ICP Test Report Certification Packet/media/files/littelfuse/technical... · 25/07/2011 · 1 ICP Test Report Certification Packet Company name : Littelfuse, Inc. Product Series:

1

ICP Test Report Certification Packet

Company name : Littelfuse, Inc.

Product Series: TVS Diode – Low Capacitance

Product #: SP03-3.3 Series

Issue Date: July 25, 2011

It is hereby certified by Littelfuse, Inc. that there is neither RoHS (EU Directive

2002/95/EC)-restricted substance nor such use, for materials to be used for unit parts, for

packing/packaging materials, and for additives and the like in the manufacturing processes.

In addition, it is hereby reported to you that the parts and sub-materials, the materials to be used

for unit parts, the packing/packaging materials, and the additives and the like in the manufacturing

processes, are all composed of the following components.

Issued by:

<Global EHS Engineer>

(1) Parts, sub-materials and unit parts

This document covers the TVS Diode Low Capacitance RoHS-Compliant series products

manufactured by Littelfuse, Inc.

＜ Raw Materials Used

Please see Table 1

(2) The ICP data on all measurable substances

Please see appropriate pages as identifed in Table 1

Remarks：.

Form 585-047 Rev. A 2/21/06

2

Table 1: List of Raw Materials covered by this report

Total Parts Raw Material Part Number Raw Material Description Page(s)

1 NA Wafer 3-9

2 A194 Leadframe 10-20

3 NA Gold Wire 21-25

4 2815A Adhesive 26-30

5 GE-1030 Epoxy Molding Compound 31-36

6 NA Tin Plating 37-42

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:r*Si tEI / Tr ib .oqodiphely l € th€r 5

q; l t : r f i / Tetrabronodiphenyl 5

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iAdXS / Hexabromod i phenyl 5

*A#XS / lep tab .onod ipheny l 5

, \ .4f l t t$ / ocrabrosodiphenyl

ntt#+Et / Nonabronodi phenyl

+*t*S / Decabronodi phenyl

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3 . MDL = Method Detecr iod L iE i t ( r i i l l x i in&. la )

4 . ' - , - Not R€su lared (d&{ , * i i )

5 . S p o t - t e s t :

t i€aarive : Absen.e of cr(vr) coat ins / surfa." taye.(r{ .r+dx, lTr{^frs),P o s i r i v e = P r € s e n c e o f c r ( v r ) c o a t i n s / s u r f a " € l a y € r ( & , r + d 4 n l f t * ) rT h e ! € s t e d s a n p t € s h o ! 1 d b e f u r t n e . v e r j f i e d b y b o i l i n g , r a t e r - e x r . a c r i o n n e r h o d i i t h es p o t t e s t r e s u l t c a n n o t b e c o n f i r n e d .(* l* i4 'F*t i4l&r+,, ! tA4sqr*Aboi I i "s, .ater-exr.a.t ionait7 ' j t i t - f * t t )

B o i I i n s - w a r € r - e r ! . a c t i o n :r i e a a r i v e : A b s e n c e o f c . ( v r ) . o a t i n c /

" , . f " " . 1 . y . . ( l { a f . d , t , l T t ! ^ 1 l s ) ,

Posi r ive : Presencc of cr (vr) coat ins / sur fa.e I ay" . ( r t ,? t . ta , ! l t , l ̂ l lJ* ) Ii h e d c t e c r € d c . n . . n t r , t i o n i n b o i l i n s - w a t e r - e x r r a c t i o n s o l u t i o n i s e q t r a 1 o .gr€ater than 0.02 ns lks wi tn 50 cn ' sample srr face area.t i8) tx , {>0.02 ns lks v i rh 50 cn? (sa,p l " sur fa.e area)

6 . # - P o s i t i r e i n d j c a t e s t h e p r € s e n . e o l C . ( V l ) o n r h e t e s t e d a r e a s a r d r e s ! l r 6 e . e s a r d € das not conply r i th RoHs req! i fenenr. (Pos i t j v€ i+ j t l i { E}4.a i , f lJ*2. {+.*RoHs**. )

Negat ive indicates t le absence of cr (Vl ) on th€ test€d a. .as and resul t be r€sardedas .onply v i rh RoHs req! i renenr. (Negzr iv€ i iX, l g ,E&anf i rar+6Ross** . )

PFCS+r l t iL(R.r . r .n . . In lorpat ion) : J l+ 2006/122lEC (Di f€. t i r€ 2006/r22lpc)( r ) lr#f 4T,Eiif i'rs-L{.{in ;+4+*rl{{.Iei'&r}tt:1,{+,i!d.^,i!0.005%.

(Vay no t be p l aced on t he ma .k€ t o . used as a subs tance o f cons t i t uen t o r p repa ra t rons i n a

. o n c e n t r a t i o n e q u a l r o o r h i g h e . r h a n 0 . 0 0 5 % b y f r a s s , )(2) tt#,F 4q l l^fi 4-L."+&&{Ssn *4r4 r f i#e&}0ifi}t 4apFosJ.49{l**}a.frr€*&}i+S

PFosi*,lE+;+d,ntao. r%, rorr{"ci.*.E,llL&f , t! RProsatll4tfr f +i++*"^,ttlug/.'.( M a y n o t b e p l a . e d o n t h € f r a r k e t i n s e n i - f i n i s h € d p r o d u c t s o r a r t i . l e s . o r p a r t s t h e r e o l , i f t h e

c o n c e n r . a t i o . o l P F O S i s e q u a l t o o r h i g L e r t h a n 0 . 1 % b y n a s s . a l . u l a t e d { i t h r e f € r e ! c e t o t h e

n a s s o f s t . u c t u . a l l y o . n i c r o s t . u c t u r a l l y d i s r i n c t p a . t s t h a t c o . r a i . P F o s o r . f o r i e x r i l e s o . o t h e .

c o a t e d n a ! e . i a l s , i f t h € a n o u n t o f P F I S ' s e q u a l t o o r h i s h € r r h a n I U s / n ' z o f r h e c o a t e d n a ! e r i a l , )

Test Report * 4 ( N . . ) : K A l 2 o r r l r o r l 3E J q l ( D a r e ) , 2 o r 1 l 0 1 / 1 0F * . ( P a s e ) : 6 o t t t

ASM H( & ASN TECHNOLOGY SIN6IIOBE

,I/F, {ATSON CET'IRE, 16 (UNG IIP ST., (S.{I CIUNG. I{ONC rONG (ASM lfi), 2 YISHI,NAVE\]JE 7, SiNCAPORE (ASV TECIINOI-oCY SINGAMRE)

|l [tt]||lrrrtll

1) ilill4Tn ji,Ala&?t *.sae,+A*.( -flrrrlllrtlt*rt ) /Th€s€ samples Ere dksolwd roraly byp€ondittontng m6thod a@ding lo bdN nd chart. ( c.& 166r m.thod exdud€d )

2) jt{,Al : #&r+ / Nm6 otthe p€6on uho made me6uEmenrAtex chano

trAfiI / ssple M.r6ri.l tfiLl*trI / Diq6lin Acidf , . f , ,3 , 14 1 -*, gl rl ttl. trtr( /

{l / d"". El.lll / HNoTHFa, A, Q,, nA t

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; .h(bhhaoit t r""y r t"c*p

ch.rg. of mesu@dt Ray Chsng

tf.. !n*e / cunins .PBpa6ilon

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d*/lrt/!.lt.jS&{11Mim@e dig*tid eith

6,Att"3.ttt+*#i,*t / tcP-AEs

n * , t \ , - T a . L h 1 l tt t l1sa*E' 540nm $4144 / l1E3u6lh6 .bedb.ne €t tto

Test Report l E € ( N o . ) , r A / 2 0 1 1 / r o r 1 3 A j h ( D a t . ) : 2 0 l l l o r / 1 0 F : k ( p a s e )

ll[rl|t[]ttttlASM H( & ASV TECI{NOLOCY SI\GAPORE

1/F, WATSON CENTRE. T6 (WG YIP ST.. I{IAI CHUNG, IIONC (OIiG (ASM H(), 2 YISqUNAVEI'UE 7, SINGAPORE (AS]V TECHNOLOCY SINGAPORE)

t *d*rt **tS +{fi,8f I PBB/PBDE anatyticat FLOW CHART1)tlrq^t : f,*4 / Name ofthe person who made measurcment Anson Tsao2), & fr l,/. : 4,1€+ / Name of the person in charge of measurement Ray Chang

jin )NA.l',34- / Firsl iesting process -------)

4f Jt4 &tr + / Oplionar screen process .--..-.-

&i1fl,S / Confimalion process -.->

Sample / tle

Screen anallsis / ?, g rIfi

Sample extraction *"9 +tFJSoxhlet method * *,+R.i4

Concenlrate/Dilutre Extracted solution+eFxB/{itr

iFilter +qx,*ia&

Analysis by GC/MSfti€,ttr{*d.}ff

t

Sample prelreatment / ll&itEI!

s 4 ( N o . ) : K A / 2 0 r 1 l r 0 1 1 3 e S ( D a t e ) : 2 t ) 7 r / o r / r o F j h . ( p a s € ) : s o f l tTest ReportASM HI( & ASU TECHNOLOGY SIN6.{PORE

1/F, INTSON CENTIO, 16 I{UNC YIP ST., (q'AI CIIUNG, HONC I(O\G (ASM H(), ? YISHIJNAVENIJE 7, SINGAPORE (ASII TECIINOLOCY SINGTPORE)

1) ,E{ t rT6l* ,Ana{*++ ' * .J ,gU 444. / rh€se sanples 'e .e d issoLved rota yby p re - cond i t i on i na ne thod acco .d i ng 1o be low f t op cha r i .

2) jrlit^'l : ftl4lE / Nabe of the p€lson '!o nadc heasureneir: A1€x Chary3) l l l i { f i l , \ : t i . l6* / NaEe of the pc 'so ' in chafce ot E€asurenent : Ray chana

i,f r,( rcP-AEs +fi.6ifr{tfr,*n(F lox Char l o f d isest ion for the e le&eats ara lys is per fo i ied by I@-AXS)

f ; . f ; . r 8 , 4 € s r " e r , c o p p . r , a l u D i n u d , . o r d q , f- +., rA dt, { *, q. n&, ! 5,,1.- /Aquz regia, Hl:O,, ]{cl, ll!, UON

4&, i.fi.lt / lxio./Is6 , S , g , F i / c o l d . p r , , ' i u r . p a r r a d , u m . c e , d i .

* dtl / I$lo,

! 6 / P l a d t i c Ilaf ,!i.,j<.,4*, t* / H,so,. Il'o. llltD,. Irl, " ^ { . *11&EZts , * / any a . id ro to ta l d ig .s t ion

g $ ' g t i & e / c u t t i n g ' p r e p a r a t i o n

tr {&#gt / sarDr e Meas!rene. t

Xh{4l3l l*.S,titf frtria*itdigtir{rL (t'T i,t + ) / Acid disesr ion bys u i l . b l e a c i d d € p e n d e d o n d i l f e r e n r s a n p L € n a t € r i a l ( a s b e l o ' t a b l e )

i&* / F i l t ra t ion

* iA / Res id .e

1) a i * t l i ! / a lkar i Fus ion

2) t&88 / i {c l ro d isso lve

6&ri+€{,4 +*41 Jbr}.* / IcP-AEs

Test Report

,l/F, WATSON CENTT!,AVENUE ?, SINGAPORE

I t4(N". ) , K,1/2otr l rort3S J q ( D , t e ) , 2 0 l t / 0 r l 1 0 F j k ( p a s € ) : e o r r r

llfllt tlrtllltASM HI( & ASV TECINOT,OGY SI\GAMRE

]6 (UNG YIP ST., {CJAI CI&NC, IIONG I{ONG (ASM II(), 2 YISL]TJN(ASII TECHNOLOCI SINGAPORE)

an+*(*y +t *841466g1 7Analytical flor!, chart of PFOA/PFOS content

1)i4li{,,\ q : * +4 / Nam€ of the person who made moasurement Anson Tsao

2)iii it A *,\ : #.16* / NamE of the p€rson in charge of measurement: Ray Chang

*n +a;!+F{t+tt} us EPA 3s40) /

Sample exLaclion by Soxhlot extraction(Reference method US EPA 3540)

+*rtfsr*i;t* /Concentrate/Dilute Extr€cted 6otution

,^ ;L+e & ft f *6.+ )fr 4 wi*. IAnal)6is was performed by LC/MS

iFTest Report ! t 4 ( N o . ) ' ( A / 2 0 1 1 / r 0 r t 3 E S ( D a t e ) : 2 0 r l l o r / r o F : k ( p a s e )

ASii H( L ASV TECHNOI-oCY SINGAPORE

1/F, WATSON CENTR!, 16 KUNG YIP ST., KIAI CHUNG, ITONC lior{c (ASM t{r(), 2 yIsLrr,NNVENIJE 7, SINGAPOTE (ASII TFCINiOLOCY SINGAFOTT)

i *+ff'*,*f / Analt'ticalflow chart of hatogen cont€nt

1) tl a{,,\ q : t* t i/ Name of the person who made measurement Jean Hung2) ;ri S,A l' , : ft .16*/ Name of the person in char,ge of measurement Ray Chang

lll ltl| ltttI|

fr+tffi$hffi |Analysis was performed by lC

&Rfiffi&**-fi /Sample picture and report numb€r

&fl;ftE/t& /Sample prslrealrnenuseparalion

*rEr6&ff&^tfffl+ /WEighting and putting sample in cetl

nt *4lt/&r&Oxyg€n Bomb Combustion / Absorption

ftlcEEit /Dilulion to fixed volume

I t * (No.) : I ( .4 /20rr l10r13 E&(Dare) : ? 0 1 1 / 0 r / r 0 F I R ( P a s e ) : r r o f 1 1Test ReportASM HI( & ASV TECI{NOINCY SIIiGAMRE

tlItl|aIltttll

4/F. X'ATSON CENTR! 6 (UNG YIP ST.. (SAI CK'NG. HONC RONG (ASM lfi). 2 YISHUNA!TI\rIJE ?, SINCAmRE (ASM TECHNOLOGI SINc,{mR!)

. - * t+JE.€,(End of ieporr) 1.

i | ' e 5 d o , r r

nown

ith scs

Test Report No. : C92010/83213 Dale:2010111h9 Page :1o f 5

HENKEL CORPORATTON ||l ||t||l||tttttlHENKEL ADHESIVE€-ELECTRONICS lrAlN OFFICE: 14000 JAMBOREE ROAD, lRVINE,CALTFORNTA, 92606 U.S.A

The following sample(s) was/were submitted and identified by/on behalfofthe client as :

Sample DescriptionStyldltem No.Sample Receivjng DateTesting Period

ADHESIVE2815A20lU11t162010t 1 1 t16 rO 2010t 1 1 t19

In accordance with the RoHS Directive 2002/95/Ec, and its amendmentdirectives.

With referenc€ to IEC 62321 : 2008Proc€dures forthe Determination of Levels of Regulated Substances inElectrotechnical Products.

(1) Determination of Cadmium by ICP-AES.(2) Determination of Lead by ICP-AES.(3) Determination of lrercury by ICP-AES.(4) Detednination of Hexavalent Chromium by UV y'is Spectrometry.(5) Detemination of PBB and PBDE by Gc/Ms.

Please refer to next page(s).

Tegt Requ€sted

Test Method

Test Result(s)

comoa i v r i , , r j r , l . , r , r ' 1 l ! r + l r ! ; ] ' i j r i t j ^ . 1 1 . , ! 11 r r : j i i l : ' i : : r j l t 4 ! 'ThsdOfumslsss6by1h€company!bjedb]b6e.alcod!oisolseMe''nt.dov.le't6!a|ableoneq

L l { i i i r t : I + * , ; ' } e6 {d : ) r !

For QuesliPlease Co

ggn d far and

ch.||tlcd lrboi.b.y - TdFl

$sbs dh ! r c c o l p ( t c t sA )

Test Report No. : CE2010/83213Date'.201U11119 Page r2o fs

HENKEL CORPORATIONHENKEL ADHESIVES-ELECTRONICS lrAlN OFFICET 14000 JAMBOREE ROAO, tRVtNE,CALIFORNIA, 92606 U.S.A

||l lltlll||lttllt

Test results bv chemical method {Unit

T.at ltem (s): lrothod(Refe. to)

ResultI/|DL

No.1Cadmium (Cd) (1 ) n.o. 2Lead (Pb) l2l n.d. 2Mercury (Hg) (3) n.o, 2Hexavalent Chromium Cr(Vl) by alkalineel:traction

l4') n.d. 2

Sum of PBB6

(5)

n.o,Monobromobiphenyl n_o. 5Dibromobiphenyl n_o.fribrcmobiphenyl n.d. 5Tetrabromobiph€nyt n.d.Pentabromobiphenyl n.d.Hexabromobiphenyl n.d.Heptebromobiphenyl n.d.Octabromobiphenyl n.d. 5Nonabromobiphenyl n.d.Decabromobiohenvl n.d.Sum of PBDEa n.d.Monobromodiphenyl ether n.d. 5Dibromodiphenyl ether n.d. 5Tribromodiphenyl ether n.o.Tetrabromodiphenyl ether n_0.Pentabromodiphenyl ether n,o,Hexabromodiphenyl ether n.d.Heptabromodiphenyl ether n.d. 5Octabromodiphenyl ethgr n.d.Nonabrcmodiphenyl ether n.d- 5Decabromodiohenvl ether n.d.

TEST PART DESCRIPTION:No.1 : SILVER COLORED PASTENote I

1. mg/kg = PPm; 0.1w{% = 1000PPm2. n.d. = Not Detected3. MDL = Method Deiection Limit4. "-" = Not Regulated

pe(s) 6bd rh s Gd €pod oi^d sc o n p . n y n i , j l r j t ' i , L n l + l , + 1 J t r ! n l r t i . 4 . . r l ] l i r r t l j t : : + . i { . d 1 ! .

HENKEL CORPOMTTON tl|l[[] [[tttnHENKEL ADHESIVES-ELECTRONICS MAIN OFFICE: 14000 JAMBOREE ROAD. lRVlNE.CALIFORNIA, 92606 U.S,A

1 )

2)3)

Test Report

Sample Material Digestion Acid

Sleel, copper, aluminum, solder Aqua regia, HNO3, HCl, HF, HrO,

Glass HNOJHF

Gold, platinum, palladium, ceramic Aqua regia

Silver HNO3

Plastic HrSO4 HrOr, HNq, HCI

Others Any acid to tolal digestion

No. : CEl201 0/832 1 3 Date : 2010/11/19 P a g e : 3 o f 5

These samples wsre dissolved totally by preronditioning method according to below flow chart( Cr& test method excluded )

Name of the person who made measurement: Climbgreat YangName of the pecon in charge of measurementr Troy Chang

conpayb , - : : 1 r : r ' u . - r i ' . i I r . , r ! r : r r " , i . ! j : . n rL l t i ! - l r ; ' r - + . r i i ; : i , l r ! ! !nyJ'adb]66eralcodiolso,seMepnn€dovg3ata!..b|oo^oq

L IL i , : t l i : * i r . i | ' r so l o7 ) re

Acid digestion by suiiable aciddeoended on different samolematerial {as below table)

Micro.rave digestion with

HNO3iHCtiFtFAdd appropriate amount of

dige6tion reagent

Heat to appropriate

temperature to extract

Cool, filter digestate

through filterAlkali FusionHClto dissolve

Add diphenyl-carbazide for

color development

measure the absorb€nce

at 540 nm by uV-VlS

HENKEL CORPORATIONHENKEL ADHESIVES-ELECTRONICS lrAlN OFFICE: 14000 JAMBOREE ROAD, tRVtNE,CALIFORNIA, 92606 U.S.A

Test Report

1) l.larE ofthe2) t{are ofthe

First testing process ----->

Optioml screen process ---.

Confirr€tion process - .>

No. : CE/2010/83213 Date : 2010/11/19 P a g e : 4 o f 5

PBB/PBDE analytical FLOW CHART

rllu |l][t ]t

person who fiEde reasurenEnt: RorEn Wongperson in cha€e of nEasurenEnt: Trcy Chang

Scr€on analysi6

Analysis by GC/MS

c o m r a i y ; i i r l : i ' r r ' r : i i ' ! : , r r i : " r ; , r , i L i r i . 1 1 1 l . r r r : l i i j . I . ! i : n r r , ' L

3 p o . $ b i | y 6 l d l s c e i l , n d l h A d r !

Sarple extraction/Soxhlet method

ConcentratdoiluteExtracted solution

' r r t i ! j 1 : 1 . !

TeSt RepOft No. : cE/2010/83213 Date: 2o1o/11/19P a g e : 5 o f 5

HENKEL CORPORATIONHENKEL ADHESIVES-ELECTRONICE MAIN OFFICE: 14000 JAMBOREE ROAD, lRVlNE,cALtFORNtA, 92606 U.S.A

lm[ttu]||itt]t

" End of Report "

i m s 3 1*r epd Gre, d.ry b @ enprec) ras€d rh 3 En .epdd 6iidr becompan r n r f r l l l l t L r i ' 1 . ^ l : l : i j i , r r * t i . l . 4 l t i r r l r i : r : r : r . i : r ! r ! r i ; l

I ; i i r . I i i :4 . l r ' ' s6 (or re

Men&dme<s6f@pi56s5Al

SGS Taiwan Ltd.台灣檢驗科技股份有限公司

No. 61, Kai-Fa Road, Nanzih Export Processing Zone , Kaohsiung, Taiwan / 高雄市楠梓加工出口區開發路61號

t + 886 (07)301 2121 f + 886 (07)3010867 www.tw.sgs.com

Member of the SGS Group

Unless otherwise stated the results shown in this test report refer only to the sample(s) tested. This test report cannot be reproduced, except in full, without prior written permission of the Company.除非另有說明，此報告結果僅對測試之樣品負責。本報告未經本公司書面許可，不可部分複製。This document is issued by the Company subject to its General Conditions of Service printed overleaf, available on request or accessible at www.sgs.com/terms_and_conditions.htm and, for electronic format documents, subject to Terms and Conditions for Electronic Documents at www.sgs.com/terms_e-document.htm. Attention is drawn to the limitation of liability, indemnification and jurisdiction issues defined therein. Any holder of this document is advised that information contained hereon reflects the Company’s findings at the time of its intervention only and within the limits of Client’s instructions, if any. The Company’s sole responsibility is to its Client and this document does not exonerate parties to a transaction from exercising all their rights and obligations under the transaction documents. This document cannot be reproduced except in full, without prior written approval of the Company. Any unauthorized alteration, forgery or falsification of the content or appearance of this document is unlawful and offenders may be prosecuted to the fullest extent of the law.

Sample Description :

Style/Item No. :

Sample Receiving Date :

Testing Period :

============================================================================================

Test Requested :

Test Method :

(1)(2)(3)(4)

(5)

Test Result(s) :

Determination of Lead by ICP-AES.Determination of Mercury by ICP-AES.Determination of Hexavalent Chromium by UV/Vis Spectrometry.

Determination of PBB and PBDE by GC/MS.

Test Report

2010/11/02

*KA/2010/B0127*

No. : KA/2010/B0127 Date : 2010/11/05 Page : 1 of 6

NITTO DENKO (TAIWAN) CORPORATIONROOM N-712, NO. 96, CHUNG SHAN N. ROAD, SEC. 2, TAIPEI, TAIWAN

EPOXY MOLDING COMPOUNDGE-1030 SERIES

The following sample(s) was/were submitted and identified by/on behalf of the client as :

2010/11/02 TO 2010/11/05

In accordance with the RoHS Directive 2002/95/EC, and itsamendment directives.

With reference to IEC 62321: 2008Procedures for the Determination of Levels of Regulated Substances inElectrotechnical Products.

Determination of Cadmium by ICP-AES.

Please refer to next page(s).



t + 886 (07)301 2121 f + 886 (07)3010867 www.tw.sgs.com



Result

No.1

n.d. 2n.d. 2n.d. 2n.d. 2

n.d. -n.d. 5n.d. 5n.d. 5n.d. 5n.d. 5n.d. 5n.d. 5n.d. 5n.d. 5n.d. 5n.d. -n.d. 5n.d. 5n.d. 5n.d. 5n.d. 5n.d. 5n.d. 5n.d. 5n.d. 5n.d. 5

Heptabromodiphenyl ether

Test Report No. : KA/2010/B0127 Date : 2010/11/05 Page : 2 of 6

NITTO DENKO (TAIWAN) CORPORATION *KA/2010/B0127*

ROOM N-712, NO. 96, CHUNG SHAN N. ROAD, SEC. 2, TAIPEI, TAIWAN

(5)

Test results by chemical method (Unit: mg/kg)

OctabromobiphenylNonabromobiphenyl

Sum of PBDEs

Octabromodiphenyl ether

NO.1 : BLACK EPOXY MOLDING COMPOUND

Mercury (Hg)Lead (Pb)

Heptabromobiphenyl

(3)(2)

(4)Hexavalent Chromium Cr(VI) by alkalineextractionSum of PBBs

Hexabromobiphenyl

Monobromobiphenyl

Monobromodiphenyl ether

Tetrabromobiphenyl

Dibromodiphenyl etherTribromodiphenyl ether

Method

(Refer to)MDL

(1)

Test Item (s):

Cadmium (Cd)

Hexabromodiphenyl ether

Dibromobiphenyl

Decabromobiphenyl

Pentabromobiphenyl

Pentabromodiphenyl ether

Tribromobiphenyl

Tetrabromodiphenyl ether

Nonabromodiphenyl etherDecabromodiphenyl ether

TEST PART DESCRIPTION:



t + 886 (07)301 2121 f + 886 (07)3010867 www.tw.sgs.com



4. "-" = Not Regulated


7. This report supersedes all pervious documents bearing the test report number KA/200X/XXXXX.8. This is the additional test report of KA/200X/XXXXX which was issued on yyyy/mm/dd.

Please refer to KA/200X/XXXXX for original information.

Note： 1. mg/kg = ppm；0.1wt% = 1000ppm2. n.d. = Not Detected3. MDL = Method Detection Limit





t + 886 (07)301 2121 f + 886 (07)3010867 www.tw.sgs.com






1) These samples were dissolved totally by pre-conditioning method according to below flow chart.（Cr6+ test

method excluded）

2) Name of the person who made measurement: Alex Chang

3) Name of the person in charge of measurement: Ray Chang

Cr6＋

Sample Material Digestion Acid

Steel, copper, aluminum, solder Aqua regia, HNO3, HCl, HF, H2O2

Glass HNO3/HF

Gold, platinum, palladium, ceramic Aqua regia

Silver HNO3

Plastic H2SO4, H2O2, HNO3, HCl

Others Any acid to total digestion

Pb、Cd

Solution

ICP-AES

Acid digestion by suitable acid

depended on different sample

material (as below table)

Filtration

Residue

1) Alkali Fusion

2) HCl to dissolve

Sample Measurement

Cutting / Preparation

Microwave digestion with

HNO3/HCl/HF

Heat to appropriate

temperature to extract

Cool, filter digestate

through filter

Add diphenyl-carbazide

for color development

Measure the absorbance

at 540 nm by UV-VIS

Add appropriate amount

of digestion reagent

Hg



t + 886 (07)301 2121 f + 886 (07)3010867 www.tw.sgs.com






PBB/PBDE analytical FLOW CHART

1) Name of the person who made measurement: Anson Tsao

2) Name of the person in charge of measurement: Ray Chang

First testing process

Optional screen process

Confirmation process

Sample

Screen analysis

Issue Report

Sample pretreatment

Sample extraction/Soxhlet method

Concentrate/DiluteExtracted solution

Analysis by GC/MS

Filter



t + 886 (07)301 2121 f + 886 (07)3010867 www.tw.sgs.com



** End of Report **




Test Report o. LPCU00093rll OatG: Osrol/2ottCTS Rcf. CTS,I lritgg4Rcddng

REDRTNG SO|_DER (1{l SOlt. BHD.LOT iti|8o, JAAII DUA tAllAl{ SEI-AYANG AARU68I(x) BATU CAVES, SELANGOR OARUL EHSAN. IiIALAYSI,A

TI|c tollowing m..ch.ndi.c war (we]!l {bnincd and id.ntifiGd by thc client as:

Pag . :1o f?

Sample OescdptionSample ReceivcdT€stir€ D.t

PURETIN SOLDER03rc120110301201 1 to 05/01201 1

Teat Re+lated

Trst Melhod

T6.t R€ults

AnaDrst3

In accordance wih the RoHS Diredive 2002r'95/EC, and itsameidrnent dileclilr3-

Pl€ase Gfe.to next pagqs).

Pleas. rlGr lo ne)d pqqs).

NE Mei Kheng, Ld Woan Yec & Lim Meng Hoe

scs L,{BORATORY SERVTCES (M) SON. BHO.

gCS t.bq&y g..tia 00 8.h h.lcd'.r' Nd {3t72{

CHONG KIEN LENB.Sc.(HONSIAMICtAA I4ANAGER

rM.r.ri6E.rF

rbr6J.LrAtanl!* 31/616r Ndtui! {01e S&!fo.il EM, rby*tlr6(B)sl2t 2?O 116005121& M.{.m

Test Reportlelt rrlrrlb:

Tast Pan Oe$iotlon :

Stmde Dolcfiplion

RoH3 DiEctiw 20O2,'5/EC

o. LPCg00003,ll D.t!: O5OtnO11CtS Ret CTSrl lr4gg4rncd.ing

: PURE TIN SOLDER

f526 Jdr rq!:* V6 3lIB Xd rdui{ ao{e Sohr$.o.ii EE, MC.nar+q|B)5i2lZ3C0 r+6(}|)5t21 sB2 w..a.on

P'{'et2 oll

CHONG NEN LENB.Sc.(HONS)AMICLAA MANAGER

d--db^4*

SCA khodry g..ri... 00 S.h h-{CqF{ lb 6ol2ra

T.!t li.m(i): Unlt Ta.t iretiod Rasulb ldcLC.dmlum(Cd) fig/tg Wfifi ruf.ranc. to IEC 62321 :2008,

lncl rffbanad w lcPoEs N.D.

L.d (Pb) me/xg Wllh relbnnc. b IEC 62321 :2008,l|lc paafonnad w lcPoEs 7

i,hrc.r/ry (H9) mdxg wnh r.|lr.nc. b tEc 62321:2008,md p.tfotnl.d W ICP.oES N.D.

H.x.vdent Chrc.nlum (CM)by Spol Llt / boillng wrho(i..don (oplbnll),

Wflh reLrfica io tEC 62321 :2006,lnd partlorm.d by UV.V|S Spectrophotomotry

(bolllng v/lt r.xflctkft only)Nagatl'/e

0.o2n'gikgPar 50crn'almP|e In

50mL

t|rn ot PBa. Wnh rorr.nc. to IEC 62321 :2008,lnd o.tbrm.d bv GC-.tlrS N.D.

li&no6.omotiph.nyl mg/xg Wlth r!f.r.n6 to IEC 523:tl :2008,lrd tartbrm.d W GC-{US N_O. 5

Dlbrohoblph.nyi ntgkg Wnn r.f€Fnca lo IEC 623212008,dtd Pa.lbfihad W GC{t S N.D. 5

fdb.ornoblphsryi ncfts Wnh r€irFnca to IEC 623212@8,|x$ r*lb.nrd bv GdMS N.O.

T.t!b.ornoUph.ny{ mckg Wnh nbnn . b IEC 62321:2008,lnd !.rlb.n d bv GdtJfq N.D.

Harobro.noblph.nyl mcilg W|l|r ra|||rnc. b IEC 62321:a)08.and per{brnd by OC+,S N.O. 5

Pent$.ofioUpheny r g/kg wth rEhl|nc. io tEc €;2321:it0a..nd parfom.d bv Gc+ls N.O. 5

lbptrbrumOlptenY mdlq Wttr r$rtnca b IEC 623,i11 :2008,.nd 6.rlbm.d bv Gc.us N.O_ 5

Oci!brcntoblph.rryl itgkg wlll r.tlr.nca to IEC €4321 :2008,.nd o.rf6nn.d bv Gc-Ms N.O.

Nom&o.mblph.nY 'rlg/kC Wi$ rcf.nnc. io IEC 62321 :20Oa,.nd padomrd w Gc+/ts N.O. 5

D.c.brortoblph.|lY nvrg Wth ribrtnc. to IEC 52321 :2008,.nd D.rbrn <l W GC-lis N.D, 5

T.al lLm(!): Unn T.3t irehod R.3ultr uD!tum ot PIDEa mg/kg witl rctbr ca b tEc €2321:2008.

.nd p.ftrm.d by GOMS N.O.

iboobrorhodlphrryl .trar rakg Witr r€fronca to IEC 62321 :2008,and a.l|brm.d bv GlAirs N.D.

Dibromodlphant ethar r gftg Wnh reibEnca to IEC 623212006,&rd D.rlbrm.d bv GCMS N,D,

Tdb.lrnodtph.nY .nl.r ng/tc With tr{bt.ic. b tEC 623i,t1:2008.and oadbnrid W (|OMS N.D,

T.tabro.nodlph.ny at rr ms/kg W[h rei.rancr b IEC 62321 :2008..nd o.rbm.d bv GoMs N.D.

PantaDrofi odlphcnt ahar firg/l(g witl r.lb'loc. b IEC 62:,21 :2008..nd o.rlb.r.d bv 6dMs N.O.

tl.labmrnodlphanyl athar mg^s Wllh r.lbGnc€ b IEC 62:121 :2(b8.dtd D.rbm.d bv 6cMs N.D.

tbPtlbroriodlphenyl .trr m9fi9 Wfli rdlr.nc. b IEC 62i|21 :20Oa.tr|d mrb.h.d bv G(:-MS N.D.

Octabroilodlphany eth€r mgxg Wnh ra{aranca b IEC 62321 :2008,rm !6dormad bv GOMS N.D.

Nonabdriodlphanyl alhar rncxg wlth r.f8r.nc. b lEc 62321 :2008..nd EdL6.d bv ac-Ms N.D.

Dacabrofiodlphan9 af|.' nt rtltl€ wlih r€,'lr.nc| b tEc 62321 :2008.tnd E ilom.d bv GC.MS N.D.

Test Report o.LPCUooogJll Datc:osDlrz)ltCTS R.f. CTS,I lrilgo1,,Rcdring

P.g.: 3 of 7

Nole : (a) mg/kg = ppm i (0.1wt% = 100oppm)(b) N.D. t Not Det ct.d(c) MDL. M.thod D.lectlon Lttntt(d) * = Spot.?..r:

r. Nagdlva maan3 ttra lbrancc of C(Vt) on the talt€d ara$b. Politiv. maan3 fia praxnc. ot C(Vl) on th. t.rtad raaa3(Tha ta3tad rampla thould ba furthar vadned by boiflng-wttar-€xtrlcton mathod I th. apottd r.ault 13 na9{lva oa clnnol ba confiinad)lolllng watar anadbn:!. Nagaliva mean3 tia rbtance ol C(Vt) on tha taltad ara|!b. PoJtva maaB lha pot€nca of C(Vl) on tha ta3tad are$i

Tha drtacLd concanHbnln 50 mL bol ng watar axlrrclion 3otuflon t3 6qu!t or gleaterthan 0.02 mgl(g wlth 50 cm' !.mpt. .u.f.ca ar.a.

For coroslon pFtacton coatngr on metabt Inionnaton on ltolrge condiflons and prcducton.ht of th. ta.lad aimpl.l. un.vrllabta and thw relutts otC(Vt) r.pf$ont !t tu3otth.l.mPla at th. llm. of Ldng.

(.)-=t|otregul.bd

SGS LABORATORY SERVICES (M) SDN. BHD.

CHONG KIEN LENB.Sc.(HONS) AMICtAB MANAGER

gCS L.ldby Sdir 00 S.h. Nid.Gz'F rbsFz{

llo-ra .Ir r,leri vriL 3lrs lob Kari! 4re 8ds!o. &nr EM. rkbt*lr t6(615r2r 2320 r.0(03)512tgt2 fr.a.m

Test Report

Tc!t| rclub ry dt.mical mettbd:

1{o, LPCUqXtOtll D.t!: ostolrzxlCT8 Rcf. Ct3rl1r49g/UR.ddng

P.gGi 4 ot 7

TG3t ltlm (r): Unit 1{cthod R€ult sertulimoiy (Sb) ppm With reterence b EPA Melhod 30514

.nd pefomed by ICP.OES N.D.

H.logcn

Halogen€hlorinc (Cl) mdks Wih refeErc€ b AS EN 1682. AnatFis wlsperbnned by lC melhod b Chlorine content. N.D.

H.logen-Fluorine (F) mdkg Wih rebrencr b 83 EN 14582. Analysis wrsp€.forn.d by lC mellbd tor Fluorhe conbr . N.D. 50

Halgg€n-Bromine (Br) msft9 Wilh rd.rence io BS EN 14582. Anrlysb wasperfo|rncd by lC mefiod for Brornine contenl. N.D.

Halogen-lodin. (l) mSr(SWilfi refcrenca !o BS EN 14582. Anatysis v/aspe.bmed by lC rnethod br lodine conient. N.D.

Tesl Pa.t De3caiolion :

S.mpl. Description : PURE TIN SOLOER

NOTE: (a) N.D- = Notd6t ded (<MDL)(b) pprn " ttrgftg(c) MDL= M.{hod gailction Limn

SGS LABORATORY SERVICES (M) SDN. 8HD.

CHONG KIEN LENB.Sc.fiONS) Al4lClAB MANAGER

SGg |.nqe.y S..ti... 00 &r. ti.{cdrF rb|3oztra

rb20J.brLitr*!* 3t/gl rorloEad a0{4 g.b{e.tb^t SB, t|c Fi.$qB)512r 290 rr8 ('13) 5121 dt2 m.d.d

Test Report

Iegt Part D.sc.iotion :

S.mplc D..cdption

No. LPcgdm3,llCTS R.t C?Sfi ll|g9,0Rcdrino

PURE TIN SOLOER

D.tc : osrolri'ol{ P.gc: 5 ol t

REDRTIG SOTDER (1{l SD .BHO.LFCU(X)O9EI'

SGS LABOMTORY SERVICES fi) SON. 8HD.

scs [email protected] s..vn- (b gft En.{ccrr.' h m72la

CHONG KIEN I.ENB.Sc.(HONSIAMICLAB MANAGER

rb25J.h.Ataril\d3l/CllobKdflhCat{eS.!{abuArl', l$yd.I|6{@)5121 23Q0 tr6 (@) 5121 P wl!.m

1.Offi ll|anol{ oF capt|rut| coi{fEr{t tytEc ezt2t 2m8

samds Rad*vt d R€{tstrgrin

Cd s.rd€ n srndl dscts

woisli sanpro (0.2{ f)

inio d*r6tid vsd

A.rd dir€srion (M(rsweve)

_roialiy Dis6dr€(f

FihmtionJ

Amtyses by lCP

Test Report 1{o. LFCU00093rl ICtS Ref. qTSrl 1/it90{R!dring

Ddc : 0tol/2011 P.g.: 0 of t

Clt samplo in snall pioc€6+

w€tti srmprs (0 1-0.59) ifito dg€6ton v6.€l+

Acrd dir€slin (Micrd6va)J'Tc{al9 Dis.oni€d'l

Fil'8lio|r'L

Matylas by tCP

5. DEIUIXAIOLO; ?ftiFgDE Wmr OC{StY EC 6,x}2l 200a

Cri srmDb in smsll liac€s+

W.!tn samd€ {0.5-1 0g) inlo sxrracrin himbt€J

Sorhl€t Enladbn wih Tdu€noJ

F||€. thrdgh 0 45 um m€rnbrans nltor+

Andys€s by Gcr'rs {wfln appro0i6la dMj6n)

2, OIIEEUI{A'|oI Ot LEAp Coit?ll{t !ytEc 6i2321 2008

SaBds R€cgivinq 8r|d R.gistration!

Cd samplo in smarr d€.ssJ

W€ig s6mpl€ (0.2-0.59) hio dgesian vsss€l.J.

Acjd diFlbn (MEb'.,!v€)+'Totafly ossotv€d'

rl#ri*+

amtys€s ty tcP

.. OEERTIITIAIK'X OF HE(AVAIIXT CHROflIUTtY tEc 6232t ZXt6

sand€ Recoivirtand R€gistation

Samdo PlopsmrionJ

spor-!8sr fu6r'tstiv.)

BoilirEF{,al€radraction

ar€ts€6 by w- rtoeholo|l'sror

T66t R€poi

SGS LABORATORY SERVICES (M) SDN. BHD.

CHONG KIEN LEN8.Sc.(HONS) AlrlCLAB MANAGER

gCgLeabyg..li8006.b.'id. ||0.26 Jdr rio-r vrih 5/A Xd XduiE aoldl3.b{.. D{r Es,{cdF tlo6o,,{. ;.r *g-L!111q. !,t q.,3)-.5'1,1-!9. *,r.9.