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RF RF andand M Millimeter-wave illimeter-wave IIntegrated ntegrated SSystems Lab.ystems Lab.1U. Kim
Q Enhancement in Spiral Inductors
Why Inductors need?
Inductors Used in RFIC, MMIC
Spiral Inductor Modeling
Degradation of Q
Q Enhancement Techniques
Conclusion
Microwave Devices Term Project
Unha Kim (2004-21475) [email protected]
RF and Millimeter-wave Integrated Systems Lab.
RF RF andand M Millimeter-wave illimeter-wave IIntegrated ntegrated SSystems Lab.ystems Lab.2U. Kim
Why Inductors Need?
Typical Design Example
A single-chip GPS Receiver
CMOS technology
Freq = 1.57542GHz
Used more than 10 inductors
About 25% of chip area
Impedance matching
DC biasing (RF choke)
Phase shifting
Filtering
LC tank
RF RF andand M Millimeter-wave illimeter-wave IIntegrated ntegrated SSystems Lab.ystems Lab.3U. Kim
Inductors Used in RFIC, MMIC
Inductors
Ribbon Inductor
Loop Inductor
Meandered Inductor
Spiral Inductor
Bondwire Inductor
Active Inductor
Considerations
Inductance
Quality Factor
Self Resonant Frequency
RF RF andand M Millimeter-wave illimeter-wave IIntegrated ntegrated SSystems Lab.ystems Lab.4U. Kim
Some Types of Inductors
Ribbon inductor
Less than 1nH
High Z0 needed
Relatively ‘pure’ inductance (low parastics)
Often used in distributed amplifiers
Loop inductor
Used extensively in the early days of MMICs
Inefficient use of chip area
Recently, it is used very little
Meandered track inductor
Can get more than 1nH
Lmeandered < Lstraight track with same length
RF RF andand M Millimeter-wave illimeter-wave IIntegrated ntegrated SSystems Lab.ystems Lab.5U. Kim
Some Types of Inductors
Bondwire inductor
Diameter = 1mil (0.001 inches)
More surface area per length than spirals
Less resistive loss, Higher Q
L = 1nH / mm
Active inductor
Higher noise
Power consumption
Limited linearity - Distortion
L = C / (gm1gm2)
d
Discrete inductor
L = 2 ~ 100nH with 2 ~10% tolerance
Q = 50 to 200 (1 to 2GHz)
SRF = 4 to 10GHz
RF RF andand M Millimeter-wave illimeter-wave IIntegrated ntegrated SSystems Lab.ystems Lab.6U. Kim
Spiral Inductor
The most frequently used
High inductance per unit area
Square, octagon, circular type
Qcircular > Qoctagon > Qsquare
Air bridge crossover or dielectric spaced underpass
Din : Inner dimension
Dout : Outer dimension
S : Spacing
W : Width
t : Thickness
n : Number of turns
RF RF andand M Millimeter-wave illimeter-wave IIntegrated ntegrated SSystems Lab.ystems Lab.7U. Kim
Spiral Inductor Modeling
Ls : Mutual Couplings
Rs : DC & AC resistance (skin effect)
Cs : Series Capacitance
Cox : Oxide Capacitance
Csi : Si Substrate Capacitance
Rsi : Si Substrate Ohmic Loss
C.Patrick Yue, “Physical Modeling of Spiral Inductors on Silicon”
RF RF andand M Millimeter-wave illimeter-wave IIntegrated ntegrated SSystems Lab.ystems Lab.8U. Kim
Degradation of Q
Problems
Limitation on the number of turns
Occupies large area
Series (DC + AC) resistance
Substrate loss
Some Proposed solutions
Patterned ground shield
Differentially driven inductor
Copper metallization
Three dimensional inductor
RF RF andand M Millimeter-wave illimeter-wave IIntegrated ntegrated SSystems Lab.ystems Lab.9U. Kim
Dominant Effects on Spiral Inductor
Rs, Cs effect dominant
Csi , Rsi effect dominant
Low frequency : series resistance effect
High frequency : substrate loss effect
Conductive Si substrate have a defect!
How can we reduce the substrate loss?
SRF
RF RF andand M Millimeter-wave illimeter-wave IIntegrated ntegrated SSystems Lab.ystems Lab.10U. Kim
Other Dimensional Effects on Spiral Inductor
1 2
3 1. Size dependencylarger size, larger substrate loss
2. Oxide thickness dependencythicker oxide, lower substrate loss
3. Metal thickness dependencythicker metal, lower Rs
Or, using Cu instead of Al, lower Rs
RF RF andand M Millimeter-wave illimeter-wave IIntegrated ntegrated SSystems Lab.ystems Lab.11U. Kim
Solid Ground Shield
Severe substrate loss at high freq.
Si substrate is vulnerable Usually ρ < 20Ω·cm
GaAs substrate is less vulnerable Semi-Insulating Substrate
SGS
To reduce substrate loss
Conductive ground shield between oxide and substrate
Metal or polysilicon deposition
Eddy current L↓ Q↓
Capacitance increases SRF↓
RF RF andand M Millimeter-wave illimeter-wave IIntegrated ntegrated SSystems Lab.ystems Lab.12U. Kim
Eddy Current
Eddy current occurs when a conductor is subjected to time-varying-magnetic field and is governed by Faraday’s law.
Eddy currents produce their own magnetic fields to oppose the original field
Eddy currents reduce the net current flow in the conductor
Increase the ac resistance
RF RF andand M Millimeter-wave illimeter-wave IIntegrated ntegrated SSystems Lab.ystems Lab.13U. Kim
Patterned Ground Shield
PGS
Orthogonal to spiral (block eddy current) Avoid attenuation of the magnetic field
Isolates between inductor and ground termination of the electric field
Aluminum metal or polysilicon (better)
Capacitance increases SRF↓
C.Patrick Yue, “On-Chip Spiral Inductors with Patterned Ground Shields for Si-Based RFICs”
RF RF andand M Millimeter-wave illimeter-wave IIntegrated ntegrated SSystems Lab.ystems Lab.14U. Kim
Patterned Ground Shield (cont’)
Q factor up to 33%
SRF decrease
SRF
RF RF andand M Millimeter-wave illimeter-wave IIntegrated ntegrated SSystems Lab.ystems Lab.15U. Kim
Patterned Ground Shield (cont’)
1. Parallel LC resonator at 2GHzThere are many advantages in designing oscillator.
2. Reduce the substrate coupling b/w two adjacent inductors by 25dB
Using PGS has both advantages and disadvantages.
1
2
RF RF andand M Millimeter-wave illimeter-wave IIntegrated ntegrated SSystems Lab.ystems Lab.16U. Kim
Differentially Driven Inductors
Differential circuits have robustness and superior noise rejection properties
Can get greater Q without altering the fabrication process
Differential signal path requires extra chip area compared to a single-ended
Symmetrical inductor has better performance than asymmetric inductor.
Adjacent conducting strips : voltage (anti-phase), current (same direction) Reinforces the magnetic field by the parallel groups of conductors Increases the overall inductance per unit area
asymmetricsymmetric
High V difference
Same I directionLow V difference
Same I direction
RF RF andand M Millimeter-wave illimeter-wave IIntegrated ntegrated SSystems Lab.ystems Lab.17U. Kim
Differentially Driven Inductors (cont’)
Mina Danesh, “Differentially Driven Symmetric Microstrip Inductors”
Lsub.sSpiral inductor
modelingSingle-ended
Lsub.d
Differential excitations
Lseries.d
Lseries.s
Lseries.d and Lseries.s are similar low-freq. dominant factor
Lsub.d is less than L sub.s up to 2 times high-freq. dominant factor
Low freq. performance is similar
(c) is superior at high freq.
RF RF andand M Millimeter-wave illimeter-wave IIntegrated ntegrated SSystems Lab.ystems Lab.18U. Kim
Differentially Driven Inductors (cont’)
Less affected by substrate parastics
50% grater Q factor than single-ended
Broader range of operating frequencies
common node
RF RF andand M Millimeter-wave illimeter-wave IIntegrated ntegrated SSystems Lab.ystems Lab.19U. Kim
Circular Shaped Inductors
1GHz
Rcircular and Roctaogonal is smaller by 10% than Rsquare
Decreasing conductor spacing is better than increasing conductor width
CIW ↑ Cox, C si ↑
S. Chaki, “Experimental Study on Spiral Inductors”
RF RF andand M Millimeter-wave illimeter-wave IIntegrated ntegrated SSystems Lab.ystems Lab.20U. Kim
Reducing Line Resistance
AC resistance W, t > 2δs
DC resistance
The four best conducting metal resistivities are
Silver : 1.62 μΩ·cm
Copper : 1.72 μΩ·cm
Gold : 2.44 μΩ·cm
Aluminum : 2.62 μΩ·cm
If we use Cu instead of Al, Rs would be reduced significantly
Some paper proposed that ( 3um-thick Al ) = ( 1um-thick Cu )
But thicker metal, larger CIW
Damascene Cu metallization
Cu metallization is not mature in RFIC & MMIC
RF RF andand M Millimeter-wave illimeter-wave IIntegrated ntegrated SSystems Lab.ystems Lab.21U. Kim
Cu Damascene Interconnects
(a) Etch trenches and via holes
(b) Ta barrier layer and Cu seed layer
(c) Electrochemical plating Cu
(d) CMP Cu and Ta, CVD nitride
Example : Cu metallization in VLSI technology
Better conductor than aluminum
Higher speed and less power consumption
Higher electomigration resistance
Diffusing freely in silicon and silicon dioxide, causing heavy metal contamination, need diffusion barrier layer
Hard to dry etch, no simple gaseous chemical compounds
RF RF andand M Millimeter-wave illimeter-wave IIntegrated ntegrated SSystems Lab.ystems Lab.22U. Kim
High Q Inductor in Single Damascene
Snezana Jenei, “High Q Inductor Add-on Module in Thick Cu/SiLKTM single damascnene”
Al sheet resistance : 20~100
Q factors up to 24 at 2.8nH by using think metal layer
Non-effective unless the substrate losses are lowered sufficiently
RF RF andand M Millimeter-wave illimeter-wave IIntegrated ntegrated SSystems Lab.ystems Lab.23U. Kim
Conclusion
Inductors are needed in RFICs & MMICs
High Q inductors are required for high performance
Spiral inductors are mostly used
The Q of spiral inductor is very low
Substrate loss and series resistance are major effects on Q
Some Q-enhancement techniques are suggested
PGS + Cu-metal + Octagonal shaped inductor is best performance
It will be trade-off relation between high-Q process and cost
RF RF andand M Millimeter-wave illimeter-wave IIntegrated ntegrated SSystems Lab.ystems Lab.24U. Kim
References
C. Patrick Yue, “Physical Modeling of Spiral Inductors on Silicon”
Mina Danesh, “Differentially Driven Symmetric Microstrip Inductors”
C. Patrick Yue, “On-Chip Spiral Inductors for Silicon-Based RFICs”
Snezana Jenei, “High Q Inductor Add-on Module in Thick Cu/SiLK single damascene”
Daniel C. Edelstein, “Spiral and Solenoidal Inductor Structures on Silicon Using Cu-Damascene Interconnects”
Joachim N. Burghartz, “On the Design of RF Spiral Inductors on Silicon”
S. Chaki, “Experimental Study on Spiral Inductors”
C. Patrick Yue, “On-Chip Spiral Inductors with Patterned Ground Shields for Si-Based RFICs”
John Rogers, “Radio Frequency Integrated Circuit Degisn”, Artech House
Thomas H. Lee, “The Design of CMOS RFICs”, Cambridge Univ. press
I. D. Robertson, “MMIC Design”, IEE press