SpringContactTestProbes Bench-topTestJigs ...· SpringContactTestProbes Bench-topTestJigs SpecialistTestProducts

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  • Spring Contact Test ProbesBench-top Test Jigs

    Specialist Test Products

    Coda Systems LtdOak Road, Little Maplestead, Halstead, Essex, CO9 2RT UK

    +44 (0)1787 478678 Fax: +44 (0)1787 274194 sales@coda-systems.co.uk

    Coda Systems LtdOak Road, Little Maplestead, Halstead, Essex, CO9 2RT UK

    +44 (0)1787 478678 Fax: +44 (0)1787 274194 sales@coda-systems.co.uk


    Kelvin Test Probes

    Micro Test Probes

    ATE Test Probes

    General PurposeTest Probes

    Kelvin Test Pinsand Fixture Kits

    Bench-topTest Jigs

    High CurrentTest Probes

  • Contents

    What is a Spring Contact Test Probe?

    Welcome to the largest ever Coda-Pin Test Product Catalogue.

    For the first time we have combined our extensive range of test probes, bench-toptest jigs and many other specialist test products into one catalogue.

    If you cant find the test probe or product you require please contact us; we may beable to source something for you.


    +44 (0)1787 478678

    General PurposeTest Probes,Receptacles & Tools

    ATE Test Probes,Receptaclesand Tools

    Bench-top Test Jigsand Accessories

    Specialist TestProducts

    High current test probes 22, 23 Ultra-high current test probes 24 Kelvin test probes 25 Kelvin test pins and fixture kits 26, 27 High frequency test probes 28 Switching test probes 29 Pneumatically controlled probing systems 30, 31 Micro test probes 32, 33 Presence detection switch probes 34 Bladed test probes 35 Large headed test probes 35 Test jig parts 36, 37

    Press ringTermination solder cup Roll crimp Barrel Plunger Contact tip style

    Receptacle Test Probe

    Test probes - test pins - spring probes - pogo pins; these are all generic terms to describe a component whose spring loaded tip willprovide a reliable electrical contact to a target whose distance away may well be indeterminate. The traditional use for them is tomake contact with printed circuit boards (PCBs) or electrical components, in order to test functionality and to measure the value ofthe components. They are widely used in vacuum test fixtures associated with automatic test equipment (ATE). They are also usedinside a functional test station as part of a larger production line.

    The test probe is comprised of a metal tube, ready assembled with a spring and contact plunger, supplied as a one-piece item.They are usually gold plated as gold is an excellent electrical conductor and is resistant to corrosion. The electrical cable isgenerally connected to a receptacle which the test probe inserts into. The use of a receptacle allows the test probe to be removedfor cleaning or replacement without having to dissconnect the electrical cable (see illustration below).

    The illustration opposite shows a test probe and itsreceptacle mounted in a block with the electricalconnection made to the tail of the receptacle. Thereceptacle has been inserted using a receptacleinsertion tool. Finally the cable is soldered to thetermination and the probe installed.

    PA1 4

    General Purpose Test Probes

    ATE Test Probes

    High Current Test Probes

    PA2 4

    PA3 & HD-PA3 5

    PC6 5

    PC8 5

    PA4 6

    PA5 7

    PA6 7

    PA7 7

    ELPA2 8

    LPA4 8

    ELPA4 8

    LPA5 8

    LPA7 8

    PA4 & ST-PA4 12

    LF-PA4 12

    LF-LPA2 13

    LPA2 & ST-LPA2 13

    LPC1 & ST-LPC1 14

    LF-LPC1 14

    HD-PC8 23

    HD-PA4 22

    HD-PA5 22

    HD-PA6 23

    HD-PA7 23

    Probe identification guideAll shown actual size




    For quotations, availability or to place an order -


    Page i How to use 2, 3 Short Reach 4, 5 Medium Reach 6, 7 Long Reach 8

    i How to use 10, 11 2.54mm/0.1 centre spacing 12 1.91mm/0.075 centre spacing 13 1.27mm/0.050 centre spacing 14 Presence detection and ATE travel indicator probes 14 ATE test probes and receptacle tools 15

    MF Series 17 CMF Series 18 CGF Series 19 i How to fit test probes and receptacles into abench-top test jig 20

  • Page4, 5

    Page2, 3

    Page6, 7


    Short Reach

    Medium Reach

    Long Reach

    Product selection Fitment and usage Aftercare

    Low profile, short travel test probes for restrictedspace applications

    Applications where long travel is not required,such as for testing thin film/hybrid circuits orbareboard PCBs

    For use in bench-top test jigs Replaceable test probe by use of a receptacle Other applications such as device programming,

    as an interface between two stages or for use asa compliant contact in your product

    Industry standard height for test jigs, fixtures andproduction line test positions

    Wide range of widths available depending on thetest centre spacing (pitch)

    General purpose testing of components,transformers, connectors and sub-assemblies

    Replaceable test probe by use of a receptacle

    Recessed test targets Dual-height test fixtures Component leads whose height may vary Replaceable test probe by use of a receptacle

    General PurposeTest Probes


    i Information

    For samples, quotations, availability or to place an order:www.coda-systems.co.uk sales@coda-systems.co.uk

    +44 (0)1787 478678

    For technical advice: technical@coda-systems.co.uk

    +44 (0)1787 478678

  • Product selection

    Probe tip selection

    Clean leads, pins

    Clean terminalpins


    PCB lands

    PCB pads


    Spear or Point

    Tip style Application Tip style Application Tip style Application Tip style Application

    PCB gold edgefingers


    Leaves nowitness marks


    Clean componentpins

    Flat PCB pads

    Leaves no witnessmarks

    Bead probingapplications


    Clean platedthrough holes

    Connector sockets

    Clean PCB pads


    Solder connection for cables Suitable for low density arrays Multi-strand cablerecommended

    Solderless connection Crimp tool required

    Wireless connection Low resistance

    Solderless connection Quick release


    For slightlycontaminatedleads, pins andblades

    Male connectorpins

    High currentapplications

    Large headedtypes for ill-defined targets


    PCB platedthrough holes

    Connector testapplications

    Self-cleaning tipstyle

    Pyramid andStar Head

    Contaminated PCBleads and pads

    Self-cleaning tipstyle

    8-pt crown forconnector pins




    Connector plug-on


    Contaminated orclean platedthrough holes

    PCB pads andlands

    Sharp Pyramid

    Once you have decided which series of general purpose test probe best suits your application, you will need to select a suitable tip style. The table below illustrateswhich of the tip styles is likely to be most effective in a particular situation.Most of our series have a choice of spring pressure. A lighter spring is preferred in test applications where the test point is considered clean or uncontaminated.The heavier spring will help the probe tip to penetrate better through any contamination. A lighter spring may have to be a consideration in test fixtures withlarge quantities of probes, or in situations where the density of probes is very high in a small area.

    The receptacle is a type of socket that fits into the drilled hole in the probe plate or block. The test probe slips inside the receptacle allowing it to become areplaceable item as the electrical cable is connected to the tail of the receptacle. There are several versions of receptacle (see below) depending on your preferredchoice of cable termination - providing it is available in the specific probe series.

    Contaminatedplated throughholes

    PCB pads andlands


    Plain Star

    Contaminated viaholes

    Contaminated PCBpads and lands

    Steel SuperSharp Blade

    Contaminated/varnished PCBs

    Uneven solderedsurfaces

    Bent or foldedover componentlands


    How to use General Purp

    Connector: RJ3-C and RJ4-C

    Receptacle termination selectionTermination Application Termination Application

    Wire-wrap For high density arraysparticularly in ATE test fixtures

    Single or double wrap Various lengths available For solid core cable only

    Round-pin For connector plug-on For use with multiwayconnectors

    Round pin connector: RJ1-C



    Wireless connection Low resistance Minimal extra length to theassembly


    Solder connection for cables Suitable for low density arrays Multi-strand cablerecommended


    i Information

    For samples, quotations, availability or to place an order:www.coda-systems.co.uk sales@coda-systems.co.uk

    +44 (0)1787 478678

    For technical advice: technical@coda-systems.co.uk

    +44 (0)1787 478678

  • Fitment and usage

    After care

    A regular maintenance programme for your probes will help you achieve themaximum probe performance and lifespan. The necessary frequency andmethod of the maintenance/cleaning programme depends on your productionenvironment, the type of equipment and the probe series used.

    Contamination left behind on the probe tip is the primary cause of probe contactproblems. This is often caused by a bi-product of the soldering process of eithersoldering flux or a solder residue. Other local contaminants such as dust, fluff,oil and grime can cause more temporary problems.

    Light brushing of the probe tip with nylon, bristle or soft metal brushes willdislodge most contaminants.