0752 Net Analyst GUI Basics v2dot0

© Acterna. All rights reserved.

0752 - NetAnalyst GUI Basics - v2.0 1

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NetAnalyst GUI Basics

Participant Guide



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Notes:



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Copyright © 2005 Acterna. All rights reserved.

Page 3

Centralized Testing: The Big Picture

NetAnalyst provides:• An operations and maintenance (OAM) interface for the CT-650• A user interface for the test setup and results• A northbound interface for other OSS• Other useful features such as scripting, scheduling, etc.The test head provides:• Test technology• Test access control• The management of simultaneous tests. A Test Access Unit (TAU) is required to provide access to circuits under test. Test access units are usually a digital cross-connect system (DCS) or a test access switch/digital test access unit (DTAU).Access to the TAU can be either via a serial link or an Ethernet interface. The CT-650 generally allows two types of test access depending on the element: non-intrusive (monitor) and intrusive (split).The CT-650 system, in conjunction with NetAnalyst 4.0, remotely monitors and tests circuits for provisioning as well as ongoing maintenance, so the service provider can quickly identify network trouble spots and efficiently direct maintenance resources from one centralized location. The CT-650 and NetAnalyst enable service providers to reduce field dispatches and respond more quickly to customers. Together, these products offer a complete SONET/SDH and E1 testing solution for service providers in a single chassis.The figure on this slide illustrates how NetAnalyst communicates with CENTEST for TAU-based testing. The TAU provides the access point for the CENTEST 650/650-S.

Legend: RTU remote test unitNIU network interface unitCSU channel service unitDSX digital signal cross connectLAN local area networkWAN wide area network



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Page 4

Session Objectives

At the conclusion of this training, participants will be able to:

Have gained an understanding of logging-in, navigating the NetAnalyst Graphical User Interface (GUI) and menus, and exiting test sessions for basic testing operations using the NetAnalyst GUI

Identify the four major sections of the NetAnalyst GUI

Understand basic OAM functions using the NetAnalyst GUI

List the steps in the centralized testing process using NetAnalyst



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Page 5

Log In

To launch NetAnalyst and log in:1. Double-click the NetAnalyst icon on the desktop.

The NetAnalyst Login window displays. The figure on this slide illustrates the Login window.

2. Type the user name.3. Type the password.4. Select a host from the drop-down list,

orType a host name or IP address in the Host field.

5. Click the OK button.



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Page 6

Navigate

After logging in, the NetAnalyst window displays. The figure on this slide illustrates the NetAnalyst window.

Menu BarThe options on the NetAnalyst menu bar include:• File – provides the options to exit NetAnalyst and save files.• Session – provides options for controlling a test or OAM session.• Help – provides access to detailed on-line help.

Tool BarThe icons on the tool bar provide access to frequently used functions. Table 1 (next 3 slides) describes the icons.



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Page 7

Tool BarTest

Configure and Maintain Resources

Test Scheduling

Results Reporting

Results Report Viewer

Telnet Terminal

Session Exit

Start Journal

Table 1 displays the icons found on the NetAnalyst tool bar. These provide access to frequently used functions. When activated, each of the tool bar icons will:• Test icon initiates a test session.• Configure and Maintain Resources icon initiates an OAM session.• Test Scheduling icon accesses the test scheduler for automated testing.• Results Reporting icon creates an HTML report of the test results.• Results Report Viewer opens and displays an existing report.• Telnet Terminal initiates a Telnet session to a test head.• Session Exit disconnects a test or OAM session.• Start Journal creates a text file of the test session details. This icon changes to Stop Journal once the journal function is activated.



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Page 8

Tool bar

Filter Results

View Results

Start Recorder

Detach Session Window

Help

Table 1 displays the icons found on the NetAnalyst tool bar. These provide access to frequently used functions. When activated, each of the tool bar icons will:• Filter Results creates filters for viewing specific test results required for analysis. • View Results displays test results.• Start Recorder Records a test for easy creation of scripts. This icon changes to Stop Recorder once the recorder function is activated.• Detach Session Window Detaches the test session window from the Workspace so that the test session window may be positioned anywhere on the desktop.• Help Accesses the on-line help system.



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Page 9

Control Center and Workspace

The figure on this slide illustrates the main NetAnalyst window. The NetAnalystwindow contains two panes:• Control Center on the left• Workspace on the rightUse the Control Center to access a test session, OAM session, or various tools, such as the Scheduler, Recorder, and Report Viewer, etc.The Workspace display changes depending on the option selected in the Control Center. For example, if you select Test Services in the Control Center, the Workspace displays a list of available Test Access Units (TAUs).

Sizing icons enable you to adjust the size of a pane.



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Page 10

Start a Test Session

The figure on this slide illustrates an expanded view of the Control Center portion of the NetAnalyst window.To start a test session:1. Expand the Create Sessions option from within the Control Center.2. Select Test Services, as shown in the figure on this slide.



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Page 11

Start a Test Session

The figure on this slide illustrates an expanded view the left portion of the workspace in NetAnalyst window. The configurable selections made in this area are necessary to create and start NetAnalyst sessions. After selecting Test Services from the control center, NetAnalyst displays a list of available test heads and TAUs in the Workspace, as shown in the figure on this slide.3. Select a test head from the Vender/Version Selection drop-down list. Use pointer tool, arrow tool, etc. to draw viewer/student attention to the location of the Vendor/Version Selection drop-down menu parameter within the control center.4. Double-click on a TAU on the Location View tab. Available TAUs will list under the Service Navigator folder. Use pointer tool, arrow tool, etc. to draw viewer/student attention to the location of the TAUs. 5. Select a test service, such as DS1.



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Page 12

Access Identifier

Upon selecting the test service, the Parameters tab automatically displays in the Workspace, as illustrated in the figure on this slide.6. Type the Access Identifier (AID) for the circuit.7. Select additional parameters, as required, for the circuit to be tested.8. Click the Create Session button at the bottom of the window.NetAnalyst initiates the test session and displays the circuit diagram. In addition, buttons and icons for performing different test applications display in the Workspace.



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Page 13

Circuit Diagram

The circuit diagram view provides a graphical representation of the circuit to be tested, as illustrated in the figure on this slide. Clicking on the Diagram button permits viewing of just the circuit diagram.The elements on the circuit diagram include:• RTU – test head• TAU – DCS port• NIU – Customer Premises EquipmentThe selected side represents the portion of the circuit corresponding to the entered AID. The connected side represents the other side of the circuit. Typically, the entered AID should be the identifier for the portion of the circuit between the DCS and the customer premises.



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Page 14

Test Information

The circuit test information view displays detailed test session information, as illustrated in the figure on this slide. Clicking on the Info button permits viewing of detailed circuit and test device information. Test circuit diagram is not viewed.The elements detailed in the test info view include:• Circuit Information – location, service type, AID, and if SLC Framed or not• Device Information – title, type, state, vendor, and version Clicking the Both button displays compacted versions of the circuit diagram and test information views.



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Page 15

Perform Test

The figure on this slide illustrates the NetAnalyst Test Session window. The bottom section of the Workspace provides various buttons, icons, and tabs used to perform test applications. The buttons and icons display in the Operation List section on the left. The tabs display on the right. Users have the option to resize the workspace area by using the resizing icons viewable in the upper lefthand corner. Workspace expands up and in front of the circuit test views and to the left in front of the control center.



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Page 16

Perform Test

To perform a test application:1. Click the network element (e.g., TAU, Selected RTU, Selected NIU) for the test on the circuit diagram.The corresponding tab displays the setup parameters at the bottom of the Workspace. In addition, the buttons in the Operation List change depending on the network element selected for testing and the stage of the application. The icons also change depending on the stage of the application.2. Select the required test parameters on the Setup tab.3. Click the application type button (e.g., Monitor, TAP Loopback, Split) in the Operation List. See Table 2 for a description of these buttons.4. Click the Start icon. 5. See Table 2 for a description of the various icons.



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Page 17

Test Application Buttons Using CT-650 for DS1

DescriptionButtonElement

Restarts a test and clears accumulated results.

Restart Test

Inserts a single bit error.Insert Single Error

Verifies that the RTU within the test head is functioning properly.

Self TestRTU

Accesses the Setup tab for specifying the type of error and either single or continuous errors to be inserted.

Inject Errors

Initiates an intrusive test and enables error insertion.

Intrusive Test

Table 2 describes the test application buttons that display for the various network elements during different stages of a test application using the CT-650 for DS1 testing.



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Page 18

Test Application Buttons Using CT-650 for DS1


Sends loop-up or loop-down codes to the CPE.LoopNIU

Communicates directly to the DCS for retrieval of cross-connect assignments and port information.

TAU Direct

Loops back the Test Access Port (TAP) on the TAU for testing the test access wiring between the test head and the TAU.

TAP Loopback

TAU

Disconnects live connections on the circuit and performs and EF, AB, or shared split, depending on the options available on the TAU.

SplitNon-intrusively monitors the traffic on a circuit.Monitor

Table 2 describes the test application buttons that display for the various network elements during different stages of a test application using the CT-650 for DS1 testing.



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Page 19

Test Application Buttons Using T3AS for DS1

Inserts a single bit error.Inject Single Error

Reports circuit performance measurements.Report

Connects directly to the test head.Telnet Reach Thru

Inserts multiple bit errors.Inject Errors

Measures the transmitted and received signals and displays test results.

Measure

Accesses the Parameters tab for configuring the test signal elements (e.g., pattern, framing, coding), and transmits the test signal.

TX Test Signal

Non-intrusively monitors the traffic on a circuit.Monitor

RTU


Table 3 describes the test application buttons that display for the various network elements during different stages of a test application using the T3AS for DS1 testing.



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Page 20

Test Application Buttons Using T3AS for DS1

Sends loop up or loop down codes to the CPE.LoopNIU

Communicates directly to the DCS for retrieval of cross-connect assignments and port information.

DCS Control

Selects the test mode and the side of the circuit to be tested e.g., split E, Loop E, Split A, etc.).

Change Access Mode

Establishes a connection between the TL1 Gateway and the circuit.

Connect Test Access

TAU


Table 3 describes the test application buttons that display for the various network elements during different stages of a test application using the T3AS for DS1 testing.



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Page 21

Test Application Buttons Using BRTU for DS1

Changes signal sent out on connected side of circuit.

Change Keep-Alive Signal

Measures Round-Trip Delay on circuit.Round-Trip Delay

Checks for pre-existing loops on the circuit.Test for Loopback

Inserts multiple bit errors.Inject Errors

Measures the transmitted and received signals and displays test results.

Measure

Accesses the Parameters tab for configuring the test signal elements (e.g., pattern, framing, coding), and transmits the test signal.

TX Test SignalNon-intrusively monitors the traffic on a circuit.Monitor

RTU


Table 4 describes the test application buttons that display for the various network elements during different stages of a test application using the BRTU for DS1 testing.



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Page 22

Test Application Buttons Using BRTU for DS1

Measures the PM data on the circuit.Measure PM

RTU

Accesses the Report tab for configuring the test signal measurement (e.g., Test Duration, and Error Type.

Measurement Parameters

Lists Performance Report Messages for circuit under test.

Report PRM

Connects directly to the test head.Telnet Reach Thru

Sends loop up or loop down codes to the CPE.LoopNIU

Selects the test mode and the side of the circuit to be tested e.g., split E, Loop E, Split A, etc.).

Change Access Mode

Establishes a connection between the TL1 Gateway and the circuit.

Connect Test Access

TAU


Table 4 describes the test application buttons that display for the various network elements during different stages of a test application using the BRTU for DS1 testing.



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Page 23

Test Status Icons

Test Status

Indicates that a test application is ready to begin.

Indicates that the test head is attempting to establish the connection and begin the application.

Indicates that an application has begun.

Indicates that an application has been stopped.

Table 5 describes the test status icons available on the Workspace during different stages of the test application.



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Page 24

Test Operation Icons

Test Operation

Starts an application.

Stops an application.

Accesses setup parameters for an application.

Table 6 describes the test operation icons available on the Workspace during different stages of the test application.



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Page 25

Test Results Icons

Test Results

Indicates that results are currently unavailable.

Indicates that errors are detected on the circuit.

Indicates that all results are OK.

Table 7 describes the test results icons available on the Workspace during different stages of the test application.



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Page 26

Test Results Using CT-650 for DS1

After starting a test application, the circuit diagram displays a graphical representation of the application and results tabs display at the bottom of the Workspace.The figure on this slide illustrates the results display.



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Page 27

Test Results Using T3AS for DS1

After starting a test application, the circuit diagram displays a graphical representation of the application and results tabs display at the bottom of the Workspace.The figure on this slide illustrates the results display.



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Page 28

Test Results Using BRTU for DS1

After starting a test application, the circuit diagram displays a graphical representation of the application and results tabs display at the bottom of the Workspace.The figure on this slide illustrates the results display for a DS1 test.



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Page 29

Results Tabs Using CT-650 for DS1

ContentsResults Tab

Displays G.821 performance statistics, such as number and percent of error free seconds, etc.G.821

Displays the current status of the signal and the line, as well as historical indicators of losses and alarms.Status

Displays information about logic, frame, BPV, and CRC errors.Errors

Displays frequently viewed results for a test, such as signal present, frame sync, pattern sync, etc. that summarize the overall status of the circuit.

Summary

The available result tabs vary according to the application performed. The Summary tab always displays by default. Table 8 summarizes the information on the different results tabs using the CT-650 for DS1 testing.

If all results are good, the green OK icon displays on the left-hand side of the window. If errors are detected, the red error icon displays on the left-hand side.



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Page 30

Results Tabs using the T3AS for DS1

Displays information about logic, frame, BPV, and CRC errors.

Errors

Displays the current status of the signal and the line, and G.821 performance statistics.

Status

Summarizes errors currently detected.Error Summary

Displays the current status of the signal (e.g. alarms, errors, loss of signal, etc.), as well as historical indicators alarms for the connected side of the circuit.

Connected

Displays the current status of the signal (e.g. alarms, errors, loss of signal, etc.), as well as historical indicators alarms for the selected side of the circuit.

Selected

ContentsResults Tab

The available result tabs vary according to the application performed. The Summary tab always displays by default. Table 9 summarizes the information on the different results tabs for using the T3AS for DS1 testing.




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Page 31

Results Tabs Using BRTU for DS1

Summarizes errors currently detected.Error Summary

Displays the current status of the signal (e.g. alarms, errors, loss of signal, etc.), as well as historical indicators alarms for the connected side of the circuit.

Connected

Displays the current status of the signal (e.g. alarms, errors, loss of signal, etc.), as well as historical indicators alarms for the selected side of the circuit.

Selected

ContentsResults Tab

The available result tabs vary according to the application performed. The Summary tab always displays by default. Table 10 summarizes the information on the different results tabs for using the BRTU for DS1 testing.




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Page 32

Exit Session

After completing the test:1. Click the Exit Session icon on the tool bar,orSelect Exit Session from the Session menu.

The figure on this slide illustrates NetAnalyst Tool Bar portion of the NetAnalystwindow.

A confirmation message displays asking if you want to end the session.2. Click the OK button on the confirmation message.The testhead returns the circuit to the idle state.



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Page 33

Start an OAM Session

An OAM session displays information about the status of RTUs and TAUs. Prior to starting a test application, it is helpful to view the OAM information to ensure that the desired RTU and TAU are available. To start an OAM Session:

1. Expand the Create Sessions option in the Control Center.2. Select OAM Services.3. Expand the OAM option on the Service Type View tab in the Workspace.

NetAnalyst displays a list of available test heads in the Workspace, as shown in the figure on this slide.

4. Select the desired testhead (CT-650) or TL1 Gateway (T3AS & BRTU).5. Click the Create Session button.



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Page 34

OAM Window Using CT-650

Note: A supervisor password is not required to view OAM information.

An error message displays, indicating that the supervisor password entered is incorrect.

3. Click the OK button on the error message.

The OAM details for the selected test head display. Several tabs provide different types of status information. The default tab is the Dial Out Seq tab. The figure on this slide illustrates the default view of the OAM window.



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Page 35

OAM Window Using T3AS

The OAM details for the TL1 Gateway display.

• User ID – identifier for the users currently running test sessions.

• Test Device TID – T3AS identifier.

• TAU TID – DCS port identifier

• AID – access (circuit) identifier

• Service – service type supported by the circuit (e.g., DS1, DS3, etc.).

• Session State – current status of the test session.



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Page 36

OAM Window Using BRTU

The OAM details for the TL1 Gateway display.

• User ID – identifier for the users currently running test sessions.

• Test Device TID – T3AS identifier.

• TAU TID – DCS port identifier

• AID – access (circuit) identifier

• Service – service type supported by the circuit (e.g., DS1, DS3, etc.).

• Session State – current status of the test session.



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Page 37

View Slot Configuration

To view each card slot on the test head:1. Click the All Devices tab.The figure on this slide illustrates the All Devices tab. The All Devices tab indicates which slots are available and which RTUs are ready for testing.The fields on the Device tab include:• Device – device identifier. For RTUs, the information includes the shelf, slot, and

card side.• Device Type – type of RTU or TAU• Device State – status of the RTU

The possible RTU states include:• Available – the RTU is ready to perform a test• Not Configured – the RTU is not associated with a test port or is not configured• Empty Slot – no RTU is installed in the indicated slot• In Use – the RTU is currently performing a test



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Page 38

Port Status

To view the port status:1. Click the Port tab.The figure on this slide illustrates the Port tab. The Port tab provides the configuration information for each test port on the test head. This information identifies which ports are available for testing and how they are configured.The fields on the Port tab include:• Port Number – port number on the test head• Configured For – port use (e.g., DCS Port, Terminal)• System Name – identifier assigned to the port• Baud Rate – transmission speed allocated to the port • Parity – indicator of whether or not parity error-detection is used on this port. • Data Bits – number of bits transmitted in a byte.



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Page 39

RTU Status

Before performing a test application, you should verify that the desired RTU is available for testing. To view detailed RTU status information:1. Click the RTU tab.The figure on this slide illustrates the RTU tab.The fields on the RTU tab include:• RTU Name – identifier for the RTU. The naming convention is shelf_slot and card side. • State – status of the RTU (e.g., available, not configured, empty slot, in use)• Card Type – type of card installed (e.g. DT1, DT3, DTU)• Test Port Type – type of test access (e.g., Dual FAD, Single FAD, TAD)• TAU Name – identifier of the Test Access Unit associated with the RTU.• SW Version – version of software installed on the TAU.• HW Version – version of hardware installed on the TAU.The possible RTU states include:• Available – the RTU is ready to perform a test• Not Configured – the RTU is not associated with a test port or is not configured• Empty Slot – no RTU is installed in the indicated slot• In Use – the RTU is currently performing a test



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Page 40

TAU Status

To view the status of connected TAUs:1. Click the TAU tab.The figure on this slide illustrates the TAU tab.The information on the TAU tab includes:• TAU Name – identifier for the TAU• State – status of the TAU (e.g., On Line)• TAU Model – manufacturer and model number of the TAU



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Page 41

Exit an OAM Session

After completing the OAM session:1. Click the Exit Session icon on the tool bar,orSelect Exit Session from the Session menu.

The figure on this slide illustrates NetAnalyst Tool Bar portion of the NetAnalystwindow.

A confirmation message displays asking if you want to end the session.2. Click the OK button on the confirmation message.The testhead returns the circuit to the idle state.



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Page 42

NetAnalyst Help

NetAnalyst 4.0 provides a comprehensive on-line help system that is very easy to use.To access on-line help:1. Click the Help icon on the tool bar.NetAnalyst launches a browser window and displays the on-line help options. The figure on this slide illustrates the NetAnalyst Help window.The on-line help provides the ability to search for a specific piece of information and displays links to several different categories of information.

The Search field displays in the upper left-hand section of the window. The links to NetAnalyst-specific categories of information display in purple just beneath the Search field. Links to documentation for other components of a centralized testing system, such as test heads and the TL1 Gateway, display in blue at the bottom of the window.2. To search for a specific topic:3. Type key words about the topic in the Search field.4. Click the Go button.5. To view a category of information, click the applicable link.



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Page 43

Eight-Step Testing on CT-650Self Test

Monitor

Split

Loop Up

Intrusive Test

Intrusive Test

Loop Down

Disconnect

Monitor

Test the test system, RTUs, and TAPs.

Look for: AIS, Yellow, Freq., CRCs, Framing Slips, BERT pattern on line.

Restore circuit.

Split Circuit for Intrusive Testing.

Check for continuity or stress failures using: Pseudorandom, 3 in 24, 1 & 7, all 1s, all 0s.

Check for pre-existing loops, test equipment on line.

NIU, CSU, HLU-C, HLU-R, Doubler 1 & 2, USER.

Optional – Ensure that circuit is restored.

Release the CENTEST so available for other tests.

In order to maximize the potential of NetAnalyst, Acterna recommends an eight-step strategy to guide centralized testing. Performed in sequence, this eight-step process forms an efficient and practical approach to centralized testing. The procedures can be used for any test device supported by NetAnalyst.

The figure on this slide illustrates the eight-step strategy of centralized testing with NetAnalyst using a CT-650 testhead.

The optional Monitor step is included before the disconnect in order to ensure that the circuit has in fact been restored to normal operating conditions.



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Page 44

Seven-Step Testing on T3AS & BRTU

In order to maximize the potential of NetAnalyst and the TL1 Gateway, Acterna recommends a seven-step strategy to guide centralized testing on a T3AS or BRTU testhead.

Performed in sequence, this seven-step process forms an efficient and practical approach to of centralized testing.

The figure on this slide illustrates the seven-step strategy of centralized testing with NetAnalyst using either a T3AS or BRTU testhead.



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Page 45

Session Objectives Review

At the conclusion of this training, participants will be able to:

Have gained an understanding of logging-in, navigating the NetAnalyst Graphical User Interface (GUI) and menus, and exiting test sessions for basic testing operations using the NetAnalyst GUI

Identify the four major sections of the NetAnalyst GUI

Understand basic OAM functions using the NetAnalyst GUI

List the steps in the centralized testing process using NetAnalyst



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Centralized Testing: The Big Picture

NetAnalyst provides:• An operations and maintenance (OAM) interface for the CT-650• A user interface for the test setup and results• A northbound interface for other OSS• Other useful features such as scripting, scheduling, etc.The test head provides:• Test technology• Test access control• The management of simultaneous tests. A Test Access Unit (TAU) is required to provide access to circuits under test. Test access units are usually a digital cross-connect system (DCS) or a test access switch/digital test access unit (DTAU).Access to the TAU can be either via a serial link or an Ethernet interface. The CT-650 generally allows two types of test access depending on the element: non-intrusive (monitor) and intrusive (split).The CT-650 system, in conjunction with NetAnalyst 4.0, remotely monitors and tests circuits for provisioning as well as ongoing maintenance, so the service provider can quickly identify network trouble spots and efficiently direct maintenance resources from one centralized location. The CT-650 and NetAnalyst enable service providers to reduce field dispatches and respond more quickly to customers. Together, these products offer a complete SONET/SDH and E1 testing solution for service providers in a single chassis.The figure on this slide illustrates how NetAnalyst communicates with CENTEST for TAU-based testing. The TAU provides the access point for the CENTEST 650/650-S.

Legend: RTU remote test unitNIU network interface unitCSU channel service unitDSX digital signal cross connectLAN local area networkWAN wide area network

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0752 Net Analyst GUI Basics v2dot0