Embed Size (px)
H. WONGONG
Department of Electronic EngineeringCity University of Hong Kong
83 Tat Chee AvenueKowloon
Hong Kong(Tel: +852 2788 7722; Fax: +852 2788 7791;
E-mail: [email protected])
R. MENOZZIENOZZI
Dipartimento di Ingegneriadell’Informazione
Universita’ di ParmaParco Area delle Scienze 181A - 43124
Parma, Italy(Tel: +39 0521 905832; Cell: +39 338 6923930;
Fax: +39 0521 905822;E-mail: [email protected])
J. H. STATHISTATHIS
IBM ResearchYorktown Heights,
NY 10598U.S.A.
(Tel: +1 914 945 2559; Fax: +1 914 945 2141;E-mail: [email protected])
YII-SHAOHAO LAIAI
Advanced Semiconductor Engineering Inc26 Chin 3rd Road
Nantze Export Processing Zone,Kaohsiung 811, Taiwan
(Tel: +886 7 361 7131 ext. 15285;Fax: +886 7 361 3094;
E-mail: [email protected])
Dr. D. DASAS
CALCE Electronic Products & SystemCentre, College Park, USA
(Tel: +301 405 7770;E-mail: [email protected])
Editorial Advisory BoardM. Amagai, Oita, JapanE. Atanassova, Sofia, BulgariaY.-C. Chan, Kowloon, Hong KongC. Y. Chang, Hsinchu, Taiwan, R.O.C.P. Chaparala, CA 95051, U.S.A.D. Das, College Park, MD, U.S.A.G. De Mey, Ghent, BelgiumS. Dimitrijev, Nathan, Brisbane, AustraliaA. Dziedzic, Wroclaw, PolandF. Fantini, Modena, ItalyD. Flores, Barcelona, SpainD. M. Fleetwood, Nashville, TN, U.S.A.M. Fukuda, Kanagawa, JapanR. Ghaffarian, Pasadena, CA, U.S.A.G. Ghibaudo, Grenoable, FranceG. Groeseneken, Leuven, BelgiumH. Iwai, Yokohama, JapanK.-N. Kim, Yongin City, South Korea
C. J. M. Lasance, Eindhoven, The NetherlandsN. Labat, 33405 Talence Cedex, FranceJ. J. Liou, Florida, U.S.A.I. Manic, Nis, SerbiaE. Miranda, Buenos Aires, ArgentinaH. S. Momose, Yokohama, JapanA. J. Mouthaan, Enschede, The NetherlandsA. Nathan, Waterloo, CanadaA. Ortiz-Conde, Caracas, VenezuelaP. Perdu, 31401 Toulouse Cedex 9, FranceS. Pershenkov, Moscow, RussiaM. K. Radhakrishnan, Bangalore, IndiaW. Stadler, D-81726 Munich, GermanyV. Szekely, Budapest, HungaryR. Vollertsen, Munchen, GermanyS. Yoshitomi, Kawasaki, JapanG. Q. (Kouchi) Zhang, 5656 AG Eindhoven, The NetherlandsM. Zwolinski, Southampton, U.K.
PUBLISHED MONTHLY
Publishing Office: Elsevier Ltd., The Boulevard, Langford Lane, Kidlington, Oxford OX5 1GB, U.K.(Tel: (01865) 843000; Fax: (01865) 843010)
Advertising information: If you are interested in advertising or other commercial opportunities please e-mail [email protected] and your enquiry will be passed to
the correct person who will respond to you within 48 hours.
Author enquiries: For enquiries relating to the submission of articles (including electronic submission) please visit this journal’s homepage at http://www.elsevier.com/locate/
microrel. For detailed instructions on the preparation of electronic artwork, please visit http://www.elsevier.com/artworkinstructions. Contact details for questions arising after
acceptance of an article, especially those relating to proofs, will be provided by the publisher. You can track accepted articles at http://www.elsevier.com/trackarticle. You can
also check our Author FAQs at http://www.elsevier.com/authorFAQ and/or contact Customer Support via http://support.elsevier.com.
Publication information: Microelectronics Reliability (ISSN 0026-2714). For 2013, volume 53 is scheduled for publication. Subscription prices are available upon request from
the Publisher or from the Elsevier Customer Service Department nearest you or from this journal’s website (http://www.elsevier.com/locate/microrel). Further information is
available on this journal and other Elsevier products through Elsevier’s website (http://www.elsevier.com). Subscriptions are accepted on a prepaid basis only and are entered on a
calendar year basis. Issues are sent by standard mail (surface within Europe, air delivery outside Europe). Priority rates are available upon request. Claims for missing issues
should be made within six months of the date of dispatch.
Orders, claims, and journal enquiries: please contact the Elsevier Customer Service Department nearest you: St. Louis: Elsevier Customer Service Department, 3251 Riverport
Lane, Maryland Heights, MO 63043, USA; phone: (877) 8397126 [toll free within the USA]; (+1) (314) 4478878 [outside the USA]; fax: (+1) (314) 4478077; e-mail:
[email protected]. Oxford: Elsevier Customer Service Department, The Boulevard, Langford Lane, Kidlington, Oxford OX5 1GB, UK; phone: (+44)
(1865) 843434; fax: (+44) (1865) 843970; e-mail: [email protected]. Tokyo: Elsevier Customer Service Department, 4F Higashi-Azabu, 1-Chome
Bldg, 1-9-15 Higashi-Azabu, Minato-ku, Tokyo 106-0044, Japan; phone: (+81) (3) 5561 5037; fax: (+81) (3) 5561 5047; e-mail: [email protected].
Singapore: Elsevier Customer Service Department, 3 Killiney Road, #08-01 Winsland House I, Singapore 239519; phone: (+65) 63490222; fax: (+65) 67331510; e-mail:
JournalsCustomerServiceAPAC@ elsevier.com
MICROELECTRONICS RELIABILITY
Editor-in-Chief
PROFESSORROFESSOR N. D. STOJADINOVICTOJADINOVIC
Department of Microelectronics, Faculty of Electronic Engineering, University of Nis,Aleksandra Medvedeva 14, 18000 Nis, Serbia
(Tel: +381 18 529 326; Fax: +381 18 588 399; E-mail: [email protected])
Associate Editors
