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Confidential 1 Confidential 1 ESD Protection Kenneth Toomey Field Application Engineer AEM Electronics (USA), Inc. [email protected]

ESD Protection - AEM Components (USA), Inc.doc.aemcomponents.com/appnotes/ESDProtectionOverview.pdf · ESD Standards MIL-STD-883, Method 3015 • Required for “on-chip” ESD protection

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Page 1: ESD Protection - AEM Components (USA), Inc.doc.aemcomponents.com/appnotes/ESDProtectionOverview.pdf · ESD Standards MIL-STD-883, Method 3015 • Required for “on-chip” ESD protection

Confidential 1Confidential 1

ESD Protection Kenneth Toomey

Field Application EngineerAEM Electronics (USA), Inc.

[email protected]

Page 2: ESD Protection - AEM Components (USA), Inc.doc.aemcomponents.com/appnotes/ESDProtectionOverview.pdf · ESD Standards MIL-STD-883, Method 3015 • Required for “on-chip” ESD protection

Effect ESD has on IC’s?Effect ESD has on IC’s?• Electrostatic Discharge is the transfer of static charge

between two objects of different potential that come in to contact

• Can generate between 1,500V to 35,000V• Leading cause of device failure

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Page 3: ESD Protection - AEM Components (USA), Inc.doc.aemcomponents.com/appnotes/ESDProtectionOverview.pdf · ESD Standards MIL-STD-883, Method 3015 • Required for “on-chip” ESD protection

New ESD ChallengesNew ESD Challenges

• IC nanometer technology is more vulnerable to ESD

• High speed interfaces and data ports– USB 3.0 - 5Gbit/sec– HDMI 1.3 - 3.4Gbit/sec– IEEE 1394 - 400/800/3200Mbit/sec

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Page 4: ESD Protection - AEM Components (USA), Inc.doc.aemcomponents.com/appnotes/ESDProtectionOverview.pdf · ESD Standards MIL-STD-883, Method 3015 • Required for “on-chip” ESD protection

ESD StandardsESD StandardsMIL-STD-883, Method 3015

• Required for “on-chip” ESD protection during chip manufacturing

• Also known as the “Human Body Model” (HBM)

• Discharges a 100pF capacitor into a 1500Ω resistor

• HBM Level 4: Peak Current 2.67A at 4kV

• Rise time: 10ns

IEC61000-4-2• Required by equipment manufacturers

for system or application level testing • Discharge a 150pF into a 330Ω

resistor• IEC Level 4: Peak Current 30A at 8kV• Rise Time: 1ns

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Page 5: ESD Protection - AEM Components (USA), Inc.doc.aemcomponents.com/appnotes/ESDProtectionOverview.pdf · ESD Standards MIL-STD-883, Method 3015 • Required for “on-chip” ESD protection

ESD Standards ComparisonESD Standards Comparison

Level

HBM IEC

Contact Discharge (kV)

PeakCurrent (A)

Contact Discharge (kV)

PeakCurrent (A)

1 0.5 0.33 2 7.52 1 0.67 4 153 2 1.33 6 22.54 4 2.67 8 30

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Page 6: ESD Protection - AEM Components (USA), Inc.doc.aemcomponents.com/appnotes/ESDProtectionOverview.pdf · ESD Standards MIL-STD-883, Method 3015 • Required for “on-chip” ESD protection

ESD Protection ESD Protection

• Non-linear voltage-current characteristic– Low voltage high

resistance– High voltage low

resistance

• Provides low impedance shunt path to ground

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Page 7: ESD Protection - AEM Components (USA), Inc.doc.aemcomponents.com/appnotes/ESDProtectionOverview.pdf · ESD Standards MIL-STD-883, Method 3015 • Required for “on-chip” ESD protection

Design ConsiderationsDesign Considerations

– Capacitance and signal integrity

– Max ESD withstanding capability of protected device

– Min ESD shot withstanding cycle of ESD device

– Package size and PCB layout

– Clamping Voltage– Breakdown/Trigger

voltage

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Page 8: ESD Protection - AEM Components (USA), Inc.doc.aemcomponents.com/appnotes/ESDProtectionOverview.pdf · ESD Standards MIL-STD-883, Method 3015 • Required for “on-chip” ESD protection

Capacitance and Signal Integrity

Capacitance and Signal Integrity

• All ESD device have some level intrinsic capacitance

• Parallel capacitance attenuates high frequency signals

• High capacitance causes signal degradation as signal frequencies increase

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Page 9: ESD Protection - AEM Components (USA), Inc.doc.aemcomponents.com/appnotes/ESDProtectionOverview.pdf · ESD Standards MIL-STD-883, Method 3015 • Required for “on-chip” ESD protection

Board LayoutBoard Layout•

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Page 10: ESD Protection - AEM Components (USA), Inc.doc.aemcomponents.com/appnotes/ESDProtectionOverview.pdf · ESD Standards MIL-STD-883, Method 3015 • Required for “on-chip” ESD protection

Types of ESD DevicesTypes of ESD Devices• Polymer Based

– Pros: • Ultra low cap - 0.05pF to 0.5pF• Low cost

– Cons:• High trigger and clamping

voltage• Low ESD strike withstanding

capability

• Low Cap MLV– Pros:

• Low cap – 0.1 to 1pF through sorting

• Low cost– Cons:

• High clamping voltage• High leakage current• Low ESD strike withstanding

capability

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Page 11: ESD Protection - AEM Components (USA), Inc.doc.aemcomponents.com/appnotes/ESDProtectionOverview.pdf · ESD Standards MIL-STD-883, Method 3015 • Required for “on-chip” ESD protection

Types of ESD DevicesTypes of ESD Devices

• TVS Diode– Pros:

• High ESD strike withstanding capability

– Cons:• High cost

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Page 12: ESD Protection - AEM Components (USA), Inc.doc.aemcomponents.com/appnotes/ESDProtectionOverview.pdf · ESD Standards MIL-STD-883, Method 3015 • Required for “on-chip” ESD protection

The GcDiode is based on a glass-ceramic dual phase material system with proprietary ESD functional material that provides non-linear resistance at different voltage conditions

Key Features- Low clamping voltage (30V) - Low capacitance (0.25pF)- Low leakage current (0.1nA)- Fast response time (1ns)- High ESD shot withstanding

capability- Bi-Directional

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AEM GcDiodeTMAEM GcDiodeTM

Page 13: ESD Protection - AEM Components (USA), Inc.doc.aemcomponents.com/appnotes/ESDProtectionOverview.pdf · ESD Standards MIL-STD-883, Method 3015 • Required for “on-chip” ESD protection

Comparison ESD SuppressionComparison ESD Suppression

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• Typical IEC61000-4-2 level 4 contact discharge (8kV) suppressed waveform.

• GcDiode has similar performance as the TVS Diode

Polymer Based

AEM GcDiode

MLV

AEM GcDiode

AEM GcDiode

TVS Diode

Page 14: ESD Protection - AEM Components (USA), Inc.doc.aemcomponents.com/appnotes/ESDProtectionOverview.pdf · ESD Standards MIL-STD-883, Method 3015 • Required for “on-chip” ESD protection

GcDiodeTM Signal Integrity10Gbit/sec

GcDiodeTM Signal Integrity10Gbit/sec

Eye Diagram Insertion Loss (S21)

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‐5

‐4

‐3

‐2

‐1

0

1.E+06 1.E+07 1.E+08 1.E+09 1.E+10

Insertion Loss [dB]

Frequency [Hz]

Page 15: ESD Protection - AEM Components (USA), Inc.doc.aemcomponents.com/appnotes/ESDProtectionOverview.pdf · ESD Standards MIL-STD-883, Method 3015 • Required for “on-chip” ESD protection

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ESD SelectionESD SelectionDATA Rate(M bit/sec)

125

0.5pF, 0.2pF2.5pF, 0.8pF33pF, 10pF, 5pF100pF~56pF

0 0.03 0.05 0.13 2 12 25 320 400 480 800 3000 5000

Audio

Video USB 1.1

RS 485 Ethernet

LCD

IEEE 1394

HDMI

USB3.0Display Port

IEEE 1394b

USB2.0

GcDiode

MLV

RS 232

IEEE 1384

10000

Page 16: ESD Protection - AEM Components (USA), Inc.doc.aemcomponents.com/appnotes/ESDProtectionOverview.pdf · ESD Standards MIL-STD-883, Method 3015 • Required for “on-chip” ESD protection

ConclusionConclusion

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• The main purpose of “On-Chip” ESD protection is to protect the IC against an ESD event during the manufacturing environment of the IC

• Supplementary ESD protection is required for system level/application ESD events

• Low capacitance to maintain signal integrity for high speed data ports

• Minimize parasitic inductance to maximize performance of ESD device

• GcDiodeTM is similar in performance to the TVS Diode