHz (25 RB)

From drop down list select Full fi lled 16QAM 5MHz (25 RB)

Defi ne PUSCH channels In the tree view, left pane of the main window, select Transport Channel

under Waveform Setup.

On the top right pane of the main window, press the Edit Channel

Confi guration button and modify the UL-SCH channel settings

to the following:

Change the Modulation Type to 16QAM

Change Resource Block Size to 5

Change Resource Block Offset to 5 (Hint: highlight all the 0’s in the

Resource Block offset row and key in 5 and click OK.)

The channel settings should match the following image.

Download the signal to the MXG Press Generate and Download button on the top tool bar. If you

encounter any errors, please refer the online help of Signal Studio software

We will now analyze the signal using the N9080A application. Even though these demonstrations are for LTE FDD, the

measurement procedures are similar for the N9082A LTE TDD application.

31

We will setup the N9080A to demodulate the 5 MHz LTE Signal. Based on this setup, we will look at the five

transmit quality measurements one at a time.


Preset the X-Series analyzer [Mode Preset] green key on top right hand corner of the X-Series hardware

Select the LTE mode [Mode] > {More 1 of 3} > {LTE}

Note: the location of the LTE softkey depends on the number of applications loaded on the X-Series analyzer. Therefore, the location on your analyzer might be different.


Note: You should see a spectrum. If not, make sure the signal is

downloaded to the MXG and RF is ON.

Go to Modulation Analysis measurement [Meas] > {More 1 of 2} > {Modulation Analysis}

Set up the analysis for Uplink and 5 MHz LTE

profi le

[Mode Setup]> {Direction: Downlink/Uplink} >

{Preset To Standard } > {5 MHz (25 RB)}

Change the Measurement Interval to show the

entire frame (20 slots)

[Meas Setup] > {Meas Time Setup} > {Meas Interval Slot} > [20]

{Enter}

Adjust input Range [AMPTD Y Scale] >{ Range} > [0] {dBm}

Auto Scale Trace 2 (spectrum trace) [AMPTD Y Scale] > highlight trace 2 > {Auto Scale [Trace 2]}

Note: you can follow same process to auto range the rest of the traces.

Double check RB Auto Detect and Auto Sync

parameters are turned ON. It should be ON by

default

[Meas Setup] > {Chan Profi le Setup} > {Edit User Mapping}

Make sure the RB Auto-Detect and Auto Sync are selected as shown by the red marks in the screen image

Return to the measurement view [Return]


Based on this setting, we will now go through the five transmit

signal quality measurements in the following order: Frequency Error,

EVM, IQ Component, In-band Emission and Spectrum Flatness.

Figure 19. Basic uplink demodulation of PUSCH

32

Demonstration 2.4a:

Frequency error


Frequency error is a measurement of

the center frequency offset from the

desired carrier frequency. If the error

is larger than a few sub-carriers, the

receiver demod may not operate and

could cause network interference.

Errors in RF frequency, LO frequency,

or digitizer clock rate could all appear

as carrier frequency error.

The frequency error is expressed

as an offset in Hz from the center

frequency setting. The frequency

error is seen on both traces.


the frequency error metrics under

the Error Summary trace. This metric

is the average frequency error of

the result data in the measurement

interval, which is 20 slots for this

demo.

Trace 2: Ch1 OFDM Frequency Error

– Shows frequency error versus slot,

where the average frequency error for

each slot is shown.

Turn off all markers: [Marker] >

{More 1 of 2} > {All Markers Off}


Change the display layout to show

two traces

[View/Display] > {Layout} > {Stack 2}

Change Trace 1 to show {Error

Summary}


{Trace 1} > {Data} > {Tables} > {Error

Summary}

Change Trace 2 to show Frequency

Error trace


{Trace 2} > {Data} > {Demod Error} >

{More 1 of 2} > {Freq Error Per Slot}

Auto range Trace B [AMPTD Y Scale] > {Auto Scale [Trace 2]}

Add Marker on Trace B [Marker] > { Properties} > {Marker Trace}

> {Trace 2} > [Return]

Place Markers on Slot 1 and Slot 5 {Select Marker} > {Marker 1 [Normal,

Trace 2]} > {Normal} > [1] {Enter}. Marker

1 is now placed on Slot 1.

{Select Marker} >{Marker 2} > {Normal}

> [5] {Enter}. Marker 2 is now placed on

Slot 5.

Note: Same process can be used to place

marker on the other slots.

Turn on Marker Table [Marker] > {More 1 of 2} > {Marker Table

On/Off}


Figure 20. Frequency error measurement

33

Demonstration 2.4b:

Error vector magnitude (EVM)

(3GPP test case 6.5.2.1)

EVM is one of the most critical

transmitter tests. It is a measure

of the amount of distortion in the

transmission, ultimately affecting the

ability of a receiver to decode and

process the signal with minimum

errors. In the uplink configuration,

it is normal for a UE to occupy only

a portion of the channel bandwidth.

EVM, therefore, is a measure of the

quality of the allocated portion of

the channel bandwidth. We will now

measure the EVM performance for

the allocated RBs.



two traces


Change Trace 1 to show Error

Summary and Trace 2 to show

Frame Summary


Summary}

Figure 21. EVM measurement

Trace 1: Error Summary Trace –

shows EVM which is an overall RMS

EVM for all selected channels plus

Peak EVM, Data only EVM and RS

EVM.

Trace 2: Frame Summary Trace –

shows the EVM as well as power,

modulation format, and number of

resource blocks occupied for the

individual channels and signals that

are present in the measurement

interval, which is one frame for this

demonstration. In this case, the EVMs

for PUSCH_16QAM and PUSCH_

DMRS are shown.


34

Demonstration 2.4c:

IQ-component


IQ offset indicates the magnitude of

carrier feedthrough for the measured

signal. For an uplink signal, even

when the signal is an ideal signal,

any IQ offset will affect the subcarrier

EVM since the DC subcarrier is not

orthogonal to the other subcarriers.

IQ offset can be caused when the

center (DC) carrier leaks into the

signal. IQ offset can also occur when

the baseband signal has a DC offset,

which then shows up as (DC) carrier

power when the baseband signal is

upconverted. We will now analyze the

IQ offset.



single trace

[View/Display] > {Layout} > {Single}

Note: in order to view the I/Q offset value in the Error Summery trace, we must change the display layout to single. Otherwise, the result will be covered by a trace below it.

Change the trace to show Error

Summary

[Trace/Detector] > {Select Trace} > {Trace 1}

> {Data} > {Tables} > {Error Summary}


Figure 22. IQ offset measurement

The signal under test has an IQ offset of –51 dB. This value is calculated by

RMS averaging the measured IQ offset for each symbol in the measurement

interval, which is 20 slots (1 frame) in this example. The value is expressed

relative to the 0 dB point, which is determined by the channel selected for sync

type. For this demo, PUSCH-DMRS is used for sync.

35

We will now analyze the IQ offset over each slot.



two trace


Change Trace 2 to show IQ offset

over slot



{More 1 of 2} > {IQ Offset Per Slot}

Auto scale Trace B [AMPTD Y Scale] > {Auto Scale [Trace 2]}

Add marker on Trace B [Marker] > { Properties} > {Marker Trace}

> {Trace 2} > [Return]

Place marker on slot 1 and slot 5 {Select Marker} > {Marker 1 [Normal,

Trace 2]} > [1] {Enter}

Marker 1 is now placed on Slot 1.

{Select Marker} > {Marker 2} > {Normal}

> [5] {Enter}

Marker 2 is now placed on Slot 5. Follow same process to place marker on

other slots.

Turn on marker table [Marker] > {More 1 of 2} > {Marker Table

On/Off}


Figure 23. IQ offset per slot measurement

Trace 2: Ch1 OFDM IQ Offset - shows

the average IQ offset for each slot in

the measurement interval, which is

20 slots in this example.

Turn off markers: [Marker] > {More 1

of 2} > {All Markers Off}

36

Demonstration 2.4d:

In-band emissions for non-allocated

RB (3GPP test case 6.5.2.3)

As we saw on a previous demo, EVM

is a measure of the quality of the

allocated portion of the transmitted

signal. In the uplink configuration, it

is normal for a UE to occupy only a

portion of the channel bandwidth. In

such a case, the unallocated portion

of the channel is available for use by

other UE. The in-band emissions for

non-allocated RB test is a measure

of the amount of power the UE may

transmit into the unallocated RB. This

measurement is similar in concept to

the SEM and ACLR requirements –

but applies to energy still within the

channel bandwidths.

There are three different types of

in-band emissions that are being

defined. They are: general, IQ image

and DC. These tests are still work

in progress in the 3GPP TS 36.521-1

v8.1.0 (2009-03) standard documents.

Therefore, this demonstration will

highlight the various traces that can

be used to measure these various

in-band emission tests.



single trace



20 slot (1 frame)



Change Trace 1 to show Power

versus RB trace

[Trace/Detector} > {Select Trace} >


{More 1 of 2} > {RB Power Spectrum}

Change the format to Log Mag (dB) [Trace/Detector} > {Format} > {Log Mag

(dB)}

Turn on a marker and measure the

DC component of Slot #10

[Marker] > {Select Marker} > {Marker 1}

> {More 1 of 2} > {Position} > {Marker

X} > [12] > {Enter} > {Marker Z} > [10] >

{Enter}

Note: You can use the multiple markers to measure DC component of the other slots by changing the position. Leave marker X at 12RB (center of the band)

and change Marker Z to a different Slot.

Measure the I/Q image at RB #16

( which is an IQ image of RB #6) at

Slot #0

[Marker] > {Select Marker} > {Marker 2}

> {Normal} > {More 1 of 2} > {Position} >

{Marker X} > [16] > {Enter} > {Marker Z}

> [0] > {Enter}

Note: You can use the multiple markers to measure IQ image of the other slots by changing the position. Change Marker X to show the image RB and Marker Z to Slot.

Turn on Marker table [Marker] > {More 1 of 2} > {Marker Table

On/Off}


37

Marker 1 shows the DC in-band

emissions. The RB over which the

DC component needs to be evaluated

depends on the number of RBs

supported by the channel bandwidth.

For channel bandwidths with an odd

number of RBs (for example 5 MHz

LTE profile has 25 RBs, which is an

odd number), the carrier leakage is

contained within the central RB and

only this RB needs to be measured

for the DC component as shown by

Marker 1. For bandwidths with even

numbers of RBs (for a 10 MHz LTE

profile, there are 50 RBs), the carrier

leakage falls in between the RB on

either side of the center frequency.

The carrier leakage impacts both RBs

so both need to be measured for the

DC component.

The DC component for all other slots

can be measured by changing the

marker position. Marker X is RB

position and Marker Z determines

slot number. For this example,

5 MHz (25 RB), RB 12 is where the

DC component is contained, therefore

the value of Marker X remains on

RB 12 and only Marker Z is changed

to select a different slot number.

The Position Markers can be found

under [Marker] > {More 1 of 2} >

{Position}.

Figure 24. DC and IQ image measurements

Marker 2 shows the IQ image in-band

emissions at Slot 0. It shows RB

16, which is an image of RB 6 (one

of the allocated RBs). It is reflected

around the center of the channel.

The IQ image for all other slots can

be measured by changing the marker

position. Marker X is RB position and

Marker Z determines slot number.

The Position Markers can be found

under [Marker] > {More 1 of 2} >

{Position}.

Turn off markers: [Marker] > {More 1

of 2} > {All Markers Off}

38

Demonstration 2.4e:

Spectrum fl atness


The fact that EVM is measured

through an equalizer makes it

desirable to define unequalized

spectrum flatness limit. Without

such a limit, large variations in power

across the channel could be removed

by the EVM measurement and

thus go unnoticed. In practice, the

equalizer in the eNB will be limited

in performance due to noise in the

channel, so an additional flatness

requirement helps constrain the

signal quality when the equalizer is

unable to correct for large errors. The

spectrum flatness measurement is a

residual result from the calculation of

the EVM equalizer coefficients. The

measurement interval is defined over

one slot in the time domain requiring

20 measurement results in a frame.

On the LTE measurement application,

the “Equalizer Channel Frequency

Response per Slot” trace is used to

measure spectral flatness.



single trace


Change the measurement interval

to 20 slot



Change Trace 1 to show frequency

response per slot trace

[Trace/Detector} > {Select Trace} >

{Trace 1} > {Data} > {Response} >

{Eq Ch Freq Resp Per Slot}

Auto Scale the trace [AMPTD Y Scale] > {Auto Scale [Trace 1]}


Figure 25. Spectrum fl atness measurement

Trace 1: Ch1 OFDM Per Slot Eq Chan

Freq Resp – shows the frequency

response of the channel for each slot

in the measurement interval, which

is 20 slots in this example. Each

slot’s channel frequency response

is plotted as a separate line with a

different color. The colors are used to

visually separate each slot’s channel

frequency response and have no

correspondence to other traces or

channels.

You can measure the spectrum

flatness of each slot by using a

marker or by analyzing one slot at

a time by using the measurement

interval and measurement offset keys

under [Meas Setup] > {Meas Time

Setup} > {Meas Interval Slot} and

{Meas Offset Slot}.

39


Analysis of PUCCH, S-RS

and PRACH

Note: this demonstration is not tied

to the conformance testing. This

section shows how to demodulate

and analyze the other UL channels

and signals, such as PUCCH, PUCCH-

DMRS, S-RS and PRACH. We will

be using Signal Studio advanced

waveform for this demonstration.

Demonstration 2.5a:

Analysis of PUSCH, PUSCH-DMRS,PUCCH, PUCCH-DMRS, and S-RS










–10 dBm amplitude and RF

Output turned ON


window,, select Instrument under

Hardware



RF Output = On

Select an uplink advanced

waveform per the March 2009

release of the 3GPP standard.


window, select Carrier 1 under Waveform

Setup

In the right pane of the main window

delete the default carrier by pressing


and from drop down list, select

Advanced LTE FDD Uplink (2009-03)

Change the channel confi guration

to Full fi lled 16QAM 10 MHz

profi le


window, select Carrier 1 under Waveform

Setup.


under Channel Confi guration click Full

fi lled QPSK 5 MHz (25 RB). From drop

down list select Full fi lled 16QAM 10 MHz

(50 RB)

Turn on group hopping In the tree view, left pane of the main

window, select UE Setup under Carrier 1.


under Cell Parameter, click on Hopping

and from drop down menu, select Group

Hopping

Turn on Sounding Reference

Signal (SRS)


window, select UE Setup under Carrier 1.

In the right pane of the main window, scroll

down to the bottom and under Sounding

Reference, click on State and from drop

down list, select On

Continued...

40


Set up the channel to confi gure

the RB block size, Offset, etc.


window, select Channel Setup under UE

Setup. In the top right pane of the main

window, highlight #2, UL-SCH. Below it,

under 3GPP, make the following changes:

Start Offset = 1

Number of Retransmissions = 2

Your image should look similar to:

The fi nal confi guration looks like:


on the top tool bar; if you encounter any

errors, please refer the online help of Signal

Studio software

Demonstration 2.5a:

Analysis of PUSCH, PUSCH-DMRS,

PUCCH, PUCCH-DMRS, and S-RS

(Continued)

41

Let us analyze these signals.


Preset the X-Series analyzer [Mode Preset] green key on top right

hand corner of the X-Series hardware

Select the LTE mode [Mode] > {More 1 of 3} > {LTE} Note: the location of the LTE softkey depends on the number of applications loaded on the X-Series analyzer, so the location on your analyzer might be different.


Note: You should see a spectrum. If not, make sure the signal is downloaded to the MXG and RF is ON.

Go to Modulation Analysis

measurement


Analysis}

Set up the analysis for uplink and 10

MHz LTE profi le

[Mode Setup]> {Direction: Downlink/

Uplink} >



show the entire frame (20 slots)




Auto Scale Trace 2 (Spectrum trace) [Trace/Detector] > {Select Trace} >

{Trace 2} [AMPTD Y Scale] > {Auto Scale

[Trace 2]}

Note: you can follow the same process to

auto scale all traces.

Double check RB Auto Detect and

Auto Sync parameters are turned

ON. It should be ON by default


{Edit User Mapping}

Make sure the RB Auto-Detect and Auto

Sync are selected.

Return to the measurement view [Return]

42

You will notice, even with auto detect

turned on, the measurement did not

synchronize to the signal. You will

see SYNC NOT FOUND message.

This is because group hopping is

enabled in the waveform generated

by Signal Studio. The auto detect and

auto sync functions detect all of the

physical layer parameters such as

RB allocation and modulation format.

However it requires manual entry of

parameters such as group hopping,

sequence hopping, and others that a

real UE receiver obtains from higher

layers or from DL control channels.

Now we will turn on group hopping on the analysis software.


Turn on group hopping [Meas Setup] > {Chan Profi le Setup} >

{Edit User Mapping} > {Group Hopping

[User01] On/Off} click OK

You display should look similar to Figure 26.

Figure 26. Basic PUSCH analysis with group hopping turned ON

43

We will now include the PUCCH and S-RS in the analysis.


Enable PUCCH and S-RS [Meas Setup] > {Chan Profi le Setup} > {Edit User

Mapping} > using a mouse, select PUCCH and

SRS boxes. Your display should look similar to:

Click OK

Note: We are using default settings for PUCCH

and SRS. The settings can be changed using the

tabs:

SRS settings:

Continued...

44

X-Series instructions Keystrokes (continued)

Change Trace 2 to show

the allocated summary

[Trace/Detector] > {Select Trace} > {Trace 2} >

{Data} > {Demod} > {Detected Allocations}


Change Trace 3 to Frame

Summary

[Trace/Detector] > {Select Trace} > {Trace 3} >

{Data} > {Tables} > {Frame Summary}


Figure 27. Analysis of PUSCH, PUCCH and SRS

Trace 1: Ch1 OFDM Meas – Shows

the composite constellation diagram,

color-coded by the channel type as

shown in Trace 3. The PUSCH_DMRS,

PUCCH_DMRS and SRS signals are

transmitted as a Zadoff-Chu sequence,

which is one of the many Constant

Amplitude Zero Auto Correlation

(CAZAC) sequences and thus appear

as irregularly spaced points on a circle.

Trace 2: Ch1 Detected Allocations

Time – Shows the allocations of

the channels and signals in a two-

dimensional grid with frequency

(subcarrier) on the vertical axis and time

(symbol) on the horizontal axis. Each

point on the grid represents a single

resource element (1 subcarrier x 1

symbol). Only channels and signals that

are selected under the channel profile

setup key are displayed on this trace.

The points are color coded according

to channel type. The Frame Summary

trace, Trace 3, displays all channels and

their corresponding colors.

Trace 3: Ch1 Frame Summary –

Shows the summary of all active

channels and signals including the

EVM for each channel, their relative

power, modulation format used, and

number of resource block occupied

by each active channel. The color of

the channel mirrors the color coding

used in other displays, such as the

constellation diagram, detected

allocations time, and the various EVM

traces.

Note: In order to view the “number

of occupied RB” column, select Trace

3 and change the display layout to

single: [View/Display] > {Layout} >

{Single}.


information about the quality of the

signal being analyzed. It provides a

number of different EVM metrics,

including measurements for the

composite signal, the data channels

only and RS only.

45

Now change the traces to show other traces and couple the markers.


Change Trace 3 to show EVM

versus Spectrum



{Error Vector Spectrum}

Change Trace 4 to show EVM

versus Symbol



{Error Vector Time}

Put marker on all traces and couple

the markers

[Marker] > {Properties} > {Marker Trace}

> {Trace 1}

[Return] > {Select Marker} > {Marker 2} >

{Normal} > {Properties} > {Marker Trace}

> {Trace 2}

Follow the same process to put markers

on Traces 3 and 4

Couple all markers [Marker] > {More 1 of 2} > {Couple

Markers On/Off}

Turn on Marker table [Marker] > {More 1 of 2} > {Marker Table

On/Off}

Select Marker 4, which is on the

Error Vector Time trace, Trace 4,

and do peak search

[Marker] > {Select Marker} > {Marker 4

[Normal, Trace 4]}> [Peak Search]

You display should look similar to Figure 28.

Figure 28. Marker coupling

The markers report data from the same point in time but in different error

domains. For example, a symbol, such as one associated with an error peak, can

be chosen from a desired domain (time, frequency, I/Q constellation location,

etc.) and examined in multiple domains at once as a way to determine its cause

or significance. Errors may be associated with a specific channel or signal, with

specific time (or symbol), or with a specific frequency (or sub-carrier).

46

Demonstration 2.5b:

Analysis of PRACH

PRACH is the Physical Random

Access Channel and is used by UEs

to request an uplink allocation from

the base station. In the frequency

domain, PRACH spans six resource

blocks of spectrum. PRACH formats

0, 1, 2, and 3 have a tight subcarrier

spacing of 1.25 kHz. This means that

the OFDM symbol duration is 800

ms. PRACH format 4 has a subcarrier

spacing of 7.5 kHz and a symbol

duration of approximately133 ms.

The frequency location of PRACH is

determined by upper layers.

Because PRACH is different from the

other UL channels in its subcarrier

spacing, it cannot be analyzed

simultaneously with PUSCH,

PUCCH, and SRS. Therefore, this

demonstration will only focus on

PRACH analysis.

Generate a PRACH signal.











turned ON

In the tree view, select Instrument under

Hardware



Change the confi guration from

default downlink to uplink.



Waveform Setup.

Press the Predefi ned Confi guration

button and from the list of predefi ned

confi guration select LTE PRACH 1

Carrier (2009-03)

Click OK

Download the signal to the MXG Press Generate and Download

button on the top tool bar.

If you encounter any errors,

please refer the online help of Signal

Studio software

47

Now analyze the PRACH signal.


Preset the X-Series analyzer [Mode Preset] green key on top right hand

corner of the X-Series hardware

Select the LTE mode [Mode] > {More 1 of 3} > {LTE}

Note: the location of the LTE softkey depends on the number of applications loaded on the X-Series analyzer, so the location on your analyzer might be different.


Note: You should see a spectrum. If not, make sure the signal is downloaded to the MXG and RF is ON.

Go to Modulation Analysis

measurement

[Meas] > {More 1 of 2} > {Modulation Analysis}

Set up the analysis for Uplink and

5 MHz LTE profi le

[Mode Setup]> {Direction: Downlink/Uplink} >


Change the Measurement

Interval to show the entire frame

(20 slots)

[Meas Setup] > {Meas Time Setup} > {Meas

Interval Slot} > [20] {Enter}

Adjust input Range [AMPTD Y Scale] >{ Range} > [0] {dBm}

Auto Scale Trace 2 (spectrum

trace)

[Trace/Detector] > {Select Trace} > {Trace 2}

[AMPTD Y Scale] > {Auto Scale [Trace 2]}

Note: you can follow the same process to auto

scale all traces.

Enable PRACH analysis [Meas Setup] > {Chan Profi le Setup} > {Edit

User Mapping} > using a mouse, select PRACH

“Present in Signal” and “Include in Analysis”

check boxes.

Now click the PRACH tab. Your display should

look similar to:

Click OK using a mouse.


48

Note: PRACH does not have a

reference signal separate from data.

For preamble formats 0 and 1, there

is only one OFDM symbol transmitted

per PRACH preamble, so the same

symbol serves as both reference

and data and therefore, turning the

equalizer on results in near-zero

EVM, if only one PRACH preamble is

found. If multiple PRACH preambles

are found, the equalizer coefficients

are averaged over the multiple bursts

and therefore the EVM reported

is reasonably large. In the case of

preamble formats 2 and 3, two OFDM

symbols are transmitted per PRACH

preamble, enabling averaging of

equalizer coefficients over the two

OFDM symbols. This causes the EVM

reported to be reasonably large even

if there is only one PRACH preamble

found.

Figure 29. Basic PRACH analysis

49

Trace 1: Ch1 OFDM Meas – Shows

constellation diagram of a PRACH

preamble that is transmitted as a

Zadoff-Chu sequence, which is one

of the many Constant Amplitude Zero

Auto Correlation (CAZAC) sequences,

and thus appear as points on a circle.

Trace 2: Ch1 Detected Allocations

Time – Shows the allocations of

the PRACH preamble in a two-

dimensional grid, with subcarrier on

the vertical axis and subframe on the

horizontal axis.

Trace 3: Ch1 OFDM Err Vect Spectrum

– Shows the PRACH EVM for each

sub-carrier. This trace is shown as a

function of PRACH subcarrier spacing

of 1.25 kHz.

Trace 4: Ch1 Frame Summary – Shows

the EVM, relative power, modulation

format, and number of resource block

occupied by PRACH preamble.

Change some of the traces:


Change Trace 2 to show the

allocated summary


{Trace 2} > {Data} > {Demod} > {Detected

Allocations}


Change Trace 4 to Frame Summary [Trace/Detector] > {Select Trace} > {Trace 4}

> {Data} > {Tables} > {Frame Summary}


Figure 30. PRACH analysis


Output RF spectrum emission


Output RF spectrum emissions test

are divided into occupied bandwidth

(OBW), spectrum emissions mask

(SEM), adjacent channel leakage

power ratio (ACLR) and spurious

emissions. The measurement

procedures for these tests are the

same as the unwanted emissions test

for downlink. For the measurement

procedures, refer to Demonstration

1.5 of this demonstration guide

50

For the downlink EVM measurement

in this demo guide, we used E-TM

3.3 and recalled this E-TM using

the recall function. The N9080A

and N9082A can also be manually

configured without recalling the

test model. Auto detection is also

available and it detects both RB

activity and modulation type for each

measured PDSCH RB, and allows the

automatic detection of either simple

or complex data allocation regions

and grouping of reported EVM metrics

by each detected modulation type in

the Frame Summary trace.

Note: The power levels for all

channels, as well as PDCCH

and PHICH allocations, are not

automatically detected, so the

user must setup these parameters

manually for the analyzer to report

a valid EVM measurement. These

settings are under [Meas Setup] >

{Channel Profile Setup} > {More(1 of

3)} > {More (2 of 3)} > {Edit Control

Channels}.

Power boost: The power for all

channels must match the transmitted

power. You must manually enter the

power for these different channels

and signals. The {Frame Summary}

trace returns the measured power

for the various active channels and

signals, so if you are not sure what

the transmitted powers are for these

various channels and signals, you

can refer to the {Frame Summary}

trace and manually enter those power

readings under designated {Power

Boost} entries.

PDCCH allocations: This determines

how many OFDM symbols are

allocated to PDCCH on a subframe-

by-subframe basis. PDCCH can be

allocated to the first three symbols

(four symbols when the number of RB

is equal or less than 10).

PHICH allocation and duration: This

determines the PHICH allocation

(Ng) = 1/6, ½, 1, or 2, as well as

with PHICH Duration. When PHICH

duration is normal, the 1st symbol

(symbol index 0) of every subframe

occupies PHICH; when PHICH

duration is extended, the first three

symbols (symbol indexes 0,1, and 2)

of every subframe occupies PHICH.

When auto-detection is turned off,

the software supports manual slot-

by-slot user definition of multiple

two-dimensional allocation regions

(RBs versus slots), which can be

associated with each PDSCH user.

Similar to the 89601A VSA LTE

application, one of the greatest

strengths of the N9080A LTE

application is its error analysis. We

will now look at the wide range of

built-in error traces available.

Appendix: More Information On Downlink EVM Measurement

Figure 31. Downlink control channel properties

51

Under the [View/Display] key, the N9080A provides various one-button presets.

In this demonstration, we will select one of the presets and modify it to show

the various supported EVM traces.


Select the preset for resource block

(RB) and slot measurement

[View/Display] > {Preset View: RB Slot

Meas}

Make sure the measurement

interval is 20 slots (1 Frame)



Include all channels and signals [Meas Setup] > {Chan Profi le Setup} >


Your display should be similar to Figure 32.

Figure 32. LTE RB error and power traces

Trace 1: Ch1 OFDM RB Power

Spectrum – Shows the power in each

RB with respect to frequency. Above

each resource block index along the

X-axis is the RMS power for that

resource block in every slot. This

trace is unique to Agilent.

Trace 2: Ch1 OFDM RB Power Time

– Shows the power in each RB with

respect to time. Above each slot on

the X-axis is the power value for each

resource block during that slot. This

trace is also unique to Agilent.

Trace 3: Ch1 OFDM RB Error Mag

Spectrum – Shows the EVM of each

RB with respect to frequency and

displays EVM for every slot during

that RB. The X-axis is RB, Y-axis is

EVM, and Z-axis is slot. This example

uses a 10 MHz LTE profile which has

50 RBs as shown on the X-axis. This

is a useful display to see the range of

EVM performance per user allocation

– another unique Agilent feature.

Trace 4: Ch1 OFDM RB Error Mag

Time – Shows the EVM of each RB

with respect to time. The X-axis is

slot, Y-axis is EVM, and Z-axis is RB.

This trace shows EVM across the

measurement interval, which is

20 slots as shown on the X-axis.

52

Now change Traces 1 and 2 to show EVM versus spectrum and time, respectively.


Change Trace 1 to show EVM per

sub-carrier



{Error Vector Spectrum}

Change Trace 2 to show EVM per

symbol



{Error Vector Time}


Figure 33. LTE error traces

Trace 1: Ch1 OFDM Error Vector

Spectrum – Shows the EVM for each

sub-carrier and displays the difference

between the measured symbols

and the reference symbols for each

subcarrier. X-axis is subcarrier, Y-axis

is EVM, and Z-axis is symbol. For

a 10 MHz LTE signal, there are 600

subcarriers (excluding DC) as shown

on the X-axis.

Trace 2: Ch1 OFDM Error Vector Time

– Shows the EVM for each symbol

and displays the difference between

the measured sub-carrier and the

reference subcarrier for each symbol.

The X-axis is symbol, Y-axis is EVM,

and Z-axis is subcarrier. For signals

using a normal cyclic prefix, there are

seven symbols per slot. This means

that for a measurement interval of 20

slots there are 140 symbols, as shown

on the X-axis.

For troubleshooting, the software

allows you to include or exclude

channels and signals. By default,

all the active channels and signals

within the measurement interval

are displayed and are included in

EVM and power calculations. You

can choose to disable any of these

channels or signals from being used

in calculations or being displayed

(except for the Frame Summary trace.

Frame Summary trace always displays

all the active channels present within

the measurement interval).

53

We will exclude all channels except P-SS, S-SS, and RS from the display and

error calculations.


Change the display layout

to show two traces


Note: You should only see Traces 1 and 2 (EVM

versus Spectrum and EVM versus Time)

Deselect ALL channels and

signals


{Composite Include} > {Exclude All}

Now you see a blank screen

Now turn on P-SS, S-SS

and RS

[Meas Setup] > {Chan Profi le Setup} > {P-SS:

Include/Exclude} > {S-SS: Include/Exclude}

{More 1 of 3} > {RS: Include/Exclude}


Figure 34. EVM analysis of P-SS, S-SS and RS only

54

On Trace 2, you can clearly see the

RS (shown in light blue) occupying

every 6th subcarrier at symbols

0 and 4 of each slot as expected.

P-SS (shown in pink) is transmitted

on 62 out of the 72 reserved center

subcarriers at OFDM symbol 6 of

slots 0 and 10. S-SS (shown in blue)

is transmitted on 62 out of the 72

reserved center subcarriers at OFDM

symbol 5 of slots 0 and 10. The

color coding makes it very easy to

distinguish the different channels

and signals – a feature unique to

Agilent.

We just demonstrated basic

demodulation and analysis of specific

channels and signals and will now

move to “advanced” demodulation.

Advanced demodulation techniques

allow you to focus in on signal errors,

or set up the analyzer so that more

detailed troubleshooting is possible.

The analysis software supports

demodulation of any user specified

slot number and OFDM symbol

number within a radio frame. The

ability to examine specific slots

or symbols individually allows

you to make all of the available

measurements on just the selected

slot or symbol. In other words, you

can gate the measurement window

to examine only slot N or symbol

N. To begin with, we will limit

our analysis to Slot 0 only. Slot 0

occupies some payload data and all

of the control channels and signals,

excluding PBCH, which is transmitted

in Slot 1. The channels and signals

present in Slot 0 are: P-SS, S-SS,

PDCCH, PCFICH, PHICH, and PDSCH.

The following example will set up the

analyzer to look at Slot 0 and perform

EVM on this slot only.

Now turn all channels back on.


Include all active channels and

signals

[Meas Setup] > [Chan Profi le Setup] >


Change the display to basic preset

view

[View/Display] > {Preset View: Basic}

Change Trace 2 to show Error

Vector Time


{Trace 2} >

{Data} > {Demod Error} > {Error Vector

Time }

Change Trace 3 to show Frame

Summary


{Trace 3}

{Data} > {Tables} > {Frame Summary}

Change the measurement time to

only measure time Slot 0



Note: If you want to measure Slot 1,

change the {Meas Offset Slot} to 1-- it

will offset it by 1 Slot.


55

All measurements shown in Figure

35 are made for Slot 0 only. When

using a normal cyclic prefix, there are

seven symbols in a slot. All the active

channels in this slot are color coded

and match the color coding used in

the frame summary table.

Symbol 0: RS is transmitted on every

6th subcarrier, while PHICH, PCFICH,

and PDCCH channels are transmitted

on the rest of the subcarriers

Symbols 1 and 2: Include more

PDCCH channels

Symbol 3: PDSCH channel

Symbol 4: RS is transmitted on every

sixth subcarrier and the rest of the

subcarriers are used to transmit user

data (PDSCH)

Symbol 5: S-SS is transmitted on

the center 72 subcarriers (only the

center 62 out of the reserved 72

subcarriers are used; the remaining

10 subcarriers are not currently used).

The rest of the subcarriers are used

to transmit user data (PDSCH).

Symbol 6: P-SS is transmitted on the

center 72 subcarriers (only the center

62 out of the reserved 72 subcarriers

are used and the remaining 10

subcarriers are not used). The rest of

the subcarriers are used to transmit

user data (PDSCH)

Figure 35. EVM analysis of Slot 0 only

56

Change the measurement interval to measure Symbol 6 only.


Change the measurement time

to only measure Symbol 6, which

occupies P-SS and PDSCH


{Meas Interval Slot} > [0] {Enter} – now

it is measuring Symbol 0. Offset it by 6

symbols to measure Symbol 6

{Meas Offset Symbol} > [6] > {Enter}


Figure 36. EVM analysis of Symbol 6 only

In this case, all measurements are made for Symbol 6, which contains the P-SS

and PDSCH. The P-SS uses a Zadoff-Chu sequence as shown by the circle (pink)

on the constellation display. The PDSCH channel in this example uses 16QAM

modulation format.

57

Now change the measurement interval back to 20 slots (1 frame).


Change the measurement interval

back to 20 slots


{Meas Offset Symbol} > [0] {Enter}

{Meas Interval Slot} > [20] > {Enter}

Another useful feature for troubleshooting is marker coupling. This allows

you to view error sources from different measurements. For instance, if you

see an error and place a marker on it, you can track that same point in the

signal in different error displays.


Change the display to basic [View/Display] > {Preset View: Basic}

Change Trace 2 to show Error Vector

Time


{Trace 2} >

{Data} > {Demod Error} > {Error Vector

Time }

Change Trace 4 to show

demodulated symbols


{Trace 4}

{Data} > {Tables} > {Symbols}

Turn on markers on each trace [Marker] > {Select Marker} > {1} >

{Normal} > {Properties} > {Marker

Trace} > { Trace 1}

Follow the same process to place

Markers 2, 3 and 4 on Traces 2, 3, and 4

respectively.

Couple the four markers [Marker] > {More 1 of 2} > {Couple

Markers: On/Off}

Put the measurement in single

sweep

[Single]

Put Marker 2 on Trace 2 on peak and

see all other markers showing same

point

[Marker] > {Select Marker} > {Marker

2}; now select peak search hard key

[Peak Search]

Note: The markers in all the other display will show the same point in time but provide different error views.

Turn on Marker Table [Marker] > {More 1 of 2} > {Marker

Table: On/Off}


58

The markers report data from the

same point in time but in different

error domains. For example, a symbol,

such as one associated with an

error peak, can be chosen from a

desired domain (time, frequency,

I/Q constellation location, etc.)

and examined in multiple domains

at once as a way to determine its

cause or significance. Errors may be

associated with a specific symbol

value (as determined from the

symbol table), with a specific time (or

symbol), or with a specific frequency

(or subcarrier).

Figure 37. Marker coupling

59

► Supported air interface features

Description Specifi cations Supplemental information

3GPP standards supported 36.211 V8.6.0 (2009-03) 36.212 V8.6.0 (2009-03) 36.213 V8.6.0 (2009-03) 36.101 V8.5.0 (2009-03) 36.104 V8.5.0 (2009-03) 36.141 V8.2.0 (2009-03) 36.521-1 V8.1.0 (2009-03)

Signal structure FDD Frame Structure Type 1TDD Frame Structure Type 2Special subframe confi gurations 0-8

N9080A onlyN9082A onlyN9082A only

Signal direction Uplink and downlinkUL/DL confi gurations 0-6 N9082A only

Signal bandwidth � 1.4 MHz (6 RB), 3 MHz (15 RB), 5 MHz (25 RB), 10 MHz (50 RB), 15 MHz (75 RB), 20 MHz (100 RB)

Modulation formats

and sequences

BPSK; BPSK with I & Q CDM; QPSK;

16QAM; 64QAM; PRS; CAZAC (Zadoff-Chu)

Physical channels

��Downlink��Uplink

PBCH, PCFICH, PHICH, PDCCH, PDSCHPUCCH, PUSCH, PRACH

Physical signals

��Downlink��Uplink

P-SS, S-SS, RSS-RS, PUCCH-DMRS, PUSCH-DMRS

► Channel power specifi cation


Channel power

Minimum power at RF input −50 dBm (nominal)

Absolute power accuracy1

20 to 30 °CAtten = 10 dB

PXA: ±0.63 dBMXA: ±0.82 dBEXA: ±0.94 dB

95% Confi dence absolute power accuracy20 to 30 °CAtten = 10 dB


Measurement fl oor PXA: −81.7 dB (nominal) @ 10 MHz BWMXA: −79.7 dBm (nominal) @ 10 MHz BWEXA: −75.7 dBm (nominal) @ 10 MHz BW

Key Specifi cations

This section contains specifications for the N9080A LTE FDD and N9082A LTE TDD measurement applications. The specifications

below are limited to channel power, adjacent channel power and modulation accuracy measurements and the specifications are the

same for both FDD and TDD applications. For the complete list of specifications for the other supported LTE measurements, refer to

the N9030A PXA Specification Guide at http://www.agilent.com/find/pxa, N9020A MXA Specification Guide at

http://www.agilent.com/find/mxa and the N9010A EXA Specification Guide at http://www.agilent.com/find/exa/.

1. Absolute power accuracy includes all error sources for in-band signals except mismatch errors and repeatability due to incomplete averaging.

It applies when the mixer level is high enough that measurement floor contribution is negligible

60

► Adjacent channel power specification

Description specifi cations Supplemental information

Adjacent channel powerMinimum power at RF inputAccuracy

Radio Offset Channel bandwidth 5 MHz 10 MHz 20 MHz

Single channel −36 dBm (nominal)

ACPR range for specifi cation

MS Adjacent1

PXA: ±0.07 dB MXA: ±0.12 dBEXA: ±0.15 dB


PXA: ±0.21 dBMXA: ±0.35 dBEXA: ± 0.36 dB

−33 to −27 dBc with Opt ML2

BTS Adjacent3





BTS Alternate3





Dynamic range E-UTRA

Offset Channel BW

Test conditions6

dynamic range Optimum mixer(nominal) level (nominal)

Adjacent 5 MHzPXA: −83.5 dB PXA: −8.5 dBmMXA:−74.2 dB MXA: −18.4 dBmEXA: –70.0 dB EXA: −16.5 dBm

Adjacent 10 MHzPXA: −82.1 dB PXA: −8.3 dBmMXA: −73.8 dB MXA: −18.4 dBmEXA: –69.3 dB EXA: −16.5 dBm

Adjacent 20 MHzMXA: −71.7 dB MXA: −18.2 dBmEXA: –68.4 dB EXA: −16.3 dBm

Alternate 5 MHzPXA: −86.7 dB PXA: −8.5 dBmMXA: −77.6 dB MXA: −18.6 dBmEXA: –75.8 dB EXA: −16.6 dBm

Alternate 10 MHzPXA: −83.7 dB PXA: −8.3 dBmMXA: −75.1 dB MXA: −18.4 dBmEXA: –73.2 dB EXA: −16.4 dBm

Alternate 20 MHzMXA: −72.1 dB MXA: −18.2 dBmEXA: –70.3 dB EXA: −16.3 dBm

Dynamic range UTRA

Offset Channel BW

Test conditions7

Dynamic range Optimum mixer(nominal) level (nominal)

2.5 MHz 5 MHzPXA: −86.2 dB PXA: −8.5 dBmMXA: −75.9 dB MXA: −18.5 dBmEXA: –70.5 dB EXA: −16.6 dBm


2.5 MHz 20 MHzMXA: −75.0 dB MXA: −18.2 dBmEXA: –71.4 dB EXA: −16.3 dBm



7.5 MHz 20 MHzMXA: −78.1 dB MXA: −18.2 dBmEXA: –75.7 dB EXA: −16.3 dBm

1. Measurement bandwidths for mobile stations are 4.5, 9.0 and 18.0 MHz for channel bandwidths of 5, 10 and 20 MHz respectively.2. For PXA the optimum mixer levels (ML) are –25, –22 and –21 dBm. For MXA the optimum mixer level (ML) is −23 dBm. For EXA the optimum mixer levels (ML) are −19, −17 and −17 dBm for channel bandwidths of 5, 10 and 20 MHz respectively.3. Measurement bandwidths for base transceiver stations are 4.515, 9.015 and 18.015 MHz for channel bandwidths of 5, 10 and 20 MHz respectively.4. The optimum mixer levels (ML) for PXA are –19, –17 and –16 dBm; for MXA are −19, −18 and −16 dBm; For EXA, they are −11, −8 and −6 dBm for channel bandwidths of 5, 10 and 20 MHz respectively.5. For PXA the optimum mixer level (ML) is –8 dBm. For MXA, the optimum mixer levels (ML) are −9, −8 and −8 dBm. For EXA, the optimum mixer level (ML) is −8 dBm for channel bandwidths of 5, 10 and 20 MHz respectively.6. E-TM 1.1 and E-TM 1.2 used for test. Noise Correction set to On.7. E-TM 1.1 and E-TM 1.2 used for test. Noise Correction set to On.

61

► Modulation analysis specifi cation


EVM

Input range ≥0 dBm, signal level within one range step of overload

Residual EVM Floor1 for

downlink (OFDMA)

Signal bandwidth

5 MHz

PXA: 0.34% (–49.3 dB)

MXA: 0.7% (–43 dB)

EXA: 1.35% (–37.3 dB)

PXA: 0.28% (–51.2 dB) (nominal)

MXA: 0.40% (–48 dB) (nominal)

EXA: 0.56% (–45 dB) (nominal)

10 MHz

PXA: 0.35% (–49.1 dB)

MXA: 0.7% (–43 dB)

EXA: 1.35%(–37.3 dB)

PXA: 0.31% (–50.3 dB) (nominal)



20 MHz2

PXA: 0.39% (–48.1 dB)

MXA: 0.7% (–43 dB)

EXA: 1.35% (–37.3 dB)

PXA: 0.34% (–49.5 dB) (nominal)



Residual EVM Floor1 for

uplink (SC-FDMA)

Signal bandwidth

5 MHz

PXA: 0.31% (–50.1 dB)

MXA: 0.7% (–43 dB)

EXA: 1.35% (–37.3 dB)

PXA: 0.22% (–53.2 dB) (nominal)



10 MHz

PXA: 0.32% (–49.8 dB)

MXA: 0.7% (–43 dB)

EXA: 1.35% (–37.3 dB)

PXA: 0.21% (–53.5 dB) (nominal)



20 MHz2

PXA: 0.36% (–49.2 dB)

MXA: 0.7% (–43 dB)

EXA: 1.35% (–37.3 dB)

PXA: 0.21% (–53.5 dB) (nominal)



Frequency error

Lock range±2.5 x subcarrier spacing = 37.5 kHz for

default 15 kHz subcarrier spacing (nominal)

Accuracy ±1 Hz + tfa3 (nominal)

1. Overall EVM and Data EVM using 3GPP standard-defined calculation. Phase Noise Optimization set to Best Close-in (< 20 kHz for MXA/EXA; <140 kHz PXA).

2. Requires Option B25 (IF bandwidth above 10 MHz, up to 25 MHz).

3. tfa = transmitter frequency x frequency reference accuracy.

62

Ordering Information

► PXA signal analyzer

For more information, refer to PXA

Configuration Guide,

literature number 5990-3953EN.

► MXA signal analyzer

For more information, refer to MXA



► EXA signal analyzer

For more information, refer to EXA



► LTE measurement application

Model number Description Required options

N9030A PXA signal analyzer 503, 508, 513, or 526 -

frequency range options (one

of these options is required)

N9030A For analysis over 10 MHz

(such as for LTE signals above

10 MHz)

B25 - 25 MHz analysis

bandwidth or

B40 - 40 MHz analysis

bandwidth or

B1X - 140 MHz analysis

bandwidth


N9020A MXA signal analyzer 503, 508, 513, or 526 –

frequency range options (one

of these options is required)

N9020A For analysis over 10 MHz and

up to 25 MHz bandwidth

(such as for LTE signals above

10 MHz)

B25 – 25 MHz analysis

bandwidth


N9010A EXA signal analyzer 503, 508, 513, or 526 –

frequency range options

(one required)

N9010A For analysis over 10 MHz and

up to 25 MHz bandwidth; such

as for LTE signals above 10

MHz

B25 – 25 MHz analysis

bandwidth


N9080A LTE FDD measurement

application

1FP – LTE-FDD

measurement, application,

Fixed Perpetual

1TP – LTE-FDD

measurement application,

Transportable Perpetual

N9082A LTE TDD measurement

application

1FP – LTE-TDD

measurement, application,

Fixed Perpetual

1TP – LTE-TDD

measurement application,

Transportable Perpetual

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