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SOPHISTICATED INSTRUMENTATION CENTRE FOR APPLIED RESEARCH AND TESTING (SICART ) (Sponsored by Department of Science and Technology, Govt. of India, New Delhi) Sardar Patel Centre for Science and Technology Vallabh Vidyanagar- 388120, Dist: Anand, Gujarat, India Phone: +91-2692-234966 Fax: +91-2692-238355 E-mail: [email protected] Website: www.sicart.res.in

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Page 1: SOPHISTICATED INSTRUMENTATION CENTRE FOR APPLIED … · Sophisticated Instrumentation Facility Available in SICART (1) Field Emission Gun Scanning Electron Microscopy (FEG-SEM) Make:

SOPHISTICATED INSTRUMENTATION CENTRE FOR APPLIED RESEARCH

AND TESTING (SICART )

(Sponsored by Department of Science and Technology, Govt. of India, New Delhi)

Sardar Patel Centre for Science and Technology

Vallabh Vidyanagar- 388120,

Dist: Anand, Gujarat, India

Phone: +91-2692-234966 Fax: +91-2692-238355

E-mail: [email protected] Website: www.sicart.res.in

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Inauguration Picture of SICART

Major Objectives of SICART

Vision: To serve the industry and academic institutes persuing scientific research for building a better society by providing total scientific solutions.

Mission:

To bridge the gap between industries and academic research institutes by

spreading awareness of the importance of Material Analysis.

SICART is committed to the pursuit of excellence and its objectives are:

1. To provide instrument facilities to Research Institutions, Universities and Industries

within and outside Gujarat state.

2. To help and provide Consultation/R&D facilities to nearby industries.

3. To establish linkages with various National level and other reputed laboratories so

as to collaborate in research projects.

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4. To help industries in developing indigenous instrumentation systems/products for

measurement, calibration and testing and issuing certification on the quality of raw

materials and products.

Authorization

1. Sophisticated Analytical Instruments Facility Supported by

Department of Science & Technology (Govt. of India)

2. Recognized by DSIR as a Research Centre

3. Recognized by Gujarat Pollution Control Board as External

Environmental Auditor, Schedule- I

4. Recognized by NABL

5. Recognized by Sardar Patel University as Research Centre for Ph.D.

study

List of Technical Staff

Sr. No.

Employee Name Designation Qualification

1 Prof. (Dr.) A. R. Jani

Hon. Director

M.Sc. (Physics) Ph.D. (Physics)

2 Dr. S. V. Patel

Sr. Scientific Officer

M.Sc. (Chemistry) Ph.D. (Polymer Chemistry)

3 Dr. M. P Patel

Sr. Scientific Officer

M.Sc. (Materials Science) Ph.D. (Materials Science)

4 Dr. K. K. Tiwari

Sr. Scientific Officer

M.Sc. (Environment Science), NET, Ph.D.

5 Dr. M. R. Tiwari

Sr. Scientific Officer

M.Sc. (Inorganic Chemistry) Ph.D. (Industrial Chemistry)

6 Dr. G. R. Chauhan

Sr. Scientific Officer

M.Sc. (Analytical Chemistry) Ph.D. (Chemistry)

7 N. B. Patel

Jr. Scientific Officer

M.Sc. (Industrial Chemistry)

8 V. J. Patel

Jr. Scientific Officer

M.Sc. (Solid State Physics)

9 Rima Sheth Technician M.Sc. (Analytical Chemistry)

10 V. A. Patel Technical Assistant

M.Sc. (Electronics)

11 Dhanvi Patel Technical Assistant

M. Sc. (Bio- Technology)

12 Dipen Patel Trainee Technician

M.Sc. (Analytical Chemistry)

Page 4: SOPHISTICATED INSTRUMENTATION CENTRE FOR APPLIED … · Sophisticated Instrumentation Facility Available in SICART (1) Field Emission Gun Scanning Electron Microscopy (FEG-SEM) Make:

Sophisticated Instrumentation Facility Available in SICART

(1) Field Emission Gun Scanning Electron Microscopy (FEG-

SEM)

Make: FEI Ltd Model: Nova NanoSEM 450

Resolution: 1.0nm at 15kV, 1.4nm at 1kV , 3.5nm at 100V,Accelerating

Voltage: 20V to 30kV, Beam current: upto

200nA Magnification: X25 to X10,00,000Field Emission Gun:Ultra-high

brightness Schottky emitter

(2) Environment Scanning Electron Microscope with EDAX

Philips, Holland, ESEM TMP+EDAX

Emission Current: 0 to 200 µA, Accelerating Voltage: 0.2 to 30 kV, Resolution with

Tungsten filament 3.5 nm at 30 kv, Magnification 10x to 400000x, Automatic scaled

micron marker, Specimen movement: X = 50 mm, Y = 50 mm, Secondary and

Gaseous Secondary with Energy Dispersive X- ray Analysis (EDAX) for qualitative

element analysis

Page 5: SOPHISTICATED INSTRUMENTATION CENTRE FOR APPLIED … · Sophisticated Instrumentation Facility Available in SICART (1) Field Emission Gun Scanning Electron Microscopy (FEG-SEM) Make:

(3) Transmission Electron Microscope (TEM) 200 kV

Technai-20, Phillips, Holland

Electron Source: LaB6 and Tungsten Filament, Accelerating Voltage

Point Resolution: 0.27nm, Magnification: 25x to 7,50,000x,

Single tilt sample holder with CCD Camera (Ultra microtome and Ultra Cutter for

sample Preparation)

(4) Inductively Coupled Plasma Spectrometer (ICP-OES)

Perkin Elmer,USA, Optima 3300 RL

Simultanious detection ,RF frequency:40MHz,RF power:750 to 1500 watts,Pump: 3

channel peristaltic pump 0.2 to 2.5 ml/m,spectrometer:6000pixel SCD Detector ,5000

Emission line resolution,Range:165 to 782nm for UV & VIS,Results:60 elements can

be detected in 1 min.

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(5) X- Ray Diffractometer (XRD)

Philips, Holland, X-pert MPD

Source: Cu target X-Ray tube,X-Ray Power: 2KW,

Detector: Xe-filled Proportional detector,Software:JCPD data base for powder

diffractometry,2 theta Measurement range: 2 to 136, Diffractometer radius: 130 to

230mm

(6) Wavelength Dispersive-X-Ray Fluorescence (WD-XRF)

Description: 4Kw, WD-XRF sequential basic system, X ray tube: Ultra thin Be

window (75µm) Detectors: Scintillation and flow counter detection Software:

Omnian software, TOXAL module, WROXI Mineral and mining Modules.

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(7) 400 MHz FT-NMR Spectrometer (FT-NMR)

Model- Bruker, Switzerland, Avance III, Topspin 2.1

Liquid and Solid multi nuclei probe

Low-Temperature Facility (Range up to -800C)

Timing Resolution 12.5 ns, Minimum event time 25 ns, Single Chip RF generation,

Highest Phase resolution (0.0055°), Highest Frequency resolution (0.005 Hz)

Solid nuclei(31P ,29Si ,23Na ,27Al ,51V ,71Ga ,119Sn ,201Pb )

Useful for structure identification of organic, inorganic and polymer compound.

(8) Fourier Transform Infrared Spectrometer (FTIR)

Perkin Elmer,USA:Spectrum-GX

FTIR Spectrometer: Normal range: 4000-400cm-1

Operating Mode:MIR and NIR (Absorbance, Transmittance and Reflectance )

Scanning range: 15600-30cm-1

Scan time: 20scan/second

Resoluiton:0.15cm-1

Single Beam/Ratio:Single,Ditector:MIRTGS

Page 8: SOPHISTICATED INSTRUMENTATION CENTRE FOR APPLIED … · Sophisticated Instrumentation Facility Available in SICART (1) Field Emission Gun Scanning Electron Microscopy (FEG-SEM) Make:

(9) UV-VIS-NIR Spectrometer

Model-Perkin Elmer, USA, Lambda 19

Wavelength Range: 185-3200 nm for Absorbance/Transmission and 200-2500 for

Reflectance

Double Beam, Double Monochromator, Ratio Recording

Lamp: Deuterium (UV), Tungsten-Halogen (VIS/NIR)

Detectors: Photomultiplier tube for UV/Vis

Solid sample attachment: Lead-Sulphide cell (PbS) for NIR

_____________________________________________________________

(10) LC-MS-MS (LCQ Fleet, TSQ Quantum Access)

Thermofisher scientific, USA

LCQ fleet and TSQ Quantum Access: ESI and APCI Source Quantum with HPLC

System

Mass range: LCQ Fleet: 50-2000 Daltons, TSQ-30-3000 Daltons

Pump: dual piston delivery system, built-in vacuum degasser.

Pressure range: 0 to 5800 PSI (0 to 400 bar) at flow rates up to 2 ml/min.

Operating temperature: 10°C to 40°C. Quaternary low pressure system.

Page 9: SOPHISTICATED INSTRUMENTATION CENTRE FOR APPLIED … · Sophisticated Instrumentation Facility Available in SICART (1) Field Emission Gun Scanning Electron Microscopy (FEG-SEM) Make:

(11) High Performance Liquid Chromatograph (HPLC)

Perkin Elmer, USA, Series-200

Quaternary gradient system ,flow rate 0.1 to 10ml/min variable operating back

pressure 5000psi,C-18,C-8 column, Detectors: Photo Diode Array (PDA

),range:190nm to 800nm,UV-VIS:190nm to 800nm,Flurescence Detector;range-

200nm to 900nm,sensitivity range 0.0001 to 2.0 AUS

(12) Gel Permeation Chromatography (GPC)

Perkin Elmer, USA, Series-200:

Determinations of Molecular weight of Polymer samples (Mn & Mw), Polydispersity.

Column: PL gel, Mixed-B, Mixed-D.

Molecular Weight distribution (range: 500-300000gm/mol)

Detector: Refractive Index (RI)

Page 10: SOPHISTICATED INSTRUMENTATION CENTRE FOR APPLIED … · Sophisticated Instrumentation Facility Available in SICART (1) Field Emission Gun Scanning Electron Microscopy (FEG-SEM) Make:

(13) High Performance Thin Layer Chromatograph (HPTLC)

Camag-Switzerland WinCat

Automatic applicator (Linomat-5) of selectable sample volume. GMP, GLP compliant

image plate scanner-3 and documentation (reproster-3) system.Scane range :( 190nm

to 800nm) Deuterium lamp tungsten lampand mercury lamp.

(14) Ion Chromatography (IC)

Dionex Dx – 600 IC System,

Electrochemical and absorbance detector

For sample separation of ions from one another, lanthanides, sugars, amino acids etc

Page 11: SOPHISTICATED INSTRUMENTATION CENTRE FOR APPLIED … · Sophisticated Instrumentation Facility Available in SICART (1) Field Emission Gun Scanning Electron Microscopy (FEG-SEM) Make:

(15) Gas Chromatography with Head Space

Perkin Elmer, USA, Auto System XL

Detector: FID (100 oC - 450oC), TCD (100 oC - 350oC) Detector, NPD and ECD,

Auto sampler

_____________________________________________________________________

__

(16) Gas Chromatograph with mass spectroscopy (GC-MS)

Perkin Elmer, USA, System XL with NIST Library

Analyser: Single Quadrupole with prefilter, Mass range: 20-650 Daltans (amu), Mass

stability:0.1m/z mass accuracy over 48 hours, Ionization modes: electro ionization

positive / negative, chemical ionization.

Page 12: SOPHISTICATED INSTRUMENTATION CENTRE FOR APPLIED … · Sophisticated Instrumentation Facility Available in SICART (1) Field Emission Gun Scanning Electron Microscopy (FEG-SEM) Make:

(17) Particle Size Analyzer (PSA)

Symantec-HELOS-BF, Germany

Laser Diffraction particle size determination system

Particle size range:0.5µm to 875 µm

Accuracy for Dry and Liquid sample

(18) CHN/S/O Elemental Analyser

2400 Series II, Perkin Elmer, USA,

Analyzed Elements: Carbon, Hydrogen, Nitrogen, Sulfur and Oxygen; Operating

Mode: CHN, CHNS and OXYGEN, Accuracy: 0.3 % abs, Analysis Time: 6 to 8

minutes per sample

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(19) Thermal Analysis (DSC, TGA, STA)

Perkin Elmer, USA, (DSC-PYRIS-1; TGA-7)

Temperature Range: DSC (0°C to 400°C)

TGA (RT to 1000°C)

Sensibility: 0.1 gm (0.0001 mg)

Atmosphere: Nitrogen or Air

(19) STA

Perkin Elmer, USA.

Model- STA 8000.

Specification - Simultaneous analysis of TG with DTA mode and DSC.

Temperature-30°C to 1000°C

Atmosphere: Nitrogen.

Page 14: SOPHISTICATED INSTRUMENTATION CENTRE FOR APPLIED … · Sophisticated Instrumentation Facility Available in SICART (1) Field Emission Gun Scanning Electron Microscopy (FEG-SEM) Make:

(20) Mercury Porosimeter

ThermoQuest, USA, 440 & 140 with ultra Micropore

Operating Pressure:0.1to 400 Mpa,

Measuring Range for Pore Radius:

Pasal 140:1900 to 58,000 nm

Pasal 440: 31.8 to 7,500 nm

(21) Universal Testing Machine (UTM)

Shimadzu, Japan, AG 100 KNG

Capacity:100KN (10000 kgf),Load measuring accuracy :+0.5% of indicated load

,cross head speed range:0.05 to 1000mm/min,Cross head speed precision: :+0.1

,Effective test width :575nm,Load cell of 100KN,1kgf.

Page 15: SOPHISTICATED INSTRUMENTATION CENTRE FOR APPLIED … · Sophisticated Instrumentation Facility Available in SICART (1) Field Emission Gun Scanning Electron Microscopy (FEG-SEM) Make:

(22) Total Organic Carbon (TOC) Analyzer

Shimadzu, Japan, TOC-VCSN/TNM-1

Measurement range: Total Carbon: 0 to 25000 mg/l; Inorganic Carbon: 0 to 3000

mg/l; Total Nitrogen: 0 to 4000 mg/l; Measurement Time: 10 minute per sample

(23) Micro Hardness Tester (MHT)

Shimadzu, Japan, HMV-2T

Maximum load: 19.61 N, Test load range: 10 to 2000 gf in 9 steps. Load duration: 5

second to 999 seconds in 1 sec increment High test measuring accuracy: 0.01 µ

Page 16: SOPHISTICATED INSTRUMENTATION CENTRE FOR APPLIED … · Sophisticated Instrumentation Facility Available in SICART (1) Field Emission Gun Scanning Electron Microscopy (FEG-SEM) Make:

(24) Laser Flash Thermal Diffusivity

NETZSCH, Burlington-MA USA

Temperature Range: Ambient to300 Deg., Standard sample Size: 12.7 mm Diameter.

Thermal Diffusivity Range: 0.001 to 10cm²/S.

Laser Type: Nd glass

Accuracy: Thermal Diffusivity and Specific Heat: +/- 5%

____________________________________________________________________

(25) Ambient Air Quality Monitoring Mobile Van

(Environnment SA, France)

Measurement of Carbon monoxide, Total hydrocarbons, Oxides of nitrogen, Ozone,

Particulate matter, Sulphur dioxide and meteorological parameters

Environmental Analysis/ Monitoring/ Auditing Facilities

Water and wastewater analysis

Solid waste and soil analysis

Stack pollution monitoring

Environmental Audit and Environmental Consultancy Services

Environmental Research & Development

Contact for more information:

Page 17: SOPHISTICATED INSTRUMENTATION CENTRE FOR APPLIED … · Sophisticated Instrumentation Facility Available in SICART (1) Field Emission Gun Scanning Electron Microscopy (FEG-SEM) Make:

Prof. (Dr.) A. R. Jani, Hon. Director

SOPHISTICATED INSTRUMENTATION CENTRE FOR APPLIED

RESEARCH AND TESTING (SICART ) (Sponsored by Department of Science and Technology, Govt. of India, New Delhi)

Sardar Patel Centre for Science and Technology

Vallabh Vidyanagar – 388120, Dist: Anand, Gujarat, INDIA

Phone: +91-2692-234966, +91 9925520338 (M); Fax: +91-2692-238355

E-mail: [email protected]

Ex. Professor-Director

UGC-Human Resource Development Center

(UGC-HRDC) Sardar Patel University & Former Professor and Head & [Dean (Faculty of Science)]

P. G. Department of Physics, Sardar Patel University.

Vallabh Vidyanagar 388 120

Gujarat State, INDIA