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PROCEEDINGS OF SPIE ... PROCEEDINGS OF SPIE Volume 9525 Proceedings of SPIE 0277-786X, V. 9525 SPIE is an international society advancing an interdisciplinary approach to the science

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  • PROCEEDINGS OF SPIE

    SPIEDigitalLibrary.org/conference-proceedings-of-spie

    Front Matter: Volume 9525

    , "Front Matter: Volume 9525," Proc. SPIE 9525, Optical Measurement Systems for Industrial Inspection IX, 952501 (22 June 2015); doi: 10.1117/12.2197953

    Event: SPIE Optical Metrology, 2015, Munich, Germany

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  • PROCEEDINGS OF SPIE

    Volume 9525

    Proceedings of SPIE 0277-786X, V. 9525

    SPIE is an international society advancing an interdisciplinary approach to the science and application of light.

    Optical Measurement Systems for Industrial Inspection IX Peter Lehmann Wolfgang Osten Armando Albertazzi G. Jr. Editors 22–25 June 2015 Munich, Germany Sponsored by SPIE Cooperating Organisations European Optical Society German Scientific Laser Society (Wissenschaftliche Gesellschaft Lasertechnik e.V.) Published by SPIE

    Optical Measurement Systems for Industrial Inspection IX, edited by Peter Lehmann, Wolfgang Osten, Armando Albertazzi G. Jr., Proc. of SPIE Vol. 9525, 952501

    © 2015 SPIE · CCC code: 0277-786X/15/$18 · doi: 10.1117/12.2197953

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  • The papers included in this volume were part of the technical conference cited on the cover and title page. Papers were selected and subject to review by the editors and conference program committee. Some conference presentations may not be available for publication. The papers published in these proceedings reflect the work and thoughts of the authors and are published herein as submitted. The publisher is not responsible for the validity of the information or for any outcomes resulting from reliance thereon. Please use the following format to cite material from this book: Author(s), "Title of Paper," in Optical Measurement Systems for Industrial Inspection IX, edited by Peter Lehmann, Wolfgang Osten, Armando Albertazzi G. Jr., Proceedings of SPIE Vol. 9525 (SPIE, Bellingham, WA, 2015) Article CID Number. ISSN: 0277-786X ISBN: 9781628416855 Published by SPIE P.O. Box 10, Bellingham, Washington 98227-0010 USA Telephone +1 360 676 3290 (Pacific Time)· Fax +1 360 647 1445 SPIE.org Copyright © 2015, Society of Photo-Optical Instrumentation Engineers. Copying of material in this book for internal or personal use, or for the internal or personal use of specific clients, beyond the fair use provisions granted by the U.S. Copyright Law is authorized by SPIE subject to payment of copying fees. The Transactional Reporting Service base fee for this volume is $18.00 per article (or portion thereof), which should be paid directly to the Copyright Clearance Center (CCC), 222 Rosewood Drive, Danvers, MA 01923. Payment may also be made electronically through CCC Online at copyright.com. Other copying for republication, resale, advertising or promotion, or any form of systematic or multiple reproduction of any material in this book is prohibited except with permission in writing from the publisher. The CCC fee code is 0277-786X/15/$18.00. Printed in the United States of America. Publication of record for individual papers is online in the SPIE Digital Library.

    SPIEDigitalLibrary.org

    Paper Numbering: Proceedings of SPIE follow an e-First publication model, with papers published first online and then in print. Papers are published as they are submitted and meet publication criteria. A unique citation identifier (CID) number is assigned to each article at the time of the first publication. Utilization of CIDs allows articles to be fully citable as soon as they are published online, and connects the same identifier to all online, print, and electronic versions of the publication. SPIE uses a six-digit CID article numbering system in which:

    The first four digits correspond to the SPIE volume number. The last two digits indicate publication order within the volume using a Base 36 numbering

    system employing both numerals and letters. These two-number sets start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B … 0Z, followed by 10-1Z, 20-2Z, etc.

    The CID Number appears on each page of the manuscript. The complete citation is used on the first page, and an abbreviated version on subsequent pages.

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  • Contents Part One xi Authors xv Conference Committee xix Introduction SESSION 1 RESOLUTION-ENHANCED TECHNIQUES 9525 02 Ultra-precision optical metrology using highly controlled fiber-based frequency combs

    (Invited Paper) [9525-1] 9525 03 Deterministic phase retrieval employing spherical illumination [9525-2] 9525 04 Digital super-resolution microscopy using example-based algorithm [9525-3] 9525 06 3D optical metrology and super-resolution microscopy with structured illumination based

    on QXGA (2048×1536) resolution [9525-135] SESSION 2 INTERFEROMETRIC TECHNIQUES 9525 07 Dual spectrally resolved interferometry to improve measurement range [9525-6] 9525 08 Full-field and contact-less topography of nanometric thin films based on multiwavelength

    interferometry [9525-7] 9525 09 Novel dispersion tolerant interferometry method for accurate measurements of

    displacement [9525-8] 9525 0B Spatial-frequency analysis algorithm for in-situ measurement of wavefront [9525-10] SESSION 3 OCT AND FIBER SENSORS 9525 0F Robust fiber optic flexure sensor exploiting mode coupling in few-mode fiber [9525-14] 9525 0H Distributed fiber optic sensor employing phase generate carrier for disturbance detection

    and location [9525-16]

    iii

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  • SESSION 4 DIGITAL HOLOGRAPHY 9525 0I Resolution enhancement in phase imaging by using modulated illumination (Invited Paper)

    [9525-169] 9525 0J Sparsity promoting automatic focusing in digital holography [9525-18] 9525 0K Holographic position measurements of an optically trapped nanoparticle [9525-19] 9525 0L Color holograms synthesis framework for three-dimensional scene reconstruction [9525-20] 9525 0M Off-axis illumination in object-rotation diffraction tomography for enhanced alignment and

    resolution [9525-21] SESSION 5 WHITE-LIGHT INTERFEROMETRY 9525 0N A new class of wide-field objectives for 3D interference microscopy [9525-22] 9525 0O Interferometric measuring system for cone inspection on shop-floor level [9525-23] 9525 0P Cross-linking characterization of polymers based on their optical dispersion utilizing a

    white-light interferometer [9525-24] 9525 0Q Robust vertical scanning white-light interferometry in close-to-machine applications

    [9525-25] 9525 0R Development of a compact low coherence interferometer based on GPGPU for fast

    microscopic surface measurement on turbine blades [9525-26] SESSION 6 SPECKLE AND SHEARING INTERFEROMETRY 9525 0T Robust speckle metrology for stress measurements outside the lab (Invited Paper) [9525-28] 9525 0U Reduction of phase singularities in speckle-shearing interferometry by incoherent

    averaging of speckle patterns [9525-29] 9525 0V Bending stress determination in pipes using a radial in-plane digital speckle pattern

    interferometer combined with instrumented indentation [9525-30] 9525 0W Influence of error sources in speckle interferometry using only two speckle patterns

    [9525-31] 9525 0X A calibration method of self-referencing interferometry based on maximum likelihood

    estimation [9525-32]

    iv

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  • SESSION 7 CONFOCAL AND WLI TECHNIQUES 9525 0Y Multiplex acquisition approach for high speed 3D measurements with a chromatic

    confocal microscope [9525-33] 9525 0Z Multi-scale roughness measurement of cementitious materials using different optical

    profilers and window resizing analysis [9525-34] 9525 10 Calibration of z-axis linearity for arbitrary optical topography measuring instruments

    [9525-163] 9525 11 Surface topography measurement based on color images processing in white light

    interferometry [9525-36] SESSION 8 FRINGE PROJECTION AND 3D IMAGING 9525 12 Automatic complete high-precision optical 3D measurement of air cooling-holes of gas

    turbine vanes for repair [9525-37] 9525 13 Endoscopic fringe projection for in-situ inspection of a sheet-bulk metal forming process

    [9525-38] 9525 14 Long wave infrared 3D scanner [9525-39] 9525 15 Experimental comparison of laser speckle projection and array projection for high-speed

    3D measurements [9525-40] 9525 16 Development of a photogrammetry system for the measurement of rotationally symmetri

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