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International Journal for Light and Electron Optics Aims & ScopeThis international journal publishes articles on all subjects related to lightand electron optics and offers a survey on the state of research and technicaldevelopment within following fi elds:Optics:• Optics design, geometrical and beam optics, wave optics• Optical and micro-optical components, diffractive optics, devices and systems• Photoelectric and optoelectronic devices• Optical properties of materials, nonlinear optics, wave propagation and
transmission in homogeneous and inhomogeneous materials• Information optics, image formation and processing, holographic techniques,
microscopes and spectrometer techniques, and image analysis• Optical testing and measuring techniques• Optical communication and computing• Physiological optics• As well as other related topics.
Electron optics:• All methods strongly related to light optics, e.g. geometrical electron
optics, imaging theories and methods, GRIN optics, geometrical aberration• Instrumentation and equipments for guiding, focusing and imaging of
charged particles, spectrometers and beam lithography• Image reconstruction and analysis, holographic methodsIt publishes original papers and short notes on theoretical and experimental researchin English. OPTIK addresses itself especially to scientific and technical working specialists in this field.At the same time it is the official organ of the German Society for AppliedOptics (DGaO), and in affiliation with the European Optical Society (EOS).
EditorProf. Dr. Theo TSCHUDIInstitute of Applied Physics, Darmstadt University of Technology,Hochschulstraße 6, 64289 Darmstadt, Germany. Phone: ++49(0)61 51/16 20 22,Fax: ++49(0)61 51/16 41 23 E-mail: [email protected]
Publisher: Elsevier GmbH,Hackerbrücke 6, 80335 München, Germany;Phone: +49 (0)89 53830, Fax: +49 (0)89 5383939,e-mail: [email protected]
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Terms of delivery (2013): Volume 124 (1 volumeconsisting of 24 issues)
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International Journal for Light and Electron Optics
Authors can send their manuscript to the Editor either by post or bye-mail: Professor Theo Tschudi, Technische Universität DarmstadtViktoriastrasse 50A, 64293 Darmstadt, Germany
Fax: +49-6151-24857E-mail: [email protected]
All manuscripts should contain: Manuscripts should be submitted in English, and the presentation should be as succinct as comprehension will permit. Manuscripts are reviewed and refereed. Those accepted for publication are edited for conformance to the journal’s style. Metric units should be used unless to do so is not feasible or would result in a serious loss of clarity.
The following fi le formats are accepted:• Text: Microsoft Word, LaTeX/REVTeX
(Note: author toolkits for Microsoft Word and LaTeX/REVTeX areavailable in internet)
• Figures: TIFF, PostScript, EPS (minimum 300 dpi resolution).See additional requirements below.
Submissions should contain PDF fi le including all fi gures and tables.
Manuscripts must contain the following:• Title page listing the paper title; the name(s) of the author(s); and
the affi liation, complete mailing address, phone number, fax number,and Email address.
• List sponsorship information in an acknowledgment section at the endof the paper.
• Abstract (200 words maximum) should be a summary of the paper andnot an introduction. Because the abstract may be used in abstractingjournals, it should be self-contained (i.e., no numerical references)and substantive in nature, presenting concisely the objectives,methodology used, results obtained, and their signifi cance.
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Literature references should appear in the text as consecutive numbers between angular brackets, e.g. [3], they should be listed in full at theend of the article.
Formats for citations[1] C.S. Lin, Y.L. Lay, C.C. Huan, H.C. Chang, T.S. Hwang, An imagebasedLCD positioning system utilizing the modifi ed FHT method,Optik 114 (2003) 151–160.[2] M. Gu, Advanced optical imaging theory, Springer, Heidelberg, 2000.[3] G.R. Meredit, Prospect of New Nonlinear Organic Materials, inC. Flytzanis, J.L. Oudar (Eds.), Material and Devices, Springer Verlag,Berlin, 1986, pp. 116–127.
In order to facilitate speedy and correct publication, please send us thefi nal form of your manuscript, carefully typed and ready for printing.Only printer’s errors may be corrected in the proofs.
Later alterations would have to be published at the end of the articleunder the heading “Postscript at proof stage”. Please take special carewith the writing of formulae. There should be clear distinctions between0 (zero) and o, O (letter o); between 1 (fi gure one), I (absolute value stroke), and l (letter l); also between n and u, and small k and capital K. Please indicate clearly the positional height of all symbols so that powers and indices can be recognized correctly.All formula symbols will be set in sloping type (italics), except for those denoting functions (sin, exp. etc), or units (cm, J. etc.), and abbreviations (max., etc). Any further exceptions should be marked in the text. Vectorswill always be set in half bold type instead of arrows above them.
OffprintsThe corresponding author, at no cost, will be provided with a PDF fi leof the article via e-mail. The PDF fi le is a watermarked version of the published article and includes a cover sheet with the journal coverimage and a disclaimer outlining the terms and conditions of use.Additional offprints may be ordered when proofs are returned.
Originality and plagiarismThe authors should ensure that they have written entirely original works, and if the authors have used the work and/or words of others, that this has been appropriately cited or quoted. Plagiarism takes many forms, from ‘passing off’ another’s paper as the author’s own paper, to copying or paraphrasing substantial parts of another’s paper (without attribution), to claiming results from research conducted by others. Plagiarism in all its forms constitutes unethical publishing behavior and is unacceptable.
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Instructions to authors
Editorial BoardProf. Dr. Hartmut BarteltAlbert-Einstein-Strasse 907745 Jena, Germany
Prof. Dr. Eusebio BernabeuCiudad Universitaria, S/NE-28040 Madrid, Spain
Prof. Dr. Shanti BhattacharyaChennai 600036, India
Prof. Dr. Siegfried BoseckPostfach 33 04 4028334 Bremen, Germany
Prof. Pankaj Kr. Choudhury 43600 Bangi, Selangor, Malaysia
Prof. Dr. M.J. DamzenImperial College LondonLondon SW7 2BZ, UK
Prof. Dr. François FloryDomaine de St. JérômeF - 13397 Marseille Cedex 20
Prof. Ari T. FribergElectrum 229SE - 164-40 Kista, Sweden
Prof. Dr. Min GuPO Box 218 HawthornVictoria 3122, Australia
Prof. Dr. Yoshiki IchiokaKamokogahara 1-4-15-131,Higashinada-kuKobe, 658-0064 Japan
Prof. Dr. Guy IndebetouwVirginia Tech, BlacksburgVirginia 24061-0435, USA
Prof. Dr. Henryk KasprzakWyberzeze Wyspianskiego 2750-370 Wroclaw, Poland
Prof. Dr. Helmut KohlWilhelm Klemm Strasse 1048149 Münster, Germany
Prof. Dr. Akhlesh Lakhtakia212 Earth-Engineering ScienceUniversity Park, PA 16802-6812, USA
Prof. Dr. Baida LüSichuan UniversityChengdu 610064, P.R.China
Dr. Kaoru Minoshima1-1-1 Umezono, Tsukuba 305-8563, Japan
Prof. Dr. Sergej Odoulov46 Science Avenue 252650 Kiev-22, Ukraine
Prof. Dr. John T. SheridanUniversity College Dublin 4, Ireland
Dr. Serguej StepanovKm. 107 carr. Tijuana-Ensenada,Ensenada, 22860, Mexico
Prof. Dr. Jari TurunenYliopistokatut, P.O.B. 111FIN – 80101 Joensuu, Finnland
Prof. Dr. Frantisek UherekJlkovicova 3, 81219 Bratislava, Slovak Republic
Dr. Lingli WangCTO Jos. Schneider Optische Werke GMBH,Ringstr. 132, 55543 Bad Kreuznach, Germany
Prof.Dr.Chunming ZhangXi’an 710049, China
