Embed Size (px)
Citation preview
AgilentMillimeter-Wave Network Analyzers 10 MHz to 110 GHz, with Extensions to 0.5 THz
Technical Overview
High Performance Bench-Top Network Analyzers
• Maximize your frequency coverage with a single sweep from 10 MHz to 110 GHz, and
realize measurements to 0.5 THz with frequency extensions
• Minimize space and maintenance costs with compact test heads and two built-in
synthesizers
• Optimize your test setup with 29 IFBW settings, 32 channels, 64 traces, and 20,001
points
• Capitalize on high performance with exceptionally accurate measurements inherent to
the PNA Series of network analyzers
• Extend your measurement capability with four port mm-wave measurements in
waveguide bands up to 0.5 THz
2
Built on a solid foundation, the Agilent millimeter-wave
solutions bring PNA Series performance, flexibility,
ease-of-use, and connectivity to your design and test
challenges in millimeter-wave applications.
The Agilent N5250C 110 GHz system is the only bench-top, broadband system
with integrated tri-axial bias tees that provides accurate control of device bias
through its force/sense ability. This system is ideal for device characterization,
modeling and parameter extraction in coaxial or on-wafer because accurate
biasing leads to precise characterization, and broad frequency coverage down to
10 MHz offers superb time domain resolution.
N5250C Key Features and Benefi ts
• 10 MHz to 110 GHz frequency range in a single sweep.
• Deliver accurate biasing through tri-axial bias tees near test ports.
• 20,001 points allow you to calibrate once over a wide frequency range and then focus
in on frequencies of interest.
• Two new calibration capabilities, data-based calibration standards and expanded
calibration algorithm, offer enhanced accuracy and design confidence.
• Code compatibility available to help Agilent 8510 users to migrate to the innovative
and flexible PNA series platform.
3
N5250C PNA Millimeter-Wave Network Analyzer
Performance
The N5250C offers unsurpassed performance for broadband, mm-wave measurements.
Figure 1 demonstrates the superb dynamic range of the N5250C system compared to
Agilent’s previous 8510XF system when measuring a connectorized bandpass filter at
94 GHz.
The N5250C also offers superb speed with measurements up to 42 times faster than the
8510XF. All of this performance comes in a compact package that requires no external
synthesizers. The port 1 millimeter-wave test head has a 25 dB attenuator to control
power using a continuously adjustable micrometer.
S21 Measurement of FilterN5250C vs. 8510XF
0
-10
-20
-30
-40
-50
-60
-70
-80
-90
-100
87 89 90.99 92.99 94.98 96.98 98.97 101
Frequency (GHz)
dBN5250C
8510XF
Figure 1. S21
fi lter measurement comparisons with Agilent’s N5250C and 8510XF systems.
The N5250C offers excellent performance for on-wafer measurements as well. Options
017 and 018 add 67 GHz bias-tees to the combiner assembly, between the input to the
combiner and the 67 GHz coupler. The bias-tees have tri-axial connectors force, sense,
and ground. Positioning the bias-tees close to the DUT greatly improves stability for
on-wafer and in-fixture devices.
Figure 2. 110 GHz millimeter-wave system with Cascade Microtech’s probe station.
4
Figure 3 shows an S21
measurement of a 40 ps transmission line made on a Cascade
Microtech1 Summit probe station with Infinity probes. The N5250C is fully compatible
with the Wavevue Measurement Studio Software from Cascade.
1. Cascade Microtech is an Agilent channel
partner. www.cascademicrotech.com
Figure 3. S21
measurement of a 40 ps transmission line made on a Cascade Microtech Summit
probe station with Infi nity probes.
Flexibility
The N5250C builds on the flexibility and performance of Agilent’s PNA series of network
analyzers. Purchase the full N5250C system, and have the flexibility of both a 10 MHz to
67 GHz PNA and mm-wave heads covering 67 GHz to 110 GHz, which combine to create
a broadband, high performance 110 GHz system.
Alternatively, purchase an E8361C PNA with Option H11 (covering 10 MHz to 67 GHz)
now, and you can easily upgrade in the future to the 110 GHz system by simply adding
the N5260A mm-wave controller with test heads.
Ease-of-use
The N5250C uses the standard PNA firmware, allowing you to: leverage software
between PNA Series network analyzers, regardless of the frequency range of your
measurement; manually control the instrument, using either the front panel or a mouse
to access the simple pull-down menus; and utilize the Cal Wizard, which will guide you
step-by-step through the most complicated of calibrations.
Also, an extensive, context-sensitive Help system thoroughly explains all of the PNA’s
features. In any dialogue box, simply click Help to see a detailed explanation of the
feature you are using. Programming examples in both SCPI and COM are also included.
5
Connectivity
Windows® built-in operating system and familiar user interface provides both ease-of-use
and connectivity.
• Capture images quickly, easily and in .jpg, .bmp, and .png formats for easy data
analysis, archiving, and printing.
• Control the analyzer using SCPI commands or gain the speed and connectivity
advantage of COM/DCOM.
• Develop code in programming environments such as Visual Basic, Visual Basic.NET,
Visual C++, Visual C++.NET, Agilent-VEE, or LabView.
• Execute code directly from the analyzer or remotely with an external PC through LAN
or GPIB, or multiple USB ports.
• Use multiple USB ports to control a variety of peripherals.
The N5250C PNA and the entire series of microwave PNA instruments are based on the
Windows XP operating system, which makes operation and programming simple, and
provides a powerful environment in which easy-to-use measurement functions and PC
capabilities are seamlessly linked. In addition, the new millimeter-wave PNA has linkages
to Agilent’s Advanced Design System (ADS) and IC-CAP modeling software.
For parameter extraction and device modeling, the N5250C is compatible and fully
supported by the Agilent IC-CAP modeling software, the platform of choice for high
frequency device modeling. IC-CAP is an open platform that offers flexibility for RF
engineers to modify and customize their own models and thus, enhancing model
accuracy.
6
1. Typical performance is expected performance
of an average unit which does not include
guardbands. It is not covered by the product
warranty.
2. Assumes a 30-inch cable from PNA 1.85 mm
Test Port Out is used to provide the 10 MHz to
67 GHz source signal. The standard confi guration
does not have a bias tee in the 1.0 mm head.
3. Assumes a 30-inch cable from PNA Source
Out bulkhead connector is used to provide the
10 MHz to 67 GHz source signal. Option 017
includes a bias tee in the 1.0 mm head.
4. Measured at test port in a 10 Hz bandwidth.
Typical performance1
Test port power (dBm)
1.0 mm test port (standard
confi guration2 or Option 0173) 1.85 mm PNA port
10 to 45 MHz –8 –7
45 to 500 MHz –3 –1
500 MHz to 2 GHz 0 +2
2 to 10 GHz –2 +2
10 to 24 GHz –5 0
24 to 30 GHz –7 0
30 to 40 GHz –10 –1
40 to 45 GHz –15 –5
45 to 50 GHz –12 –1
50 to 60 GHz –17 –4
60 to 67 GHz –19 –8
67 to 70 GHz –9 n/a
70 to 75 GHz –7 n/a
75 to 80 GHz –6 n/a
80 to 100 GHz –5 n/a
100 to 110 GHz –8 n/a
Noise fl oor4 (dBm) 1.0 mm test port 1.85 mm PNA port
10 to 45 MHz –71 –72
45 to 500 MHz –97 –98
500 MHz to 2 GHz –120 –121
2 to 10 GHz –118 –121
10 to 24 GHz –116 –121
24 to 30 GHz –107 –112
30 to 40 GHz –102 –108
40 to 45 GHz –99 –106
45 to 50 GHz –97 –104
50 to 60 GHz –95 –104
60 to 67 GHz –92 –103
67 to 70 GHz –92 n/a
70 to 75 GHz –96 n/a
75 to 80 GHz –95 n/a
80 to 100 GHz –94 n/a
100 to 110 GHz –95 n/a
System dynamic range4 (dB) 1.0 mm test port 1.85 mm PNA port
10 to 45 MHz 63 65
45 to 500 MHz 94 97
500 MHz to 2 GHz 120 123
2 to 10 GHz 116 123
10 to 24 GHz 111 121
24 to 30 GHz 100 112
30 to 40 GHz 92 107
40 to 45 GHz 84 101
45 to 50 GHz 85 103
50 to 60 GHz 78 100
60 to 67 GHz 75 95
67 to 70 GHz 83 n/a
70 to 75 GHz 89 n/a
75 to 80 GHz 89 n/a
80 to 100 GHz 89 n/a
100 to 110 GHz 87 n/a
7
Residual directivity
–60
–55
–50
–45
–40
–35
–30
–25
–20
–15
–10
–5
0
0 20 40 60 80 100
Frequency in GHz
Vec
tor
erro
r m
ag (
dB)
0 20 40 60 80 100
Frequency in GHz
Vec
tor
erro
r m
ag (
dB)
Residual reflection tracking
-0.15
-0.14
-0.13
-0.12
-0.11
-0.1
-0.09
-0.08
-0.07
-0.06
-0.05
-0.04
-0.03
-0.02
-0.01
0
0 20 40 60 80 100
Frequency in GHz
Vec
tor
erro
r m
ag (
dB)
Residual source match
–50
–45
–40
–35
–30
–25
–20
–15
–10
–5
0
Residual load match
–50
–45
–40
–35
–30
–25
–20
–15
–10
–5
0
0 20 40 60 80 100
Frequency in GHz
Vec
tor
erro
r m
ag (
dB)
Residual transmission tracking
–0.18
–0.17
–0.16
–0.15
–0.14
–0.13
–0.12
–0.11
–0.1
–0.09
–0.08
–0.07
–0.06
–0.05
–0.04
–0.03
–0.02
–0.01
0
0 20 40 60 80 100
Frequency in GHz
Vec
tor
erro
r m
ag (
dB)
Figure 4. Plots showing residual calibration errors
based on a coverage factor of 2 (2 sigma).
Measurement cycle time1 (ms) Forward sweep, uncorrected
Number of points
51 101 201 401 801 1601
10 MHz to 110 GHz
10 kHz IFBW
300 400 500 600 700 1000
58 to 62 GHz
10 kHz IFBW
111
75 to 79 GHz
10 kHz IFBW
93
Cycle time versus IF bandwidth Forward sweep, uncorrected, 201 points
IF bandwidth (Hz) 45 MHz to 100 GHz cycle time (ms) 75 to 79 GHz cycle time (ms)
10000 500 93
1000 800 267
100 3500 2000
10 20900 18200
1. “Cycle time” includes sweep time, retrace time, and band-crossing time. For a full 2-port corrected
measurement with forward and reverse sweeps, the cycle times above should be approximately doubled.
Test port damage level
Frequency 1.0 mm test port 1.85 mm test port Waveguide port
10 MHz to 110 GHz 27 dBm 27 dBm 27 dBm
Option H08 and H11 rear panel connectors (typical)IF connectors A, R1, R2, B (BNC Connectors)
IF connector input frequency 8.333 MHz
Nominal input impedance at IF inputs 50 Ω
RF damage level to IF connector inputs –20.0 dBm
DC damage level to IF connector inputs 25 volts
0.1 dB compression point at IF inputs –27.0 dBm
Pulse input connectors1 A, R1, R2, B (BNC Connectors)
Nominal input impedance at pulse inputs 1 Kohm
Minimum IF gate width 20 ns for less than 1 dB deviation
from theoretical performance2
DC damage level to pulse connector inputs 5.5 volts
Drive voltage TTL (0, +5.0) volts
Rear panel LO power – test port frequency
(see 836x H11 specs for test port frequencies up to 67 GHz)
67 GHz to 110 GHz3 –7 to –13 dBm
Rear panel RF power – test port frequencies
(see 836x H11 specs for test port frequencies up to 67 GHz)
67 GHz to 76 GHz4 –4 to –10 dBm
76 GHz to 96 GHz4 +1 to –5 dBm
96 GHz to 110 GHz4 +5 to –1 dBm
1. Pulse input connectors are operational only with Option H08 (Pulse Measurement Capability) enabled.
2. Based on deviation from signal reduction equation: Signal Reduction (dB) = 20log10
(Duty_cycle) =
20log10
(pulse_width/period). Measured at Pulse Repetition Frequency (PFR) of 1 MHz.
3. For rear panel LO port frequency, divide by 8.
4. For rear panel RF port frequency, divide by 6.
Note: Typical system performance for front panel jumpers is not provided for the N5250C.
8
Figure 5. With Option 017, the signal is routed out of PNA from the front panel jumpers rather than the ports. Without
Option 017, the signal is routed from the front panel ports to the combiner assembly, allowing access to the PNA’s
internal bias-tees.
Receiver A Receiver B
Port 1 Port 2
67 to 110 GHz
waveguide head
67 to 110 GHz
waveguide head
IF1 IF2 IF3 IF4
Test set I/O
LO RF
Combiner assembly
Testport 1
Testport 2
E8361Cwith Option H11
N5260Awith
test heads
30 in.
76.2 cm
48 in.
121.9 cm
30 in.
76.2 cm
48 in.
121.9 cm
Combiner assembly
Optionalbias-tees
(Option 017)
Test set controller
Reference receiver
Reference receiver
Option 016receiver
attenuators
Port 1 Port 2
Bias-tee
50 dB
A
Bias-tee
50 dB
B
R1 R2
LO distribution toeach receiver
To IF multiplexer(see Figure 5)
To IF multiplexer(see Figure 5)
LO: 2 to 20 GHz
R1IF
R2IF
AIF
BIF
R1gate
R2gate
Agate
BgateRF: 2 to 20 GHz
IF multiplexer
A/D
ExternalIF input
IF gating
RF
LO(from LO distribution.
See test setblock diagram)
SMAconnectors
BNCconnectors
SMAconnectors
BNCconnectors
50 dB 50 dB
N5250C system block diagram
Figure 6. Simplifi ed receiver block diagram
Figure 7. PNA test set block diagram
9
Banded mm-wave Features
• Use the 2-port N5260A millimeter-wave test set controller to interface your PNA to the
millimeter-wave module of your choice
• Use the 2-port N5261A or 4-port N5262A millimeter- wave test set controller to
interface the PNA-X to the millimeter-wave module of your choice
• Wide selection of waveguide modules available to cover from 50 GHz to 0.5 THz1
• Flexible configuration, evolve as your needs grow
• Up to 20 dB improvement of dynamic range can be achieved by adding external
synthesizers2
Performance
Banded millimeter-wave systems configured with the PNA-X offer exceptional dynamic
range all the way to 0.5 THz without additional external synthesizers. See Figure 9 for
comparisons of waveguide band WR-03. Plus, pulsed millimeter-wave measurements can
easily be achieved by simply adding built-in pulse generators and modulators, with no
extra external equipment required.
With the PNA banded millimeter-wave system configured to make measurements from
140 GHz to 220 GHz (WR-05 waveguide band), dynamic range better than 60 dB across
the entire band is achievable without any external synthesizers. As shown in Figure 8,
adding two external synthesizers3 can improve dynamic range up to 10 dB across the
fequency range.
– 13 0 .0 0
– 12 0 .0 0
– 110 .0 0
– 10 0 .0 0
– 9 0. 00
– 8 0. 00
– 7 0. 00
– 6 0. 00
– 5 0. 00
– 4 0. 00
– 3 0. 00
– 2 0. 00
– 10 .0 0
0. 00
140 150 160 170 180 190 200 210 220
Frequency (GHz)
No PSG, 10 Hz BW
PSG, 10 Hz BW
dB
WR-05, Dynamic range
1. VNA2 waveguide modules from OML, Inc.
are compatible with PNA and PNA-X banded
millimeter-wave systems. VNA1 waveguide
module from OML, Inc. may be used with 8510
systems. These VNA1 waveguide modules can
be upgraded to VNA2 modules. Please contact
OML, Inc. for details of upgrade, or visit OML,
Inc. at www.omlinc.com
2. For systems based on the PNA (not PNA-X),
adding external synthesizers can improve
dynamic range significantly at or above 220 GHz,
while slight improvement can be seen between
110 GHz and 220 GHz.
3. External synthesizers used are the Agilent PSG
Series, E8257D with Options 520 (20 GHz) and
UNX (Ultra-low Phase Noise). Two external
synthesizers are required; one for the RF signal
and the other for the LO signal.
4. This plot is intended for use as a reference, and
not as specifications. PNA system configuration
included the E8362C 20 GHz MW PNA with
Options H11, UNL, 014, 080 & 081, the N5260A
mm-wave test set controller with one WR-05
Transmission/Reflection (T/R) test head module
and one WR-05 Transmission-only (T) test
head module. (One T/R module and one T
module allow for S11 and S21 measurements.
Two T/R modules allow for S11, S21, S12 and
S22 measurements.) External synthesizers
were added for dynamic range comparison.
Measurement setup: 201 points, 10 Hz IF BW,
and no average.
Figure 8. Dynamic range4 of frequency band WR-05 (140 to 220 GHz), PNA System with and without
external synthesizers3.
Banded Millimeter-Wave Key Features and Benefi ts
The Agilent banded millimeter-wave system provides measurement capabilities
up to 0.5 THz! Systems are extremely easy to configure and can be adapted to
different needs as your measurement requirements change.
10
220 230.5 241 251.5 262 272.5 283 293.5 304 314.5 325
Frequency (GHz)
dB
No PSG, 10 HzPSG, 10 Hz No PSG, 10 Hz, PNA-X
0.00
–20.00
–40.00
–60.00
–80.00
–100.00
–120.00
1. This plot is intended for use as a reference, and
not as specifi cations. PNA system confi guration
included the E8362C 20 GHz MW PNA with
Options H11, UNL, 014, 080 and 081, the
N5260A mm-wave test set controller with one
WR-03 Transmission/Refl ection (T/R) test head
module and one WR-03 Transmission-only (T)
test head module. (One T/R module and one T
module allow for S11 and S21 measurements.
Two T/R modules allow for S11, S21, S12 and
S22 measurements.) External synthesizers
were added for dynamic range comparison.
PNA-X system confi guration included the
N5242A with options 200 and 020, the N5260A
millimeter-wave test set controller with one
WR-03 T/R module and one WR-03 T module.
Measurement setup: 201 points, 10 Hz IF BW,
and no average.
2. External synthesizers used are the Agilent PSG
Series, E8257D with Options 520 (20 GHz) and
UNX (Ultra-low Phase Noise). Two external
synthesizers are required; one for the RF signal
and the other for the LO signal.
3. The following Microwave PNA’s are compatible:
E8361/2/3/4C; each unit must include
Options H11, 014, UNL, 080 and 081. PNA-X
confi guration includes N5242A with Options 200
and 020.
4. External synthesizers can be added to the PNA
system as desired.
Figure 9 illustrates achievable dynamic range from 220 to 325 GHz (WR-03 waveguide
band). By adding external synthesizers to the PNA setup, an improvement of up to 20 dB
is achievable, resulting in better than 60 dB in dynamic range across the entire frequency
band, which is similar to that of the PNA-X (without external synthesizer). For additional
details and millimeter-wave configuration information refer to Application Note 1408-15:
Banded Millimeter-Wave Measurements with the PNA, literature number 5989-4098EN,
found on the PNA Web page: www.agilent.com/find/pna
Figure 9. Dynamic range1 of frequency band WR-03 (220 to 325 GHz), PNA system with and without
external synthesizers2 and PNA-X.
The PNA banded millimeter-wave system can also be configured for on-wafer
applications. Waveguide probing accessories are available from Cascade Microtech,
including Impedance Standard Substrates (ISS) for waveguide probes. Figure 10 shows
the waveguide version of Cascade’s Infinity probe to 220 GHz.
Figure 10. Cascade Infi nity Probe (GSG 150),
waveguide versions to 220 GHz.
Flexibility
The PNA banded millimeter-wave systems offer exceptional performance with ultimate
system flexibility. A banded millimeter-wave system can be configured from the N5250C
110 GHz system by simply replacing the test head modules with the waveguide modules
of your choice. A banded millimeter-wave system can also be configured from any of the
Microwave PNA Series3 or the PNA-X by simply adding the N5260A millimeter-wave test
set controller and a pair of waveguide band test head modules4.
11
Ease-of-use
The banded millimeter-wave system uses the standard PNA firmware, allowing you to;
leverage software between PNA Series network analyzers, regardless of the frequency
range of your measurement; manually control the instrument, using either the front panel
or a mouse to access the simple pull-down menus; and utilize the Cal Wizard, which will
guide you step-by-step through the most complicated of calibrations.
The banded millimeter-wave system can easily be configured using the dialogue box
shown in Figure 11. Multiple system configurations can be added to the list, but only
one is active at a time. Creating a banded configuration is easy, simply enter the start
and stop frequencies, and the multipliers for RF and LO frequency ranges (the values
are located on the test head modules). Once a configuration has been added to the list,
simply highlight the setup of choice and then click Activate Selected Config to apply.
A number of different configurations are available that allow setup for your system with
added control on the ALC for the N5261A and N5262A test sets. This interface allows
for the ease of switching from one configuration to the next without restarting the PNA/
PNA-X or reconfiguration of connections.
In addition, an extensive, context-sensitive Help system thoroughly explains all of the
PNA’s features. In any dialog box, simply click Help to see a detailed explanation of the
feature you are using. Programming examples in both SCPI and COM are also included.
Connectivity
Windows built-in operating system and familiar user interface provides both ease-of-use
and connectivity.
• Capture images quickly, easily and in .jpg, .bmp, and .png formats for easy data
analysis, archiving, and printing.
• Control the analyzer using SCPI commands or gain the speed and connectivity
advantage of COM/DCOM.
• Develop code in programming environments such as Visual Basic, Visual Basic.NET,
Visual C++, Visual C++.NET, Agilent-VEE, or LabView.
• Execute code directly from the analyzer or remotely with an external PC through LAN
or GPIB, or multiple USB ports.
• Use multiple USB ports to control a variety of peripherals.
The PNA millimeter-wave series and the entire series of microwave PNA instruments are
based on the Windows XP operating system, which makes operation and programming
simple, and provides a powerful environment in which easy-to-use measurement
functions and PC capabilities are seamlessly linked.
Figure 11. On-screen dialog to confi gure a banded millimeter-wave setup
12
Port 1 Port 2
waveguide head waveguide head
IF1 IF2 IF3 IF4
Test set I/O
LO RF
Testport 1
Testport 2
Any Microwave PNA (E8361/2/3/4C with Options H11, 014, UNL, 080, 081)
N5260A
Waveguide modules of choice
48 in.
121.9 cm 48 in.
121.9 cm
Test set controller
N5250C Ordering Information
With the N5250C, you receive all of the features and flexibility of the PNA platform,
including:
• Windows architecture
• LAN, GPIB, and multiple USB ports
• 29 IFBW settings, 32 channels, 64 traces, and 20,001 points per trace
• Frequency converter measurements1, pulsed-RF measurements1, and time-domain
transform applications
Note: Requires a completed ISP at time of order
N5250C confi guration (block diagram detail shown in Figure 5)
• E8361C PNA microwave network analyzer which supplies the signal for frequencies up
to 67 GHz
• Millimeter-wave test set controller drives the millimeter-wave test heads for
performance up to 110 GHz
• The combiner assembly contains a 67 GHz coupler and a combiner that combines the
10 MHz to 67 GHz signal from the PNA with the 67 GHz to 110 GHz signal from the
millimeter-wave test heads. Option 017 allows you to add bias-tees to the combiner
assembly for added measurement stability for on-wafer and in-fixture devices.
• Millimeter-wave test heads provide the signal from 67 GHz to 110 GHz
• Test set and module cables
Figure 13. A banded millimeter-wave system consists of three major components: (1) Microwave PNA
(E8361/2/3/4C with Options H11, 014, UNL, 080, 081) or PNA-X (N5242A with Options 200 and 020),
(2) N5260A and (3) Test head modules.
Banded millimeter-wave block diagram
1. Up to 67 GHz.
Figure 12. N5261A/62A
Test Set Block Diagram
13
N5250C PNA millimeter-wave system, 10 MHz to 110 GHz, includes:
E8361C MW PNA with IF access (Option H11)
• Configurable test set – Option 014
• Extended power range and bias-tees – Option UNL
• Frequency-offset mode – Option 080
• Reference channel switch – Option 081
N5260A millimeter-wave test set controller with test heads
• 67 GHz to 110 GHz test heads, micrometer attenuator on port 1
• 1.0 mm combiner assembly
• Test set and module interconnecting cables
Installation and productivity assistance (requires a completed ISP at order)
Additional options available:
• Millimeter-wave modules with bias-tees – Option 017
• Millimeter-wave modules with bias-tees and port 2 attenuator – Option 018
• Receiver attenuator – Option 0162
• Time-domain capability – Option 010
• Pulsed-RF measurement capability – Option H082
• Frequency converter application – Option 0832
Factory integration of the N5250C system integrates the E8361C with Option H11 and
the N5260A millimeter-wave test set controller with test heads. On-site installation is
included, and the entire system carries a full one-year, on-site warranty (where available).
Accessories
On-wafer applications
For on-wafer applications, Cascade Microtech provides complete probing systems using
the N5250C and other PNA configurations. These include both new probing systems and
upgrades to existing Cascade Microtech products. Cascade can also provide on-wafer
verification and probing system training. Once the N5250C system is verified in coax,
Cascade Microtech will verify the system through its wafer probes.
Recommended bias tee connection for N5250C
The following is a list of cables and adapters that are suggested for connection of
the bias tee on the N5250C option 017 and option 018 systems to a 4156C Parametric
Analyzer. For other power supplies a different combination of cables maybe required.
• Quantity 5 of the Triax to sub-mini-triax Cascade cable part number is 104-330-LC,
(these are used to connect to the Bias Tee connectors on the N5250C combiner
module).
• Quantity 5 of the Triax Barrel TEI-14949 from Trompeter part TEI-14949 (use to
connect the Cascade cable to the Agilent cables on item 3).
• Quantity 4 of the Agilent Triax to Triax cables Agilent product number 16494A (these
are used for the FORCE/SENSE connection, 24 inches long).
• Quantity 1 of the Agilent 16493H Triax to Triax cables Agilent product number 16493H
(these will be used for the GNDU connection).
Note: A second GNDU connection is not required to prevent any ground currents.
1. For on-wafer applications, two 11500J/K/L cables are required; one cable for each test port.
2. These options apply to the E8361C and are limited to 67 GHz frequency range.
1.0 mm accessories
The following accessories are
available for use with the N5250C
system, but are not included in the
system.
• 11500I 1.0 mm (f-f) test port cable
(8.8 cm)
• 11500J 1.0 mm (m-f) test port
cable (16.0 cm)1
• 11500K 1.0 mm (m-f) test port
cable (20.0 cm)1
• 11500L 1.0 mm (m-f) test port
cable (24.0 cm)1
• 85059A DC to 110 GHz precision
calibration/verification kit
• V281C 1.0 mm (f) to V-band
waveguide adapter
• V281D 1.0 mm (m) to V-band
waveguide adapter
• W281C 1.0 mm (f) to W-band
waveguide adapter
• W281D 1.0 mm (m) to W-band
waveguide adapter
• 11920A 1.0 mm (m) to 1.0 mm (m)
adapter
• 11920B 1.0 mm (f) to 1.0 mm (f)
adapter
• 11920C 1.0 mm (m) to 1.0 mm (f)
adapter
• 11921E 1.0 mm (m) to 1.852 mm
(m) adapter
• 11921F 1.0 mm (f) to 1.852 mm (f)
adapter
• 11921G 1.0 mm (m) to 1.852 mm
(f) adapter
• 11921H 1.0 mm (f) to 1.852 mm
(m) adapter
• 11922A 1.0 mm (m) to 2.4 mm (m)
adapter
• 11922B 1.0 mm (f) to 2.4 mm (f)
adapter
• 11922C 1.0 mm (m) to 2.4 mm (f)
adapter
• 11922D 1.0 mm (f) to 2.4 mm (m)
adapter
• 11923A 1.0 mm (f) connector
launch assembly
14
N525OC Components Available Separately
E8361C MW PNA with the following options:
• IF access – Option H11 (required)
• Configurable test set – Option 014 (required)
• Extended power range and bias-tees – Option UNL (required)
• Frequency-offset mode – Option 080 (required)
• Reference channel switch – Option 081 (required)
Additional options available:
• Receiver attenuator – Option 0161
• Time-domain capability – Option 010
• Pulsed-RF measurement capability – Option H081
• Frequency converter application – Option 0831
The N5260A millimeter wave controller with test heads may be purchased separately in
the future to add a single sweep 10 MHz to 110 GHz capability.
N5260A millimeter-wave test set controller, includes:
• Millimeter-wave test set controller
• Two sets of 48 inch test head cables for RF, LO, IF and DC for connection to test heads
• A set of IF, RF, LO and test set interface cable for connection to the PNA or PNA-X
Note: PNA-X requires a set of 4 BNC-SMA adapters and a 10 dB pad for use with the
N5260A.
Additional options available: (choose one, if applicable)
The following options include installation and productivity assistance – requires a
complete ISP at time of order.
• Option 110 adds 67 GHz to 110 GHz test heads with combiner assembly, and port 1
attenuator.
• Option 120 adds 67 GHz to 110 GHz test heads with combiner assembly, port 1
attenuator and bias-tees.
• Option 130 adds 67 GHz to 110 GHz test heads with combiner assembly, bias-tees,
ports 1 and 2 attenuators.
Note: Option PS-S20 Productivity assistance recommended when Option 110, 120, or 130
is NOT ordered.
Banded Millimeter Wave System Confi guration
To configure a basic banded millimeter wave measurement system, three basic
components are required:
1. A performance network analyzer
2. Millimeter wave test set controller
3. A waveguide module based on application need and frequency band
4. An optional calibration kit in waveguide unless on-wafer or other media is being used
1. These options apply to the E8361C and are
limited to 67 GHz frequency range.
15
Performance network analyzer
Product model Description Minimum required optionsE8362C 20 GHz 2-port performance
network analyzer
H11, 080, 081, 014 and UNL
E8363C 40 GHz 2-port performance
network analyzer
H11, 080, 081, 014 and UNL
E8364C 50 GHz 2-port performance
network analyzer
H11, 080, 081, 014 and UNL
E8361C 67 GHz 2-port performance
network analyzer
H11, 080, 081, 014 and UNL
N5242A Opt. 2xx 26.5 GHz 2-port PNA-X
network analyzer
Option 020
N5242A Opt. 4xx 26.5 GHz 4-port PNA-X
network analyzer
Option 020
Note: When configuring the N5242A (Option 200 and 224 required) with a N5262A 4-port millimeter
wave test set controller, also include Option 551 for 4-port calibration capability.
Optionally for rear panel connection of the RF source to the N5261A/N5262A test set
controller include the switch combiner options to the N5242A selected above. For N5242A
with Option 2xx, add Option 224 and for the N5242A with Option 4xx, add Option 423.
For E836x based systems used with modules above 200 GHz, these systems require a
pair of external synthesizers (one for RF and the other for LO) to increase the dynamic
range, see Figure 9 for improvement. Recommended synthesizers are E8257D with
Options 520 and UNX.
Millimeter wave test set controllers
Product number Description OptionsN5260A 2-port test controller
for PNA based
solution
Includes all cables for connection to PNA
as well as two sets of 48 inch RF, LO, DC
and IF cables for connection to a pair of
T/R millimeter modules.
N5261A 2-port test set
controller for PNA-X
based confi guration
• Option 102 – A set of cables for
connection to a 2-port PNA-X
• Option 104 – A set of cables for
connection to a 4-port PNA-X
• Option 50x – A single set of RF, LO, DC
and IF cables for connection to a single
T/R millimeter module (see Option
Descriptions for details).
N5262A 4-port test set
controller for PNA-X
based confi guration
• Option 102 – A set of cables for
connection to a 2-port PNA-X
• Option 104 – A set of cables for
connection to a 4-port PNA-X
• Option 50x – A single set of RF, LO, DC
and IF cables for connection to a single
T/R millimeter module (see Option
Descriptions for details).
When configuring the PNA-X with a N5260A millimeter wave test set controller, please
include a 10 dB 3.5 mm pad for connection to the LO and a set of four BNC to SMA
adapters.
Millimeter wave modules
Several modules are available and other special options may be configured on request.
Select the appropriate quantity of modules required for the measurement set up. To
request a specially configured test module contact your local Agilent sales engineer.
The single and dual channel receiver modules are used for antenna applications or for
1-port single path S-parameter measurements.
16
Transmission refl ection modules
Waveguide flange Frequency GHz
Standard transmission/reflection modules
Transmission/reflection modules with 25 dB mechanical attenuator
Transmission/reflection modules with 15 dB LO and RF amplifier1
WR22 33 - 50 N5256AW22 - STD N5256AW22 - 001 N5256AW22 - 002
WR15 50 - 75 N5256AW15 - STD N5256AW15 - 001 N5256AW15 - 002
WR12 60 - 90 N5256AW12 - STD N5256AW12 - 001 N5256AW12 - 002
WR10 75 - 110 N5256AW10 - STD N5256AW10 - 001 N5256AW10 - 002
WR08 90 - 140 N5256AW08 - STD N5256AW08 - 001 N5256AW08 - 002
WR06 110 - 170 N5256AW06 - STD N5256AW06 - 001 N5256AW06 - 002
WR05 140 - 220 N5256AW05 - STD N5256AW05 - 001 N5256AW05 - 002
WR03 220 - 325 N5256AW03 - STD N5256AW03 - 001 N5256AW03 - 002
WR02.2 325 - 500 N5256AW02 - STD Not available N5256AW02 - 0022
Extended WR12 56 - 94 N5256AX12 - STD N5256AX12 - 001 Available on request
1. Note the modules with the RF/LO amplifi ers are for antenna applications that include a cable loss of 15 dBm to the module from the port of the Test set being used. Do not connect these directly to the test set controller port with the standard 48 inch cable, use a 15 dB pad if needed.
2. These modules require an external DC power supply (e.g. E3615A) when using them with the N5260A.3. For transmission reflection modules with both the 25 dB mechanical attenuator and the 15 dB LO and RF amplifier order N5256AWxx-003. Not available for N5256AW02
Single channel receive modules
Waveguide flange Frequency GHzStandard single channel receive modules
Single channel receive modules with 15 dB LO amplifier
WR22 33 - 50 N5257AR22 - STD N5257AR22 - 001
WR15 50 - 75 N5257AR15 - STD N5257AR15 - 001
WR12 60 - 90 N5257AR12 - STD N5257AR12 - 001
WR10 75 - 110 N5257AR10 - STD N5257AR10 - 001
WR08 90 - 140 N5257AR08 - STD N5257AR08 - 001
WR06 110 - 170 N5257AR06 - STD N5257AR06 - 001
WR05 140 - 220 N5257AR05 - STD N5257AR05 - 001
WR03 220 - 325 N5257AR03 - STD N5257AR03 - 001
WR02.2 325 - 500 N5257AR02 - STD Available on request
Dual channel receive modules
Waveguide flange Frequency GHzStandard dual channel receive module
Dual channel receive module with 15 dB LO amplifier
WR15 50 - 75 N5258AD15 - STD N5258AD15 - 001
WR12 60 - 90 N5258AD12 - STD N5258AD12 - 001
WR10 75 - 110 N5258AD10 - STD N5258AD10 - 001
WR08 90 - 140 N5258AD08 - STD N5258AD08 - 001
WR06 110 - 170 N5258AD06 - STD N5258AD06 - 001
WR05 140 - 220 N5258AD05 - STD N5258AD05 - 001
WR03 220 - 325 N5258AD03 - STD N5258AD03 - 001
Millimeter wave calibration kits
Waveguide flange Frequency GHz Calibration kitWR22 33 - 50 Q11644A
WR15 50 - 75 V11644A
WR12 60 - 90 N5260AC12
WR10 75 - 110 W11644A
WR08 90 - 140 N5260AC08
WR06 110 - 170 N5260AC06
WR05 140 - 220 N5260AC05
WR03 220 - 325 N5260AC03
WR02.2 325 - 500 N5260AC02
Extended WR12 56 - 94 N5260AC12
17
Option Descriptions
• Millimeter Module Cable Options ( for N561A and N5262A Millimeter Test Set Controller)
• Option 501: A set of 4 foot cables for connection of a module to the test set controller.
• Option 502: A set of 2 meter cables for connection of module to the test set controller.
• Option 503: A set of 3 meter cables for connection of module to the test set controller.
• Option 505: A set of 5 meter cables for connection of module to the test set controller.
• Millimeter-wave modules with bias-tees (Option 017) (Only available with the PNA N5250C)Adds 67 GHz bias-tees to the combiner assembly between the input to the combiner
and the 67 GHz coupler. The bias-tees have tri-axial connectors for force, sense,
and ground. Positioning the bias-tees close to the DUT greatly improves stability for
on-wafer and in-fixture devices. The bias-tees added for this option have a voltage
rating of 40 volts and a maximum of 0.5 amps.
• Millimeter-wave modules with bias-tees and port 2 attenuator (Option 018) (Only available with the PNA N5250C)Adds 67 GHz bias-tees to the combiner assembly between the input to the combiner
and the 67 GHz coupler. The bias-tees have tri-axial connectors for force, sense,
and ground. Positioning the bias-tees close to the DUT greatly improves stability for
on-wafer and in-fixture devices. The bias-tees added for this option have a voltage
rating of 40 volts and a maximum of 0.5 amps. Additionally, Option 018 adds a 25 dB
micrometer attenuator to the port 2 test head.
• IF access (Option H11) Provides hardware to enable antenna, point-in-pulse, and broadband millimeter-wave
measurements to 110 GHz. For each of the MW PNA’s measurement receivers,
IF gates (enabled with pulsed measurement capability, Option H08) and external
IF inputs are added. In addition, access to the PNA’s internal RF and LO source is
provided for remote mixing applications. For basic antenna measurements, only Option
H11 is necessary. Pulsed-antenna applications also require the pulsed measurement
capability (Option H08). Broadband measurements to 110 GHz, also requires an
N5260A.
◦ Use external IF access for up to 20 dB more sensitivity when making antenna
measurements with a remote mixing configuration
◦ Add Option H08 (Pulsed-RF Measurement Capability) to enable advanced pulsed
measurements
◦ Upgrade an E8361C with Option H11 to a broadband (10 MHz to 110 GHz) VNA
system simply by purchasing an N5260A controller test set with Option 110, 120, or
130.
• Time-domain capability (Option 010)Used for viewing reflection and transmission responses in time or distance domain.
• Configurable test set (Option 014)Provides six front panel access loops. The loops provide access to the signal path
between (a) the source output and the reference receiver, (b) the source output and
directional coupler thru arm and (c) the coupled arm of the directional coupler and the
port receiver.
• Extended power range and bias tees (Option UNL)1
A 50 dB step attenuator and bias-tee set is inserted between the source and test port
one and another set between the source and test port two.
• Frequency offset (Option 080)1
This option enables the PNA Series microwave network analyzers to set the source
frequency independently from where the receivers are tuned.
1. These options apply to the E8361C and are
limited to 67 GHz frequency range.
18
• Reference receiver switch (Option 081) Option 081 adds a solid-state internal RF transfer switch in the R1 reference-receiver
path. The switch allows the instrument to easily switch between standard S-
parameter (non-frequency-offset) measurements and frequency-offset measurements
such as relative phase or absolute group delay that require an external reference
mixer.
• Frequency converter measurement application (Option 083)1
The frequency converter application adds an intuitive and easy-to-use user interface,
advanced calibration choices that provide exceptional amplitude and phase accuracy,
and control of external signal sources for use as local oscillators.
• Add receiver attenuators (Option 016)1
A 50 dB step attenuator is added between each test port and its corresponding
receiver.
• Pulsed-RF measurement capability (Option H08)1 Provides software to set up and control pulsed-RF measurements with point-in-pulse
capability. The software sets the coefficients of the MW PNA ’s digital-IF filter
to null out unwanted spectral components, enables the IF gates provided with IF
Access (Option H11), and controls selected Agilent pulse generators. It can be run
on the PNA or an external computer. A “.dll ”file containing the IF-filter algorithms
is included for automated pulsed-RF testing. The pulsed application is configured to
work with the Agilent 81110A series pulse generator. For more detailed information
regarding pulsed measurement capabilities with the PNA refer to the Agilent Web site
www.agilent.com/find/pna and download the PNA Series MW Configuration Guide
for Pulsed Measurements, literature number 5989-7913EN.
• Rack mount kit without handles (Option 1CM)Adds a rack mount (5063-9217) and rail kit (E3663AC) for use without handles.
• Rack mount kit with handles (Option 1CP)Adds rack mount (5063-9237) and rail kit (E3663AC) for use with previously supplied
handles.
External synthesizers
• Recommended for enhancement of dynamic rrange of systems in certain frequency
bands of operation.
• Typically for operations below 110 GHz external synthesizers are not required to
achieve the already exceptional dynamic range as stated in the table on Page 6.
• When using a PNA based system and if you need to improve the dynamic range by up
to 10 dB a set of external synthesizers are recommended. Note you will not need the
external synthesizers when using a PNA-X.
• For frequency bands beyond 220 GHz, an improvement of up to 20 dB may be gained
for PNA based configurations. Once again on the PNA-X there is no need to add
external sources, please refer to Figure 9 for the typical performance.
• For rack mount configurations a rear panel output is recommended.
Ordering external synthesizers (not required for N5242A PNA-X)
• Two external synthesizers are required one for the RF and one for the LO and we
recommend the E8257D with options 520 and UNX.
• For rear panel access to the E8257D option 1EM is available, moves all front panel
connector to the rear.
• When external synthesizers are added, the following cables are also required and may
be purchased separately:
◦ 5 x BNC (2 for 10 MHz connections and 3 for Trigger connections)
◦ 2 x 3.5mm (11500 E/F depending on setup and distance)
◦ 2 x GPIB (10833A 1 meter GPIB cable)1. Up to 67 GHz.
19
PNA and PNA-X options as related to banded millimeter-wave systems
PNA series PNA-XE8362C (10 MHz to 20 GHz)
E8363C (10 MHz to 40 GHz)
E8364C (10 MHz to 50 GHz)
E8361C (10 MHz to 67 GHz)
N5242A (10 MHz to 26.5 GHz)
2-port with confi gurable test set Option 0141 Option 2002
4-port with confi gurable test set n/a Option 400
Time domain Option 010 Option 010
IF access / IF inputs Option H111 (requires Options
014, UNL, 080 and 081)
Option 0202
2 ports, add internal 2nd source,
combiner and mechanical switches
n/a N5245A-224 Requires Options 200,
219 and 080
4 ports, add internal combiner and
mechanical switches
n/a N5245A-423 Requires Option 400,
419 and 080
Built-in pulse modulators n/a Option 021 (fi rst source)
Option 022 (second source)
Built-in pulse generators n/a Option 025
Pulse measurements Option H08 Option H08
Frequency offset Option 0801 Option 080
Reference receiver switch Option 0811 (included in Options 200 and 400)
Extended power range and bias tees Option UNL1 Option 219
(2-port, requires Option 200)
Option 419
(4-port, requires Option 400)
1. Minimum requirement on the PNA confi guration to be used in a banded milli-meter-wave system: E8361/2/3/4C with Options H11, 014, UNL, 080 and 081.
2. Minimum requirement on the PNA-X confi guration to be used in a banded millimeter-wave system: N5242A with Options 200 and 020.
Please refer to the Agilent PNA Series Microwave Network Analyzers Configuration Guide, literature number 5989-7606EN, for details
on option descriptions, other configurations and accessories.
Key Web Resources
Engineering services for 8510 to PNA Series migrationAgilent’s network analyzer experts can save you time and money by working with you to
migrate your 8510 instruments and transition your test code quickly and easily.
For more information visit: www.agilent.com/find/8510
Information resourcesFor more information on the N5250C PNA visit: www.agilent.com/find/pnaTest and measurement accessories visit: www.agilent.com/find/accessorieswww.agilent.com/find/mmwave
Agilent channel partnersOur channel partners offer accessories and measurement solutions that extend your
network analysis capabilities.
For information about probing equipment and accessories, contact:
Cascade Microtech, Inc.
2430 NW 206th Avenue
Beaverton, Oregon 97006, USA
Toll-free telephone: (800) 550-3279
Telephone: (503) 601-1000
Fax: (503) 601-1002
Web site: www.cascademicrotech.comE-mail: [email protected]
Remove all doubtOur repair and calibration services
will get your equipment back to you,
performing like new, when prom-
ised. You will get full value out of
your Agilent equipment through-
out its lifetime. Your equipment
will be serviced by Agilent-trained
technicians using the latest factory
calibration procedures, automated
repair diagnostics and genuine parts.
You will always have the utmost
confi dence in your measurements.
For information regarding self
maintenance of this product, please
contact your Agilent offi ce.
Agilent offers a wide range of ad-
ditional expert test and measure-
ment services for your equipment,
including initial start-up assistance,
onsite education and training, as
well as design, system integration,
and project management.
For more information on repair and
calibration services, go to:
www.agilent.com/find/removealldoubt
For more information on Agilent Technologies’ products, applications or services, please contact your local Agilent office. The complete list is
available at:
www.agilent.com/fi nd/contactus
AmericasCanada (877) 894-4414 Latin America 305 269 7500United States (800) 829-4444
Asia Pacifi cAustralia 1 800 629 485China 800 810 0189Hong Kong 800 938 693India 1 800 112 929Japan 0120 (421) 345Korea 080 769 0800Malaysia 1 800 888 848Singapore 1 800 375 8100Taiwan 0800 047 866Thailand 1 800 226 008
Europe & Middle EastAustria 01 36027 71571Belgium 32 (0) 2 404 93 40 Denmark 45 70 13 15 15Finland 358 (0) 10 855 2100France 0825 010 700* *0.125 €/minute
Germany 07031 464 6333 Ireland 1890 924 204Israel 972-3-9288-504/544Italy 39 02 92 60 8484Netherlands 31 (0) 20 547 2111Spain 34 (91) 631 3300Sweden 0200-88 22 55Switzerland 0800 80 53 53United Kingdom 44 (0) 118 9276201Other European Countries: www.agilent.com/fi nd/contactusRevised: July 2, 2009
Product specifi cations and descriptions in this document subject to change without notice.
© Agilent Technologies, Inc. 2008, 2009Printed in USA, August 21, 20095989-7620EN
www.agilent.comwww.agilent.com/find/mmwave
Agilent Email Updates
www.agilent.com/find/emailupdatesGet the latest information on the
products and applications you select.
Agilent Direct
www.agilent.com/find/agilentdirectQuickly choose and use your test
equipment solutions with confi dence.
Windows is a U.S. registered trademark of
Microsoft Corporation.
