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Silicon strip detectors and their readout electronics
Francis Anghinolfi
CERN
1F. Anghinolfi CERN/PH/ESE SeminarDecember 1, 2009
OUTLINE
• Silicon strips detectors for tracking
• (Micro)Electronics for silicon strips
• Strips readout examples
December 1, 2009 F. Anghinolfi CERN/PH/ESE Seminar 2
NB : I will not talk about silicon pixel detectors nor silicon drift detectors …..
Silicon Strips Detectors
• Solid State• ~100% efficient for particle detection• Small (best when ….)
December 1, 2009 F. Anghinolfi CERN/PH/ESE Seminar 3
• No multiplication Small signals, then need smart electronics to detect the signal (large amplification and noise reduction)
• Leakage (DC) current
PROS
CONS
Silicon Strips Detectors
December 1, 2009 F. Anghinolfi CERN/PH/ESE Seminar 4
Solid state
• No gas, no liquid stable material• But as a consequence, subject to radiation degradation
• Benefits from silicon wafer industry environment (access to very pure silicon material, precise alignment machines, clean room technologies etc …)
Silicon Strips Detectors
December 1, 2009 F. Anghinolfi CERN/PH/ESE Seminar 5
Efficiency
SIGNAL if there is PARTICLEDetection Efficiency close to 100%
Charge is always generated by a MIP crossing particle
Silicon Strips Detectors
December 1, 2009 F. Anghinolfi CERN/PH/ESE Seminar 6
Efficiency
SIGNAL if there is PARTICLEDetection Efficiency close to 100%
Inefficiency may result from :Insensitive areas (edges)Charge sharingTraps or defect
Silicon Strips Detectors
December 1, 2009 F. Anghinolfi CERN/PH/ESE Seminar 7
Signal formation in Silicium
• High Energy Particle deliver signal in the depletion region, by electron hole pair creation. Positive and negative charges drift in presence of the applied electric field
++++ - -
- - -
c
Silicon Strips Detectors
December 1, 2009 F. Anghinolfi CERN/PH/ESE Seminar 8
Signal formation in Silicium
• The depletion region is obtained by applying a voltage between top and bottom of the detector
• For large voltage and small doping concentration it is possible to obtain the depletion of the full volume
Silicon Strips Detectors
December 1, 2009 F. Anghinolfi CERN/PH/ESE Seminar 9
Signal formation in Silicium
The diode (p-type over n-type bulk in this figure) is needed to block direct current path.Direct current path could be as high as mA per strips ( a killer for signal detection)
The diode is reverse biased. The dynamic signal from particle track is sensed through the capacitance of the blocking diode
Silicon Strips Detectors
December 1, 2009 F. Anghinolfi CERN/PH/ESE Seminar 10
Signal formation in Silicium
• The signal is formed by electron-hole pair creation along the track path
• for a fully depleted silicon volume 300 um thick the average signal is around 22000 electrons (3.5 fC)
The energy loss for a Minimum Ionizing Particle (MIP) is around 260eV/um for 300um thick silicon. One e-h pair creation energy in silicon is 3.62 eV
Silicon Strips Detectors
December 1, 2009 F. Anghinolfi CERN/PH/ESE Seminar 11
Charge sharing
Particle track through Si material
e-e-
e-e-
e-e-
Strip length
Strip pitchCollected Charge quantity depends on the depleted silicon thickness
In case of track angle the charge distributes on adjacent strips
The charges are drifting along the electrical field toward the strips. The electronics channels are connected to the strips (directly or through decoupling capacitors)
Silicon Strips Detectors
December 1, 2009 F. Anghinolfi CERN/PH/ESE Seminar 12
Signal formation in Silicium
• The collection time is usually below 10ns for electrons (drifting to one side) and below 25ns for holes (drifting the other side)
• Good time resolution is also possible (~ few ns range, OK for LHC with 25ns bunch interval)
Silicon Strips Detectors
December 1, 2009 F. Anghinolfi CERN/PH/ESE Seminar 13
The Signal is small
For example read the signal on 50 ohms resistor : Typical 3.5fC delivered on 50 ohms in ~10ns results in peak voltage of 17uV
The voltage noise of the 50 ohms resistor in the bandwidth required for signal is ~ 3.5uV rms
The ratio (5), is not enough to provide safe signal detection (additional noise sources, charge sharing etc …)
Silicon Strips Detectors
December 1, 2009 F. Anghinolfi CERN/PH/ESE Seminar 14
The sensing geometry (strip size) can be small
• Small is good for tracking detectors : 10-20um position resolution attainable (less for pixels)
• Small geometry is beneficial for the signal detection electronics ….
Silicon Strips Detectors
December 1, 2009 F. Anghinolfi CERN/PH/ESE Seminar 15
Small is good for the detection
• Small areas are obtained by the detector segmentation• There is no signal loss (dead areas) even with segmented detectors• Small areas have less leakage current and less capacitance, 2 key items which improve the signal detection (signal over noise ratio SNR)
Silicon Strips Detectors
December 1, 2009 F. Anghinolfi CERN/PH/ESE Seminar 16
Example : Segmented detector
1280 strips on ~ 10 cm
4 rows of 2.5cm long strips
2,5cm
This detector is made of 4 rows of 1280 strips of length 2,5cm. The strip pitch (horizontal axis) is 80um. The expected resolution is 23 um in X.
(Development for ATLAS upgrade, KEK, Japan)
Silicon Strips Detectors
December 1, 2009 F. Anghinolfi CERN/PH/ESE Seminar 17
What we know about electronics for Silicon Strips
• Has to deal with small signal and leakage current
• Small detector segments have less leakage current and less capacitance, 2 key items which improve the signal detection (signal over noise ratio SNR)
• But more channels to cover a fixed detecting area : It creates a trade-off between power (nbe of channels) versus SNR
Readout Electronics
December 1, 2009 F. Anghinolfi CERN/PH/ESE Seminar 18
The electronics circuit is necessary for :
signal amplification (signal multiplication factor)
noise rejection
signal “shaping”
Impedance adaptation
Typical “front-end” elements
Final objective :
Signal detection
Amplitude measurement
Time measurement
Z+
-
Particle Detector
Electronic Circuit
Rp
Readout Electronics
December 1, 2009 F. Anghinolfi CERN/PH/ESE Seminar 19
Circuit
Low Z output voltage source circuit can drive any load
Output signal shape adapted to subsequent stage (T/H, ADC, Discriminator)
Signal shaping is used to reduce noise vs. signal
ZoZ+
-
High Z
Low Z
Low Z
T
Voltage source
• Impedance adaptation• Amplitude resolution• Time resolution• Noise cut
Rp
Readout Electronics
December 1, 2009 F. Anghinolfi CERN/PH/ESE Seminar 20
x(f) y(f)
x(f)f
y(f)f
h(f)
f
Noise floor(white)
f0
f0
f0Improved Signal/Noise
Ratio
Example of signal filtering : the above figure shows a « standard » filter case, where only noise is filtered out.
Readout Electronics
December 1, 2009 F. Anghinolfi CERN/PH/ESE Seminar 21
x(f) y(f)
x(f)
f f
h(f)
f
Noise floor
f0
f0Improved Signal/Noise
Ratio
In particle physics, the input signal, from detector, is often a very fast pulse, similar to a “Dirac” pulse. Therefore, its frequency representation is over a large frequency range.The filter (shaper) provides a limitation in the signal bandwidth and therefore signal shape at the filter output is different from the input signal shape.
The output signal shape, different from the input detector signal shape, is chosen to optimize the Signal-to-Noise Ratio
• Doing this there is a trade-off btw. SNR, power and pile-up
y(f)
Readout Electronics
December 1, 2009 F. Anghinolfi CERN/PH/ESE Seminar 22
ff0
ff0
Filter cuts noise. Signal BW is preserved
Filter cuts inside signal BW : modified shape
Readout ElectronicsPreamplifier Shaper
(t) Q/C.(t)
I O
What are the functions of preamplifier and shaper (in ideal world) :
• Preamplifier : is an ideal integrator : it detects an input charge burst Q
(t). The output is a voltage step Q/C.(t). Has large signal gain such that noise of subsequent stage (shaper) is negligeable.
• Shaper : a filter with : characteristics fixed to give a predefined output signal shape, and rejection of noise frequency components which are outside of the signal frequency range.
December 1, 2009 23F. Anghinolfi CERN/PH/ESE Seminar
Readout Electronics
24
5 10 15 20 25 30 35
0.02
0.04
0.06
0.08
0.1
2 4 6 8 10
-0.005
-0.0025
0.0025
0.005
0.0075
0.01
Preamplifier Shaper
(t)
1/s RCs /(1+RCs)5x
I O
T.F. from I to O
= = RC/(1+RCs)5
Output signal of preamplifier + shaper with “ideal” charge at the input
t
1 2 3 4 5
0.2
0.4
0.6
0.8
1
t
0.2 0.5 1 2 5 100.1
0.2
0.5
1
2
5
f
t
RCtettO /
4
4
RC
1)(
0.001 0.0050.01 0.05 0.1 0.5 1
0.0001
0.0002
0.0005
0.001
0.002
0.005
0.01
0.02
f
CR_RC4 shaper
Ideal Integrator
Q/C.(t)
December 1, 2009 F. Anghinolfi CERN/PH/ESE Seminar
Readout Electronics
5 10 15 20
0.01
0.02
0.03
Preamplifier Shaper
CR_RC shaperNon-Ideal Integrator(t)
1/(1+T1s) RCs /(1+RCs)2
I O
x
Non ideal shape, long tail
Integrator baseline
restoration
December 1, 2009 25F. Anghinolfi CERN/PH/ESE Seminar
Readout Electronics
2 4 6 8 10 12 14
0.025
0.05
0.075
0.1
0.125
0.15
0.175
Preamplifier Shaper
(t)
1/(1+T1s) (1+T1s) /(1+RCs)2
Pole-Zero Cancellation
I O
T.F. from I to O x
CR_RC shaperNon-Ideal Integrator
Ideal shape, no tail
Integrator baseline
restoration
December 1, 2009 26F. Anghinolfi CERN/PH/ESE Seminar
Readout ElectronicsPile-up
• The detector pulse is transformed by the front-end circuit to obtain a signal with a finite return to zero time
2 4 6 8 10 12 14
0.025
0.05
0.075
0.1
0.125
0.15
0.175
5 10 15 20 25 30 35
0.02
0.04
0.06
0.08
0.1
CR-RC :Return to baseline > 7*Tp
CR-RC4 :Return to baseline < 3*Tp
December 1, 2009 27F. Anghinolfi CERN/PH/ESE Seminar
1 2 3 4 5 8 7
1 2 3
Readout Electronics
For the requirement of strips readout for the LHC experiments, the shaping (peaking) time should be in the order of 25 ns
It allows discrimination of events as close as 75ns
With the CR-RCn circuits as described above, it is difficult to trade 25ns peaking time with low power circuit
December 1, 2009 28F. Anghinolfi CERN/PH/ESE Seminar
Readout Electronics
Different solutions have been implemented to realize low power and fast (25ns) shaping time for the LHC experiments:
• transimpedance amplifiers
• analog signal processing
December 1, 2009 29F. Anghinolfi CERN/PH/ESE Seminar
Readout ElectronicsTransimpedance Amplifier
Cd
Rf
Detector model
Amplifier
Resistive feedback element
Vout
iin(t)
December 1, 2009 30F. Anghinolfi CERN/PH/ESE Seminar
s.Rf.Cd1
Rf
i
vout
in
The main pole is function of the detector input capacitance
Other poles are coming from the amplifier open-loop transfer function.
The preamplifier does a fraction of the shaping function
But this circuit is critically stable and needs careful design
The feedback element Rf contributes to the noise
A
For ideal Amplifier A
Readout ElectronicsAnalogue Signal Processing
programmable gain
charge preamplifier
shaper
analoguepipeline
1 of the 128 channels
SFSF
unity gain inverter
S/H
APSP
differentialcurrentoutput stage
128:1 MUX
500400300200100
0250200150100500
December 1, 2009 31F. Anghinolfi CERN/PH/ESE Seminar
50ns shaperCharge preamp
Analog Processor, 25ns shaping time
The fast shaping is applied only to selected samples of the signal, therefore there is a gain in power
Analogue sampling and storage
Readout ElectronicsThe Signal-to-Noise Ratio
2vna
Rp
G(f)
Cd2qIshot
4kTRp
Rs 4kTRs
December 1, 2009 32F. Anghinolfi CERN/PH/ESE Seminar
Whatever is the solution choosen to realize the shaping function, the overall Signal-to-Noise depends on the overall electronics circuit transfer function up to the measurement output
The signal is from the detector, the noises are from the active (transistor, diode) and passive (resistors) elements
Diode(for strips : reverse bias diode)
Resistance in parallel
Resistance in serie
Input transistor (under assumption that load does not contribute, and that the input gain stage is high enough to neglect 2nd stages contribution…)
Readout ElectronicsThe Signal-to-Noise Ratio
2vna
Rp
G(f)
Cd2qIshot
4kTRp
Rs 4kTRs
December 1, 2009 33F. Anghinolfi CERN/PH/ESE Seminar
In case of strips :
Strip capacitance
Reverse bias diode leakage
Bias resistors
Not present
Input device “channel” noise
Front-end circuit with shaping time constant
Readout ElectronicsThe Signal-to-Noise Ratio
• All noise contributions are calculated in terms of noise voltage appearing at the input of the amplifier
• Noise sources are from detector element and from amplifier.
4 noise sources are considered here :
1. Ishot current in diode (leakage current in Si Detector element )
2. Rp noise, (any) resistance in parallel to the input3. Rs noise, (any) resistance in serie with the input4. V2
na equivalent input noise of the input device of the amplifier
December 1, 2009 34F. Anghinolfi CERN/PH/ESE Seminar
Readout ElectronicsThe Signal-to-Noise Ratio
22
2
22 42
4
8d
nashotp
CVkTRsqI
R
kT
q
eENC
2vna
Rp
G(f)
Cd2qIshot
4kTRp
Rs 4kTRs
December 1, 2009 35F. Anghinolfi CERN/PH/ESE Seminar
A formulation of the noise in “electrons” is given here for the CR-RC2 transfer function G(f)
The signal-to noise ratio is computed by division of the signal expressed in electrons by the ENC calculated with the formula
is the shaping time (0 to peak) of the CR_RC2 shaping function
V2na is the equivalent
voltage noise source of the amplifier input device
gmkTvna
1
3
242
gm is proportional to the square root of the current in the input device
Readout ElectronicsThe Signal-to-Noise Ratio
21
222
3
24.
4. d
p
Cgm
q
kTFs
Rq
kTFpENC
0.340.360.400.450.510.630.92Fp
7654321n
1.271.161.110.990.950.840.92Fs
7654321n
December 1, 2009 36F. Anghinolfi CERN/PH/ESE Seminar
CR-RCn “n” factor dependance
Formulation without diode current, without Rs Small detector segment
Shaping time trade-off
Increase transistor current (power !)
To reduce ENC
Readout ElectronicsThe Signal-to-Noise Ratio
C=5pF
C=10pF
C=15pF
Shaping time (ns)
ENC dependence to the shaping time (C=10pF, gm=10mS, R=100Kohms)
optimum
Shaping time (ns)
December 1, 2009 37F. Anghinolfi CERN/PH/ESE Seminar
ENC (el.) ENC (el.)
Readout ElectronicsThe Power vs. other parameters trade-off
Numerical example :
Target 10pF detector, ENC as 500el. =25ns, V= 2.5V P = 0.32mW (strips typical)
Target 0.2pF detector, ENC as 120el. =25ns, V= 2.5V P = 3 W (pixel case)
December 1, 2009 38F. Anghinolfi CERN/PH/ESE Seminar
This (approximate, don’t use it in real life !) equation shows the relationship btw. the front-end power (input branch only !), detector capacitance and noise performance
Readout System for highly segmented Si Strips detectors
APV25 description
December 1, 2009 39F. Anghinolfi CERN/PH/ESE Seminar
8.1 mm
7.1m
m
pipeline
128x192
128
x p
ream
p/sh
aper
AP
SP
+ 1
28:1
MU
X
pipe logicbias gen.
CAL FIF
O
controllogic
The CMS silicon tracker analogue architecture; 128 channels of preamplifier/shaper followed by one analogue memory (pipeline) bank.
The APSP is the final “fast” shaping circuit, acting on selected signal samples
The readout is analogue : reading amplitude allows to measure charge sharing across adjacent strips
Readout System for highly segmented Si Strips detectors
ABCD/N description
December 1, 2009 40F. Anghinolfi CERN/PH/ESE Seminar
The ATLAS silicon tracker binary architecture; 128 channels of preamplifier/shaper/comparator with two memory banks, one for trigger latency and one readout buffer
The readout is binary (either above or below a programmable threshold). Low threshold setting is required to not loose signal in case of charge sharing
Readout System for highly segmented Si Strips detectors
Beetle FE chip
December 1, 2009 41F. Anghinolfi CERN/PH/ESE Seminar
The LHCb VELO frontend chip tracker has128 channels of preamplifier/shaper/discriminator followed by one analogue memory (pipeline) bank. Either analogue or binary data is stored into the pipeline.
The readout is analogue but both amplitude or binary information can be readout.
Readout System for highly segmented Si Strips detectors
Performance and system aspects for the LHC experiments
Parameter Number
Spatial precision 20 um range
Channel count ~10M (CMS, ATLAS)
Channel power 3-5 mW
SNR Above 10 after radiation damage
Linearity a few MIPs
Long term performance Should work for 10 “LHC years”
Radiation tolerance LHC radiation levels ~10Mrad and 2 10^14 eqvlt 1MeV neutrons
December 1, 2009 42F. Anghinolfi CERN/PH/ESE Seminar
Readout System for highly segmented Si Strips detectors
PHOTOS
December 1, 2009 43F. Anghinolfi CERN/PH/ESE Seminar
The VELO tracker detector of LHCb:
The electronics (Beetle) are on the PCB circling around the radial strips
Readout System for highly segmented Si Strips detectors
PHOTOS
December 1, 2009 44F. Anghinolfi CERN/PH/ESE Seminar
The CMS tracker module :
Two large planes detectors are connected together by bonding to get long strips (20cm).
The electronics (APV25) are on the small PCB at the end of the silicon detector
Readout System for highly segmented Si Strips detectors
PHOTOS
December 1, 2009 45F. Anghinolfi CERN/PH/ESE Seminar
View of one fraction of the CMS tracker, showing detecting planes and the associated electronics and cabling
Readout System for highly segmented Si Strips detectors
PHOTOS
December 1, 2009 46F. Anghinolfi CERN/PH/ESE Seminar
View of one disk of the CMS tracker end-cap: detectors with strips form a “V” shape
Readout System for highly segmented Si Strips detectors
December 1, 2009 47F. Anghinolfi CERN/PH/ESE Seminar
View of one barrel of the ATLAS SCT tracker.
Readout System for highly segmented Si Strips detectors
PHOTOS
December 1, 2009 48F. Anghinolfi CERN/PH/ESE Seminar
Details of the electronics FE parts on the ATLAS barrel modules
December 1, 2009 F. Anghinolfi CERN/PH/ESE Seminar 4949
Silicon strips are candidate for the LHC experiments upgrade
SLHC ATLAS expected Tracker Occupancy (P. Nevski)
• Outer Layers – long strips– 2 Layers R= 81.4, 95.4 cm – Granularity 12 cm x 80 um – Z length 2x190 cm
• Middle Layers – short strips– 3 layers at R=38, 47.3, 57.4
cm– Granularity 3 cm x 80 um– Z length 2x100 cm
Example of Barrel layoutR. Nickerson, Oxford
Section of projected SI Tracker geometry(Nov.08)
Barrel Disks
December 1, 2009 F. Anghinolfi CERN/PH/ESE Seminar 5050
Service bus
TTC, Data & DCS fibers
PS cable
DCS env. IN
Cooling In
Opto
SC
DCSinterlock
SMC Hybrid
Module #1 Module #2 Module #12
Cooling Out
~1.2m
MC MC MC MC MC MC
ABCN-25 : Silicon Strip Module/Stave Readout Concept (ATLAS)
~ 1.2 meter
Cross section
Carbon Honeycomb Cooling PipeSensor, Hybrid, ASIC
61440 strips on each side
10 c
m