Upload
nguyendung
View
227
Download
0
Embed Size (px)
Citation preview
Electronics- lectures for Mechanical Engineering
part 2
Dr. Bogusław Boratyński
Faculty of Microsystems Electronics and Photonics,
Wroclaw University of Technology,
2011
From the course syllabus
Basic literature & figure sources:
G. Rizzoni, Fundamentals of Electrical Engineering, McGraw-Hill
R.F. Pierret, Semiconductor Device Fundamentals, Addison-Wesley Publ.,
B.G. Streetman, Solid State Electronic Devices, Prentice-Hall,
D. Bell, Fundamentals of Electric Circuits, Oxford Univ. Press,
T. Mouthaan, Semiconductor Devices Explained, John Willey&Sons
Additional literature:
W. Marciniak, Przyrządy półprzewodnikowe i układy scalone, WNT,
A. Świt, J. Pułtorak, Przyrządy półprzewodnikowe, WNT,
B.G. Streetman, Przyrządy półprzewodnikowe, WNT
Semiconductor devices
Chapter 3 Electronic devices.
3.1 The p-n junction. Semiconductor diodes.
The p-n junction operation principle.
The Shockley equation – the I-V characteristic.
Ideal and real diodes. Temperature effects.
Bias - operating point. Small signal models.
Breakdown in the junction – Zener diode.
Photodiodes and photovoltaic cells.
Metal-semiconductor contact - the Schottky diode.
Rectifier and voltage regulator circuits.
The p-n diode fabrication
Source: R.F. Pierret, Semiconductor Device Fundamentals, Addison-Wesley Publishing Comp.
Photolithography process
The ideal p-n junction
A real diode and the ideal p-n junction model
- external bias voltage VA
Source: R.F. Pierret, Semiconductor Device Fundamentals, Addison-Wesley Publishing Comp.
In p-type sc.:
majority carriers
- holes
In n-type sc.:
majority carriers
- electrons
A-anode
p-type
K-cathode
n-type
symbol
The ideal p-n junction electrostatics
Source: R.F. Pierret, Semiconductor Device Fundamentals, Addison-Wesley Publishing Comp.
W - the depletion region
(junction region) width
Vo < Eg /q
Typical values: Vo (Eg)
Ge: 0.4V (0.7eV)
Si: 0.7V (1.1eV)
Build-in potential,
or diffusion barrier,
or contact potential
in the p-n junction
Electric field
E
majority
holes
majority
electrons
Forward bias:
diffusion of
majority
carriersReverse bias:
drift of
minority
carriers
Vo
actual barrier
Vo - VA < Vo
actual barrier
Vo + |VA| > Vo
VA >0
VA <0
E
E
The ideal p-n junction at equilibrium and under bias
Energy band models under external bias voltage - VA
minority
holes
I-V characteristic
minority
electrons
Source: R.F. Pierret, Semiconductor Device Fundamentals, Addison-Wesley Publishing Comp.
Energy band models – another view
a p-n junction formation a p-n junction under bias
Source: T. Mouthaan, Semiconductor Devices Explained,
John Willey&Sons
The ideal p-n junction under bias
The Shockley equation - current-voltage dependence in the p-n junction
Io =const. - saturation current ( due to minority carriers flow)
Source: R.F. Pierret, Semiconductor Device Fundamentals, Addison-Wesley Publishing Comp.
ln(I) - V
characteristic
exponential function dependence in forward direction
kT/q = 26 mV
@ T=300K
Temperature influence on the I-V characteristic
The Shockley equation – temperature dependence
Io =const. If T=const. but, if T then Io
Temperature coefficients (TC):
Forward voltage - Voltage TC
dV/dT = -2 mV/K @ I=const.
Reverse current - Current TC
(dI/dT)(1/I) = +10%/K @ V=const.
every dT=10K the reverse current doubles
Example (Si diode) at forward bias: dT=70K
at 25 C VA = 620mV @ I = const. (1mA)
at 95 C VA =620mV + 70K · (-2 mV/K) = 620mV - 140mV=
=480mV = 0.48V dVA = -140mV
Example at reverse bias:
at 25 C Irev = 10nA @ VA = const. (-20V)
at 95 C Irev = 27 x 10nA = 128 x 10nA= 1.28 A
kT/q = 26 mV
only @ T=300K
Application:
Diode as a temperature sensor.
A real p-n junction under bias
The Shockley equation + breakdown phenomena at reverse bias
Source: R.F. Pierret, Semiconductor Device Fundamentals,
Addison-Wesley Publishing Comp.
Source: B.G.Streetman, Solid State Electronic Devices,
Prentice Hall.
Breakdown – rapid current increase
a typical
Si diode
I-V curve
A real p-n junction under bias
The Shockley equation gives a good aproximation of the forward I-V curve.
Source: B.G.Streetman, Solid State Electronic Devices,
Prentice Hall.
The diffusion barrier
(junction built-in potential):
Vo < Eg /q
Typical values: Vo (Eg)
Ge: 0.4V (0.7eV)
Si: 0.7V (1.1eV)
GaAs: 1.0V (1.4eV) The „knee voltage” value vs. Eg
similar to Vo- Eg dependence
„knee voltages”
A real p-n junction under bias
Source: R.F. Pierret, Semiconductor Device Fundamentals,
Addison-Wesley Publishing Comp.
Source: B.G.Streetman, Solid State Electronic Devices,
Prentice Hall.
The Shockley equation + additional Rec. - Gen. currents
Junction breakdown – rapid
current increase
- generation
current
Additional
junction
currents:
- recombination
current
A real p-n diode
BAV19 diode
I-V measurements
Io = Ig – generation current
at reverse bias
n –ideality factor
n {1,2}
value dependent on
recombination current
at forward bias
Absolute Maximum Rating from the datasheet:
IF=500mA - dc forward current
VR = 100V - dc reverse voltage
Tj=175C - junction temperature
A real p-n diode
Fairchild BAV19, -20, -21 diodes
DC circuit analysis
The load line concept Finding the operating point - Qpoint
Source: G. Rizzoni, Fundamentals of Electrical Engineering,
McGraw-Hill
from KVL:
VT= RT iD + vD
and the load line equation is:
iD = -(1/ RT) vD + VT /RT
Operating point is;
iD = 21mA , vD = 1.0 V
Small signal equvalent model of a diode
From the Shockley equation:
Source: R.F. Pierret, Semiconductor Device Fundamentals,
Addison-Wesley Publishing Comp.
Source: B.G.Streetman, Solid State Electronic Devices,
Prentice Hall.
g = dI/dU = IQ/(kT/q) = IQ/26mV
g-1 = rd - dynamic resistance of the diode
Ctotal - capacitances of a diode
Rseries - parasitic series resistances
Valid for
low frequency:
f<100kHz
Valid for
high frequency:
f>100kHz
g-1 = rd
Rseries
Qp1
Qp2
slope=
g2
slope = g1
Values of the model components depend
on the operating point Q (the applied bias),
excluding Rseries
original single electron
original single electron1+3 electrons
+3 holes
P-N junction breakdown phenomena
Zener breakdown (electron tunneling)
Source: R.F. Pierret, Semiconductor Device Fundamentals,
Addison-Wesley Publishing Comp.
avalanche breakdown
(carrier multiplication)
small voltage bias
no breakdown
large voltage bias
E E
A Zener diode – voltage regulator device
The Zener diode operates at the breakdown at a given voltage Vz
The I-V curve - makes the output voltage constant at Vz
Source: B.G.Streetman, Solid State Electronic Devices,
Prentice Hall.
Vz = Zener breakdown voltage
Izm - max. current value
large ripples small ripples
Vz = const.
Input voltage Output voltage
Izm ------------
Rs
Voltage regulator circuit
+_
Vz examples
3.3 V
5 V
6.3 V
9.1 V
12 V
15 V
24 V
91 V
BZX85C9V1
BZX85B12tolerance:
C - 5%
B - 2%
Forward
„self biased”
Solar cell
A photodiode structure
Source: R.F. Pierret, Semiconductor Device Fundamentals,
Addison-Wesley Publishing Comp.
Reverse biased
photodiode
photons
G - flux of photons
Optical absorption in a photodiode
I-V characteristic of illuminated diode
Photon absorption mechanism
Source: T. Mouthaan, Semiconductor Devices Explained,
John Willey&Sons.
0
depletion region
with an electric field
el. field
profile
photon
absorption
- optical absorption constant of the material
Photon absorption
Optical spectrum and the absorption edge λG for various semiconductors
Source: R.F. Pierret, Semiconductor Device Fundamentals,
Addison-Wesley Publishing Comp.
GaN
IRUV
AlGaAs InGaAs
λG [ m]=1.24/Eg [eV]
A photodiode structure
Optical absorption in a photodiode
Source: R.F. Pierret, Semiconductor Device Fundamentals,
Addison-Wesley Publishing Comp.
Reverse biased photodiode
photons
Solar cells
Source: R.F. Pierret, Semiconductor Device Fundamentals,
Addison-Wesley Publishing Comp.
Solar cell becomes forward biased due to illumination – no external bias applied
- power source or power converter
- photocurrent
Forward bias: V>0, but I<0
P= I U < 0 - source of power
Forward
„self biased”
Solar cell
G - flux of photons
I-V characteristics of an illuminated diode
Reverse biased
photodiode
P>0 P<0
Solar cells
Source: R.F. Pierret, Semiconductor Device Fundamentals,
Addison-Wesley Publishing Comp.
Solar cell operationSolar spectum: AM1 - outside atm.
AM 1.5 - av. terrestrial P=100mW/cm sq.
Efficiency:
FF - fill factorPin = Psun
= 5…..15…..30……40 [%}
= 5% amorphous sc.
= 10% polycrystalline sc.
= 20% single crystal sc.
= 35% multi-junction cells
= 40% concentrated sunlight
Max. power point
- operating point
slope
1/R load
R load
Vm
Im
A metal - semiconductor junction
Source: Source: B.G.Streetman, Solid State Electronic Devices, Prentice Hall. Source: J. Singh, Semiconductor Devices , John Willey&Sons
ohmic contact
- small resistance
a Schottky junction
rectifying contact – a diode
- saturation current
thermionic current
Metal Semiconductor
Metal Semiconductor
p-n
diode
General rectifier circuits
Full-wave rectifier circuitHalf-wave rectifier circuit source voltage (f=60Hz, T=1/f=16.7ms)
Source: G.Rizzoni, Fundamentals of Electrical Eng., McGraw-Hill
Rectifier circuits + filtering
Bridge rectifier circuit
Source: G.Rizzoni, Fundamentals of Electrical Eng., McGraw-Hill
1k
RL
1k
RL
Rectifier circuits - constant voltage power supply
DC power supply circuit
Source: G.Rizzoni, Fundamentals of Electrical Eng., McGraw-Hill
Bridge rectifier circuit
large ripples small ripples
Vz = const.
Input voltage Output voltage
Izm ------------
Rs
voltage regulator (Zener diode)
Diodes and their applications
Different types of diodes - summary
Zener diode - voltage regulators
General purpose diode (rectifying, switching)
Electroluminescent diode, LED – display, indicator, lamps
Varactor diode - tuned circuits
Schottky diode (metal-semiconductor diode) – rectifying,
switching also in microwave circuits
Photodiode – photodetector, photovoltaic cell, solar cell