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( Installed in our PLD Lab ). TURBO TESTER. Testing and DFT tools. Maksim Jenihhin. IXX9500 Doktoriseminar. DFT Package tools. DFT Advisor – insert internal scan circuitry BSD Architect – insert boundary scan circuitry Fast Scan – quick full-scan ATPG and fault simulator - PowerPoint PPT Presentation
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Testing and DFT toolsTesting and DFT tools( Installed in our PLD Lab )( Installed in our PLD Lab )
Maksim JenihhinMaksim Jenihhin
IXX9500 IXX9500 DoktoriseminarDoktoriseminar
TURBO TESTERTURBO TESTER
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DFT Package toolsDFTAdvisor – insert internal scan circuitryBSDArchitect – insert boundary scan circuitryFastScan – quick full-scan ATPG and fault simulatorFlexTest – sequential ATPG and fault simulatorLBISTArchitect – insert logic BIST circuitryMBISTArchitect – insert memory BIST circuitryEmbedded Deterministic Test (EDT) and TestKompress
- generate and compress deterministic test patterns
server:/home/user>cat .cshrc…setenv MENTORsetenv MENTOR_64…
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Design FlowDF
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ATPG library
ATPG library is NOT required if the design netlist fully defines all the primitives.
(It can occur only in Verilog and TDL formats.)
> find /cad/m_04/ -name atpglib -print.../cad/m_04/dft/shared/pkgs/testkompress.ss5/systest_data/atpglib
Tools:DFTAdvisor
FlexTestLBISTArchitect
etc.
Design
Levels:RTLGate
Formats:EDIFVHDL
VerilogGenieTDL
Model
1. Use one preinstalled for Mentor Graphics training examples. To locate it use find command.
2. Use class.atpglib compatible with Turbo Tester class.lib (Synopsys)www.pld.ttu.ee/~maksim/mg/class.atpglib
3. Create your own for your particular library: a. Manuallyb. Use LibComp to translate it from Verilog
Where to get one?ATPG
Library
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MG DFT DocumentationLocal
/cad/m_04/dft/shared/pdfdocsMentor Graphics SUPPORTNET (requires free registration)
http://www.mentor.com/supportnet/External storage of Mentor Graphics Design-for-Test ’99 documentation:
http://www.fm.vslib.cz/~kes/bs/mg/mg.html
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Synopsys TetraMAX
Offers a choice of ATPG modes: Basic-Scan ATPG, an efficient combinational-only mode for full-scan designs Fast-Sequential ATPG for limited support of partial-scan designs Full-Sequential ATPG for maximum test coverage in partial-scan designs
It is integrated with Synopsys’ DFT Compiler.
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Design ErrorDiagnosis
TURBO TESTER EnvironmentTURBO TESTER Environment
Test Generation
Design TestSet
HazardAnalysis
Data
DefectLibrary
MultivaluedSimulation
Test SetOptimization
FaultTable
FaultSimulation
FaultyArea
Specifi-cation
Formats:EDIFAGM
Levels:GateRTL
Algorithms:Deterministic
RandomGenetic
Circuits:CombinationalSequential
Methods:BILBOCSTPHybrid
BISTSimulation
Fault models:Stuck-at faults
Physical defects
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TT Development Team
Department of Computer Engineering
Official website: http://www.pld.ttu.ee/TT
Prof. Raimund UbarJaan Raik
Elmet OrassonArtur JutmanGert JervanMargit Aarna
Eero IvaskSergei Devadze
Vladislav VislogubovMaksim Jenihhin